SAC305无铅钎料在Au／Ni镀层上的铺展性能研究

文章阐述了钎料润湿的基本原理,分析了关键工艺参数对钎料铺展性能的影响规律。针对温度、时间和表面状态等关键参数／状态,对无铅钎料SAC305在Au／Ni镀层上的铺展性能开展试验研究。结果表明,随着焊接温度和保温时间的增加,无铅钎料SAC305的铺展性能明显改善,铺展系数逐渐趋于100％。同时,通过RF的Ar等离子对钎料进行表面预处理也能够使其铺展性能有所改善。试验结果与理论分析具有较好的一致性。     

无铅条件下PCBA可制造性初探

在无铅条件下提高PCBA可制造性涉及的因素包括:PCB和元器件的制造、焊料(焊膏)的选用、设备的加工能力以及工艺技术等.本文通过分析PCBA可制造性的内涵,提出装联无铅化的关键所在,重点论述了在采用Sn-Ag-Cu和Sn-Cu钎料的条件下,实现无铅再流焊和无铅波峰焊的技术途径和对策.     

消费类电子产品用低温Sn-Bi基无铅钎料研究

表面贴装技术(SMT)正在逐渐向着低温互连的趋势转变,促使低温无铅钎料合金成为行业内关注的焦点之一。Sn-Bi共晶合金由于低熔点(138℃)、高强度、低成本而应用于消费类电子产品封装与组装,但是由于Bi相固有的脆性、时效过程中Bi相的粗化、钎料合金与Cu反应时Bi相在Cu₃Sn/Cu界面的偏析等缺陷的存在阻碍了Sn-Bi共晶钎料合金的广泛应用。降低Sn-Bi共晶合金中的Bi含量可有效改善其力学性能与焊点可靠性。针对低温无铅互连中低Bi含量的Sn-Bi基无铅钎料合金,研究了不同Bi含量下低温无铅钎料的微观组织、硬度、弯曲强度、抗拉强度、延展性以及Sn-Bi基/Cu焊点中界面微观组织、跌落性能与电迁移性能,分析了消费类电子产品封装用低温Sn-Bi基无铅钎料合金的发展方向与研究进展。     

Sn-Ag系电子无铅软钎料的超电势研究

随着微电子表面组装技术（SMT）的迅速发展和公众环境意识的增强，无铅软钎料成为近年来研究的焦点。主要研究了Sn-Ag系合金钎料的超电势电化学性能，并且与传统的Sn-Pb近共晶合金进行了对比。试验证明在酸、碱两种不同的溶液环境中，无铅软钎料在Sn-Pb合金的超电势有明显的差异。并指出含铋的钎料的超电势随着铋的含量的增加而降低，从而提出了在无铅软钎料研究中应当考虑因超电势变化而引起的问题。     

无铅波峰焊钎料抗氧化影响的研究

研究了目前常用的Sn-0.7Cu无铅钎料在手浸锡炉和模拟波峰炉中的抗氧化情况.主要研究了微量P元素的加入对钎料抗氧化性的影响.通过钎料在液态下表面颜色变化和锡渣的产生量的比较可以发现微量P元素的加入可以提高钎料的抗氧化性能.通过比色分析发现微量P元素在钎料表面或亚表面富集,形成"阻挡层",抑制了钎料的进一步氧化.通过实验得出P的最佳质量分数为0.011%.     

合金元素对Sn-Zn基无铅钎料高温抗氧化性的影响

研究了不同微量合金元素对Sn-Zn基无铅钎料高温抗氧化性的影响。钎料在液态下的表面颜色变化以及热重分析表明,Al、Cr能明显改善Sn-Zn基钎料的抗氧化性能。通过俄歇能谱深度剖析和X射线衍射分析探讨了合金元素的抗氧化机理:Al和Cr在钎料表面或亚表面富集,形成阻挡层,抑制了钎料的氧化。比较了合金元素对Sn-Zn基钎料润湿性能的影响,结果表明Al的加入不利于钎料的铺展。通过实验得出结论:Cr是一种比Al更具有吸引力的Sn-Zn基钎料的高温抗氧化合金元素。     

中国无铅钎料专利研究报告

本文涵盖了自1995年至2005年所有涉及到无铅钎料的中国专利。报告的钎料范围是用于表面组装技术，有明确限定成分和成分质量比的Sn基无铅钎料（无铅焊料）。报告的主要内容包括无铅钎料专利的申请者情况及申请和授权情况；在申请专利钎料中Sn-Zn系、Sn-Ag系、Sn-Bi系和Sn-Cu系的数量分布情况以及钎料所含元素情况；国外申请者申请和授权情况；制备方法的情况。最后指出了我国的无铅钎料专利领域存在的问题和发展方向。     

无铅钎料对不锈钢的腐蚀性研究

相对于传统的Sn-Pb合金,无铅钎料在高温下对不锈钢的腐蚀性明显加强,从而造成波峰焊接设备的损坏。通过试验的方式,在450℃条件下将不锈钢材料、表面特殊氮化处理不锈钢、钛合金和铸铁浸入液态无铅钎料Sn-0.7Cu中720h,通过腐蚀界面的微观组织分析,研究了无铅钎料侵蚀不锈钢界面的机理以及几种材料的耐腐蚀性分析,从而为防止无铅钎料的腐蚀提供可靠的依据。     

PCB技术的革新与进步

文章概述了近几年来在PCB工业中生产技术的革新与进步情况,特别是直流电镀(镀层均匀性、填孔镀等)、表面涂(镀)覆(化学镀镍/钯浸金和直接浸金等)技术的革新与进步,推动了PCB工艺技术的发展。     

微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响

以Sn-0.7Cu系无铅钎料合金为基础,添加微量的P、Ge、Ga、RE元素,进行了280℃大气环境下氧化试验,通过对含有不同微量元素的无铅钎料表面氧化状况的对比及分析,研究了不同微量元素对Sn-0.7Cu无铅钎料抗氧化性能的影响。发现当P和Ga同时添加时,得到Sn-0.7Cu-(0.001~0.1)P-(0.0001~0.1)Ga无铅钎料的抗氧化性能高于Sn-0.7Cu-(0.001~0.1)P和Sn-0.7Cu-(0.0001~0.1)Ga的抗氧化性能。     

BGA混合焊点热循环负载下的可靠性研究

焊料从有铅向无铅转换中,不可避免会遇到二者混合使用的情况,有必要对生成的混合焊点进行可靠性研究。通过对不同工艺参数下形成的混合焊点和无铅焊点进行了外观检测、X射线检测和温度循环测试。结果显示,只要工艺参数控制得当,混合焊点是可行的。在焊球合金、焊料合金、峰值温度、液相线以上时间和焊接环境五个关键因素中,前四项对焊点可靠性比较重要,焊接环境对焊点可靠性的影响不很显著。     

Intermetallic phase detection in lead-free solders using synchrotron x-ray diffraction

The high-intensity, high-resolution x-ray source at the European Synchrotron Radiation Facility (ESRF) has been used in x-ray diffraction (XRD) experiments to detect intermetallic compounds (IMCs) in lead-free solder bumps. The IMCs found in 95.5Sn3.8Ag0.7Cu solder bumps on Cu pads with electroplated-nickel immersion-gold (ENIG) surface finish are consistent with results based on traditional destructive methods. Moreover, after positive identification of the IMCs from the diffraction data, spatial distribution plots over the entire bump were obtained. These spatial distributions for selected intermetallic phases display the layer thickness and confirm the locations of the IMCs. For isothermally aged solder samples, results have shown that much thicker layers of IMCs have grown from the pad interface into the bulk of the solder. Additionally, the XRD technique has also been used in a temperature-resolved mode to observe the formation of IMCs, in situ, during the solidification of the solder joint. The results demonstrate that the XRD technique is very attractive as it allows for nondestructive investigations to be performed on expensive state-of-the-art electronic components, thereby allowing new, lead-free materials to be fully characterized.     

无铅可焊性镀层及其在电子工业中的应用

在电子工业中 ,为消除铅的污染 ,探讨了各种替代Sn-Pb合金的无铅可焊性镀层。论述了电镀Sn -Zn、Sn-Ag、Sn-Bi合金的方法及其镀层的可焊性能。     

Lead-free interconnect technique by using variable frequency microwave

A novel lead-free interconnect technique using variable frequency microwave (VFM) was investigated. The lead-free solder interconnection between the component chips and the metal pads through VFM was first demonstrated. Comparison between the microstructures of the lead-free solder joints on Cu and Sn surfaces formed by a conventional thermal reflow process and VFM was conducted. The VFM heating technique successfully created the lead-free solder/Cu and Sn joints through their intermetallic compounds (IMCs), while maintaining the substrate temperature as low as 210°C.     

Lead-Free Bumping Using an Alternating Electromagnetic Field

A novel lead-free bumping technique using an alternating electromagnetic field (AEF) was investigated. Lead-free solder bumps reflowed onto copper pads through AEF have been achieved. A comparison was conducted between the microstructures of the lead-free solder joints formed by the conventional thermal reflow and AEF reflow. Keeping the substrate temperature lower than that of the solder bumps, AEF reflow successfully created metallurgical bonding between the lead-free solders and metallizations through an interfacial intermetallic compound (IMC). The AEF reflow could be finished in several seconds, much faster than the conventional hot-air reflow. Considering the morphology of the interfacial Cu₆Sn₅ IMC, a shorter heating time above the melting point would be a better choice for solder joint reliability. The results show that AEF reflow is a promising localized heating soldering technique in electronic packaging.     

Solder Joint Reliability Assessment for Flip Chip Ball Grid Array Components with Various Designs in Lead-Free Solder Materials and Solder Mask Dimensions

This study investigates the reliability of flip chip ball grid array (FCBGA) components with three types of solder materials: eutectic solder with a composition Sn63Pb37 and the lead-free solders SnAg3.0Cu0.5 and SnAg4.0Cu0.5. Two substrate-side solder mask (S/M) opening sizes, 0.4 mm and 0.525 mm, were used. Both the monotonic and cyclic mechanical four-point bend tests are conducted for the reliability assessment. It is found that the FCBGA components with SnAg3.0Cu0.5 solder have the best durability during the cyclic bend test, yet the eutectic solder is the strongest during the monotonic bend test. Besides, the FCBGA components with 0.525-mm S/M opening have around 3 times more life cycles than those with the 0.4-mm S/M opening in the cyclic bend test. It is also noteworthy that the lead-free solder materials have much variation in the failed cycles during the cyclic test. Moreover, the failure locations for those components with 0.4-mm S/M openings are found to be at the interface between the package side metal pad and the solder ball, and those with an S/M opening of 0.525 mm are observed to be failed mostly at the interface between the printed circuit board (PCB) side metal pad and the solder ball.     

Contact resistance and fretting corrosion of lead-free alloy coated electrical contacts

As lead-free solders replace tin-lead solders in soldering, it is also expected that lead-free solder alloys will be used as contact finish materials for electrical contacts. In this study, the contact resistance and fretting corrosion of tin-silver-copper and tin-copper coatings were investigated and compared with tin-lead eutectic coating. The contact resistance before and after different aging conditions, including mixed flowing gas, steam, and dry heat aging, was examined. Tin-silver-copper and tin-lead alloy coatings have similar performance on contact resistance versus contact normal force after dry heat aging and MFG aging. Severe degradation was found on tin-silver-copper coatings after steam aging. Higher contact force is suggested in the application of tin-silver-copper solder alloy coating than for eutectic tin-lead alloy coatings. Fretting corrosion on tin-silver-copper and tin-copper lead-free alloy coatings was studied and compared with tin-lead coating. Fretting corrosion experiments were conducted and compared at different temperatures and normal forces. In general, tin-silver-copper and tin-copper alloys show equal or better fretting corrosion resistance than tin-lead eutectic alloy at the experimental conditions in this study.     

回流焊峰值温度对混装BGA焊点的影响研究

针对当前大量使用有铅焊料焊接无铅BGA的实际现状,通过调控有铅制程回流曲线的峰值温度,研究其对混装BGA焊点坍塌高度、空洞率及微观组织的影响。结果表明,峰值温度从210℃提升至225℃,无铅BGA焊球能够全部充分坍塌且高度保持一致;峰值温度为210℃时,混合焊点内的空洞率最低,随着峰值温度的升高,空洞尺寸和空洞率均有所增加;峰值温度为215℃时的微观组织最细小且尺寸分布最均匀,继续提升峰值温度,微观组织尺寸会随之增大。因此使用有铅焊料焊接无铅BGA的最佳峰值温度为215℃,与有铅制程保持一致。     

Depressing effect of 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

The formation and growth of intermetallic compounds (IMCs) in lead-free solder joints, during soldering or subsequent aging, have a significant effect on the thermal and mechanical behavior of solder joints. In this study, the effects of a 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu (SAC) lead-free solder alloys on the growth of IMCs with Cu substrates during soldering and subsequent isothermal aging were investigated. During soldering, it was found that a 0.2wt.%Zn addition did not contribute to forming the IMC, which was verified as the same phase structure as the IMC for Sn-3.0Ag-0.5Cu/Cu. However, during solid-state isothermal aging, the IMC growth was remarkably depressed by the 0.2 wt.% Zn addition in the SAC solder matrix, and this effect tended to be more prominent at higher aging temperature. The activation energy for the overall IMC growth was determined as 61.460 and 106.903 kJ/mol for Sn-Ag-Cu/Cu and Sn-Ag-Cu-0.2Zn/Cu, respectively. The reduced diffusion coefficient was confirmed for the 0.2Zn-containing solder/Cu system. Also, thermodynamic analysis showed the reduced driving force for the Cu₆Sn₅ IMC with the addition of Zn. These may provide the evidence to demonstrate the depressing effect of IMC growth due to the 0.2wt.%Zn addition in the Sn-Ag-Cu solder matrix.     

氮气保护无铅波峰焊焊接质量分析

相对于传统的Sn-Pb焊料,无铅焊料更容易氧化,润湿性较差,从而影响波峰焊接质量.N2保护可以降低无铅焊料的氧化,提高无铅焊料的润湿性,从而提高波峰焊接质量.从润湿性的机理分析了N2保护提高无铅焊料润湿性的原因,并通过润湿性实验和波峰焊接试验证实了N2保护的优越性.