The electron spectro-microscopy beamline at National Synchrotron Light Source II: a wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy (μ-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 μm for ARPES and 0.5 μm for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.     

A pulsed electron gun for ultrafast electron diffraction at surfaces

The construction of a pulsed electron gun for ultrafast reflection high-energy electron diffraction experiments at surfaces is reported. Special emphasis is placed on the characterization of the electron source: a photocathode, consisting of a 10 nm thin Au film deposited onto a sapphire substrate. Electron pulses are generated by the illumination of the film with ultraviolet laser pulses of femtosecond duration. The photoelectrons are emitted homogeneously across the photocathode with an energy distribution of 0.1 eV width. After leaving the Au film, the electrons are accelerated to kinetic energies of up to 15 keV. Focusing is accomplished by an electrostatic lens. The temporal resolution of the experiment is determined by the probing time of the electrons traveling across the surface which is about 30 ps. However, the duration of the electron pulses can be reduced to less than 6 ps.     

Design of the injection beamline for the Californium Rare Isotope Breeder Upgrade electron beam ion source charge breeder

The design of the ion injection line connecting the electron beam ion source (EBIS) charge breeder and the Californium Rare Isotope Breeder Upgrade radio frequency quadrupole cooler-buncher at the Argonne Tandem Linear Accelerator System was investigated with particle tracking simulations. The injection line was configured to accommodate several differential pumping sections, individual optical components were optimized to minimize emittance growth, and the ion beam parameters were matched with the EBIS electron beam acceptance to minimize losses upon injection.     

Secondary electron emission from distributed ion scattering off surfaces for space instrumentation

We present an alternative method for generating start electrons for time of flight (TOF) space plasma analyzers. The technique presented here takes advantage of the processes occurring during the scattering of the particles off a surface, i.e., kinetic electron emission. The use of a thin microchannel plate as a scattering surface allows us to distribute this surface along a single plane normal to the particle velocity. The uncertainty on the TOF distance is thus minimized, allowing a greater mass resolution. The first tests carried out showed that a mass resolution of 10 for a beam energy of 10 keV is easily reachable.     

A very low energy compact electron beam ion trap for spectroscopic research in Shanghai

In this paper, a new compact low energy electron beam ion trap, SH-PermEBIT, is reported. This electron beam ion trap (EBIT) can operate in the electron energy range of 60-5000 eV, with a current density of up to 100 A/cm(2). The low energy limit of this machine sets the record among the reported works so far. The magnetic field in the central drift tube region of this EBIT is around 0.5 T, produced by permanent magnets and soft iron. The design of this EBIT allows adjustment of the electron gun's axial position in the fringe field of the central magnetic field. This turned out to be very important for optimizing the magnetic field in the region of the electron gun and particularly important for low electron beam energy operation, since the magnetic field strength is not tunable with permanent magnets. In this work, transmission of the electron beam as well as the upper limit of the electron beam width under several conditions are measured. Spectral results from test operation of this EBIT at the electron energies of 60, 315, 2800, and 4100 eV are also reported.     

A collimator for hot plasma x-ray diagnostics in ion sources

We present a collimator configuration for measuring energy resolved x-ray plasma volume bremsstrahlung emitted, e.g., by an ECRIS. Special attention we paid to shielding the detector against interfering Compton scattered radiation and wall bremsstrahlung stemming from the collimator entrance aperture. We estimate the efficiency for shielding of Compton scattered radiation at least attainable by this arrangement.     

Low energy ion counting efficiency of a Johnston electron multiplier

We report a measurement of the absolute efficiency of a Johnston Laboratories MMl electron multiplier for detection of 2-4 keV Ne(+). The measured detection efficiency depends both on ion impact energy and on the magnitude and direction of an externally applied electric field near the first dynode.     

Inclined slot-excited annular electron cyclotron resonance plasma source for hyperthermal neutral beam generation

An inclined slot-excited antenna (ISLAN) electron cyclotron resonance (ECR) plasma source is newly designed and constructed for higher flux hyperthermal neutral beam (HNB) generation. The developed ISLAN source is modified from vertical slot-excited antenna (VSLAN) source in two aspects: one is the use of inclined slots instead of vertical slots, and the other is a cusp magnetic field configuration rather than a toroidal configuration. Such modifications allow us to have more uniform arrangement of slots and magnets, then enabling plasma generation more uniform and thinner. Moreover, ECR plasma allows higher ionization rate, enabling plasma density higher even in submillitorr pressures, therefore decreasing the collision rate and∕or the reionization rate of the reflected atoms while passing through the plasma, and eventually getting higher flux of HNBs. In this paper, we report the design features and the plasma characteristics of the ISLAN source by doing plasma measurements and electromagnetic simulations. It was found that ISLAN source can be a high potential source for larger flux HNB generation; the source was found to give higher plasma densities and better uniformities than inductively coupled plasma source, particularly in low pressure ranges. Also, it is important that using ISLAN gives easier matching and better stability, i.e., ISLAN shows similar field patterns and good plasma symmetries irrespective of the variations of the mean diameter of the ring resonator and∕or the presence of a limiter or a reflector, and the operating pressures.     

A synchrotron beamline for extreme-ultraviolet photoresist testing

Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contamination potential of the outgas products of a candidate resist by simultaneously irradiating a multilayer optic and a nearby resist-coated wafer with EUV radiation. The facility can also be used without changing its configuration to provide accurate resist dose-to-clear measurements. Detailed, real-time information on the rate of contamination growth is given by a unique, in situ imaging ellipsometer. We will describe the optical layout, mechanical design, and capabilities of the beamline, finally presenting experimental examples of its capabilities.     

Multipurpose modular experimental station for the DiProI beamline of Fermi@Elettra free electron laser

We present a compact modular apparatus with a flexible design that will be operated at the DiProI beamline of the Fermi@Elettra free electron laser (FEL) for performing static and time-resolved coherent diffraction imaging experiments, taking advantage of the full coherence and variable polarization of the short seeded FEL pulses. The apparatus has been assembled and the potential of the experimental setup is demonstrated by commissioning tests with coherent synchrotron radiation. This multipurpose experimental station will be open to general users after installation at the Fermi@Elettra free electron laser in 2011.     

Advanced light ion source extraction system for a new electron cyclotron resonance ion source geometry at Saclay

One of the main goal of intense light ion injector projects such as IPHI, IFMIF, or SPIRAL2, is to produce high current beams while keeping transverse emittance as low as possible. To prevent emittance growth induced in a dual solenoid low energy transfer line, its length has to be minimized. This can be performed with the advanced light ion source extraction system concept that we are developing: a new ECR 2.45 GHz type ion source based on the use of an additional low energy beam transport (LEBT) short length solenoid close to the extraction aperture to create the resonance in the plasma chamber. The geometry of the source has been considerably modified to allow easy maintenance of each component and to save space in front of the extraction. The source aims to be very flexible and to be able to extract high current ion beams at energy up to 100 kV. A specific experimental setup for this source is under installation on the BETSI test bench, to compare its performances with sources developed up to now in the laboratory, such as SILHI, IFMIF, or SPIRAL2 ECR sources. This original extraction source concept is presented, as well as electromagnetic simulations with OPERA-2D code. Ion beam extraction in space charge compensation regime with AXCEL, and beam dynamics simulation with SOLMAXP codes show the beam quality improvement at the end of the LEBT.     

A 2.45 GHz electron cyclotron resonance proton ion source and a dual-lens low energy beam transport

The structure and preliminary commissioning results of a new 2.45 GHz ECR proton ion source and a dual-lens low energy beam transport (LEBT) system are presented in this paper. The main magnetic field of the ion source is provided by a set of permanent magnets with two small electro-solenoid magnets at the injection and the extraction to fine tune the magnetic field for better microwave coupling. A 50 keV pulsed proton beam extracted by a three-electrode mechanism passes through the LEBT system of length of 1183 mm. This LEBT consists of a diagnosis chamber, two Glaser lenses, two steering magnets, and a final beam defining cone. A set of inner permanent magnetic rings is embedded in each of the two Glaser lenses to produce a flatter axial-field to reduce the lens aberrations.     

Imaging friction tracks at diamond surfaces using reflection electron microscopy

Reflection electron microscopy (REM) is applied to image the structure of polished natural diamond (001) surfaces (of 5 × 4 mm size) after friction experiments under a pressure below the critical value. Friction tracks marked by a diamond needle after a single pass movement under a pressure of 13 GPa can be seen in REM images and show non-uniform contrast. The surface shows relatively dark image contrast at the light contacted area, which is possibly due to the structural modification at the top atomic layer. The high local contacting pressure pushes part of the needle into the surface which causes fracture, resulting in the formation of grooves at the surface. It is possible to have plastic deformation in this process, but no evidence has been found for the presence of cracking. The observations support the adhesion frictional mechanism rather than the micro-cleavage model.     

Degradation, amorphization, and recrystallization of ion bombarded Si(111) surfaces studied by in situ reflection electron microscopy and reflection high energy electron diffraction techniques.

In this paper we report the effect of noble gas ions bombardment on the degradation of atomically flat Si(111) surfaces at room and high (400 degrees C-600 degrees C) temperatures. Reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) have been used to characterize the topography and structure of the as-implanted and post annealed surface layers. It is shown that the fading of the specularly reflected beam is not directly related to the amorphization of the surface. This experimental study has also evidenced the difficulties one meets to regrow a defect-free material after amorphization by noble gas bombardment. For high temperature for which the amorphization is not possible, the surface loses its stepped structure and turns into a monocrystalline but atomically rough surface. This roughness is a function of substrate temperature.     

A parallel plate avalanche detector for low energy ion identification

A setup for identifying low-energy (1–10 MeV) ions with charges Z ≥ 1 by simultaneously measuring the energy losses and the time of flight is described. The setup is composed of a multiwire proportional chamber and a strip silicon detector, which are used to measure the ion energy, and two low-pressure avalanche wireless detectors for measuring the energy losses and the time of flight. Results obtained in measuring α particles from ²²⁶Ra source and p, Be, C, and O ions produced on the ITs-100 cyclotron at the Flerov Laboratory of Nuclear Reactions are presented.     

Programmable smart electron emission controller for hot filament

In electron ionization source, electrons are produced through thermionic emission by heating a wire filament, accelerating the electrons by high voltage, and ionizing the analyzed molecules. In such a system, one important parameter is the filament emission current that determines the ionization rate; therefore, one needs to regulate this current. On the one hand, fast responses control is needed to keep the emission current constant, but on the other hand, we need to protect the filament from damage that occurs by large filaments current transients and overheating. To control our filament current and emission current, we developed a digital circuit based on a digital signal processing controller that has several modes of operation. We used a smart algorithm that has a fast response to a small signal and a slow response to a large signal. In addition, we have several protective measures that prevent the current from reaching unsafe values.     

A particle-in-cell Monte Carlo code for electron beam ion source simulation

FAR-TECH, Inc., has developed a particle-in-cell Monte Carlo code (EBIS-PIC) to model ion motions in an electron beam ion source (EBIS). First, a steady state electron beam is simulated by the PBGUNS code (see http://far-tech.com/pbguns/index.html). Then, the injected primary ions and the ions from the background neutral gas are tracked in the trapping region using Monte Carlo method. Atomic collisions and Coulomb collisions are included in the EBIS-PIC model. The space charge potential is updated by solving the Poisson equation each time step. The preliminary simulation results are presented and compared with BNL electron beam test stand (EBTS) fast trapping experiments.     

Retarding field analyzer for ion energy distribution measurements at a radio-frequency biased electrode

A retarding field energy analyzer designed to measure ion energy distributions impacting a radio-frequency biased electrode in a plasma discharge is examined. The analyzer is compact so that the need for differential pumping is avoided. The analyzer is designed to sit on the electrode surface, in place of the substrate, and the signal cables are fed out through the reactor side port. This prevents the need for modifications to the rf electrode--as is normally the case for analyzers built into such electrodes. The capabilities of the analyzer are demonstrated through experiments with various electrode bias conditions in an inductively coupled plasma reactor. The electrode is initially grounded and the measured distributions are validated with the Langmuir probe measurements of the plasma potential. Ion energy distributions are then given for various rf bias voltage levels, discharge pressures, rf bias frequencies--500 kHz to 30 MHz, and rf bias waveforms--sinusoidal, square, and dual frequency.     

A device for prompt measuring of the maximum electron energy

A simple compact device for prompt evaluation of the maximum electron energy has been developed. ЦВИД-01-1 and ЦВИД-3 color film indicators were used as detectors of electrons. The results of ARSA accelerator experiments were compared to those obtained using a semicircular magnetic spectrometer. The difference in the measured maximum electron energies was at most 8%.     

Experimental electron energy distribution function investigation at initial stage of electron cyclotron resonance discharge

Experimental investigation is undertaken to study formation of electron energy distribution function (EEDF) at the initial stage of electron cyclotron resonance (ECR) discharge inside magnetic mirror trap. In experiment, where discharge was initiated by high power radiation of gyrotron operated in the mm-wavelength range, electrons were revealed to leave the trap having EEDF be quite different from Maxwellian one. Specifically, the EEDF was found to decrease slowly with energy up to 400-500 keV and drops abruptly further. The possible physical mechanisms are discussed to explain losses of high energy electrons from the trap and a limitation of their energy.