Lifetime of Combined $k$-out-of-$n$ , and Consecutive $k_{c}$ -out-of-$n$ Systems

A combined k-out-of-n:F(G) & consecutive k_c -out-of-n :F(G) system fails (functions) iff at least k components fail (function), or at least fcc consecutive components fail (function). Explicit formulas are given for the lifetime distribution of these combined systems whenever the lifetimes of components are exchangeable, and have an absolutely continuous joint distribution. The lifetime distributions of the aforementioned systems are represented as a linear combination of distributions of order statistics by using the concept of Samaniego's signature. Formulas for the mean lifetimes are given. Some numerical results are also presented.     

An Efficient Algorithm for Computing the Reliability of Consecutive-$k$-Out-Of-$n$:F Systems

Many algorithms for computing the reliability of linear or circular consecutive-k-out-of-n:F systems appeared in this Transactions. The best complexity estimate obtained for solving this problem is O(k³ log(n/k)) operations in the case of i.i.d. components. Using fast algorithms for computing a selected term of a linear recurrence with constant coefficients, we provide an algorithm having arithmetic complexity O(k log (k) log(log(k)) log(n)+k^omega) where 2相似文献   

Performance evaluation of generalized multi-state k-out-of-n systems

The generalized multi-state k-out-of-n:G system model defined by Huang provides more flexibilities for modeling of multi-state systems. However, the performance evaluation algorithm they proposed for such systems is not efficient, and it is applicable only when the k/sub i/ values follow a monotonic pattern. In this paper, we defined the concept of generalized multi-state k-out-of-n:F systems. There is an equivalent generalized multi-state k-out-of-n:G system with respect to each generalized multi-state k-out-of-n:F system, and vice versa. The form of minimal cut vector for generalized multi-state k-out-of-n:F systems is presented. An efficient recursive algorithm based on minimal cut vectors is developed to evaluate the state distributions of a generalized multi-state k-out-of-n:F system. Thus, a generalized multi-state k-out-of-n:G system can first be transformed to the equivalent generalized multi-state k-out-of-n:F system, and then be evaluated using the proposed recursive algorithm. Numerical examples are given to illustrate the effectiveness and efficiencies of the proposed recursive algorithms.     

Achievable Limits on the Reliability of $k$-out-of- $n$:G Systems Subject to Imperfect Fault Coverage

Systems which must be designed to achieve very low probabilities of failure often use redundancy to meet these requirements. However, redundant k-out-of-n:G systems which are subject to imperfect fault coverage have an optimum level of redundancy, n _opt. That is to say, additional redundancy in excess of nopt will result in an increase, not a decrease, in the probability of system failure. This characteristic severely limits the level of redundancy considered in the design of highly reliable systems to modest values of n. Correct modeling of imperfect coverage is critical to the design of highly reliable systems. Two distinctly different k-out-of-n:G imperfect fault coverage reliability models are discussed in this paper: Element Level Coverage (ELC), and Fault Level Coverage (FLC). ELC is the appropriate model when each component can be assigned a given coverage level, while FLC is the appropriate model for systems using voting as the primary means of selection among redundant components. It is shown, over a wide range of realistic coverage values and relatively high component reliabilities, that the optimal redundancy level for ELC systems is 2 and 4 for FLC systems. It is also shown that the optimal probability of failure for FLC systems exceeds that of ELC systems by several orders of magnitude. New functions for computing the mean time to failure for i.i.d. k-out-of-n:G ELC, and FLC systems are also presented.     

Two-Way Handshaking Circular Sequential $k$-Out-of- $n$ Congestion System

Many communication systems require a two-way, or three-way handshaking process to improve their dependability & authenticity in order to achieve a more successful operation. In this paper, we present a new two-way handshaking reliability model based upon threshold-based cryptography systems. Such systems require a two-way handshaking process to i) establish a group of participated servers in the first handshaking process, and ii) calculate a cipher with successfully connected servers collaboratively in the second handshaking process. When the servers are attempted, each server has three known connection probabilities in the following three states: i) successful, ii) breakdown, and iii) congested. These connection probabilities are unchanged in both handshaking processes. During the first handshaking process, we establish connections that more than servers are willing to participate. For the second handshaking process, the system becomes successful as soon as we can connect these servers successfully again. Because we need to connect servers successfully in the second handshaking process, we would rather connect additional servers besides the servers required to be connected successfully in the first handshaking process. This preference will minimize the chance that the system breaks down when fewer than servers can be reconnected successfully in the second handshaking process. We refer to this system as a Two-Way Handshaking Circular Sequential-out-of-Congestion (TWHCSknC) system. In this paper, we derived analytical formulas for the system's successful probability & average stop length, and we showed that the TWHCSknC system is a communication system with an efficient two-way handshaking process.     

Generalized multi-state k-out-of-n:G systems

In a binary k-out-of-n:G system, k is the minimum number of components that must work for the system to work. Let 1 represent the working state and 0 the failure state, k then indicates the minimum number of components that must be in state 1 for the system to be in state 1. This paper defines the multi-state k-out-of-n:G system: each component and the system can be in 1 of M+1 possible states: 0, 1, ..., M. In Case I, the system is in state ⩾j iff at least k_j components are in state ⩾j. The value of k_j I 1 can be different for different required minimum system-state level j. Examples illustrate applications of this definition. Algorithms for reliability evaluation of such systems are presented     

An algorithm for lower reliability bounds of multistate two-terminal networks

Network reliability is extensively used to measure the degree of stability of the quality of infrastructure services. The performance of an infrastructure network and its components degrades over time in real situations. Multi-state reliability modeling that allows a finite number of different states for the performance of the network and its components is more appropriate for the reliability assessment, and provides a more realistic view of the network performance than the traditional binary reliability modeling. Due to the computational complexity of the enumerative methods in evaluating the multi-state reliability, the problem can be reduced to searching lower boundary points, and using them to evaluate reliability. Lower boundary points can be used to compute the exact reliability value and reliability bounds. We present an algorithm to search for lower boundary points. The proposed algorithm has considerable improvement in terms of computational efficiency by significantly reducing the number of iterations to obtain lower reliability bounds.     

Eigendecomposition of Images Correlated on $S^{1}$, $S^{2}$, and $SO(3)$ Using Spectral Theory

Eigendecomposition represents one computationally efficient approach for dealing with object detection and pose estimation, as well as other vision-based problems, and has been applied to sets of correlated images for this purpose. The major drawback in using eigendecomposition is the off line computational expense incurred by computing the desired subspace. This off line expense increases drastically as the number of correlated images becomes large (which is the case when doing fully general 3-D pose estimation). Previous work has shown that for data correlated on S ¹ , Fourier analysis can help reduce the computational burden of this off line expense. This paper presents a method for extending this technique to data correlated on S ² as well as SO(3) by sampling the sphere appropriately. An algorithm is then developed for reducing the off line computational burden associated with computing the eigenspace by exploiting the spectral information of this spherical data set using spherical harmonics and Wigner-D functions. Experimental results are presented to compare the proposed algorithm to the true eigendecomposition, as well as assess the computational savings.     

Rearrangeable and Nonblocking $[w,f]$-Distributors

We formulate a graph model called [w,f]-distributors which is useful in analyzing the structures and comparing the quantitative complexities and qualitative features of optical multicast cross-connects. Using the formulation we show that two strictly nonblocking multicast optical cross-connects under two different request models are equivalent topologically, even though one request model is much less restrictive than the other. We then investigate the tradeoff between the depth and the complexity of an optical multicast cross-connect using the graph model. Upper and lower complexity bounds are proved. In the process, we also give a generic recursive construction that can be used to construct optimal and near-optimal [w,f]-distributors. The recursive construction can also be used to construct cost-effective optical multicast cross-connects. Another important result that follows is the exact asymptotic behavior of the size of optimal [w,f] -connectors, the unicast version of [w,f]-distributors.     

Reliability Analysis on the δ-Shock Model of Complex Systems

We investigate the delta-shock model of complex systems consisting of n i.i.d. components. We first obtain a general lifetime distribution for the delta-shock model of a general complex system by reducing the system to a linear combination of parallel systems. We then consider coherent system structures including series, parallel, and k-out-of-n, then derive some useful results including reliability bounds, bounds on the mean lifetime, limiting distributions, and Laplace-Stieltes transforms     

Computing consecutive-type reliabilities nonrecursively

The reliability of consecutive-type systems has been approached from various angles. A new method is presented for deriving exact expressions for the generating functions and the reliabilities of various consecutive-type systems. This method, based on Feller's run theory, is easy to implement, and leads to both recursive and nonrecursive formulas for the reliability. The nonrecursive expression is especially advantageous for systems with numerous components. In comparison to the n (number of components) computations that the recursive formulas require, the nonrecursive formula only requires the computation of the roots of a polynomial of order k. The method is extended for computing generating functions and reliabilities of systems with multi-state components as well as systems with s-dependent components.     

Ytterbium-Doped P$_2$O$_5$-TeO $_2$ Glass for Laser Applications

Ytterbium-doped sodium phospho-tellurite glasses are made with different P₂O₅:TeO₂ ratio, and Yb³⁺ concentrations. Physical properties of the new Yb hosts are favorable for laser applications. The glasses show high absorption and emission cross sections and higher lifetime of Yb³⁺:²F_5/2rarr²F_7/2 transition. The emission cross sections are calculated using two different methods and compared. The laser parameters of these Yb³⁺ -doped glasses are better than many reported glasses and crystals making them potential to fabricate high power laser and broadband optical amplifier in the wavelength region around ~1 mum     

Capacity Bounds for MIMO Nakagami- $m$ Fading Channels

This paper studies the ergodic capacity limits of multiple-input multiple-output (MIMO) antenna systems with arbitrary finite number of antennas operating on general fading environments. Through the use of majorization theory, we first investigate in detail the ergodic capacity of Nakagami- $m$ fading channels, for which we derive several ergodic capacity upper and lower bounds. We then show that a simple expression for the capacity upper bound is possible for high signal-to-noise ratio (SNR), which permits to analyze the impact of the channel fading parameter $m$ on the ergodic capacity. The asymptotic behavior of the capacity in the large-system limit in which the number of antennas at one or both side(s) goes to infinity, is also addressed. Results demonstrate that the capacity scaling laws for Nakagami-$m$ and Rayleigh-fading MIMO channels are identical. Finally, we employ the same technique to distributed MIMO (D-MIMO) systems undergoing composite log-normal and Nakagami fading, where we derive similar ergodic capacity upper and lower bounds. Monte Carlo simulation results are provided to verify the tightness of the proposed bounds.      

Architectural Optimizations for Low-Power $K$ -Best MIMO Decoders

Maximum-likelihood (ML) detection for higher order multiple-input–multiple-output (MIMO) systems faces a major challenge in computational complexity. This limits the practicality of these systems from an implementation point of view, particularly for mobile battery-operated devices. In this paper, we propose a modified approach for MIMO detection, which takes advantage of the quadratic-amplitude modulation (QAM) constellation structure to accelerate the detection procedure. This approach achieves low-power operation by extending the minimum number of paths and reducing the number of required computations for each path extension, which results in an order-of-magnitude reduction in computations in comparison with existing algorithms. This paper also describes the very-large-scale integration (VLSI) design of the low-power path metric computation unit. The approach is applied to a 4 $times$ 4, 64-QAM MIMO detector system. Results show negligible performance degradation compared with conventional algorithms while reducing the complexity by more than 50%.      

Density of States-Based DC $I$– $V$ Model of Amorphous Gallium–Indium–Zinc-Oxide Thin-Film Transistors

The density of states (DOS)-based DC I-V model of an amorphous gallium-indium-zinc oxide (a-GIZO) thin-film transistor (TFT) is proposed and demonstrated with self-consistent methodologies for extracting parameters. By combining the optical charge-pumping technique and the nonlinear relation between the surface potential (phiS) and gate voltage (V _GS), it is verified that the proposed DC model reproduces well both the measured V _GS-dependent mobility and the I _DS-V _GS characteristics. Finally, the extracted DOS parameters are N _TA = 4.4 times 10¹⁷ cm^-3 middot eV^-1, N _DA = 3 times 10¹⁵ cm^-3 middot eV^-1, kT _TA = 0.023 eV, kT _DGA = 1.5 eV, and EO = 1.8 eV, with the formulas of exponential tail states and Gaussian deep states.     

22.7-dB Gain $-$19.7-dBm $ICP_{1{rm dB}}$ UWB CMOS LNA

A fully differential CMOS ultrawideband low-noise amplifier (LNA) is presented. The LNA has been realized in a standard 90-nm CMOS technology and consists of a common-gate stage and two subsequent common-source stages. The common-gate input stage realizes a wideband input impedance matching to the source impedance of the receiver (i.e., the antenna), whereas the two subsequent common-source stages provide a wideband gain by exploiting RLC tanks. The measurements have exhibited a transducer gain of 22.7 dB at 5.2 GHz, a 4.9-GHz-wide B _3dB, an input reflection coefficient lower than -10.5 dB, and an input-referred 1-dB compression point of -19.7 dBm, which are in excellent agreement with the postlayout simulation results, confirming the approach validity and the design robustness.     

Effects of In Situ $hbox{O}_{2}$ Plasma Treatment on off-State Leakage and Reliability in Metal-Gate/High- $k$ Dielectric MOSFETs

The effects of in situ O₂ plasma treatment on device characteristics and reliability of metal-gate/high-k devices are investigated systematically. It was found that the O₂ plasma treatment can be employed for mitigating the formation of a leakage path between the high-k dielectric and the capping nitride layer. It also did not change the threshold voltage (V_th), carrier mobility, or equivalent oxide thickness. Compared with the control samples, the O₂ plasma-treated samples achieved a 20-times lower OFF-state current and enhanced hot-carrier-injection stress immunity.     

Leakage Minimization of SRAM Cells in a Dual-$V_t$ and Dual-$T_{rm ox}$ Technology

Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicrometer regime. As a result, reducing the subthreshold and tunneling gate leakage currents has become one of the most important criteria in the design of VLSI circuits. This paper presents a method based on dual- V t and dual- T _ox assignment to reduce the total leakage power dissipation of static random access memories (SRAMs) while maintaining their performance. The proposed method is based on the observation that read and write delays of a memory cell in an SRAM block depend on the physical distance of the cell from the sense amplifier and the decoder. Thus, the idea is to deploy different configurations of six-transistor SRAM cells corresponding to different threshold voltage and oxide thickness assignments for the transistors. Unlike other techniques for low-leakage SRAM design, the proposed technique incurs neither area nor delay overhead. In addition, it results in a minor change in the SRAM design flow. The leakage saving achieved by using this technique is a function of the values of the high threshold voltage and the oxide thickness, as well as the number of rows and columns in the cell array. Simulation results with a 65-nm process demonstrate that this technique can reduce the total leakage power dissipation of a 64 times 512 SRAM array by 33% and that of a 32 times 512 SRAM array by 40%.     

Improved Electrical Properties of Ge p-MOSFET With $ hbox{HfO}_{2}$ Gate Dielectric by Using $hbox{TaO}_{x} hbox{N}_{y}$ Interlayer

The electrical characteristics of germanium p-metal-oxide-semiconductor (p-MOS) capacitor and p-MOS field-effect transistor (FET) with a stack gate dielectric of HfO₂/TaOxNy are investigated. Experimental results show that MOS devices exhibit much lower gate leakage current than MOS devices with only HfO₂ as gate dielectric, good interface properties, good transistor characteristics, and about 1.7-fold hole-mobility enhancement as compared with conventional Si p-MOSFETs. These demonstrate that forming an ultrathin passivation layer of TaOxNy on germanium surface prior to deposition of high-k dielectrics can effectively suppress the growth of unstable GeOx, thus reducing interface states and increasing carrier mobility in the inversion channel of Ge-based transistors.     

Average BER Analysis for $M$-ary FSK Signals in Nakagami-$q$ (Hoyt) Fading With Noncoherent Diversity Combining

This paper analyzes the average bit error rate (BER) of noncoherent M-ary frequency-shift keying (FSK) signals over multichannel nonidentically distributed Nakagami-q (Hoyt) fading employing diversity combining. The first part of the paper considers the conventional postdetection noncoherent equal-gain combiner (NC-EGC), in which a Fourier series inversion formula is employed to derive a simple and rapidly converging series-based expression for the system average BER. This expression is valid for arbitrary values of received average signal-to-noise ratios (SNRs) and fading parameters. The derived expression is then compared with some existing ones in the literature, and the results show a large reduction in computational complexity, particularly when M and/or the diversity order increases. In the second part, a new noncoherent combiner is proposed to achieve improvements over the conventional NC-EGC. It is also shown that this new combiner results in a simple closed-form expression for the system average BER that is given in terms of elementary functions; hence, it can be easily numerically evaluated with noticeable computation efficiency.