High-speed experiments on a QFP-based comparator for ADCs with18-GHz sample rate and 5-GHz input frequency

The authors report on the high-speed operation of a superconducting comparator circuit, based on coupling the quantum flux parametron (QFP) to an RF SQUID, which can be used to build a flash-type analog-to-digital converter (ADC). Simulations of this circuit show that it is expected to achieve operation with input signal bandwidths greater than 4 GHz and with a dynamic range equal to at least 4 b of resolution. A QFP-based comparator fabricated with a process using NbN/Pb-alloy Josephson junctions of 5 μm by 5 μm and a current density of 100 A/cm² has been examined to evaluate the properties of the QFP-ADC. Analog-to-digital conversion of the comparator has been observed with a QFP activation frequency up to 18.2 GHz. By employing a sampling method, input signals with frequencies up to 5.4 GHz have also been digitized     

Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling

This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise.     

一种基于闩锁结构的高速电压比较器

文章结合高速A/D转换器的研究设计了一种新型高速、高精度集成闩锁比较器,针对提高集成闩锁型电压比较器的性能,讨论了比较器失效、速度-功耗优化、时钟反馈噪声等设计问题.该比较器有较高的输入电阻,对高频时钟的反馈噪声有较好的抑制性能,采用"电容中和技术"补偿预放大级带宽后更加适用于高速应用的需要.文中给出了详细的性能分析以及采用PSPICE仿真的模拟结果.     

In-band clock distribution concept for ultra-high bit rates OTDM system

A novel clock distribution concept based on inband phase-modulated pilot insertion is demonstrated.This method avoids the need for an ultrafast phase comparator and a phase-locked loop in the receiver.Experimental results show that the clock can be successfully extracted from 160Gbit/s optical time-division multiplexing (OTDM) data signal and employed for demultiplexing of 40Gbit/s tributaries.The in-band clock distribution introduces 1.5dB of power penalty with an error-free performance.     

2.5Gb/s Ga As MESFET定时判决电路

设计了 2 .5 Gb/ s光纤通信用耗尽型 Ga As MESFET定时判决电路 .通过 SPICE模拟表明恢复的时钟频率达2 .5 GHz,判决电路传输速率达 2 .5 Gb/ s.实验证明经时钟信号抽样后判决电路可产生正确的数字信号 ,传输速率达 2 .5 Gb/ s     

Decision and clock recovery circuits for gigahertz optical fiber receivers in silicon NMOS

New design techniques for implementing a data and clock recovery circuit on a silicon NMOS monolithic IC employing 1-μm feature sizes, and operating at speeds greater than 2 Gbit/s are described. A clocked comparator can resolve a 60-mV peak-to-peak signal into logic levels at 2 Gbit/s. The circuit can tolerate a 100° phase margin between the incoming signal and the clock. An NRZ data rate of 4 Gbit/s may be resolved by two such multiplexed circuits following a preamplifier in the same technology. A VCO capable of operation at 2 GHz in a PLL, that does not require off-chip components, is also described. An observer loop concept is employed in the PLL to align the recovered clock signal with the incoming data.     

A novel low-power,low-offset,and high-speed CMOS dynamic latched comparator

A novel dynamic latched comparator with offset voltage compensation is presented. The proposed comparator uses one phase clock signal for its operation and can drive a larger capacitive load with complementary version of the regenerative output latch stage. As it provides a larger voltage gain up to 22 V/V to the regenerative latch, the input-referred offset voltage of the latch is reduced and metastability is improved. The proposed comparator is designed using 90 nm PTM technology and 1 V power supply voltage. It demonstrates up to 24.6% less offset voltage and 30.0% less sensitivity of delay to decreasing input voltage difference (17 ps/decade) than the conventional double-tail latched comparator at approximately the same area and power consumption. In addition, with a digitally controlled capacitive offset calibration technique, the offset voltage of the proposed comparator is further reduced from 6.03 to 1.10 mV at 1-sigma at the operating clock frequency of 3 GHz, and it consumes 54 μW/GHz after calibration.     

Demonstration of RSFQ digitizer on a multichip module

A 1-b slice of a rapid single-flux quantum (RSFQ) digitizer with interchip communications on a multichip module (MCM) has been successfully designed, fabricated using 3-μm Nb technology, and tested. We placed a flash comparator followed by an enable switch and an MCM transmitter circuit on one side of the chip, and an MCM receiver circuit followed by a memory buffer on the other side. The 5 × 5 mm chip was flip-chip mounted on a 10 × 10 mm carrier chip by a solder bump technique. During circuit operation, the comparator output signal and the clock signal left the chip, moved to the carrier chip, and returned back to the chip into the memory buffer. We operated the circuit with a beat frequency technique where the data input frequency was slightly off from the clock frequency by the beat frequency of 10 kHz. The circuit operated correctly up to 10 GHz. The critical circuit operation margin was observed to be the bias current to the SQUID in the MCM receiver circuit and was about ±6% at 10 GHz     

A new high-speed periodic-threshold comparator for use in aJosephson A/D converter

A Josephson comparator based on a nonhysteric one-junction superconducting quantum interference device (SQUID) for use in a periodic-threshold A/D (analog-to-digital) converter is discussed. Simulations show that a 4-bit A/D converter using this comparator could have a sampling rate of >20 GHz with an analog signal bandwidth of >10 GHz. This performance represents a factor-of-greater-than-five improvement over that of other periodic-threshold A/D converters, which are based on two- or three-junction SQUIDs     

Low-voltage, high-speed CMOS analog latched voltage comparator using the “flipped voltage follower” as input stage

The design and characterization of a low-voltage, high-speed CMOS analog latched voltage comparator based on the flipped voltage follower (FVF) cell and input signal regeneration is presented. The proposed circuit consists of a differential input stage with a common-mode signal detector, followed by a regenerative latch and a Set-Reset (S-R) latch. It is suitable for successive-approximation type’s analog-to-digital converters (ADC), but can also be adapted for use in flash-type ADCs. The circuit was fabricated using 0.18 μm CMOS technology, and its measured performance shows 12-bit resolution at 20 MHz comparison rate and 1 V single supply voltage, with a total power consumption of 63.5 μW.     

An 8-bit 100-MHz full-Nyquist analog-to-digital converter

An 8-bit 100-MHz full-Nyquist analog-to-digital (A/D) converter using a folding and interpolation architecture is presented. In a folding system a multiple use of comparator stages is implemented. A reduction in the number of comparators, equal to the number of times the signal is folded, is obtained. However, every quantization level requires a folding stage, thus no reduction in input circuitry is found. Interpolation between the outputs of the folding stages generates additional folding signals without the need for input stages. A reduction in input circuitry equal to the number of interpolations is obtained. The converter is implemented in an oxide-isolated bipolar process, requiring 800 mW from a single 5.2-V supply. A high-level model describing distortion caused by timing errors is presented. Considering clock timing accuracies needed to obtain the speed requirement, this distortion is thought to be the main speed limitation     

线阵CCD高速数据采集与实时处理系统

介绍了一种新型的线阵CCD高速数据采集与实时处理系统,其由高速ADC、高速缓存FIFO、比较器模块和数字信号处理器(DSP)构成,数据的存储和读取都由特殊设计的比较器模块启动,比较器的阈值自适应可调,使得FIFO只存储CCD输出的有效像元信号,从而减轻了DSP数据处理的负担,可实现实时处理。详细描述了系统工作原理、硬件电路及其控制逻辑和数据处理算法。本系统用于高速位移测量,实验表明,数据采集速率可达20MHz,最快响应时间为0.1ms,实时处理的效果较好。     

一种用于高精度D/A转换器的数字校准技术

介绍了一种用于400MSPS16位高精度电流舵D/A转换器的数字静态校准技术。该校准技术利用地址产生器、钟控比较器、SAR寄存器和校准DAC,构成逐次逼近式校准环路。利用该校准环路,可以自动完成高7位电流源阵列单元的校准,从而极大地提高电流源的匹配性。采用该校准技术的16位电流舵D/A转换器的DNL大于±0.5LSB,达到了真正的16位精度。     

连续时间Sigma Delta ADC设计和非理想因素分析

文章设计了一个用于物联网模拟基带的、低压、低功耗、宽带、连续时间Sigma Delta ADC,特别是对各种非理想因素（时钟抖动,环路延时,运放有限增益和带宽,比较器offset,DAC失配等）,基于matlab和simulink等工具进行了系统级仿真并得到各种非理想因素对系统性能的影响。电路架构采用3阶3bit前馈加反馈结构,电源电压1.2V,输入信号带宽为16MHz,过采样率为16,采样频率为512MHz。测试结果显示,SNR为60dB,SNDR为59.3dB,总功耗为22mW。     

A high-speed and high-resolution CMOS comparator with three-stage preamplifier

The accuracy of A/D and D/A converters depend largely upon their inner comparators. To guarantee 12-bit high resolution for an A/D converter, a precise CMOS comparator consisting of a three-stage differential preamplifier together with a positive feedback latch is proposed. Circuit structure, gain, the principle of input offset voltage storage and latching time constant for the comparator will be analyzed and optimized in this article. With 0.5 μm HYNIX mixed signal technology, the simulation result shows that the circuit has a precision of 400 μV at 20 MHz. The test result shows that the circuit has a precision of 600 μV at 16 MHz, and dissipates only 78 μW of power dissipation at 5 V. The size of the chip is 210 × 180 μm2. The comparator has been successfully used in a 10 MSPS 12-bit A/D converter. The circuit can be also used in a less than 13-bit A/D converter.     

A monolithic voltage-comparator array for A/D converters

Describes a monolithic circuit consisting of an array of 8 voltage comparators, a resistive voltage divider, and associated logic circuits. Intended as an encoding component for high-speed parallel A/D converters, this `3-bit quantizer' uses regeneration for voltage gain and signal storage. A Gray-code output minimizes the problem of comparator indecision. The principal error sources are an asymmetry-induced comparator offset with 2-mV standard deviation and a thermally induced offset of a much as /spl plusmn/2.5 mV, dependent on signal history. The quantizer has been incorporated in an experimental 6-bit 200 megasample/s (MS/s) A/D converter.     

10 GB/s bit-synchronizer circuit with automatic timing alignment byclock phase shifting using quantum-well AlGaAs/GaAs/AlGaAs

A bit-synchronizer circuit is presented which operated up to a bit rate of Gb/s. The circuit comprises two master-slave flip -flops for data sampling, two EXCLUSIVE-OR gates for clock phase adjustment, an active signal splitter, and an EXCLUSIVE-OR gate for data transition detection. The gain of the EXCLUSIVE-OR phase comparator circuit is measured to be 302 mV/rad for a 1010-bit sequence. The margins for monotonous phase comparison are ±54° relative to the `in bit cell center' position of the sampling clock edge. The circuit is fabricated by using an enhancement/depletion 0.3 μm recessed-gate AlGaAs/GaAs/AlGaAs quantum-well FET process. The chip has a power dissipation of 230 mW at a supply voltage of 1.90 V     

A 75-mW, 10-b, 20-MSPS CMOS subranging ADC with 9.5 effective bitsat Nyquist

A CMOS subranging analog-to-digital converter (ADC) incorporates several features to enhance performance and reduce power dissipation. The combination of an extended settling period for the fine references, absolute-value signal processing, and interpolation in the comparator banks alleviates the principal speed-limiting operation. A front-end sample-and-hold amplifier (SHA) provides sustained dynamic performance at high input frequencies and performs single-ended to differential conversion with a signal gain of two and with low distortion. The SHA holds its differential output for a full clock cycle while it simultaneously samples the next single-ended input, thereby allowing it to drive two comparator banks on consecutive clock phases. The remaining analog circuits are implemented in a fully differential manner. The use of pipelining allows every input sample to be processed by the same channel, thereby avoiding the use of ping-pong techniques, while providing a conversion latency of only two clock cycles. The dynamic performance with a single-ended input approaches that of an ideal ill-bit ADC, typically providing 9.7 effective bits for low input frequencies and 9.5 bits at Nyquist. This performance level is comparable to the best reported for 10-bit CMOS ADC's with differential inputs and significantly better than those with single-ended inputs. The typical maximum differential nonlinearity is ±0.4 LSB, and the maximum integral nonlinearity is ±0.55 LSB without trimming or calibration. With an ADC power of 55 mW plus an SHA power of 20 mW from a 5-V supply, the active area is 1.6 mm² in a 0.5-μm double-poly, double-metal CMOS technology     

Low-power 600MHz comparator for 0.5V supply voltage in 0.12 lm CMOS

A comparator, fabricated in a 1.5 V/0.12 mum CMOS process, is presented. The commonly separated reset and active-load transistors of typical comparators are combined. In the input part two NMOS transistors are added to reduce power consumption. At a supply voltage of 0.5 V the comparator works at a maximal clock of 600 MHz and consumes 18 muW     

DDS自动测试技术研究

重点研究了如何快速又精确地输出DDS的测试值并使测试值符合测试规范.基于NI卡板、信号分析仪、示波器和信号发生器,对DDS的特性参数进行测试研究.信号发生器提供时钟信号与比较器输入;信号分析仪对频域和调制域信号进行测试;示波器对时域信号进行测试;通过IabViEW编程得到DAC数字正弦波和输入数字码并实现测试自动化;最后将结果返回计算机,测试结果符合规范.实验证明,在实际应用中该方法快速精确并具有很好的通用性,可拓展到其他芯片的测试.