Peculiarities of radiative recombination in amorphous molecular semiconductors doped with polymethine dye

Processes of charge carrier photogeneration and recombination are investigated in films of poly-N-epoxypropylcarbazole doped with polymethine dye. Films with blocking contacts were illuminated with light from either the region of dye absorption or beyond this region. The kinetics of accumulation and relaxation of electron–hole pairs with lifetimes greater than tens or hundreds of seconds was studied. It is presumed that the reason for the growth of recombination luminescence intensity in an external electric field is connected with the increase in efficiency of radiative recombination stimulated by electrons captured from photogenerated excitons. © 1998 John Wiley & Sons, Ltd.     

Photoconductivity of organic polymer films doped with porous silicon nanoparticles and ionic polymethine dyes

Features of electrical conductivity and photoconductivity of polyvinylbutyral films containing porous silicon nanoparticles and similar films doped with cationic and anionic polymethine dyes are studied. Sensitization of the photoelectric effect by dyes with different ionicities in films is explained by the possible photogeneration of holes and electrons from dye molecules and the intrinsic bipolar conductivity of porous silicon nanoparticles. It is assumed that the electronic conductivity in porous silicon nanoparticles is higher in comparison with p-type conductivity.     

Structural and Luminescent Properties of SiO<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>N<Subscript><Emphasis Type="Italic">y</Emphasis></Subscript>(Si) Nanocomposite Films

With a view to creating Si LEDs, the structural and luminescent properties of SiO _x N _y films containing Si nanocrystals in the SiO _x N _y matrix are studied experimentally. It is found that the film structure (nanocrystal size and concentration, the presence of an amorphous phase, etc.) and the spectrum and intensity of photoluminescence (PL) and electroluminescence (EL) are strongly dependent on the Si stoichiometric excess δ and annealing conditions. At δ≈ 10%, unannealed films are amorphous and contain Si clusters of size < 2 nm, as deduced from the TEM and microdiffraction data obtained. Annealing at 800–1000°C for 10–60 min produces Si crystals 3–5 nm in size with a concentration of ≈10¹⁸ cm^?3. The annealed films exhibit room-temperature PL and EL over the wavelength range 400–850 nm with intensity peaks located at 50–60 and 60–70 nm, respectively. The PL and EL spectra are found to be qualitatively similar. This suggests that both the PL and the EL should be associated with the formation of luminescent centers at nanocrystal–matrix interfaces and in boundary regions. However, the two phenomena should differ in the mechanism by which the centers are excited. With the EL, excitation should occur by impact processes due to carrier heating in high electric fields. It is found that as δ increases, so does the proportion of large amorphous Si clusters with a high density of dangling bonds. This enhances nonradiative recombination and suppresses luminescence.     

Relationship of Band-Edge Luminescence to Recombination Lifetime in Silicon Wafers

In recent years, intrinsic luminescence has been used as a method to characterize the recombination lifetime of crystalline silicon. The assumption is that the steady-state intrinsic photoluminescence at 1.09 eV (1.134 μm) can be related to the recombination lifetime. In this work, we measured the band-edge photoluminescence (PL) intensities of a number of single-crystal wafers. The resistivity in the wafer set ranges from 1 to 11,000 ohm-cm under constant excitation intensity. We then measured the PL spectra and recombination lifetimes of these wafer sets under a variety of conditions. The lifetime was measured using resonant-coupled photoconductive decay (RCPCD) in both air ambient and an iodine/methanol solution. The same procedure was used for the PL spectra. Plots of the measured lifetime versus the PL intensity showed weak correlation between the two quantities in air ambient. However, there is a positive relationship between the near-bandgap PL intensity and the recombination lifetime for passivated surfaces. Some fundamental physical reasons will be used to explain these results.     

分子束外延PbTe薄膜中的红外光电导探测器

中红外探测器在诸多领域具有重要的应用,目前,我国在PbTe、PbSe中红外探测器方面研制较少,通过分子束外延技术、以CdZnTe(lll)为衬底生长PbTe外延薄膜,XRD表征表明:PbTe外延薄膜是单晶薄膜,且与衬底具有相同(lll)取向,光吸收光谱测量得到外延薄膜的光学吸收边位于3.875 μm,光致发光谱显示发光波长位于3.66 μm,蓝移是红外激光泵浦导致PbTe温升所致.以PbTe为有源区材料、ZnS薄膜作为钝化和绝缘材料,用AuPtTi合金作为欧姆接触电极,研制了PbTe光电导中红外探测器原型器件,探测器在78 K温度下的光电导响应在红外波段的1.5～5.5μm,探测率约为2×10~9 cm·Hz~(1/2)·W~(-1).最后,对影响探测器工作的因素和改进方法进行了讨论.     

Carbazole-containing polyphenylquinolines as a basis for optoelectronic materials with white luminescence

The photophysical properties of poly-2,2′-(1-dodecyl carbazole-4,7-yl)-6,6′-(oxy)-bis-(4-phenylquinoline) in a solution, as a film, and in a poly(methyl methacrylate) or poly-N-vinylcarbazole host matrix have been studied. Considerable positive solvatochromism in the photoluminescence spectra, compared with solvatochromism in the absorption spectra, indicates that the dipole moment of the donor-acceptor complex increases in the excited state. Calculations show that the dipole moments of the complex in the ground and excited states differ by more than an order of magnitude. Upon transition to films, photoluminescence is observed in the entire visible spectral range (white luminescence). The intensity of the white luminescence grows by an order of magnitude when the polymer is dispersed in a poly(methyl methacrylate) matrix. The integrated photosensitivity and parameters of the photogeneration process (quantum yield of carrier photogeneration, quantum yield of free carrier formation, and thermalization radii) have been determined.     

Photoluminescence study of ZnO varistor stability

Photoluminescence (PL) measurements were carried out on commercial ZnO varistor samples that were electrically stressed and/or annealed at different temperatures. Changes in the intensity of green and yellow luminescence centers were studied as a function of annealing treatment. It was found that the ZnO luminescence (green and yellow) decrease with increase in annealing temperature, reach a minimum at 700°C, and increase again beyond 800°C. Furthermore, these green and yellow luminescence bands observed in the PL spectra are quenched in the ZnO varistor samples, compared to pure ZnO. In an electrically stressed ZnO varistor sample, the luminescence intensity was found to be higher compared to the as-sintered varistor sample. Annealing of the stressed varistor sample resulted in a decrease of the luminescence intensity. These PL observations are consistent with previous deep level transient spectroscopy and doppler positron annihilation spectroscopy results. All of the experimental results are consistent with the ion migration model of degradation and can be explained using a grain boundary defect model.     

纳米硅薄膜的发光特性研究

研究了 nc- Si:H薄膜的光致发光 ( PL) ,分析了晶粒尺寸、温度对发光特性的影响。对发光样品 ,晶粒尺寸有一上限 ,其值在 4～ 5nm之间。在 10～ 77K,nc- Si:H薄膜的发光强度几乎没有变化 ;当温度高于 77K,发光强度指数式下降。随温度升高 ,发光峰位有少许红移。讨论了nc- Si:H光致发光机理 ,用量子限制 -发光中心模型对实验现象进行了解释。从载流子的激发、复合两方面讨论了发光过程 ,认为载流子在晶粒内部激发后 ,弛豫到晶粒界面的发光中心复合发光。     

有机染料在多孔铝中的发光研究

用电化学方法制备的多孔阳极氧化铝具有孔径大小均匀、相互平行、排列规则的微孔结构 ,可作为多种发光材料的透明基底 .以多孔铝为载体 ,将有机染料嵌入多孔铝孔中 ,获得有机染料固体镶嵌膜 ,测量了镶嵌膜的吸收光谱、光致发光谱 .镶嵌膜的吸收光谱和液相染料的吸收光谱基本一致 ,光致发光谱的发光峰位蓝移 ,发光强度降低 ,但光谱线型更趋于对称 .实验结果表明染料以单体形式存在于多孔铝中 .通过对衬底多孔铝进行一系列后处理 ,发现热处理和扩大多孔铝空隙率可以增强镶嵌膜的发光强度     

sol-gel 法制备ATO薄膜的结构与光学性能研究

采用sol-gel法在玻璃衬底上制备ATO(SnO2∶Sb)薄膜,并用XRD、SEM、紫外-可见光谱和光致发光对薄膜进行了表征,研究了ATO薄膜的结构和光学性能。结果表明:ATO薄膜微晶晶相与SnO2一致,仍然是四方金红石结构;ATO薄膜在可见光区的透过率超过80%,当r(Sb∶Sn)为0.15时,ATO薄膜的透过率最高达87%;ATO薄膜在344～380nm处有一个很强的紫外-紫光发射带,随着Sb掺杂量的增加,发射峰逐渐变强,在r(Sb∶Sn)为0.25时,发射峰相对强度达302.4。     

基于光子晶体渐变型双异构微腔的掺铒硅光致发光研究

实验验证了室温下二维氧化物下包层非对称平板三角晶格光子晶体渐变型双异构微腔对绝缘体上硅(SOI)基片上铒氧共掺硅材料的显著发光增强作用.在波长为488 nm、功率为15 mW激光激发下,微腔的光致发光(PL)谱呈现出一个位于1 557.93 nm通信波长处的尖锐狭窄的发光峰,相比于无光子晶体区域,发光增强了约13倍.谐振峰随光泵浦功率增加,发生明显的红移,Q值逐渐下降,在1.5mW光泵浦功率下,Q值达6 655.微腔谐振波长与光子晶体晶格周期之间呈线性正比关系,通过调整晶格周期,实现了掺铒硅发光增强峰波长的灵活可控.     

GaInAs／AlInAs调制掺杂结构材料的光学性质研究

研究了ＧａＩｎＡｓ／ＡｌＩｎＡｓｎ型调制掺杂结构样品的光致发光及其激发光谱。当空穴态被局域化后．二维电子气的发光线形反映了导带二维态密度的填充效应：导带两个子带填充电子。发光强度则表明，导带第二子带电子波函数在空间上更扩展，与空间分离的空穴产生发光复合的几率较大。激发光谱提供了样品中异质结结构直接带边附近光吸收过程的信息。     

Optical and structural characteristics of Ga-doped ZnO films

The n-ZnO films doped with Ga to the content 2.5 at % are produced by pulse laser deposition onto the (0001) oriented single crystal sapphire substrates. The transmittance spectra of the ZnO films in the range from 200 to 3200 nm are studied in relation to the Ga dopant content. It is established that an increase in the Ga content shifts the fundamental absorption edge to the blue region, but reduces the transparency of the ZnO films in the infrared spectral region. The dependence of the band gap on the level of doping with Ga is determined. The photoluminescence spectra of the ZnO films doped to different levels are recorded. It is established that the PL intensity and peak position vary unsteadily with the level of doping. X-ray diffraction studies of the structure of the films are carried out. It is found that the crystallographic parameters (the lattice constant c) of the ZnO film depend on the Ga dopant content and the conditions of deposition of the films.     

Studies of deep centers in dilute GaAsN and InGaAsN films grown by molecular beam epitaxy

Deep levels spectra DLTS, 77 K photoluminescence (PL) spectra and photosensitivity were measured for GaAsN and InGaAsN films with low N and In concentration grown by molecular beam epitaxy and in GaAs films grown on GaAsN buffer. It is shown that the bandedge luminescence intensity is greatly decreased in GaAsN, GaAs/GaAsN and particularly in InGaAsN structures compared to the homoepitaxial GaAs. Comparison of the DLTS and PL spectra strongly suggests that the main recombination center in such films is the EL3-like electron trap whose concentration greatly increases upon In and N incorporation into the solid solution. Based on published results the trap is associated with substitutional oxygen on As site and the results are discussed in view of such possible assignment.     

Effects of external fields on the excitonic emission from single InAs/GaAs quantum dots

A low-temperature micro-photoluminescence (μ-PL) investigation of InAs/GaAs quantum dots (QDs) exposed to a lateral external electric field is reported. It is demonstrated that the QDs PL signal could be increased several times by altering the external and/or the internal electric field. The internal field in the vicinity of the dots could be altered by means of an additional infra-red laser. We propose a model, which is based on an essentially faster lateral transport of the charge carriers achieved in an external electric field. Consequently, also the capture probability into the dots and subsequently the dot luminescence is also enhanced. The results obtained suggest that the lateral electric fields play a major role for the dot luminescence intensity measured in our experiment.     

α-SiO_xN_y薄膜中分立能级的光发射

采用 PECVD法制备了 α- Si Ox Ny 薄膜 ,观察到两组分立能级的强荧光发射 ,一组位于紫外光波段 ,由三个可分辨的发射峰组成 ,波长分别为 330、340和 345nm;另一组位于红光波段 ,由两个发射峰组成 ,波长分别为 735nm和 745nm.发射峰依赖于薄膜中氧和氮的同时存在 ,其强度首先随薄膜中其含量的增加而增强 ,达到饱和值后 ,随着其含量的进一步增加而下降 .这表明发射峰可能起源于 O- Si- N结合而形成的发光中心 .     

氮气中退火对ZnO薄膜结构与光学性能的影响

采用直流磁控溅射法制备了ZnO薄膜,并将样品在氮气中进行了退火.对样品的表面形貌、结构性能、发光特性、透射光谱分别进行了检测.结果表明:退火后,样品的结晶质量提高,光致发光峰增强,在可见光范围内的平均透过率也有所增加.计算表明:退火后ZnO薄膜的禁带宽度略有减小.这可能是氮掺入ZnO薄膜后,N2p与O2p形成杂化轨道,二者能带部分重叠,从而使价带变宽、禁带变窄.     

Study of photoluminescence of SiOxNy films implanted with Ge+ ions and annealed under the conditions of hydrostatic pressure

The influence of hydrostatic pressure on photoluminescence of SiO_xN_y (x=0.25 and y=1) films grown on the Si substrates and implanted with Ge⁺ ions, with pressure applied during annealing of the films, was studied for the first time. It is shown that hydrostatic compression leads to a tenfold increase in the photoluminescence intensity of the implanted SiO_xN_y films compared to that obtained as a result of postimplantation annealings at atmospheric pressure. The observed increase in the photoluminescence intensity is attributed to accelerated formation of radiative-recombination centers in the metastable-phase zones in the implanted silicon oxynitride. These centers are tentatively related to ≡Si-Si≡ centers and to complexes involving Ge atoms (of ≡Si-Ge≡ and ≡Ge-Ge≡ types).     

退火温度对ZnS/PS薄膜的晶体结构和光电性质的影响

用脉冲激光沉积法(PLD)在多孔硅(PS)衬底上生长ZnS薄膜,分别在300℃、400℃和500℃下真空退火。用X射线衍射(XRD)和扫描电子显微镜(SEM)研究了退火对ZnS薄膜的晶体结构和表面形貌的影响,并测量了ZnS/PS复合体系的光致发光(PL)谱和异质结的I-V特性曲线。研究表明,ZnS薄膜仅在28.5°附近存在着(111)方向的高度取向生长,由此判断薄膜是单晶立方结构的-βZnS。随着退火温度的升高,-βZnS的(111)衍射峰强度逐渐增大,且ZnS薄膜表面变得更加均匀致密,说明高温退火可以有效地促进晶粒的结合并改善结晶质量。ZnS/PS复合体系的PL谱中,随着退火温度升高,ZnS薄膜的自激活发光强度增大,而PS的发光强度减小,说明退火处理更有利于ZnS薄膜的发光。根据三基色叠加的原理,ZnS的蓝、绿光与PS的红光相叠加,ZnS/PS体系可以发射出较强的白光。但过高的退火温度会影响整个ZnS/PS体系的白光发射。ZnS/PS异质结的I-V特性曲线呈现出整流特性,且随着退火温度的升高其正向电流增加。     

A mechanism of electroluminescence in silicon diodes with a high dislocation density

A new concept is suggested to explain the effect of dislocations on electroluminescence in silicon diodes. This concept is based on consideration of the spatial correlation between injected electrons and holes that recombine inside a dislocation core. This correlation leads to an increase in the probability of radiative recombination for electron-hole pairs. Two cases are analyzed. In the first case, the resulting current is controlled mainly by tunneling of electrons and holes along dislocations, which is followed by electron-hole recombination under the conditions of barrier lowering. In this situation, electroluminescence is not related to the fundamental absorption edge and the energy position of the electroluminescence band shifts to shorter wavelengths as either the temperature decreases or the applied voltage increases. In the second case, the diffusion-related component is prevalent in the total current. The radiative recombination of electron-hole pairs occurs in quasi-neutral regions and the electroluminescence exhibits an edge-related character. It is shown that the suggested mechanism may be responsible for a substantial enhancement of both the electroluminescence intensity and the quantum efficiency in silicon diodes with dislocations if the Shockley-Read-Hall lifetime is shorter than 10^?3 s.