Pulsed laser deposition of (MoO3)1 − x(V2O5)x thin films: Preparation, characterization and gasochromic studies

In this study we demonstrate a new composite oxide thin films of (MoO₃)_1 − x(V₂O₅)_x, x = 0, 0.01, 0.03, and 0.05, fabricated by pulsed laser deposition (PLD). The performance of platinum (Pt) catalyst activated hydrogen gas sensor with modified (MoO₃)_1 − x(V₂O₅)_x thin films were investigated. The thickness of the (MoO₃)_1 − x(V₂O₅)_x thin film is about 600-650 nm and its surface has a uniform morphology. Our results show that the gasochromic sensors prepared by (MoO₃)_0.99(V₂O₅)_0.01 thin film exhibited excellent hydrogen sensibility. The response and recovery time are in the range of 9-15 min for coloration and bleaching at room temperature under H₂ atmosphere. The results also show that (MoO₃)_1 − x(V₂O₅)_x/Pt (x = 0.01, 0.03, 0.05) thin films perform better gasochromic capability than the pristine MoO₃/Pt sample.     

An investigation on electrochromic properties of (WO3)1−x-(Fe2O3)x thin films

In this research, the effect of Fe₂O₃ content on the electrochromic properties of WO₃ in thermally evaporated (WO₃)_1−x-(Fe₂O₃)_x thin films (0 ≤ x ≤ 0.4) has been studied. The atomic composition of the deposited metal oxides was determined by X-ray photoelectron spectroscopy analysis. The surface morphology of the thin films has been examined by atomic force microscopy. The surface roughness of all the films was measured about 1.3 nm with an average lateral grain size of 30 nm showing a smooth and nanostructured surface. The electrochromic properties of (WO₃)_1−x-(Fe₂O₃)_x thin films deposited on ITO/glass substrate were studied in a LiClO₄ + PC electrolyte by using ultraviolet-visible spectrophotometry. It was shown that increasing the Fe₂O₃ content leads to reduction of the optical density (ΔOD) of the colored films and also leads to increasing the optimum coloring voltage from 4 to 6 V in which ΔOD shows its maximum values, in our experimental conditions. Furthermore, by using this procedure, it is possible to make an electrochromical filter which behaves similar to the colored WO₃ film in the visible region, while it can be nearly transparent for near-infrared wavelengths, in contrast of the pure colored WO₃ film.     

Large electrocaloric effect of highly (100)-oriented 0.68PbMg1/3Nb2/3O3-0.32PbTiO3 thin films with a Pb(Zr0.3Ti0.7)O3/PbOx buffer layer

0.68PbMg_1/3Nb_2/3O₃-0.32PbTiO₃ (PMN-PT) thin films with a lead zirconate titanate Pb(Zr_0.3Ti_0.7)O₃ (PZT)/PbO_x buffer layer were deposited on Pt/TiO₂/SiO₂/Si substrates by radio frequency magnetron sputtering technique, and pure perovskite crystalline phase with highly (100)-preferred orientation was formed in the ferroelectric films. We found that the highly (100)-oriented thin films possess not only excellent dielectric and ferroelectric properties but also a large electrocaloric effect (13.4 K at 15 V, i.e., 0.89 K/V) which is attributed to the large electric field-induced polarization and entropy change during the ferroelectric-paraelectric phase transition. The experimental results indicate that the use of PZT/PbO_x buffer layer can induce the crystal orientation and phase purity of the PMN-PT thin films, and consequently enhance their electrical properties.     

Microstructure and electrical properties of Ba0.7Sr0.3(Ti1 − xZrx)O3 thin films prepared on copper foils with sol-gel method

Ba_0.7Sr_0.3(Ti_1 − xZr_x)O₃ (x = 0, 0.1, 0.2) (BSZT) thin films have been prepared on copper foils using sol-gel method. The films were annealed in an atmosphere with low oxygen pressure so that the substrate oxidation was avoided and the formation of the perovskite phase was allowed. The X-ray diffraction results show a stable polycrystalline perovskite phase, with the diffraction peaks of the BSZT films shifting toward the smaller 2θ with increasing Zr content. Scanning electron microscopy images show that the grain size of the BSZT thin films decreases with increasing Zr content. High resolution transmission electron microscopy shows the clear lattice and domain structure in the film. The dielectric peaks of the BSZT thin films broaden with increasing Zr content. Leakage current density of Ba_0.7Sr_0.3(Ti_1 − xZr_x)O₃ (x = 0.1) thin film is the lowest over the whole applied voltage.     

High-purity TeO2–WO3–(La2O3, Bi2O3) glasses for fiber-optics

TeO₂–WO₃, TeO₂–WO₃–La₂O₃ and TeO₂–WO₃–La₂O₃–Bi₂O₃ glasses were produced by high-purity oxides mixtures melting in crucibles of gold or platinum in purified oxygen atmosphere. The total content of Cu, Mn, Fe, Co and Ni impurities was not more than 0.1–2 ppm wt in glasses and below 0.1 ppm wt in the initial oxides. The hydroxyl groups absorption coefficients of the tellurite glasses at the maximum of the absorption band (λ ∼ 3 μm) lay in the region of 0.01–0.001 cm⁻¹. Stability to crystallization characterized by T_x − T_g = 150–190 °C was demonstrated for high purity 75TeO₂–25WO₃ glasses by DSC-measurements. There were no thermal effects of crystallization and crystallized phases fusion in case of La₂O₃-containing glasses.The optical absorption losses, measured by the laser calorimetry method at λ = 1.06, 1.56 and 1.97 μm, did not exceed 40–120 dB/km for glass samples. The multimode optical fibers with optical losses of 50–250 dB/km at 1.2–2.2 μm were produced from high-purity TeO₂–WO₃–(La₂O₃, Bi₂O₃) glasses.     

The effect of heat treatment on physical properties of nanograined (WO3)1-x-(Fe2O3)x thin films

Thin films of (WO₃)_1-x-(Fe₂O₃)_x composition were deposited by thermal evaporation on glass substrates and then all samples were annealed at 200-500 °C in air. Optical properties such as transmittance, reflectance, optical bangap energy, and the optical constants of the “as deposited” and the annealed films were studied using ultraviolet-visible spectrophotometry. It was shown that the annealing process changes the film optical properties which were related to Fe₂O₃ concentration. Moreover, using X-ray photoelectron spectroscopy, we have indicated that WO₃ is stoichiometric, while iron oxide was in both FeO and Fe₂O₃ compositions so that the FeO composition converted to Fe₂O₃ after the annealing process. Using atomic force microscopy, it was observed that surface of the “as deposited” films were smooth with a nanometric grain size. The film surface remained unchanged after annealing up to 300 °C. Surface roughness and the grain size of the films with x = 0, 0.05, and 0.75 highly increased at higher annealing temperatures (400 and 500 °C), but were nearly unchanged for medium x-values (0.3 and 0.4).     

Electrical properties of Pb0.97La0.02(Zr0.95Ti0.05)O3 antiferroelectric thin films on TiO2 buffer layer

Pb_0.97La_0.02(Zr_0.95Ti_0.05)O₃ antiferroelectric thin films with thickness of 500 nm were successfully deposited on TiO₂ buffered Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) and Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) substrates via sol-gel process. Microstructure of Pb_0.97La_0.02(Zr_0.95Ti_0.05)O₃ thin films was studied by X-ray diffraction analyses. The antiferroelectric nature of the Pb_0.97La_0.02(Zr_0.95Ti_0.05)O₃ thin films was confirmed by the double hysteresis behaviors of polarization and double buffer fly response of dielectric constant versus applied voltage at room temperature. The capacitance-voltage behaviors of the Pb_0.97La_0.02(Zr_0.95Ti_0.05)O₃ films with and without TiO₂ buffer layer were studied, as a function of temperature. The temperature dependence of dielectric constant displayed a similar behavior and the Curie temperature (T_c) was 193 °C for films on both substrates. The current caused by the polarization and depolarization of polar in the Pb_0.97La_0.02(Zr_0.95Ti_0.05)O₃ films was detected by current density-electric field measurement.     

Electrical properties of Pb(Mg1/3Nb2/3)O3-PbTiO3 ceramics modified with WO3

Ferroelectrics 0.67Pb (Mg_1/3Nb_2/3)O₃-0.33PbTiO₃ (PMN-PT) + x mol% WO₃ (x=0.1, 0.5, 1, 2) were prepared by columbite precursor method. Electrical properties of WO₃-modified ferroelectrics were investigated. X-ray diffraction (XRD) was used to identify crystal structure, and pyrochlore phase were observed in 0.67Pb (Mg_1/3Nb_2/3)O₃-0.33PbTiO₃+2 mol% WO₃. Dielectric peak temperature decreased with WO₃ doping, indicating that W⁶⁺ incorporated into PMN-PT lattice. Lattice constant, pyrochlore phase and grain size contribute to the variation of K_max. Both piezoelectric constant (d₃₃) and electromechanical coupling factors (k_p) were enhanced by doping 0.1 mol% WO₃, which results from the introduction of “soft” characteristics into PMN-PT, while further WO₃ addition was detrimental. We consider that the two factors, introduction of “soft” characteristics and the formation of pyrochlore phase, appear to act together to cause the variation of piezoelectric properties of 0.67PMN-0.33PT ceramics doping with WO₃.     

Novel transparent conducting oxide: Anatase Ti1−xNbxO2

Single-crystalline Ti_1−xNb_xO₂ (x = 0.2) films of 40 nm thickness were deposited on SrTiO₃ (100) substrates by the pulsed laser deposition (PLD) technique. X-ray diffraction measurement confirmed epitaxial growth of anatase (001) film. The resistivity of Ti_1−xNb_xO₂ films with x ≥ 0.03 is 2-3 × 10^− 4 Ω cm at room temperature. The carrier density of Ti_1−xNb_xO₂, which is almost proportional to the Nb concentration, can be controlled in a range of 1 × 10¹⁹ to 2 × 10²¹ cm^− 3. Optical measurements revealed that internal transmittance in the visible and near-infrared region for films with x = 0.03 was more than 97%. These results demonstrate that the presently developed anatase Ti_1−xNb_xO₂ is one of the promising candidates for the practical TCOs.     

Nanoscale study by piezoresponse force microscopy of relaxor 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 and 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3 thin films grown on platinum and LaNiO3 electrodes

Relaxor 0.7Pb(Mg_1/3Nb_2/3)O₃-0.3PbTiO₃ (70/30 PMN-PT) and 0.9Pb(Mg_1/3Nb_2/3)O₃-0.1PbTiO₃ (90/10 PMN-PT) thin films have been grown by RF-sputtering on platinum (Pt) and lanthanum nickelate (LaNiO₃) bottom electrodes. For both electrodes, macroscopic measurements evidence lower coercive fields, remnant polarizations and piezoelectric coefficients d₃₃ for 90/10 PMN-PT films compared to 70/30 PMN-PT films. For both compositions, coercive fields and remnant polarizations are lower for films grown on LaNiO₃ compared to on Pt while piezoelectric coefficients d₃₃ are higher. For each electrode and composition, a similar behavior is revealed for electromechanical activity at the nanoscale when measuring local piezoelectric hysteresis loops; on the other hand, the voltages required for switching the domains are the highest for 90/10 PMN-PT films grown on LaNiO₃. The existence of large grain boundaries in the films grown on Pt and the presence of local random fields with polar nano-domains for the 90/10 composition could explain the differences measured in domains switching properties at the macroscale and nanoscale levels.     

Diffuse transition and piezoelectric properties of Pb[(Zr1−xTix)0.74(Mg1/3Nb2/3)0.20(Zn1/3Nb2/3)0.06]O3 Ceramics

In this work, the piezoelectric ceramic system of Pb[(Zr_1−xTi_x)_0.74(Mg_1/3Nb_2/3)_0.20(Zn_1/3Nb_2/3)_0.06]O₃, 0.47≤x≤0.57, with composition close to the morphotropic phase boundary, was studied. From the results of X-ray diffraction and piezoelectric measurement, ceramics near x=0.51 were found at the morphotropic phase boundary (MPB) between the tetragonal and pseudocubic perovskite. The planar coupling factor (k_p=0.72) is high at compositions near the MPB, but the mechanical quality factor (Q_m=75) is low. The calculation of the diffuseness of phase transition shows that the region of phase coexistence of this system is broader than that of the ternary system.     

Ferroelectric and dielectric multilayer heterostructures based on KTa0.65Nb0.35O3 and Bi1.5-xZn0.92-yNb1.5O6.92-1.5x-y grown by pulsed laser deposition and chemical solution deposition for high frequency tunable devices

Epitaxial growth of Bi_1.5-xZn_0.92-yNb_1.5O_6.92-1.5x-y (BZN) thin films was achieved on (100)_pc LaAlO₃ substrate by pulsed laser deposition (PLD) and by chemical solution deposition based on Pechini process. Effect of bismuth and zinc deficiency on the BZN thin films obtained by PLD was discussed, in relation with the starting target composition. Dielectric permittivity and bandgap values were determined from electrical and spectroscopic ellipsometry measurements performed on randomly oriented films grown on Pt/Si substrate. BZN thin films obtained by PLD exhibit, at 100 kHz, a dielectric constant of ε_r = 203 and quite low dielectric losses of tanδ = 5 × 10^− 2. Epitaxial ferroelectric − dielectric KTa_0.65Nb_0.35O₃ (KTN) − Bi_1.5-xZn_0.92-yNb_1.5O_6.92-1.5x-y (KTN on BZN and BZN on KTN) bilayers were obtained by PLD on (100)_pc LaAlO₃ with the insertion of a suitable buffer layer of KNbO₃ in the case of KTN on BZN. Such multilayer heterostructures with an epitaxial growth control of each layer are promising candidates for potential integration in microwave devices.     

Silver loaded WO3 − x/TiO2 composite multifunctional thin films

Multifunctional WO_3 − x-TiO₂ composite thin films have been prepared by sol-gel synthesis and shown to be good visible light photocatalysts whilst retaining a desirable underlying blue colouration. The WO_3 − x-TiO₂ composite thin films were further enhanced using silver nanoparticles synthesised in-situ on the surface from the photo-degradation of silver nitrate solution. Thin films were characterised using X-ray diffraction, Raman, Scanning electron microscopy and UV-visible spectroscopy and shown to photo degrade stearic acid, using white light λ = 420-800 nm.     

Studying trivalent/bivalent metal ion doped TiO2 as p-TiO2 in bipolar heterojunction devices

Trivalent/bivalent metal ions doped TiO₂ thin films (M_xTi_1−xO₂, M = Cr³⁺, Fe³⁺, Ni²⁺, Co²⁺, Mn²⁺ and x = 0.01, 0.05, 0.1, 0.15, 0.2) were deposited on Indium–tin oxide (ITO) coated glass substrates by spin coating technique. X-ray photoelectron spectroscopy (XPS) showed Ti⁴⁺ oxidation state of the Ti2p band in the doped p-TiO₂. The homogenous M_xTi_1−xO₂ was used to support n-ZnO thin films with thickness ∼40–80 nm and vertically aligned n-ZnO nanorods (NR) with length ∼300 nm and 1.5 μm. Current (I)–voltage (V) characteristics for the Ag/n-ZnO/M_xTi_1−xO₂/ITO/glass assembly showed rectifying behavior with small turn-on voltages (V₀) < 1 V. The ideality factor (η) and the resistances in both forward and reverse bias were calculated. The temperature dependence performance of these bipolar devices was performed and variation of the parameters with temperature was studied.     

Magnetic softness and interparticle exchange interactions of (Fe65Co35)1 − x(Al2O3)x (x = 0-0.50) nanogranular films

The effect of Al₂O₃ content on the structure, electrical properties, magnetic properties, and interparticle exchange interactions of (Fe₆₅Co₃₅)_1 − x(Al₂O₃)_x films with Al₂O₃ volume fractions x ranging from 0 to 0.50 was systematically investigated. Among the films with x between 0 and 0.25, the lowest coercivity of 0.56 kA/m was achieved in the (Fe₆₅Co₃₅)_0.82(Al₂O₃)_0.18 film. This is ascribed to the strongest exchange interactions between the Fe₆₅Co₃₅ nanoparticles in this film. Combined with the microstructure analysis of the (Fe₆₅Co₃₅)_1 − x(Al₂O₃)_x films, the modified Herzer's model was extended to interpret the variation of the coercivity with x and analyze the effect of the exchange interactions between the Fe₆₅Co₃₅ nanoparticles on the magnetic softness. The remanence curves confirm the existence of the exchange interactions and reveal the evolution of the exchange interaction strength with Al₂O₃ content.     

Synthesis and electrochemical properties of Nb-doped Li3V2(PO4)3/C cathode materials for lithium-ion batteries

Li₃V_2−xNb_x(PO₄)₃/C cathode materials were synthesized by a sol-gel method. X-ray diffraction patterns demonstrated that the appropriate addition of Nb did not destroy the lattice structure of Li₃V₂(PO₄)₃, and enlarged the unit cell volume, which could provide more space for lithium intercalation/de-intercalation. Transmission electron microscopy and energy dispersive X-ray spectroscopy analysis illustrated that Nb could not only be doped into the crystal lattice, but also form an amorphous (Nb, C, V, P and O) layer around the particles. As the cathode materials of Li-ion batteries, Li₃V_2−xNb_x(PO₄)₃/C (x ≤ 0.15) exhibited higher discharge capacity and better cycle stability than the pure one. At a discharge rate of 0.5C, the initial discharge capacity of Li₃V_1.85Nb_0.15(PO₄)₃/C was 162.4 mAh/g. The low charge-transfer resistances and large lithium ion diffusion coefficients confirmed that Li₃V_2−xNb_x(PO₄)₃/C samples possessed better electronic conductivity and lithium ion mobility. These improved electrochemical performances can be attributed to the appropriate amount of Nb doping in Li₃V₂(PO₄)₃ system by enhancing structural stability and electrical conductivity.     

Characterization of nanostructured photosensitive (NiS)x(CdS)(1−x) composite thin films grown by successive ionic layer adsorption and reaction (SILAR) route

Recently ternary semiconductor nanostructured composite materials have attracted the interest of researchers because of their photovoltaic applications. Thin films of (NiS)_x(CdS)_(1−x) with variable composition (x = 1-0) had been deposited onto glass substrates by the successive ionic layer adsorption and reaction (SILAR) method. As grown and annealed films were characterised by X-ray diffraction, scanning electron microscopy and EDAX to investigate structural and morphological properties. The (NiS)_x(CdS)_(1−x) films were polycrystalline in nature having mixed phase of rhombohedral and hexagonal crystal structure due to NiS and CdS respectively. The optical and electrical properties of (NiS)_x(CdS)_(1−x) thin films were studied to determine compsition dependent bandgap, activation energy and photconductivity. The bandgap and activation energy of annealed (NiS)_x(CdS)_(1−x) film decrease with improvement in photosensitive nature.     

Structure of post-annealed ferroelectric PbZrxTi1-xO3 and SrBi2Ta2O9 thin films

In order to fabricate good quality ferroelectric thin films, PbZr_xTi_(1-x)O₃ (PZT) and SrBi₂Ta₂O₉ (SBT) films were fabricated on SiO₂/Si(100) substrates and on Pt/Ti/ SiO₂/Si(100) substrates by pulsed laser excimer deposition (PLD). X-ray diffraction, Rutherford backscattering analysis, and atomic force microscopy were used to characterize the structural properties of the samples, which were post-annealed at different temperatures. The results showed that the PZT and SBT films fabricated on Pt/Ti/SiO₂/Si(100) substrates and annealed at 700 °C exhibited optimum properties.     

Yb-doped NaBi(WO4)2 fibre single crystals grown by the micro-pulling down technique and emission spectroscopic characterization

NaBi_1−xYb_x(WO₄)₂ fibres single crystals were successfully grown by micro-pulling down technology (MPD). The Yb³⁺-doped NaBi(WO₄)₂ fibres single crystals have been pulled using MPD technique with controlled diameter and stationary stable growth conditions corresponding to flat crystallization interface with meniscus length equal to the fibre radii and pulling rate range [6-48 mm h⁻¹]. We have determined the monophased field of NaBi_1−xYb_x(WO₄)₂ for x ≤ 0.3. The lattices parameters decrease as a function of Yb³⁺ substitution in Bi³⁺ sites. The melt behaviour has been study by DTA/TG analysis. We have found that the stoichiometric compounds NaBi(WO₄)₂ melt congruently at 935 °C. The fibre diameters varied from 0.5 to 1 mm depending on the capillary die diameter, pulling rate and the molten zone temperature. Complementary Yb³⁺ spectroscopic characterization in the NaBi(WO₄)₂ lattice has been done by IR emission measurements under laser pumping at room temperature.     

Distribution of pyrochlore phase in Pb(Mg1/3Nb2/3)O3-PbTiO3 films and suppression with a Pb(Zr0.52Ti0.48)O3 interfacial layer

Thin films of the relaxor ferroelectric Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ (PMN-PT) on Pt/Ti/SiO₂/Si (Pt/Si) substrates both with and without a Pb(Zr_0.52Ti_0.48)O₃ (PZT) interfacial layer were investigated. Perovskite and pyrochlore coexistence was observed for PMN-PT thin films without a PZT interfacial layer. Interestingly, most of the pyrochlore phase was observed in single-coated films and in the first layer of multi-coated films. The pyrochlore phase exhibited grains with an average size of about 25 nm, which is smaller than those of the perovskite phase (about 90 nm). In contrast, for PMN-PT thin films grown on a PZT interfacial layer, the formation of a pyrochlore phase at the interface between PMN-PT layers and the substrate is completely suppressed. Moreover, small grains are not observed in the films with a PZT interfacial layer. The measured polarization-electric field (P-E) hysteresis loops of PMN-PT films with and without PZT layers indicate that enhanced electrical properties can be obtained when a PZT interfacial layer is used. These enhanced properties include an increase in the value of remanent polarization P_r from 2.7 to 5.8 μC/cm² and a decrease in the coercive field E_c from 60.5 to 28.0 kV/cm.