Procedures and standards for accurate spectrophotometric measurements of specular reflectance

Procedures and standards that have been developed at the National Research Council of Canada for the accurate measurement of specular reflectance are discussed for both absolute and relative methods over the spectral range 250 to 2500 nm. There has been an increasing demand for these types of measurements, particularly for coated samples approaching the extremes of 0% reflectance and 100% reflectance. In some applications of these coatings, such as energy conservation and control, conventional methods of measuring specular reflectance give insufficient accuracies for the prediction of optical performance. Details of alignment procedures for both absolute and relative reflectance methods, the preparation and application of several candidate reflectance standards, and the compensation, attenuation, and verification procedures that have been developed to improve the precision and accuracy of specular reflectance measurements are described. Using these various techniques, one can routinely achieve accuracies of 0.3% reflectance at reflectance values as high as 97% and as low as 4%.     

Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples

A symmetry X system that has been constructed for the absolute measurements of reflectance and transmittance of specular samples in the infrared region is described. The system has been designed so that it can be incorporated into commercial Fourier-transform infrared spectrometers. Although ten mirrors were used in this system, it is disclosed that the geometric mean of two reflectance values is independent of the reflectance difference of the individual mirrors and the optical loss at each mirror. This system achieves spectral measurements with high accuracy and within a short period of time. In particular, the system affords us the self-diagnostic ability for measured spectra, and the simultaneous measurements of reflectance and transmittance under the same geometry enable us to evaluate measurement uncertainties. Although the symmetry X system is used for infrared spectral measurements, the measurement method, design principles, and features are generally applicable to other wavelengths as well.     

Spatially resolved absolute diffuse reflectance measurements for noninvasive determination of the optical scattering and absorption coefficients of biological tissue

The absorption and transport scattering coefficients of biological tissues determine the radial dependence of the diffuse reflectance that is due to a point source. A system is described for making remote measurements of spatially resolved absolute diffuse reflectance and hence noninvasive, noncontact estimates of the tissue optical properties. The system incorporated a laser source and a CCD camera. Deflection of the incident beam into the camera allowed characterization of the source for absolute reflectance measurements. It is shown that an often used solution of the diffusion equation cannot be applied for these measurements. Instead, a neural network, trained on the results of Monte Carlo simulations, was used to estimate the absorption and scattering coefficients from the reflectance data. Tests on tissue-simulating phantoms with transport scattering coefficients between 0.5 and 2.0 mm(-1) and absorption coefficients between 0.002 and 0.1 mm(-1) showed the rms errors of this technique to be 2.6% for the transport scattering coefficient and 14% for the absorption coefficients. The optical properties of bovine muscle, adipose, and liver tissue, as well as chicken muscle (breast), were also measured ex vivo at 633 and 751 nm. For muscle tissue it was found that the Monte Carlo simulation did not agree with experimental measurements of reflectance at distances less than 2 mm from the incident beam.     

Method for high-accuracy reflectance measurements in the 2.5-microm region

Reflectance measurement with spectroradiometers in the solar wavelength region (0.4-2.5 microm) are frequently conducted in the laboratory or in the field to characterize surface materials of artificial and natural targets. The spectral surface reflectance is calculated as the ratio of the signals obtained over the target surface and a reference panel, yielding a relative reflectance value. If the reflectance of the reference panel is known, the absolute target reflectance can be computed. This standard measurement technique assumes that the signal at the radiometer is due completely to reflected target and reference radiation. However, for field measurements in the 2.4-2.5-microm region with the Sun as the illumination source, the emitted thermal radiation is not a negligible part of the signal even at ambient temperatures, because the atmospheric transmittance, and thus the solar illumination level, is small in the atmospheric absorption regions. A new method is proposed that calculates reflectance values in the 2.4-2.5-microm region while it accounts for the reference panel reflectance and the emitted radiation. This technique needs instruments with noise-equivalent radiances of 2 orders of magnitude below currently commercially available instruments and requires measurement of the surface temperatures of target and reference. If the reference panel reflectance and temperature effects are neglected, the standard method yields reflectance errors up to 0.08 and 0.15 units for 7- and 2-nm bandwidth instruments, respectively. For the new method the corresponding errors can be reduced to approximately 0.01 units for the surface temperature range of 20-35 degrees C.     

Bidirectional reflectance of dry and submerged Labsphere Spectralon plaque

We present the bidirectional reflectance of a Labsphere calibration plaque, both dry and submerged in water, at normal illumination. The measurements indicate that when submerged in water, the Labsphere calibration plaque has a higher reflectance value than when dry at viewing angles below 55 degrees . The results are presented in the form of a reflectance factor and are useful for calibrating underwater reflectance measurements.     

Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples

An integrating-sphere system has been designed and constructed for multiple optical properties measurement in the IR spectral range. In particular, for specular samples, the absolute transmittance and reflectance can be measured directly with high accuracy and the absorptance can be obtained from these by simple calculation. These properties are measured with a Fourier transform spectrophotometer for several samples of both opaque and transmitting materials. The expanded uncertainties of the measurements are shown to be less than 0.003 (absolute) over most of the detector-limited working spectral range of 2 to 18 microm. The sphere is manipulated by means of two rotation stages that enable the ports on the sphere to be rearranged in any orientation relative to the input beam. Although the sphere system is used for infrared spectral measurements, the measurement method, design principles, and features are generally applicable to other wavelengths as well.     

Spectral reflectance of silicon photodiodes

A precision spectrometer was used to measure the spectral reflectance of a silicon photodiode over the wavelength range from 250 to 850 nm. The results were compared with the corresponding values predicted by a model based on thin-film Fresnel formulas and the known refractive indices of silicon and silicon dioxide. The good agreement at the level of 2 x 10(-3) in the visible wavelength range verifies that the reflection model can be used for accurate extrapolation of the spectral reflectance and responsivity of silicon photodiode devices. In addition, characterization of the photodiode reflectance in the ultraviolet region improves the accuracy of the spectral irradiance measurements when filter radiometers based on trap detectors are used.     

Maximum a posteriori estimation of spectral reflectance from color image and multipoint spectral measurements

Accurate color image reproduction under arbitrary illumination can be realized if the spectral reflectance functions in a scene are obtained. Although multispectral imaging is one of the promising methods to obtain the reflectance of a scene, it is expected to reduce the number of color channels without significant loss of accuracy. This paper presents what we believe to be a new method for estimating spectral reflectance functions from color image and multipoint spectral measurements based on maximum a posteriori (MAP) estimation. Multipoint spectral measurements are utilized as auxiliary information to improve the accuracy of spectral reflectance estimated from image data. Through simulations, it is confirmed that the proposed method improves the estimation accuracy, particularly when a scene includes subjects that belong to various categories.     

Spectral reflectance and responsivity of Ge- and InGaAs-photodiodes in the near-infrared: measurement and model

The spectral reflectance and responsivity of Ge- and InGaAs-photodiodes at (nearly) normal and oblique incidence (45 degrees) were investigated. The derived data allow a calculation of the photodiodes responsivities for any incident angle. The measurements were carried out with s- and p-polarized radiation in the wavelength range from 1260 to 1640 nm. The spectral reflectance of the photodiodes was modeled by using the matrix approach developed for thin-film optical assemblies. The comparison between the calculated and measured reflectance shows a difference of less than 2% for the Ge-photodiode. For the InGaAs-photodiode, the differences between measured and calculated reflectance are larger, i.e., up to 6% for wavelengths between 1380 and 1580 nm. Despite the larger differences between calculated and measured spectral reflectances for the InGaAs-photodiode, the difference between calculated and measured spectral responsivity is even smaller for the InGaAs-photodiode than for the Ge-photodiode, i.e., < or =1.2% for the InGaAs-photodiode compared to < or =2.2% for the Ge-photodiode. This is because the difference in responsivity is strongly correlated to the absolute spectral reflectance level, which is much lower for the InGaAs-photodiode. This observation also shows the importance of having small reflectances, i.e., appropriate antireflection coatings for the photodiodes. The relative standard uncertainty associated with the modeled spectral responsivity is about 2.2% for the Ge-photodiode and about 1.2% for the InGaAs-photodiode for any incident angle over the whole spectral range measured. The data obtained for the photodiodes allow the calculation of the spectral responsivity of Ge- and InGaAs-trap detectors and the comparison with experimental results.     

Optical properties of an optically rough coating from inversion of diffuse reflectance measurements

A method is developed for determining the optical properties of an optically rough coating on an opaque substrate from reflectance measurements. A modified Kubelka-Munk two- flux model is used to calculate the reflectance of the coating as a function of the refractive index, absorption coefficient, scattering coefficient, and thickness. The calculated reflectance is then fitted to measurements using a spectral projected gradient algorithm, allowing the optical properties to be obtained. The technique is applied to titanium dioxide coatings on a titanium substrate. Realistic values of refractive index and absorption coefficients are generally obtained. Quantities that are useful for solar water-splitting applications are calculated, including the depth profile of absorption and the proportion of the incident photon flux absorbed in the coating under solar illumination.     

Sample holder and methodology for measuring the reflectance and transmittance of narrow-leaf samples

Measuring the reflectance and transmittance of narrow samples can be difficult, as the width of the illuminating beam may be greater than the width of the sample. The small sample area can also compound the already time-consuming process of reconfiguring the instrument between reflectance and transmittance measurements by introducing additional alignment problems. A method of measuring the reflectance and transmittance properties of narrow-leaf samples using reflectance configurations only is developed and tested. The method uses a mask and mask correction and relationships between reflectance measurements against contrasting backgrounds to determine sample reflectance and transmittance. The design of the accompanying sample-holding apparatus is also described. In testing, the mean error was less than 1% reflectance/transmittance, and standard deviation of the error was approximately 1% reflectance and 2% transmittance as compared to samples measured using conventional measurement configurations.     

Spectrophotometer for noninvasive measurement of intrinsic fluorescence and reflectance of the ocular fundus

A spectrophotometer for noninvasively measuring the intrinsic fluorescence and the reflectance of the ocular fundus is described. The instrument uses multichannel spectral analysis for recording fluorescence emission spectra (500-800 nm) with seven excitation wavelengths between 430 and 550 nm and for the determination of fundus reflectance spectra (400-800 nm). Measurements are performed from a discrete fundus area, with a spatial resolution of a 1-2° visual angle. Calibration procedures are detailed. Representative fluorescence and reflectance spectra obtained from five normal subjects indicate that the fluorescence originates from within the fundus layers. Although the absolute fundus fluorescence measurement is affected by lens absorption and ocular refraction, it is minimally influenced by the strong fluorescence of the crystalline lens.     

Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence

The optical parameters of a SiO2 thin-film coating determined from the spectral reflectance and transmittance measurements at various incidence angles, including the normal incidence and the Brewster's angle, are compared in this paper. The high-accuracy measurements were carried out through visible-near-infrared spectral regions by using our purpose-built instruments. The optical parameters obtained from the reflectance and the transmittance data are consistent over the angles of incidence and agree within 0.2%. The effect of important systematic factors in the oblique-incidence spectrophotometric measurements is also discussed.     

Determination of tissue optical properties from diffuse reflectance profiles by multivariate calibration

We describe a method for determining the reduced scattering and absorption coefficients of turbid biological media from the spatially resolved diffuse reflectance. A Sugeno Fuzzy Inference System in conjunction with data preprocessing techniques is employed to perform multivariate calibration and prediction on reflectance data generated by Monte Carlo simulations. The preprocessing consists of either a principal component analysis or a new, extended curve-fitting procedure originating from diffusion theory. Prediction tests on reflectance data with absorption coefficients between 0.04 and 0.06 mm(-1) and reduced scattering coefficients between 0.45 and 0.99 mm(-1) show the root-mean-square error of this method to be 0.25% for both coefficients. With reference to practical applications, we also describe how the prediction accuracy is affected by using relative instead of absolute reflectance data, by imposing measurement noise on the reflectance data, and by changing the number and the position of detectors.     

Remote-sensing reflectance of turbid sediment-dominated waters. Reduction of sediment type variations and changing illumination conditions effects by use of reflectance ratios

Variations of sediment type (grain size and refractive index) and changing illumination conditions affect the reflectance signal of coastal waters and limit the accuracy of sediment-concentration estimations from remote-sensing measurements. These effects are analyzed from numerous in situ remote-sensing measurements carried out in the Gironde and Loire Estuaries and then reduced and partly eliminated when reflectance ratios between the near infrared and the visible are considered. These ratios showed high correlation with the sediment concentration. On the basis of the obtained relationships, performing correspondence functions were established that allow an accurate estimation of suspended sediments in the estuaries from Système Probatoire d'Observation de la Terre, Landsat, and Sea-Viewing Wide Field-of-View Sensor data, independently of the date of acquisition.     

Reduction of skylight reflection effects in the above-water measurement of diffuse marine reflectance

Reflected skylight in above-water measurements of diffuse marine reflectance can be reduced substantially by viewing the surface through an analyzer transmitting the vertically polarized component of incident radiance. For maximum reduction of effects, radiometric measurements should be made at a viewing zenith angle of ~45 degrees (near the Brewster angle) and a relative azimuth angle between solar and viewing directions greater than 90 degrees (backscattering), preferably 135 degrees . In this case the residual reflected skylight in the polarized signal exhibits minimum sensitivity to the sea state and can be corrected to within a few 10(-4) in reflectance units. For most oceanic waters the resulting relative error on the diffuse marine reflectance in the blue and green is less than 1%. Since the water body polarizes incident skylight, the measured polarized reflectance differs from the total reflectance. The difference, however, is small for the considered geometry. Measurements made at the Scripps Institution of Oceanography pier in La Jolla, Calif., with a specifically designed scanning polarization radiometer, confirm the theoretical findings and demonstrate the usefulness of polarization radiometry for measuring diffuse marine reflectance.     

Image-based bidirectional reflectance distribution function measurement

We present a new image-based process for measuring a surface's bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments.     

Modeling the bidirectional reflectance of emissive displays

The reflection properties of a display device influence the available contrast and affect the perception of subtle detail. The display reflection characteristics of flat-panel displays (FPDs) are appropriately described by a six-dimensional bidirectional reflectance distribution function (BRDF). I describe a Monte Carlo method for modeling the bidirectional reflectance of multilayer emissive structures used in electronic display devices. I estimate the complete BRDF using a one-dimensional angular distribution function of the luminance. I apply the method to model typical high-performance cathode-ray tube and FPD structures. I find that, for the BRDF signatures of cathode-ray tubes characterized by a specular and a quasi-Lambertian components, the estimated values for the specular and diffuse reflection coefficients agree well with low-resolution experimental measurements conducted with a rotation arm and a collimated probe. I show that emissive FPDs with thin-film organic layers on reflective substrates can exhibit a predominant specular peak broadened by short-range light scattering.     

Lidar in-space technology experiment measurements of sea surface directional reflectance and the link to surface wind speed

The dependence of sea surface directional reflectance on surface wind stress suggests a method for deriving surface wind speed from space-based lidar measurements of sea surface backscatter. In particular, lidar measurements in the nadir angle range from 10 degrees to 30 degrees appear to be most sensitive to surface wind-speed variability in the regime below 10 m/s. The Lidar In-space Technology Experiment (LITE) shuttle lidar mission of September 1994 provided a unique opportunity to measure directional backscatter at selected locations by use of the landmark track maneuver and to measure fixed-angle backscatter from the ocean surfaces on a global scale. During the landmark track maneuver the shuttle orbiter orientation and roll axis are adjusted continuously to maintain the lidar footprint at a fixed location for a duration of ~1 min. Several data sets were converted to calibrated reflectance units and compared with a surface reflectance model to deduce surface wind speeds. Comparisons were made with ERS-1 scatterometer data and surface measurements.