Development of ferroelectric oxides based resistive switching materials

Resistive random access memory (RRAM) is one of the most promising candidates that satisfies the requirements of new generation non-volatile memories, as a consequence of its high density, outstanding scalability, and low power consumption. The review is based on a summary of recent studies in ferroelectric oxides based resistive switching (RS) materials and devices. It highlights the various ferroelectric oxide materials with RS behaviour and the underlying mechanisms including filament-type and interface-type mechanism. In the end, the challenge in current RRAM for future high-density data storage applications is addressed.     

Light-controlled plasmon switching using hybrid metal-semiconductor nanostructures

We present a proof of concept for the dynamic control over the plasmon resonance frequencies in a hybrid metal-semiconductor nanoshell structure with Ag core and TiO(2) coating. Our method relies on the temporary change of the dielectric function ε of TiO(2) achieved through temporarily generated electron-hole pairs by means of a pump laser pulse. This change in ε leads to a blue shift of the Ag surface plasmon frequency. We choose TiO(2) as the environment of the Ag core because the band gap energy of TiO(2) is larger than the Ag surface plasmon energy of our nanoparticles, which allows the surface plasmon being excited without generating electron-hole pairs in the environment at the same time. We calculate the magnitude of the plasmon resonance shift as a function of electron-hole pair density and obtain shifts up to 126 nm at wavelengths around 460 nm. Using our results, we develop the model of a light-controlled surface plasmon polariton switch.     

Nanoionics-based resistive switching memories

Many metal-insulator-metal systems show electrically induced resistive switching effects and have therefore been proposed as the basis for future non-volatile memories. They combine the advantages of Flash and DRAM (dynamic random access memories) while avoiding their drawbacks, and they might be highly scalable. Here we propose a coarse-grained classification into primarily thermal, electrical or ion-migration-induced switching mechanisms. The ion-migration effects are coupled to redox processes which cause the change in resistance. They are subdivided into cation-migration cells, based on the electrochemical growth and dissolution of metallic filaments, and anion-migration cells, typically realized with transition metal oxides as the insulator, in which electronically conducting paths of sub-oxides are formed and removed by local redox processes. From this insight, we take a brief look into molecular switching systems. Finally, we discuss chip architecture and scaling issues.     

Photo-stimulated resistive switching of ZnO nanorods

Resistive switching memory devices are promising candidates for emerging memory technologies because they yield outstanding device performance. Storage mechanisms for achieving high-density memory applications have been developed; however, so far many of them exhibit typical resistive switching behavior from the limited controlling conditions. In this study, we introduce photons as an unconventional stimulus for activating resistive switching behaviors. First, we compare the resistive switching behavior in light and dark conditions to describe how resistive switching memories can benefit from photons. Second, we drive the switching of resistance not by the electrical stimulus but only by the modulation of photon. ZnO nanorods were employed as a model system to demonstrate photo-stimulated resistive switching in high-surface-area nanomaterials, in which photo-driven surface states strongly affect their photoconductivity and resistance states.     

Multistate resistive switching in silver nanoparticle films

Abstract

Resistive switching devices have garnered significant consideration for their potential use in nanoelectronics and non-volatile memory applications. Here we investigate the nonlinear current–voltage behavior and resistive switching properties of composite nanoparticle films comprising a large collective of metal–insulator–metal junctions. Silver nanoparticles prepared via the polyol process and coated with an insulating polymer layer of tetraethylene glycol were deposited onto silicon oxide substrates. Activation required a forming step achieved through application of a bias voltage. Once activated, the nanoparticle films exhibited controllable resistive switching between multiple discrete low resistance states that depended on operational parameters including the applied bias voltage, temperature and sweep frequency. The films’ resistance switching behavior is shown here to be the result of nanofilament formation due to formative electromigration effects. Because of their tunable and distinct resistance states, scalability and ease of fabrication, nanoparticle films have a potential place in memory technology as resistive random access memory cells.     

Multistate resistive switching in silver nanoparticle films

Resistive switching devices have garnered significant consideration for their potential use in nanoelectronics and non-volatile memory applications. Here we investigate the nonlinear current–voltage behavior and resistive switching properties of composite nanoparticle films comprising a large collective of metal–insulator–metal junctions. Silver nanoparticles prepared via the polyol process and coated with an insulating polymer layer of tetraethylene glycol were deposited onto silicon oxide substrates. Activation required a forming step achieved through application of a bias voltage. Once activated, the nanoparticle films exhibited controllable resistive switching between multiple discrete low resistance states that depended on operational parameters including the applied bias voltage, temperature and sweep frequency. The films’ resistance switching behavior is shown here to be the result of nanofilament formation due to formative electromigration effects. Because of their tunable and distinct resistance states, scalability and ease of fabrication, nanoparticle films have a potential place in memory technology as resistive random access memory cells.     

Domain switching in polycrystalline ferroelectric ceramics

Ferroelectric ceramics are widely used as sensors and actuators for their electro-mechanical properties, and in electronic applications for their dielectric properties. Domain switching--the phenomenon wherein the ferroelectric material changes from one spontaneously polarized state to another under electrical or mechanical loads--is an important attribute of these materials. However, this is a complex collective process in commercially used polycrystalline ceramics that are agglomerations of a very large number of variously oriented grains. As the domains in one grain attempt to switch, they are constrained by the differently oriented neighbouring grains. Here we use a combined theoretical and experimental approach to establish a relation between crystallographic symmetry and the ability of a ferroelectric polycrystalline ceramic to switch. In particular, we show that equiaxed polycrystals of materials that are either tetragonal or rhombohedral cannot switch; yet polycrystals of materials where these two symmetries co-exist can in fact switch.     

Numerical analysis of ferroelectric/ferroelastic domain switching in ferroelectric ceramics

A numerical approach predicting the behavior of ferroelectric ceramics under electric field and mechanical loading is proposed in this paper. In the model, macroscopic properties of ferroelectric ceramics are determined by microscopic structures. Ferroelectric ceramics are seen to be composed of many domains with different orientations, and domain switching is the source of the nonlinear constitutive behavior of the ferroelectric ceramics. Numerical calculations based on the model were carried out, and the computational results are compared with the experimental results, which shows the two sets of results consist with each other. The calculation approach can provide a guidance for the ceramics component design.     

New charge-transfer salts for reversible resistive memory switching

We found novel organic charge-transfer salts that exhibit reversible resistive memory switching phenomena. Homogeneous layers of these complexes can be easily fabricated using solution processing. The copper-2,3-dichloro-5,6-dicyano-p-benzoquinone complex was investigated in more detail. Devices made of this complex can be reversibly switched between a high and a low resistance state by applying voltage pulses as short as 1 micros. The memory states remain stable for more than 15 h without an electricity source.     

Voltage-controlled reverse filament growth boosts resistive switching memory

Nonvolatile memory devices based on filamentary resistance switching (RS) areamong the frontrunners to fuel future devices and sensors of the internet of things (IoT) era. The capability of many metal-insulator-metal cells to switch between two distinctive resistive states in response to an external electrical stimulus has been demonstrated. Through years of selection, cells based on the drift of metal ions, namely conductive-bridge memory devices, have shown a wide range of applications with nanosecond switching speeds, nanometer scalability, high-density, and low power-consumption. However, for low (sub-10-μA) current operation, a critical challenge is still represented by programming variability and by the stability of the conductive filament over time. Here, by introducing the concept of reverse filament growth (RFG), we managed to control the structural reconfiguration of the conductive filament inside a memory cell with significant enhancements of each of the aforementioned properties. A first-in-class Cu-based switching device is demonstrated, with a dedicated stack that enabled us to systematically trigger RFG, thus tuning the device’s properties. Along with nanosecond switching speeds, we achieved an endurance of up to 10⁶ cycles with a 10² read window, with outstanding disturb immunity and optimal stability of the filament over time. Furthermore, by tuning the filament’s shape, an excellent control of multi-level bit operations was achieved. Thus, this device offers high flexibility in memory applications.

Open image in new window

     

铁电陶瓷中电畴翻转研究进展

电畴为铁电陶瓷固有的独特微观组织特征之一,铁电陶瓷的许多性能均与其密切有关.综述了铁电陶瓷中的电畴结构,系统介绍了电场、机械作用引起的电畴翻转,概述了电畴翻转对铁电陶瓷断裂韧性的影响及其研究进展.     

Modeling of charge switching in ferroelectric capacitors

To simulate charge switching in ferroelectric capacitors, a pair of exponential growth and decay currents is mapped to the process of polarization reversal. This is based on the fact that these exponential currents [i.e., i = I(m) e(t/tau) (t < or = 0) and i = I(m) e(-t/tau) (t > or = 0)], are completely specified by two constants I(m) and tau and each accommodates an integral charge Q = I(m) x tau. Equating this charge to the remanent spontaneous polarization allows for the modeling of switching current. For practical circuit simulations for charge switching, this modeling of switching current is simplified to an exponential decay current whose integral charge is set equal to the total reversed spontaneous polarization. This is because an exponential decay current can be conveniently implemented by charging a series resistor and capacitor (RC) circuit with a pulse-voltage source. The voltage transitions of the pulse source are associated with the polarization reversal and can be controlled with a noninverting Schmitt trigger that toggles at the positive and negative coercive voltages of a ferroelectric capacitor. The final circuit model incorporates such electrical and geometrical parameters as capacitance, remanent spontaneous polarization, coercive field, electrode area, and film thickness of a ferroelectric, thin-film capacitor.     

Modeling for multilevel switching in oxide-based bipolar resistive memory

We report a physical model for multilevel switching in oxide-based bipolar resistive memory (ReRAM). To confirm the validity of the model, we conduct experiments with tantalum-oxide-based ReRAM of which multi-resistance levels are obtained by reset voltage modifications. It is also noticeable that, in addition to multilevel switching capability, the ReRAM exhibits extremely different switching timescales, i.e. of the order of 10(-7)?s to 10(0)?s, with regard to reset voltages of only a few volts difference which can be well explained by our model. It is demonstrated that with this simple model, multilevel switching behavior in oxide bipolar ReRAM can be described not only qualitatively but also quantitatively.     

Nanoscale resistive switching devices for memory and computing applications

With the slowing down of the Moore’s law and fundamental limitations due to the von-Neumann bottleneck, continued improvements in computing hardware performance become increasingly more challenging. Resistive switching (RS) devices are being extensively studied as promising candidates for next generation memory and computing applications due to their fast switching speed, excellent endurance and retention, and scaling and three-dimensional (3D) stacking capability. In particular, RS devices offer the potential to natively emulate the functions and structures of synapses and neurons, allowing them to efficiently implement neural networks (NNs) and other in-memory computing systems for data intensive applications such as machine learning tasks. In this review, we will examine the mechanisms of RS effects and discuss recent progresses in the application of RS devices for memory, deep learning accelerator, and more faithful brain-inspired computing tasks. Challenges and possible solutions at the device, algorithm, and system levels will also be discussed.

     

Microprocess measurement channel under group switching of resistive sensors

A method and a version of designing multichannel measurement converter of a microprocessor system designated for carrying out measurements utilizing resistive sensors are described. To simplify the circuitry implementation of the hardware it is suggested to combine algorithmic methods of providing accuracy with the measuring procedures. Translated from Izmeritel'naya Tekhnika, No. 5, pp. 9–11, May, 1995     

A novel fabrication method for titania resistive switching device

The titania showing reversible resistive switching are attractive for today's semiconductor technology in nonvolatile random-access memories. A novel fabrication method for titania resistive switching device with vertical structure is proposed. First, the Pt electrode was fabricated the bottom using conventional photolithography and chemical etching technique. Next, the titania thin films with the thickness about 50 nm was deposited on the bottom electrode by electron beam evaporation (EBE). Then, the trench of photoresist for electrode deposit was etched with mild chemical process to preserve the original structure of titania layer. After that, the platinum was deposited in the trench of photoresist using ion sputter. A final lift-off process to define the Pt top electrodes was performed with acetone in an ultrasonic bath to remove the resist. The resistive bistability was observed in this device. The on-threshold voltage is +1.5 V and the off-threshold voltage is -0.6 V. The resistance ratio between the two stable states of the device including Al electrode is approximately 1 x 10(3), the state is nonvolatile and the retention-time test performed over an hour in sweeping mode measurement. The results indicate the forming and rupture of conductive channel relate to the defects and distributing of oxygen vacancy. This method is low-cost, high-yielding, and easy to implement, which is applicable to the fabrication of nonvolatile memories.     

Homogenization modeling of domain switching in ferroelectric materials

We presented a multiscale nonlinear finite element simulation to analyze domain switching behaviors in ferroelectric materials. We utilized an incremental form of fundamental constitutive law to consider changes in the material properties caused by domain switching. A multiscale nonlinear problem was formulated by employing the asymptotic homogenization theory based on the perturbation method and implemented using finite element analysis. The developed simulation was applied to barium titanate with a Perovskite-type tetragonal crystal structure. The 90° and 180° domain switching behaviors of a single crystal were computed for verification. The nonlinear behaviors of a bulk polycrystal with virtual microstructure were analyzed as a case study. The variation of the crystal orientation distribution in the polycrystalline microstructure was analyzed to reveal its influence on macroscopic hysteresis and butterfly curves.