Electrical characterization of silicon tips using conducting atomic force microscopy

The electrical properties of n-doped Si tips have been characterized in conducting atomic force microscopy under various conditions. Si tips with SiO2 layer on them present complex electric properties: which include a larger positive threshold bias, which is different from that of its doped semiconductor material. Silicon tips after removing their SiO2 layer had smaller positive threshold bias; such bias varied with the loading force: smaller loading forces corresponding to larger positive threshold biases, and it remained constant at lower levels for larger loading forces. Humidity of experiments influenced the threshold bias: lower relative humidities (<25%) and larger loading forces were in favor of getting stable threshold bias. The conductance increased remarkably in high relative humidity although it was kept in a narrow range when relative humidity was lower than 40%. Loading force didn't affect the conductance in the examined relative humidity conditions. One advantage of bare silicon tips over commercial conducting ones is that they smaller radius than gold-coated tips; this is in more favor of reaching single molecular electronics.     

Atomic force microscopy silicon tips as photon tunneling sensors: a resonant evanescent coupling experiment

Evanescent wave conversion by transparent dielectric nanoprobes has long been achieved in photon scanning tunneling microscopy experiments. Nevertheless, the exact mechanism (i.e., resolution limit) of this optical interaction is not satisfactorily explained theoretically nor evidenced experimentally. We study the ability of doped silicon atomic force microscopy tips to capture infrared near-field waves standing at the flat surface of a semiconductor (semi-insulating InP) material. It is shown that, unlike silicon nitride tips previously studied, the transmitted intensity of these silicon tips does not obey the classical frustrated total internal reflection model but a more complex dependence that involves a resonant tunneling transfer. An explanation is proposed that follows the theoretical predictions for the electromagnetic coupling between subwavelength objects.     

Electrostatic nanolithography in polymers using atomic force microscopy

The past decade has witnessed an explosion of techniques used to pattern polymers on the nano (1-100 nm) and submicrometre (100-1,000 nm) scale, driven by the extensive versatility of polymers for diverse applications, such as molecular electronics, data storage, optoelectronics, displays, sacrificial templates and all forms of sensors. Conceptually, most of the patterning techniques, including microcontact printing (soft lithography), photolithography, electron-beam lithography, block-copolymer templating and dip-pen lithography, are based on the spatially selective removal or formation/deposition of polymer. Here, we demonstrate an alternative and novel lithography technique--electrostatic nanolithography using atomic force microscopy--that generates features by mass transport of polymer within an initially uniform, planar film without chemical crosslinking, substantial polymer degradation or ablation. The combination of localized softening of attolitres (10(2)-10(5) nm3) of polymer by Joule heating, extremely non-uniform electric field gradients to polarize and manipulate the soften polymer, and single-step process methodology using conventional atomic force microscopy (AFM) equipment, establishes a new paradigm for polymer nanolithography, allowing rapid (of the order of milliseconds) creation of raised (or depressed) features without external heating of a polymer film or AFM tip-film contact.     

Atomic force microscopy using plastic replicas

Scanning probe microscopy is now an accepted tool in both industrial and research efforts. Its development parallels the advances in technology and imaging applications found in the history of progress of both transmission electron microscopy and scanning electron microscopy. All three forms of microscopy ultimately suffer a fundamental application problem—situations arise where it is either unreasonable or impossible to observe a particular sample within the sample stage of the microscope. For the transmission and electron and scanning electron microscopies, this problem has been resolved by resorting to making a replica of the area of interest on the actual sample and preparing the replica so that it may be imaged directly by the desired microscopy technique. This work attempts to ascertain the suitability of observing replicas using a scanned probe microscope; specifically, employing the techniques of atomic force microscopy to image plastic surface replicas.     

Electron microscopy of oxidized silicon nitride

The effect of oxidation at 1000 and 1400° C on the internal structure of reaction sintered silicon nitride has been examined by high voltage electron microscopy. The formation of a sheath region of amorphous silica around internal pores has been observed after oxidation at both temperatures. The frequency of occurrence of these regions is higher after oxidation at 1000° C, which is consistent with weight gain experiments. The effects of oxidation on strength are discussed. The main effect of the amorphous silica regions is probably in founding off internal pores, effectively increasing the surface energy and so increasing strength. Another factor is the formation at 1000 and 1400° C of an oxidized surface layer (containing crystalline silica) [1, 2] leading to an increase in room temperature strength after oxidation at 1000° C. Removal of this layer produces a further increase in strength (∼15%) showing that the oxidation has a greater beneficial effect on the internal structure.     

Tapping-mode scanning force microscopy: Metallic tips and samples

The operation of a tapping-mode scanning force microscope using a metallic tip and metallic sample, with a bias voltage applied between the two, is modelled as a driven nonlinear oscillator, where metal-metal adhesion and electric forces are taken into account. The model, which applies to the case where the sample indentation by the tip is minimal, shows that one can obtain a good estimate of the tip-sample contact time from the tip-sample current.     

Atomic force microscopy of electrochemical nanoelectrodes

Nanometer-sized electrodes have recently been used to investigate important chemical and biological systems on the nanoscale. Although nanoelectrodes offer a number of advantages over macroscopic electrochemical probes, visualization of their surfaces remains challenging. Thus, the interpretation of the electrochemical response relies on assumptions about the electrode shape and size prior to the experiment and the changes induced by surface reactions (e.g., electrodeposition). In this paper, we present first AFM images of nanoelectrodes, which provide detailed and unambiguous information about the electrode geometry. The effects of polishing and cleaning nanoelectrodes are investigated, and AFM results are compared to those obtained by voltammetry and SEM. In situ AFM is potentially useful for monitoring surface reactions at nanoelectrodes.     

Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers

The primary cortical cells were selected as a model to study the adherence and neural network development on chemically roughened silicon substrates without any coatings using confocal laser scanning microscopy (CLSM) and atomic force microscopy (AFM). The silicon substrates have a nano-range roughness (RMS) achieved by chemical etching using hydrofluoric (HF) acid. After 7 days of culturing, the neurons were observed to connect together and form dense neural networks. Furthermore, AFM results revealed that some porous structures at a few micrometer range existed between the neuron cells and the silicon substrates. It is suggested that the porous structures are made of extracellular matrix (ECM) components and play an important role in the neuronal adhesion and neurite outgrowth on the inert silicon wafers.     

Atomic force microscopy of electrospun organic-inorganic lipid nanofibers

An organic-inorganic hybridization strategy has been proposed to synthesize polymerizable lipid-based materials for the creation of highly stable lipid-mimetic nanostructures. We employ atomic force microscopy (AFM) to analyze the surface morphology and mechanical property of electrospun cholesteryl-succinyl silane (CSS) nanofibers. The AFM nanoindentation of the CSS nanofibers reveals elastic moduli of 55.3?±?27.6 to 70.8?±?35 MPa, which is significantly higher than the moduli of natural phospholipids and cholesterols. The study shows that organic-inorganic hybridization is useful in the design of highly stable lipid-based materials.     

Atomic force microscopy of scratch damage in polypropylene

Abstract

Atomic force microscopy (AFM) in tapping mode has been used to characterise surface damage on deformed polypropylenes induced during a scratch test. Atomic force micrographs revealed differences in microstructures that could be used to predict the deformation resistance of two different types of polypropylene. The undeformed surface of the two types of polypropylene (identified as polypropylene-L and polypropylene-R) was characterised by differences in arrangement (regular or irregular) of fibrils depending on their melt flow conditions. Polypropylene-L is a polymer with longer chains and with restricted flow, whereas polypropylene-R has shorter chains obtained by controlled rheology. The microfibrils in undeformed polypropylene-L bend, forming raised surface features of height in the region of 10- 50 nm. In comparison to polypropylene-L, the microfibrils in undeformed polypropylene-R exhibited surface features of relatively lower height (10 - 20 nm). 30 × 30 nm scan AFM images provided details of microfibrils containing chains of molecules of ~0.5 nm wide. Surface deformation induced by the scratch resulted in the formation of scratch tracks characterised by regions of quasi-periodic (consecutive) cracking. This type of deformation is attributed to higher applied loads or to higher contact strains. This is particularly important in semicrystalline polymers, where there is partial reorganisation of microstructure on the application of surface stresses because of their viscoelastic properties. Atomic force micrographs of mechanically deformed polypropylene-L and polypropylene-R at a scan size of 1 × 1 μm indicated a lesser amount of reorganisation of microstructure in polypropylene-L as compared with polypropylene-R. Surface profiles and section analysis of the AFM micrographs suggested that polypropylene-R is more scratch resistant in comparison to polypropylene-L under identical scratch test conditions, consistent with Raman spectroscopy observations of tensile deformed polypropylene.     

Atomic force microscopy study of silica nanopowder compacts

Nanometer silica powders compacted at different pressures have been studied by atomic force microscopy (AFM). Local elastic moduli measurements made on the powder compacts yield values smaller than that of bulk silica. Loading force-distance curves measured show break points at some critical pressures. AFM images obtained at constant contact forces above and below the critical force at which a break point occured show the break point was a result of AFM tip plowing into the nanometer powder compacts. The applied force required for break points to occur increases with sample density. Such a behavior has been qualitatively explained in terms of adhesion force between nanoparticle and sample surface morphology.     

Atomic force microscopy study of surface-modified carbon fibers

Structural carbon fibers surface-modified with titanium carbide have been studied by atomic force microscopy (AFM). Using statistical analysis of AFM images, quantitative characteristics of fiber surfaces have been determined. The results demonstrate that surface modification has a significant effect on the surface topography of the fibers: their surface becomes smoother and more uniform, as evidenced by the decrease in roughness value and average height and the narrower height distribution.