Optical and structural properties of amorphous and heat treated In0.4Se0.6 film of different thicknesses

The optical gap (E _g ^opt ) of as-deposited In_0.4Se_0.6 film is found to increase with the thickness of the film. The optical gap attains a steady value after several heat treatments of the films at elevated temperatures. The values of optical gaps of In_0.4Se_0.6 films are found to depend on the temperature of the heat treatment. The effect of thickness and temperature of heat treatment on the optical gap of the film is interpreted in terms of creation or elimination of defects in the amorphous structure of In_0.4Se_0.6 film. X-ray diffraction spectra are taken for both as deposited and heat treated In_0.4Se_0.6 films. From the results related to the radial distribution functions of the specimens it is noted that in the case of In_0.4Se_0.6 a transition from amorphous to crystalline states takes place at 523 K and above. The results also show that both the optical gap and the coordination number decrease with increasing temperature of heat treatment. Therefore it is evident that the heat treatment improves the long range order of In_0.4Se_0.6 but reduces the coordination in the short range.     

A.c. photoconductivity and optical properties of bulk polycrystalline and amorphous In x Se1−x thin films

The a.c. photoconductivity of bulk polycrystalline In _x Se_1–x and the optical properties of amorphous In _x Se_1–x thin films were investigated. The effect of heat treatment on the absorption coefficient of InSe thin films was also studied. The spectral response of the photoconductivity of polycrystalline In _x Se_1–x related to the near-edge absorption spectrum, shows a well-defined maximum corresponding to the width of the forbidden gap. Polycrystalline In _x Se_1–x realizes the behaviour of photoconductors which are sensitive in a spectral range between 400 and 1700 nm. Optical absorption of amorphous In _x Se_1–x thin films was recorded as a function of photon energy and the data were used to deduce the value of optical energy gap of the films. It was found that the optical energy gap decreased with increasing indium content in both bulk polycrystalline and amorphous thin films. The effect of heat treatment on the optical gap of the film has been interpreted in terms of the density of states model of Mott and Davis.     

Effects of annealing temperatures on optical and electrical properties of vacuum evaporated Ga15Se77In8 chalcogenide thin films

The optical constants (absorption coefficient, optical band gap, refractive index, extinction coefficient, real and imaginary parts of dielectric constants) of amorphous and thermally annealed thin films of Ga₁₅Se₇₇In₈ chalcogenide glasses with thickness 4000 Å have been investigated from absorption and reflection spectra as a function of photon energy in the wave length region 400-800 nm. Thin films of Ga₁₅Se₇₇In₈ chalcogenide glasses were thermally annealed for 2 h at three different annealing temperatures 333 K, 348 K and 363 K, which are in between the glass transition and crystallization temperature of Ga₁₅Se₇₇In₈ glasses. Analysis of the optical absorption data shows that the rule of non-direct transitions predominates. It was found that the optical band gap decreases with increasing annealing temperature. It has been observed that the value of absorption coefficient and extinction coefficient increases while the values of refractive index decrease with increasing annealing temperature. The decrease in optical band gap is explained on the basis of the change in nature of films, from amorphous to crystalline state. The dc conductivity of amorphous and thermally annealed thin films of Ga₁₅Se₇₇In₈ chalcogenide glasses is also reported for the temperature range 298-393 K. It has been observed that the conduction is due to thermally assisted tunneling of the carriers in the localized states near the band edges. The dc conductivity was observed to increase with the corresponding decrease in activation energy on increasing annealing temperature in the present system. These results were analyzed in terms of the Davis-Mott model.     

On the compositional dependence of the optical gap and structural properties of amorphous In x Se1−x thin films

The optical gap of the amorphous In _x Se_1–x thin film has been observed to decrease with increasing content of indium in the film (x). An attempt is made to interpret the compositional dependence of the optical gap in amorphous In _x Se_1–x thin film in an alloy-like approach. It has been found that introduction of higher concentrations of indium imparts greater stability to the structure of the indium selenium alloy. From the study of the radial distribution function (RDF) by X-rays it is observed that there is a correlation between the coordination number and the optical gap of indium selenide thin films.     

Heat treatment effect on the structural and optical properties of Ga2Se3-Ga2S3 thin films

The structural properties of the 50 mol% Ga₂Se₃-50 mol% Ga₂S₃ system in thin-film form were studied using an X-ray diffraction technique. As-deposited films had an amorphous nature, whereas films heat treated for 2 h at 400 °C in a vacuum of 10^–2 Pa had a single-phase (cubic) polycrystalline nature with lattice constanta=0.532 nm. The optical properties of Ga₂Se₃-Ga₂S₃ thin films as-deposited and as-heat treated were also studied. It was found that heat treatment strongly affects the optical constants as well as the energy gap, which can be attributed to compositional as well as structural changes.     

Indium selenide microrod films: chemical bath deposition from acidic bath

Films of indium selenide was deposited onto glass and indium tin oxide coated glass substrates in acidic medium using chemical bath deposition at room temperature. Indium sulphate and sodium selenosulphate were used as precursors of In³⁺ and Se^2?, respectively. The structural, surface morphological and optical properties of the deposited films were studied. Diffractograms in structural study revealed the deposited material is In₂Se₃ films. Controlled bath conditions resulted in the evolution of the In₂Se₃ microrod-like morphology. The optical band gap of the film was found to be 1.7 eV.     

Investigation of Sb<Subscript>65</Subscript>Se<Subscript>35</Subscript>/Sb multilayer thin films for high speed and high thermal stability application in phase change memory

Sb₆₅Se₃₅/Sb multilayer composite thin films were prepared by depositing the Sb₆₅Se₃₅ and Sb layers alternately. In situ resistance vs. temperature was measured and the crystallization temperature increased with thickening the Sb₆₅Se₃₅ layer in Sb₆₅Se₃₅/Sb thin films. The data retention temperature of 10 years increased greatly from 14 °C of pure Sb to 103 °C of [Sb₆₅Se₃₅(3 nm)/Sb(7 nm)]₃. Also, the band gap was broadened and the surface became smoother. X-ray diffraction patterns for the studied materials revealed that Sb and Sb₂Se₃ phases coexisted in Sb₆₅Se₃₅/Sb thin films. Absorbing the advantages of the fast phase change for Sb, the [Sb₆₅Se₃₅(1 nm)/Sb(9 nm)]₅ multilayer thin film had an ultrafast amorphization speed of 1.6 ns. The results indicated that Sb₆₅Se₃₅/Sb multilayer thin film was a potential phase change material for fast speed and good stability.     

Structural, electrical and optical properties of Bi2Se3 and Bi2Se(3−x)Tex thin films

Thin films of Bi₂Se₃, Bi₂Se_2.9Te_0.1, Bi₂Se_2.7Te_0.3 and Bi₂Se_2.6Te_0.4 are prepared by compound evaporation. Micro structural, optical and electrical measurements are carried out on these films. X-ray diffraction pattern indicates that the as-prepared films are polycrystalline in nature with exact matching of standard pattern. The composition and morphology are determined using energy dispersive X-ray analysis and scanning electron microscopy (SEM). The optical band gap, which is direct allowed, is 0.67 eV for Bi₂Se₃ thin films and the activation energy is 53 meV. Tellurium doped thin films also show strong optical absorption corresponding to a band gap of 0.70-0.78 eV. Absolute value of electrical conductivity in the case of tellurium doped thin film shows a decreasing trend with respect to parent structure.     

Effect of composition,film thickness and annealing on the optical properties of Bi-Sb-Se thin films

Thin films of Bi₁₀Sb _x Se_90–x (x35, 40, 45) of different composition and thickness, were deposited on glass substrates by vacuum evaporation. Optical absorption measurements show that the fundamental absorption edge is a function of glass composition, film thickness and annealing temperature. The optical absorption is due to indirect electronic transitions. The value of the optical band gap was found to increase with thickness and decreasing the antimony content and with increasing temperature of heat treatment. The validity of the Urbach rule was investigated and the respective parameters estimated. X-ray diffraction was used to obtain an insight into the structural information.     

Single step electrochemical synthesis of Sb<Subscript>2</Subscript>Se<Subscript>3</Subscript> thin films: effect of molarities of precursor solution

In the present investigation, we have successfully synthesized polycrystalline Sb₂Se₃ thin films by single-step electrochemical method. Effect of concentration of precursor solution on structural, morphological, optical, and wettability properties by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), optical absorption, and contact angle measurement have been investigated. It is evident from XRD pattern that Sb₂Se₃ thin films are polycrystalline having orthorhombic crystal structure. Also, as precursor concentration increases the diffraction peak intensity also increases. Scanning electron micrographs reveal that the increase in precursor concentration causes the formation of soap foam like microstructure which is spread in the form of ellipsoids over whole substrate surface. The optical band gap decreases from 1.49 to 1.35 eV and contact angle decreases from 40° to 13°, i.e., the surface of Sb₂Se₃ thin films converts from hydrophilic to superhydrophilic nature due to increase in precursor concentration. In addition, the holographic interferometric properties have been studied. The thickness, stress to substrate and deposited mass of the thin films is determined using double exposure holographic interferometry (DEHI) technique.     

Structural,optical and microscopic properties of chemically deposited In<Subscript>2</Subscript>Se<Subscript>3</Subscript> thin films

Solar cell technologically important binary indium selenide thin film has been developed by relatively simple chemical method. The reaction between indium chloride, tartaric acid, hydrazine hydrate and sodium selenosulphate in an aqueous alkaline medium at room temperature gives deposits In₂Se₃ thin film. Various preparative parameters are discussed. The as grown films were found to be transparent, uniform, well adherent, red in color. The prepared films were studied using X-ray diffraction, scanning electron microscopy, atomic absorption spectroscopy, Energy dispersive atomic X-ray diffraction, optical absorption and electrical conductivity properties. The direct optical band gap value E_g for the films was found to be as the order of 2.35 eV at room temperature and having specific electrical conductivity of the order of 10⁻² (Ω cm)⁻¹ showing n-type conduction mechanism. The utility of the adapted technique is discussed from the point of view of applications considering the optoelectric and structural data obtained.     

Electrical and optical properties of In2Se3 thin films

In₂Se₃ thin films were grown with good stoichiometry at a substrate temperature around 460 K in the α phase and were shown to remain in the β phase above 480 K. The Hall coefficient and the d.c. conductivity of polycrystalline In₂Se₃ films grown on Pyrex and mica substrates were studied in the temperature range 77–530 K. After thermal treatment above 473 K of the α phase thin film, the electrical resistivity decreased and the sample remained in an irreversible phase. This is explained in terms of structural changes at high temperatures. The mobility behaviour of the β phase annealed thin films is illustrated. We use the Petritz barrier model to explain the activation energy of the mobility as due to the grain boundaries of the polycrystallites.The optical properties (refractive index and absorption coefficient) are also reported. The direct band gaps of In₂Se₃ thin films are 1.43 eV and 1.55 eV for the α phase and β phase respectively. These values are obtained from transmission measurements and are confirmed through photoconductivity measurements.     

Optical,structural and electrical properties of co-evaporated CuIn2Se3.5 thin films

Polycrystalline CuIn₂Se_3.5 thin films have been prepared by a three-source co-evaporation technique. The optical band gap, structural and electrical properties of these co-evaporated CuIn₂Se_3.5 thin films deposited on glass substrate held at 673 K and in situ annealed at 723 K in selenium atmosphere are reported here. Optical band gap of the films, determined from spectral transmission data, is found to be 1.22 eV. Powder X-ray diffraction (XRD) studies reveal the CuIn₂Se_3.5 films to be polycrystalline in nature with tetragonal structure. The lattice parameters are found to be a=0.576 nm and c=1.151 nm. The average grain size of the films is 1 μm. The films are n-type with room temperature resistivity of 180 Ω cm. The activation energies, determined from the temperature dependence of electrical conductivity, are found to be 0.34 eV (320–415 K) and 0.10 eV (223–320 K) and are attributed to In_Cu and V_Se, respectively.     

Steady state and transient photoconductivity measurements in a-Se90 − xSb10Inx thin films

Amorphous thin films of Se_90 − xSb₁₀In_x (0 ≤ x ≤ 15) have been prepared by electron beam evaporation method. The steady state and transient photoconductivity measurements on the thin films of Se_90 − xSb₁₀In_x (0 ≤ x ≤ 15) were carried out at different levels of light intensities (500 lx-5000 lx) at room temperature (301 K). The plot of photocurrent (I_ph) versus light intensity (F) follows a power law I_ph ∝ F^γ. The value of exponent γ lies between 0.5 and 1.0, which indicates there exists a continuous distribution of localized states in the mobility gap of Se_90 − xSb₁₀In_x (0 ≤ x ≤ 15) thin films. For transient photoconductivity, when the samples were illuminated with light, the photocurrent reaches the maximum value during the first 5 s of exposure time and thereafter, it starts decreasing and becomes stable after 15 min of exposure. This kind of phenomenon is termed as photo-degradation of photocurrent. The results have been explained on the basis of charged defect model and the intercluster interaction model. The magnitude of photocurrent of the system a-Se₇₅Sb₁₀In₁₅ is higher than the parent system a-Se₉₀Sb₁₀. The photosensitivity shows a minimum value at 5 atomic percentage of indium (In) concentration, which is explained based on chemically ordered network model and the topological model.     

Optical properties of Sb2Se3 thin films

The optical constants (the refractive index n and the absorption index k) of Sb₂Se₃ thin films deposited at room temperature on quartz have been calculated in the wavelength range (5000–2000 nm) using a transmission spectrum. Both n and k were found to be practically independent on either time, up to 6 months, or the film thickness in the range of 102–760 nm. Beyond the absorption edge, the absorption is due to allowed indirect and direct transitions with energy gaps of 1.225 and 1.91 eV, respectively. The value of the optical gap depends on the annealing temperature. X-ray analysis showed that the prepared films at room temperature had amorphous structure while the films annealed at 200°C for 1 h were verified to be crystalline.     

In situ electrical conductivity and amorphous-crystalline transition in vacuum-deposited thin films of Se20Te80 alloy

In situ electrical conductivity measurements have been carried out on vacuum-deposited thin films of Se₂₀Te₈₀ alloy during heating and cooling cycles. The electrical conductivity and X-ray diffraction studies show that the as-grown Se₂₀Te₈₀ films are amorphous and, upon heating, undergo an irreversible amorphous-crystalline transition between 315 and 350 K. The observation that the as-grown thin films (deposited at room temperature on glass substrates) are amorphous is in contrast to earlier observations by other workers who find that they are polycrystalline. Above the transition temperature, the electrical conductivity of the polycrystalline Se₂₀Te₈₀ films changes as an exponential function of reciprocal temperature. The amorphous-crystalline transition in Se₂₀Te₈₀ thin films is broad, with films of high initial resistance having lower transition temperatures and low-resistance films having higher transition temperatures. The observation of a broad transition in the case of the present Se₂₀Te₈₀ thin films has to be contrasted with our earlier observations of sharp transitions in the case of Se₈₀Te₂₀ and Se₅₀Te₅₀ thin films.     

Effects of annealing on the optical bandgap of amorphous Ga5Se95-xSbx during crystallization

Abstract

The optical bandgap of as-deposited and annealed films of amorphous Ga₅Se_95-xSb_x (a-Ga₅Se_95-xSb_x) (where x = 0, 5, 10 and 15) have been studied as a function of photon energy in the wavelength range 400–900 nm. Thin films were induced by thermal annealing for 1 h at a temperature below their crystallization temperatures. It has been found that the optical bandgap increases with increasing annealing temperature. For as-deposited films, it has been found that the optical bandgap and refractive index decrease while the extinction coefficient k increases on incorporation of antimony into the Ga-Se system. The temperature dependence (312–392 K) of dc conductivity of bulk samples of a-Ga₅Se_95-xSb_x has also been reported. It has been found that the decrease in activation energy may be due to the decrease in optical bandgap on adding antimony to the present system.     

Nanocomposite thin films of Ga5Sb10Ge25Se60 chalcogenide glass for optical limiting applications

We report a low-cost, scalable method to fabricate optical grade composite thin films for nonlinear optical applications. The transmission and reflection spectra of prepared Ga₅Sb₁₀Ge₂₅Se₆₀/PVA composite films were investigated. Optical band gap of the thin films were calculated using Tauc’s extrapolation method. The band gap of the nanocomposite thin films were found to be tunable depending on the grain size of the films. Nonlinear optical characterization of samples were studied by the Z-scan technique using an Nd:YAG laser (532 nm, 7 ns, 10 Hz). Sequential Z-scan traces were made in four regimes of intensity for films with three different grain sizes. The Z-scan spectra reveal a strong nonlinear absorption depending on the grain size of the films suggesting that the new materials are promising candidates for the development of nonlinear optical devices and are extremely perspective as optical limiters of intense short pulse radiation.     

Optical band gap and optical constants in a-Se100–xSbx thin films

Abstract

The optical properties of a-Se_100-xSb_x thin films (where x = 0, 0.5, 2.5, 5 and 10) have been studied in the wavelength range 540–900 nm. It was found that the optical band gap increases with increasing Sb concentration in the a-Se_100-x Sb _x system. The refractive index n decreases, while the extinction coefficient k increases with increasing photon energy. DC conductivity measurements of a-Se_100-x Sb _x thin films have been reported in the temperature range 349–375 K. It has been observed that the conductivity increases while the activation energy decreases with increasing Sb concentration. We correlated the optical band gap with the electronegativity of the sample. The band gap increases with the decrease in electronegativity of each sample of a-Se_100-x Sb _x .     

Electrical and optical properties of Indium sesquitelluride (In2Te3) thin films

Indium sesquitelluride (In₂Te₃) thin films were grown on glass substrates using a flash evaporation technique. The nature of contact phenomena of Ag, Sn, In, Zn, Al-(p) In₂Te₃ junctions had been investigated. Ag, Sn, In and Zn metals were found to provide ohmic contact for In₂Te₃ thin films. The variation of DC-electrical resistivity of In₂Te₃ thin films with temperature was studied at different substrate temperatures. The optical measurements revealed that the flash evaporated In₂Te₃ thin films possessing direct energy band-gap. The variation of optical energy gap with substrate temperature was investigated. Film thickness, substrate temperature, composition and crystallinity were found to determine the optimization of electrical and optical properties of In₂Te₃ thin film.