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利用固态反应法制备了CaCu3-xMgxTi4O12(x=0,0.2,0.4,0.6,0.8,1.0)陶瓷,并分析探讨了MgO添加量对其介电性能的影响.研究结果表明,添加MgO后陶瓷晶粒有变小的现象,且MgO的添加摩尔比为0.6时其介电常数最佳,但介电常数随频率增加下降也较快;MgO添的加摩尔比为0.2和0.4时虽然介电常数增加较少,但随频率变化幅度却较小.在频率<1 000 Hz时添加MgO会使陶瓷使的介电损耗大幅上升,这表明添加MgO有降低电阻的效果. 相似文献
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本文利用固态反应法制备了CaCu3-xMnxTi4O12(x=0,0.2,0.4,0.6,0.8,1.0)陶瓷,并分析探讨了MnO添加量对其介电性能的影响。研究结果表明,MnO的添加有助于CaCu3Ti4O12相生成,且在高MnO添加的情况下所得陶瓷晶粒尺寸较小。MnO的添加对CaCu3Ti4O12的介电性能有非常不好的影响,少量的添加就会导致其介电常数由10000多降至只有数百。在1000Hz前MnO的添加会使陶瓷的介电损耗大幅上升,这表明MnO添加有降低电阻的效果。 相似文献
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本文以Li2CO3,ZnO,CaCO3,TiO2为原料,采用固相反应法制备了Li2Zn3(1-x)Ca3xTi4O12(x=0,0.05,0.1,0.15)陶瓷,并研究了CaTiO3固溶量对其显微结构和微波介电性能的影响.结果表明:Li2Zn3Ti4O12晶相中固溶CaTiO3相,晶胞参数会增大;少量CaTiO3相固溶于Li2Zn3Ti4O12陶瓷后,提高了Li2Zn3Ti4012陶瓷的烧结温度及其介电常数,但降低了其品质因素,可增大其温频系数.在1100℃/2 h烧结条件下,Li2Zn2.7Ca0.3Ti4O12陶瓷微波介电性能达到:εr=24,Q×f=50000 GHz,Tf=-25×10-6/℃. 相似文献
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以Bi2O3和SiO2为原料,利用NaCl-Na2SO4熔盐系统,在850℃保温3 h制成粉体样品,使用XRD对粉体物相进行表征,确定粉体为纯的Bi4Si3O12,然后将该粉体压片烧成Bi4Si3O12陶瓷.通过SEM和阻抗分析仪对陶瓷微观形貌和介电性能进行了分析,研究烧成温度、保温时间对硅酸铋陶瓷介电性能的影响.研究... 相似文献
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以ZnNb2O6为前驱体,通过固相反应合成了(1-x)CaTiO_3-xCa(Zn_(1/3)Nb_(2/3))O_3体系微波介质陶瓷。对固溶体进行了结构与性能测试,研究了体系结构与性能随组份变化规律。结果表明,由于Zn,Nb对Ti的B位取代增大了B-O八面体的倾斜角,从而导致随着Ca(Zn_(1/3)Nb_(2/3))O_3含量从0.2增加至0.8,介电常数从109减小为49,Q×f值从8340GHz增至13200GHz,频率温度稳定系数由321ppm/℃降为-18ppm/℃。在x=0.7时获得ε_1≈56,Q×f≈11500GHz,τ_f≈-5ppm/℃的最佳性能。 相似文献
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Maria Virginia Gelfuso Juan Oswaldo Montoya Uribe Daniel Thomazini 《International Journal of Applied Ceramic Technology》2019,16(2):868-882
The influence of the CuO–TiO2 phase (CT) on dielectric properties of the CCTO ceramic was investigated. CaCuXTiYO12 (CCXTYO) powders were prepared based on the coprecipitated method, where 2.70 ≤ x ≤ 3.30 and 3.25 ≤ y ≤ 4.75. XRD patterns confirmed the presence of CCTO and also the secondary phases as CuO, TiO2, and CaTiO3 for each sample and aided in its quantification. Scanning Electron Microscopy (SEM) shows secondary phases evolution in the grain boundaries, and its influence on size and morphology of the grains. Impedance spectroscopy measurements showed that the ceramics with lower amount of CuO and TiO2 phases (CT/deficient ceramics) exhibited the highest ε′ values (2.1 × 104 at 1 kHz for CC2.9T3.75O ceramic). Also, CT/deficient ceramics showed lower tanδ values (0.090 at 1 kHz for CC2.9T3.75O ceramic) than ceramics prepared with excessive CuO–TiO2 phase (0.241 at 1 kHz for CC3.1T4.25O ceramics). The deficiency of CuO and TiO2 phases associated with high percentage of CCTO and CaTiO3 phases resulted in ceramics with the higher ε′ values. 相似文献
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Dielectric Characteristics of UV‐Curable CaCu3Ti4O12 Composite Thick Film Capacitors on Cu Foils 下载免费PDF全文
Hong Rak Choi Koppole Sekhar Ah Ra Jo Yong Soo Cho 《International Journal of Applied Ceramic Technology》2016,13(4):685-689
Dielectric composite thick films containing a high dielectric constant CaCu3Ti4O12 (CCTO) filler in a UV‐cured polymer matrix were investigated as flexible planar capacitors on Cu foils. Dielectric performance depended on the volume fraction and size of CCTO particles dispersed in the cured polymer matrix. As a result, the thick films containing 33.3 vol.% CCTO with an average particle size of 0.47 μm exhibited a dielectric constant of ~80 and a dielectric loss of ~0.06 at 10 kHz. The effective medium theory model incorporating a morphology fitting parameter has been proven to be most close to the experimental values. 相似文献
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采用固相反应法分别制备了Mg2+及Sr2+掺杂的Ca1-xMgxCu3Ti4O12和Ca1-xSrxCu3Ti4O12(x=0、0.1、0.2)陶瓷,利用XRD和SEM分别对陶瓷的物相结构和微观形貌进行了分析,并对其介电性能进行了测试.结果表明,Mg2+的掺杂易引起CaCu3Ti4O12(CCTO)化学计量比的偏失,同时陶瓷的致密化程度受到影响,介电常数也显著降低.而Sr2+的掺杂不仅对CCTO陶瓷物相结构影响不大,而且可以促进陶瓷晶粒的长大,并有效降低了CCTO陶瓷的烧结温度.当Sr2+掺杂量为0.2、测试频率在1 k-2.5kHz时,介电常数为104左右,介电损耗在0.05-0.1之间,介电综合性能比纯CCTO陶瓷有所提高. 相似文献
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《Ceramics International》2019,45(10):12994-13003
The temperature and dc bias stability of the dielectric constant and loss tangent of CaCu3Ti4O12 samples sintered under different oxygen atmospheres are discussed. The results suggest that the metal-oxygen vacancy related defects not only provide the charge carriers for the conduction (defect doping) but also contribute to the huge permittivity in the way of defect dipoles repositioning under charge carrier hopping. The charge localization in a specific copper-oxygen vacancy defect complex is the reason of the huge and stable permittivity and low dielectric loss in the middle temperature range, 90 K-200 K (20 Hz), while the implementation of the large barrier layer height needs a contribution by the titanium oxygen vacancy related trap charges in the grain boundaries, which also lead to a second permittivity stable range in a higher temperature range 200 K–300 K. 相似文献
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采用传统固相反应法制备了添加H3BO3助烧剂的Li2Zn3Ti4O12 (LZT)陶瓷,分别通过XRD、SEM、排水法及网络分析仪等方法研究了不同H3BO3添加量对所得陶瓷的物相、微观形貌、烧结特性与微波介电性能的影响.结果表明在LZT陶瓷中添加3wt% H3BO3可有效降低烧结温度,在900 ℃/2 h烧结条件下可以获得高致密性及优异的微波介电性:ρ=4.15 g/cm3,εr=17.916,Q×f=61200 GHz,Tf=-52.87×10-6/℃. 相似文献