共查询到13条相似文献,搜索用时 140 毫秒
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深亚微米槽栅PMOSFET结构参数对其抗热载流子效应和短沟道抑制作用的影响 总被引:3,自引:3,他引:0
基于流体动力学能量输运模型 ,利用二维仿真软件 Medici对深亚微米槽栅 PMOS器件的结构参数 ,如凹槽拐角、负结深、沟道和衬底掺杂浓度对器件抗热载流子特性和短沟道效应抑制作用的影响进行了研究 .并从器件内部物理机理上对研究结果进行了解释 .研究发现 ,随着凹槽拐角、负结深的增大和沟道杂质浓度的提高 ,器件的抗热载流子能力增强 ,阈值电压升高 ,对短沟道效应的抑制作用增强 .而随着衬底掺杂浓度的提高 ,虽然器件的短沟道抑制能力增强 ,但抗热载流子性能降低 相似文献
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基于流体动力学能量输运模型,利用二维仿真软件Medici对深亚微米槽栅PMOS器件的结构参数,如凹槽拐角、负结深、沟道和衬底掺杂浓度对器件抗热载流子特性和短沟道效应抑制作用的影响进行了研究.并从器件内部物理机理上对研究结果进行了解释.研究发现,随着凹槽拐角、负结深的增大和沟道杂质浓度的提高,器件的抗热载流子能力增强,阈值电压升高,对短沟道效应的抑制作用增强.而随着衬底掺杂浓度的提高,虽然器件的短沟道抑制能力增强,但抗热载流子性能降低. 相似文献
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基于流体动力学能量输运模型,利用二维仿真软件Medici对深亚微米槽栅PMOS器件的几何结构参数,如:沟道长度、凹槽拐角、凹槽深度和漏源结深导致的负结深对器件抗热载流子特性的影响进行了研究。并从器件内部物理机理上对研究结果进行了解释。研究发现,在深亚微米和超深亚微米区域,槽栅器件能够很好地抑制热载流子效应,且随着凹槽拐角、负结深的增大,器件的抗热载流子能力增强。这主要是因为这些结构参数影响了电场在槽栅MOS器件的分布和拐角效应,从而影响了载流子的运动并使器件的热载流子效应发生变化。 相似文献
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基于流体动力学能量输运模型 ,利用二维仿真软件 Medici研究了深亚微米槽栅 PMOS器件衬底和沟道掺杂浓度对器件抗热载流子特性的影响 ,并从器件内部物理机理上对研究结果进行了解释。研究发现 ,随着沟道杂质浓度的提高 ,器件的抗热载流子能力增强 ;而随着衬底掺杂浓度的提高 ,器件的抗热载流子性能降低。这主要是因为这些结构参数影响了电场在槽栅 MOS器件内的分布和拐角效应 ,从而影响了载流子的运动并使器件的热载流子效应发生变化 相似文献
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为优化槽栅器件结构 ,提高槽栅 MOSFET的性能和可靠性 ,文中用器件仿真软件对凹槽拐角对深亚微米槽栅 PMOSFET的特性影响进行了研究。研究结果表明凹槽拐角强烈影响器件的特性 :随着凹槽拐角的增大 ,阈值电压上升 ,电流驱动能力提高 ,而热载流子效应大大减弱 ,抗热载流子性能增强 ,热载流子可靠性获得提高 ;但凹槽拐角过大时 (例如 90°) ,器件特性变化有所不同 相似文献
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基于能量输运模型对由凹槽深度改变引起的负结深的变化对深亚微米槽栅PMOSFET性能的影响进行了分析,对所得结果从器件内部物理机制上进行了讨论,最后与由漏源结深变化导致的负结深的改变对器件特性的影响进行了对比.研究结果表明随着负结深(凹槽深度)的增大,槽栅器件的阈值电压升高,亚阈斜率退化,漏极驱动能力减弱,器件短沟道效应的抑制更为有效,抗热载流子性能的提高较大,且器件的漏极驱动能力的退化要比改变结深小.因此,改变槽深加大负结深更有利于器件性能的提高. 相似文献
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Grooved gate structure Metal-Oxide-Semiconductor (MOS) device is considered as the most promising candidate used in deep and super-deep sub-micron region, for it can suppress hot carrier effect and short channel effect deeply. Based on the hydrodynamic energy transport model, using two-dimensional device simulator Medici, the relation between structure parameters and hot carrier effect immunity for deep-sub-micron N-channel MOSFET's is studied and compared with that of counterpart conventional planar device in this paper. The examined structure parameters include negative junction depth, concave corner and effective channel length. Simulation results show that grooved gate device can suppress hot carrier effect deeply even in deep sub-micron region. The studies also indicate that hot carrier effect is strongly influenced by the concave corner and channel length for grooved gate device. With the increase of concave corner, the hot carrier effect in grooved gate MOSFET decreases sharply, and with the redu 相似文献
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RenHongxia ZhangXiaoju HaoYue XuDonggang 《电子科学学刊(英文版)》2003,20(3):202-208
Grooved gate structure Metal-Oxide-Semiconductor(MOS) device is considered as the most promising candidate used in deep and super-deep sub-micron region,for it can suppress hot carrier effect and short channel effect deeply.Based on the hydrodynamic energy transoprt model,using two-dimensional device simulator Medici,the relation between structure parameters and hot carrier effect immunity for deep-sub-micron N-channel Mosfet‘s is studied and compared with that of counterpart conventional planar device in this paper.The examined structure parameters include negative junction depth,conventinal planar device in this paper.The examined structure parameters include negative junction depth,concave corner and effective channel length.Simulation results show that grooved gate device can suppress hot carrier effect is strongly influenced by the concave corner and channel length for grooved gate device.With the increase of concave corner,the hot carrier effect in groovd gate MOSFET decreases sharply,and with the reducing of effective channel length,the hot carrier effect becomes large. 相似文献
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Tanaka J. Toyabe T. Ihara S. Kimura S. Noda H. Itoh K. 《Electron Device Letters, IEEE》1993,14(8):396-399
MOSFETs in the sub-0.1-μm regime were investigated using a nonplanar device simulator CADDETH-NP. It was found that even in this regime, the short-channel effect can be suppressed in grooved gate MOSFETs because of the concave corner of the gate insulator. MOSFETs with a gate length of 0.05 μm or less with no threshold voltage lowering can be made by optimizing the concave corner radius, junction depths, and channel doping 相似文献