Delay‐locked loop based clock and data recovery with wide operating range and low jitter in a 65‐nm CMOS process

A delay‐locked loop (DLL) based clock and data recovery (CDR) circuit with a half‐rate clock is proposed. The CDR includes a coarse and a fine tuned block, in which the novel coarse and fine phase detectors form closed loops. It is designed in a 65‐nm complementary metal‐oxide semiconductor (CMOS) process using a 1.2‐V supply voltage. The simulation results show that it can cover a wide operating range from 500 Mbps to 8 Gbps and the corresponding peak‐to‐peak jitters are 1.63 ps and 0.96 ps, respectively. Copyright © 2016 John Wiley & Sons, Ltd.     

GRO‐TDC with gate‐switch‐based delay cell halving resolution limit

In this paper, we propose a time‐to‐digital converter (TDC) with first‐order noise‐shaping. The proposed gated ring oscillator (GRO)‐TDC overcomes the limitation associated with GRO's intrinsic resolution by adopting two GROs, whose delay difference is equal to half the delay of a delay cell. The GRO is composed of 17 stages of a newly proposed delay cell, which utilizes a gate‐switched configuration to solve the charge redistribution problem. The proposed GRO‐TDC is designed using a 65‐nm process technology, with an area of 0.015 mm² and a supply voltage of 1 V. The sampling rate and the effective resolution of the proposed GRO‐TDC are 50 MS/s and 1.22 ps, respectively. Finally, the proposed GRO‐TDC consumes a power of 9.08 and 2.41 mW in the calibration and conversion modes, respectively. Copyright © 2017 John Wiley & Sons, Ltd.     

Low‐power,latch‐based multistage time‐to‐digital converter in 65 nm CMOS technology

In this paper, a low‐power and high‐resolution latch‐based time‐to‐digital converter (TDC) based on a multistage scheme is proposed. The proposed multistage TDC includes coarse, middle, and fine stages. The coarse stage is a new design of the flash TDC that is implemented by latches without using the delay cell. Also, the middle stage is a new design of the Vernier TDC with employed latches. The fine stage comprises parallel latches with different input loads.     

Bang‐bang cycle‐slip detector improves jitter‐tolerance in SONET PLL/DLL CDR

The phase‐locked loop circuit (PLL) cycle‐slips (CS) phenomenon is a problem in two‐level baseband clock and data recovery (CDR) data‐synchronization. A singular example is that of a CDR synchronizer that uses a PLL in cascaded with delay‐lock‐loop (P/DLL) architecture. The CS issue is most evident when testing jitter‐tolerance to sine‐modulated jitter, particularly for sine‐modulated jitter‐frequencies near the PLL bandwidth. Reuse of a bang‐bang frequency‐detector, already on board of reference‐less CDRs, does CS detection and provides for suppression producing a clean demodulation. In the cascaded‐DLL of Rhee's P/DLL [1], this CS‐suppressed PLL‐clock assures proper DLL operation to broadband the jitter‐tolerance recommendation of the synchronous optical network (SONET). Copyright © 2016 John Wiley & Sons, Ltd.     

An all‐digital DLL with duty‐cycle correction using reusable TDC

This paper presents the design of an all‐digital delay‐locked loop (ADDLL) with duty‐cycle correction using reusable time‐to‐digital converter (TDC). The proposed ADDLL uses a reusable TDC for achieving a wide‐operating frequency range. In addition, it achieves the frequency doubling output clock easily by changing the quantization interval. It is implemented in a 0.18‐µm complementary metal‐oxide semiconductor technology. This circuit corrects the duty cycle and synchronizes the input and output clocks in 10 clock cycles. The output duty cycle is corrected to 50 ± 1.5% as the input duty cycle ranges from 25% to 75%. The acceptable input frequency range is from 300 to 900 MHz without frequency doubling. The acceptable input frequency range is from 150 to 450 MHz when using frequency doubling. It dissipates 6.2 mW from a 1.8‐V supply at 900 MHz. The peak‐to‐peak and RMS jitters at 900 MHz are 14 and 1.8 ps, respectively. Copyright © 2015 John Wiley & Sons, Ltd.     

A 6‐Gbps/lane receiver for a clock‐forwarded link in 65‐nm CMOS process

For a 6‐Gbps/lane clock‐forwarded link, a wireline receiver has been developed. The phases of the sampling clocks are aligned to the center of the input data eye by a clock and data recovery (CDR) circuit. In the CDR circuit, the sampling clock phases are rotated by a phase rotating phase locked loop (PLL). A three‐tap decision feedback equalizer (DFE) compensates for the loss of cable together with a continuous‐time linear equalizer (CTLE) to ensure sufficient eye opening for the CDR circuit to find the optimum sampling phase. The DFE coefficients are adaptively calculated based on the data and edge samples. Implemented in a 65‐nm CMOS process, the three‐lane 6‐Gbps/lane receiver for a clock‐forwarded link occupies 0.63 mm² including pads and consumes 288 mA from a 1.2‐V supply. Copyright © 2015 John Wiley & Sons, Ltd.     

A 0.008‐mm2, 35‐μW, 8.87‐ps‐resolution CMOS time‐to‐digital converter using dual‐slope architecture

This paper presents a high resolution time‐to‐digital converter (TDC) for low‐area applications. To achieve both high resolution and low circuit area, we propose a dual‐slope voltage‐domain TDC, which is composed of a time‐to‐voltage converter (TVC) and an analog‐to‐digital converter (ADC). In the TVC, a current source and a capacitor are used to make the circuit as simple as possible. For the same reason, a single‐slope ADC, which is commonly used for compact area ADC applications, is adapted and optimized. Because the main non‐linearity occurs in the current source of the TVC and the ramp generator of the ADC, a double gain‐boosting current source is applied to overcome the low output impedance of the current source in the sub‐100‐nm CMOS process. The prototype TDC is implemented using a 65‐nm CMOS process, and occupies only 0.008 mm². The measurement result shows a dynamic range with an 8‐bit 8.86‐ps resolution and an integrated non‐linearity of ±1.25 LSB. Copyright © 2016 John Wiley & Sons, Ltd.     

A small fully digital open‐loop clock and data recovery circuit for wired BANs

This paper proposes a new open‐loop and low complexity (small size) fast‐lock synchronization circuit for clock and data recovery in wearable systems. The system includes sensors embedded in textile and connected by conductive yarns. Synchronization is based on the open‐loop selection of the correct phase of the receiver clock synchronously with the incoming signal. The clock generator of the receiver is an autonomous oscillator set to operate at the same nominal frequency. The circuit lock time is at most one clock cycle, faster than all methods based on phase‐locked loops or delay‐locked loops. The circuit can be used for baseband communication independently of the signal coding method used in the physical layer, making it suitable for many applications. The fully digital circuit (including non‐return‐to‐zero inverted decoder) occupies 0.0022 in a 0.35 complementary metal‐oxide semiconductor (CMOS) process, a smaller implementation than many existing circuits, and supports a maximum system clock frequency of 70 for a 35‐data rate. Experimental results demonstrate that the proposed circuit robustly generates a synchronous clock for data recovery. The circuit is suitable for systems that tolerate some jitter but requires fast lock time, small size, and low energy consumption. Copyright © 2015 John Wiley & Sons, Ltd.     

A single‐bit continuous‐time delta‐sigma modulator using clock‐jitter and inter‐symbol‐interference suppression technique

This paper presents a technique for mitigating two well‐known DAC non‐idealities in continuous‐time delta‐sigma modulators (CTDSMs), particularly in wide‐band and low over‐sampling‐ratio (OSR) cases. This technique employs a special digital‐to‐analog convertor (DAC) waveform, called modified return‐to‐zero (MRZ), to reduce the time uncertainty effect because of the jittered clock at the sampling time instances and eliminate the effect of inter‐symbol‐interference (ISI) which degrades the modulator performance, especially when non‐return‐to‐zero (NRZ) DAC waveform is chosen in the modulator design. A third‐order single‐bit CTDSM is designed based on the proposed technique and step‐by‐step design procedure at circuit and system levels, considering clock jitter and ISI, is explained. Circuit simulations in 180‐nm CMOS technology show that in the presence of circuit non‐idealities which generate jitter and asymmetrical rise and fall times in the DAC current pulse, signal‐to‐noise‐distortion‐ratio (SNDR) of the proposed modulator is higher than the conventional modulator with NRZ waveform by about 10 dB. In these simulations, clock jitter standard deviation is 0.3% of the sampling period (T_S) and the difference between fall/rise times in the DAC current pulse is 4%T_S. Simulated at 600‐MHz sampling frequency (f_S) with an oversampling ratio (OSR) of 24, SNDR figure of merit (FOM_SNDR) of the proposed modulator in 180‐nm CMOS is 300 fj/conversion. Copyright © 2016 John Wiley & Sons, Ltd.     

A new fast‐lock,low‐jitter,and all‐digital frequency synthesizer for DVB‐T receivers

Lock time and convergence time are the most important challenges in delay‐locked loops (DLLs). In this paper we cover French very high frequency band with a novel all‐digital fast‐lock DLL‐based frequency synthesizer. Because this new architecture uses a digital signal processing unit instead of using phase frequency detector, charge pump, and loop filter in conventional DLL, therefore, it shows better jitter performance, lock time, and convergence speed than previous related works. Optimization methods are used to make input and output signals of the proposed DLL in phase. The proposed architecture is designed to cover all channels of French very high frequency band by choosing number of delay cells in signal path. Simulation has been done for 22–27 delay cells, and f_REF = 16 MHz, which can produce output frequency in range of 176–216 MHz. Locking time is approximately 0.3 µs, which is equal to five clock cycles of reference clock. All of the simulation results show superiority of the proposed structure. Copyright © 2013 John Wiley & Sons, Ltd.     

Wide‐band aperture array using a four‐channel manifold‐type planar multiplexer and digital 2‐D IIR filterbank

Emerging wide‐band communications and spectrum‐sensing systems demand support for multiple electronically scanned beams while maintaining a frequency independent, constant far‐field beam width. Realizing existing phased‐array technology on a digital scale is computationally intensive. Moreover, digitizing wide‐band signals at Nyquist rate requires complex high‐speed analog‐to‐digital converters (ADCs), which is challenging for real developments driven by the current ADC technology. A low‐complexity alternative proposed in this paper is the use of radio‐frequency (RF) channelizers for spectrum division followed by sub‐sampling of the RF sub‐bands, which results in extensive reduction of the necessary ADC operative frequency. The RF‐channelized array signals are directionally filtered using 2‐D digital filterbanks. This mixed‐domain RF/digital aperture array allows sub‐sampling, without utilizing multi‐rate 2‐D systolic arrays, which are difficult to realize in practice. Simulated examples showing 14–19 dB of rejection of wide‐band interference and noise for a processed bandwidth of 1.6 GHz are demonstrated. The sampling rate is 400 MHz. The proposed VLSI hardware uses a single‐phase clock signal of 400 MHz. Prototype hardware realizations and measurement using 65‐nm Xilinx field‐programmable gate arrays, as well as Cadence RTL synthesis results including gate counts, area‐time complexity, and dynamic power consumption for a 45‐nm CMOS circuit operating at B _DC = 1.1 V, are presented. Copyright © 2016 John Wiley & Sons, Ltd.     

Non‐idealities in linear CDR phase detectors

The effects of circuit non‐idealities in a “Hogge”‐type phase detector are examined. Using a behavioral model for each circuit block, it is shown that various circuit non‐idealities introduce static phase offset in the phase detector, reduce the monotonic range of its transfer characteristics and eventually degrade the capture range and jitter tolerance of the clock and data recovery (CDR) loop. Lower bounds on the bandwidths of the various blocks in the CDR are also established in order to avoid variations of the transfer characteristics. Copyright © 2011 John Wiley & Sons, Ltd.     

A 7.5‐μW 0.08‐mm2 single‐ended SC delta‐sigma ADC for acoustic sensor applications

This study presents an ultra‐low‐power, small‐size, 1‐bit, single‐ended, and switched‐capacitor (SC) delta‐sigma analog‐to‐digital converter (ADC) for wireless acoustic sensor nodes. This wireless sensor node has a delta‐sigma ADC that converts the sensed signal to a digital signal for convenient data processing and emphasizes the features of small size and low‐power consumption. The chip area of the delta‐sigma ADC is dominated by the capacitor; therefore, a novel common‐mode (CM) controlling technique with only transistors is proposed. This ADC achieves an extremely small size of 0.08 mm² in a 130‐nm CMOS process. The conventional operational transconductance amplifiers (OTAs) are replaced by inverters in the weak inversion region to achieve high power efficiency. At 4‐MHz sampling frequency and 0.7‐V power supply voltage, the delta‐sigma ADC achieves a 55.8‐dB signal‐to‐noise‐plus‐distortion ratio (SNDR) and a 298‐fJ/step figure‐of‐merit (FOM) in a signal bandwidth of 25 kHz, while consuming only 7.5 μW of power. Copyright © 2015 John Wiley & Sons, Ltd.     

A 120–420 MHz delay‐locked loop with multi‐band voltage‐controlled delay unit

A low‐jitter and low‐power dissipation delay‐locked loop (DLL) is presented. A proposed multi‐band voltage control delay unit (MVCDU) is employed to extend the operation frequency of the DLL by controlling the delay cell within the MVCDU. The jitter of DLL is reduced due to MVCDU's low sensitivity. The delay cell in the MVCDU employs a differential configuration to further reduce the noise impact from the fluctuation in the supply and ground voltage. The operating frequency of the proposed DLL ranges from 120 to 420 MHz. The proposed design has been fabricated in a TSMC 0.18µm CMOS process. The measured RMS and peak‐to‐peak jitters are 4.86 and 34.55 ps, respectively, at an operating frequency of 300 MHz. The power dissipation is below 14.85 mW at an operating frequency of 420 MHz. Copyright © 2010 John Wiley & Sons, Ltd.     

A subthreshold current‐sensing ΣΔ modulator for low‐voltage and low‐power sensor interfaces

A continuous‐time (CT) ΣΔ modulator for sensing and direct analog‐to‐digital conversion of nA‐range (subthreshold) currents is presented in this work. The presented modulator uses a subthreshold technique based on subthreshold source‐coupled logic cells to efficiently convert subthreshold current to digital code without performing current‐to‐voltage conversion. As a benefit of this technique, the current‐sensing CT ΣΔ modulator operates at low voltage and consumes very low power, which makes it convenient for low‐power and low‐voltage current‐mode sensor interfaces. The prototype design is implemented in a 0.18 µm standard complementary metal‐oxide semiconductor technology. The modulator operates with a supply voltage of 0.8 V and consumes 5.43 μW of power at the maximum bandwidth of 20 kHz. The obtainable current‐sensing resolution ranges from effective number of bits (ENOB) = 7.1 bits at a 5 kHz bandwidth to ENOB = 6.5 bits at a 20 kHz bandwidth (ENOB). The obtained power efficiency (peak FoM = 1.5 pJ/conv) outperforms existing current‐mode analog‐to‐digital converter designs and is comparable with the voltage‐mode CT ΣΔ modulators. The modulator generates very low levels of switching noise thanks to CT operation and subthreshold current‐mode circuits that draw a constant subthreshold current from the voltage supply. The presented modulator is used as a readout interface for sensors with current‐mode output in ultra low‐power conditions and is also suitable to perform on‐chip current measurements in power management circuits. Copyright © 2014 John Wiley & Sons, Ltd.     

Novel quantum‐dot cellular automata implementation of flip‐flop and phase‐frequency detector based on nand‐nor‐inverter gates

CMOS technology faces fundamental challenges such as frequency and power consumption due to the impossibility of further reducing dimensions. For these reasons, researchers have been thinking replacement of this technology with other technologies such as quantum‐dot cellular automata (QCA) technology. Many studies have been done to design digital circuits using QCA technology. Phase‐frequency detector (PFD) is one of the main blocks in electrical and communication circuits. In this paper, a novel structure for PFDs in QCA technology is proposed. In the proposed design, the novel D flip‐flop (D‐FF) with reset ability is used. The D‐FF is designed by the proposed D latch which is based on nand‐nor‐inverter (NNI) and an inverter gate. This proposed D latch has 22 cells and 0.5 clock cycle latency and 0.018‐μm² area. The inverter gate of the D‐FF has output signal with high polarization level and lower area than previous inverters, and the NNI gate of the D‐FF is a universal gate. The proposed PFD has 141 cells, 0.17‐μm² occupied area, and two clock cycle latency that is smaller compared with PFD and is based on common inverter and majority gates.     

Design of a 1‐GSample/s 9‐b double sampling track‐and‐hold amplifier in BiCMOS technology

This paper gives a detail presentation of a fully pseudo‐differential open‐loop BiCMOS track‐and‐hold amplifier (THA) for 9‐b operation up to 1 GSample/s. The proposed THA not only uses a double sampling technique to increase the achievable sampling frequency by a factor of two, but also employs a linearization technique to reduce the gain dependence of the THA input stage upon the input level. Moreover, timing mismatch between the clock signals of the two interleaved paths is minimized by means of a timing mismatch insensitive clock generator controlled by a common master sampling clock. The post‐layout simulation results using TSMC 75 GHz f_T, 0.35‐µm SiGe BiCMOS technology show that the proposed architecture achieve a signal to noise and distortion ratio of 53.92 dB, equivalent to the effective number of bits of 8.66‐b for 58.11 MHz input frequency at 1 GSample/s. The power dissipation of the whole THA is 161.1 mW. Copyright © 2012 John Wiley & Sons, Ltd.     

Redundancy‐bandwidth scalable techniques for signal‐independent element transition rates in high‐speed current‐steering DACs

This paper presents redundancy‐bandwidth scalable techniques to deal with the intersymbol interference distortions for current‐steering digital‐to‐analog converters in high‐speed applications. A switching strategy that explores the use of redundant current sources is proposed to realize a signal‐independent element transition rate, ie, the number of switching activities during the transition of successive sampling clock cycles. With a certain number of redundant current sources, this strategy significantly reduces the intersymbol interference distortions without oversampling operation or causing signal attenuation, which makes it appealing for high‐speed applications. As analyzed in this paper, the number of required redundant current sources is scalable for different bandwidth requirement in specific applications, leading to 3 redundancy‐bandwidth scalable trade‐offs between the cost from redundant current sources and the high‐dynamic‐range bandwidth. In implementation, we propose a custom‐designed decoder, named as the overlap‐controlled data‐weighted averaging (OC‐DWA). Compared with the existing similar‐purpose designs, the proposed OC‐DWA decoder realizes the current sources selection with a simple barrel rotator, which is of much lower hardware complexity and energy consumption. Simulations of a digital‐to‐analog converter with this decoder exhibit an enhanced dynamic range over the entire Nyquist band, which verifies the redundancy‐bandwidth scalability of the proposed techniques.     

Design and implementation of a hybrid DPWM under 50 ps resolution based on general‐purpose FPGA

High‐resolution pulse width modulators are used widely in different fields of electrical engineering, such as dimming of light‐emitting diode (LED) lighting, motor control, RF modulators, audio amplifiers, and switch‐mode power supplies. To realize a high‐resolution digital pulse‐width modulator (DPWM) in a limited inner system clock, a simple implementation of a hybrid DPWM with the resolution under 50 ps based on a general‐purpose field‐programmable gate array (FPGA) is described. The multiplexer device implementing the fast carry‐chain path and an AND gate controlling the selection input are used as a delay unit. The manual routing or placement is not required in the proposed approach, which just needs some conditional constraints. Some different conditional constraints influencing the monotonicity and resolution of DPWM are discussed. Finally, a 1 MHz switching frequency DPWM with 40 ps resolution is experimentally demonstrated, with high monotonicity and linearity. Further, a synchronous buck with and without this high‐resolution DPWM is experimentally compared to illustrate the regulation resolution.