Compositional dependence of absorption coefficient and band-gap for Nb2O5-SiO2 mixture thin films

The absorption coefficient of composite films consisting of niobia (Nb₂O₅) and silica (SiO₂) mixtures is studied for photon energies around the band gap. The films were deposited by co-evaporation and their composition was varied by changing the ratio of deposition rates of the two materials. Both, as-deposited and thermally annealed films were characterized by different techniques: the absorption coefficient was determined by spectrophotometric measurements and the structural properties were investigated using infrared spectroscopy, transmission electron microscopy and X-ray diffraction. The correlation between the variations of absorption properties and film composition and structure is established. The absorption coefficients determined experimentally are compared with the results derived from effective medium theories in order to evaluate the suitability of these theories for the studied composites.     

Patterning of multilayer dielectric optical coatings for multispectral CCDs

The development of optical sensors for spacecraft applications requires that all components be as lightweight as possible. One method to reduce the weight of a multispectral optical system is to eliminate beamsplitting optics and multiple detectors by patterning a filter array directly onto a CCD. However, techniques commonly used in the production of these filter arrays result in decreased image resolutions. This can greatly impact the performance of sensors used for applications such as planetary probes. To address this issue, we have studied the patterning of multilayer dielectric optical coatings in a small scale, two dimensional array, which will allow development of a four color sensor with a resolution one-half that of monochromatic sensors (compared to one-fourth or less for a four color striped array). We have developed ion milling techniques for the preparation of optical filter arrays which are patterned on a scale as small as 7.5 μm, enabling each pixel of a CCD to have its own associated filter. This paper presents details of the fabrication of these multispectral arrays, and discusses problems associated with pixel-sized filters.     

Determination of the optical constants of HfO2–SiO2 composite thin films through reverse fitting of transmission spectra

Composite thin films of HfO₂:SiO₂ with wide range of relative composition from 100:0 (pure HfO₂) to 10:90 have been deposited on fused silica substrates by co-evaporation technique and the optical properties of the films have been studied by measuring the transmission spectra of the samples by spectrophotometer. Different important optical parameters viz., band gap, refractive index and absorption coefficients of the samples have been obtained by fitting the measured optical spectra with theoretically generated spectra and the variation of the optical constants as a function of SiO₂ content in the films have been obtained. Two different dispersion models viz., the single effective oscillator model and the Tauc–Lorentz model have been used to generate the theoretical spectra in the above fitting procedure. X-ray reflectivity (XRR) measurement technique has been used to find the densities of the films in order to explain the observed variation in optical properties of the films with increase in SiO₂ content.     

Surface properties of hard protective coatings studied by optical techniques

The paper describes optical study of SiC, C and NiC layers deposited on Si substrates by double beam ion sputtering (DBIS) method. The following optical methods: ellipsometry, bidirectional reflection distribution function (BRDF) and total integrated scattering (TIS) studies have been applied. The obtained results allowed us to determine the refractive indices, extinction coefficients and the roughness parameters of DBIS films. Also surface profiles of optical constants determined from scanning ellipsometric measurements have been presented. The power spectral density functions (PSD) of surface roughness for studied samples have been determined. The influence of the deposition technology on film topography has been discussed.     

The effective surface Debye temperature of Yb:GaN

The effective Debye temperature of ytterbium and gallium in Yb:GaN thin films has been obtained using X-ray photoemission spectroscopy. The vibrational motion normal to the surface results in a dimunition of photoemission intensities from which we have estimated the effective Debye temperatures of 221 ± 30 K and 308 ± 30 K for Yb and Ga, respectively. The difference between the measured values for Yb and Ga suggests that the Debye temperatures are influenced by the local environment. The smaller effective surface Debye temperature for Yb correlates to a soft, strained surface, possibly due to an increased Yb―N bond length as compared to the Ga―N bond length.     

Laser damage thresholds of optical coatings

Since the very beginning of laser technology, Laser Induced Damage Thresholds (LIDT) of optical components were always an obstacle for the application of laser systems operating at high power levels. Also, further progresses in the development of new high power laser concepts are often directly limited by the availability of advanced optical components with high quality and LIDT-values. Nowadays, in the course of the development of optical materials with excellent quality and power handling capability, the problem of laser induced damage has shifted from the bulk to the surface of the optical component. The optical surface is objected to various production steps and environmental influences, which modify its structure and composition. Especially, the thin film coating, which is deposited on the optical surface to adapt its reflectance and transmittance to the application, contributes predominantly to the reduction of the LIDT-values. As a consequence, the measurement and optimization of the power handling capability of thin films is considered as one of the primary research areas in modern optics technology and is supported by an extensive scientific community.In the present paper, a brief review will be given on selected fundamental damage mechanisms in thin films considering different operation conditions of modern laser systems. Also, the current standards for the measurement of LIDT will be described, and examples illustrating some practical aspects of high power optical coatings will be presented. Finally, recent trends in laser technology will be discussed in respect to research in laser induced damage.     

Advanced key technologies for magnetron sputtering and PECVD of inorganic and hybrid transparent coatings

Besides classical multilayer systems with alternating low and high refractive indices, reactive pulse magnetron sputtering processes offer various possibilities of depositing gradient films with continuously varying refractive index. Using nanoscale film growth control it is possible to achieve optical filter systems with a defined dependency of refractive index on film thickness, e.g. by sputtering a silicon target in a time variant mixture of oxygen and nitrogen. Also reactive co-sputtering of different target materials such as silicon and tantalum in oxygen is suitable as well. Rugate filters made from SiO_xN_y or Si_xTa_yO_z gradient refractive index profiles find their application in spectroscopy, laser optics and solar concentrator systems.Furthermore polymer substrates are increasingly relevant for the application of optical coatings due to their mechanical and economical advantages. Magnetron PECVD (magPECVD) using HMDSO as precursor allows to deposit carbon containing films with polymer-like properties. Results show the suitability of these coatings as hard coatings or matching layers. Multifunctional coatings with antireflective and scratch-resistant properties were deposited on polymer substrates using a combined magPECVD and sputter deposition process.     

Measurement of the refractive index and thickness of a transparent film from the shift of the interference pattern due to the sample rotation

A method is described for the simultaneous measurement of the refractive index and thickness of a transparent film. The method is based on the rotational shift of the interference pattern caused by the change of the light incidence angle. The refractive index is evaluated without any prior information about film thickness or about the substrate and its refractive index. In addition, the roughness of the interfaces and/or the presence of an unidentified thin layer are not important. In two experimental examples, the refractive index and thickness are measured for a GaN thin film and a cling-film.     

Analysis of laminated composite beams using layerwise displacement theories

Within the displacement field of a layerwise theory, two laminated beam theories for beams with general lamination are developed. In the first theory, an existing layerwise laminated plate theory is adapted to laminated beams. The procedure used in the second theory is simple and straightforward and similar to the one used in the development of plate and shell theories. These theories can also be used in developing simpler theories such as classical, first, and higher-order shear deformation laminated beam theories. Equations of motions are obtained by using Hamilton’s principle. For the assessment of the accuracy of these theories, analytical solutions for static bending and free vibration are developed and compared with those of an existing three-dimensional elasticity solution of cross-ply laminates in cylindrical bending and with the three-dimensional finite element analysis for angle-ply laminates.     

Structural, dielectric and optical properties of Ba(Ti, Zr)O3 thin films prepared by chemical solution deposition

Ba(Ti_0.95Zr_0.05)O₃ (BTZ) thin films grown on Pt/Ti/SiO₂/Si(100) substrates were prepared by chemical solution deposition. The structure and surface morphology of BTZ thin films has been studied by X-ray diffraction (XRD) and scanning electron microscope (SEM). At 100 kHz, the dielectric constant and dissipation factor of the BTZ film are 121 and 0.016, respectively. The ellipsometric spectrum of the BTZ thin film annealed at 730 °C was measured in the range of wavelength from 355 to 1700 nm. Assuming a five-layer model (air/surface roughness layer/BTZ/interface layer/Pt) for the BTZ thin films on platinized silicon substrates, the optical constant spectra (refractive index n and the extinction coefficient k) of the BTZ thin films were obtained.     

Static behavior of composite beams using various refined shear deformation theories

Static behavior of composite beams with arbitrary lay-ups using various refined shear deformation theories is presented. The developed theories, which do not require shear correction factor, account for parabolical variation of shear strains and consequently shear stresses through the depth of the beam. In addition, they have strong similarity with Euler–Bernoulli beam theory in some aspects such as governing equations, boundary conditions, and stress resultant expressions. A two-noded C¹ finite element with six degree-of-freedom per node which accounts for shear deformation effects and all coupling coming from the material anisotropy is developed to solve the problem. Numerical results are performed for symmetric and anti-symmetric cross-ply composite beams under the uniformly distributed load and concentrated load. The effects of fiber angle and lay-ups on the shear deformation parameter and extension-bending-shear-torsion response are investigated.     

Lattice properties of YBa2Cu3?xCoxO7: Pilot calculations using effective medium theory

We report preliminary total energy calculations for YBa₂Cu_3–xCo_xO₇ of the lattice parameters and of the Raman-active phonon modes, particularly of the apex oxygen, within the so-called effective-medium theory. Experimentally it is found that substitution of Cu(1) by Co (or Al) introduces a correlation between the apex oxygen mode and the critical temperature, and that this correlation reflects the variation in distance between the O(4) and Cu(2), that decreases with doping, and between the Ba and Cu(2), that on the contrary increases with doping. The picture that emerges from this study is the following: as the Co (or Al) atoms partially substitute the Cu(1), there is a reduction of the hole carriers in the plane. This picture is supported by the present pilot calculation.     

Controlled synthesis and characteristics of antireflection coatings of TiO2 produced from a organometallic colloid

Antireflection titanium dioxide (TiO₂) coatings have been developed on monocrystalline silicon by a sol–gel spin-coating process using titanium di-isopropoxidebis(acetylacetonate) colloidal precursor solution. The effect of titanium content in the precursor, spin rate, sintering duration and temperature have been studied and their effect on coating thickness and optical properties (i.e., refractive index and reflectivity) were investigated. The influence of post-deposition sintering temperature on the optical characteristics, composition and the microstructure of the coatings have been evaluated by UV–vis spectroscopy, ellipsometry, X-ray photoelectron spectroscopy, atomic force microscopy and X-ray diffraction techniques. Solar cells made on silicon wafers with TiO₂ as antireflection layer showed enhancement of more than 20% in short circuit current density in comparison to a cell devoid of the TiO₂ coating.     

Structural and optical properties of amorphous oxygenated iron boron nitride thin films produced by reactive co-sputtering

Amorphous oxygenated iron boron nitride (a-FeBN:O) thin films were prepared by reactive radio-frequency (RF) sputtering, from hexagonal boron nitride chips placed on iron target, under a total pressure of a gas mixture of argon and oxygen maintained at 1 Pa. The films were deposited onto silicon and glass substrates, at room temperature. The power of the generator RF was varied from 150 to 350 W. The chemical and structural analyses were investigated using X-ray photoelectron spectroscopy (XPS), energy dispersive of X-ray and X-ray reflectometry (XRR). The optical properties of the films were obtained from the optical transmittance and reflectance measurements in the ultraviolet-visible-near infrared wavelengths range. XPS reveals the presence of boron, nitrogen, iron and oxygen atoms and also the formation of different chemical bonds such as Fe-O, B-N, B-O and the ternary BNO phase. This latter phase is predominant in the deposited films as observed in the B 1s and N 1s core level spectra. As the RF power increases, the contribution of N-B bonds in the as-deposited films decreases. The XRR results show that the mass density of a-FeBN:O thin films increases from 2.6 to 4.12 g/cm³ with increasing the RF power from 150 to 350 W. This behavior is more important for films deposited at RF power higher than 150 W, and has been associated with the enhancement of iron atoms in the film structure. The optical band gap decreases from 3.74 to 3.12 eV with increasing the RF power from 150 to 350 W.     

Synthesis and characterization of porous silsesquioxane dielectric films

The silsesquioxane (SSQ) films with low dielectric constant have been successfully synthesized by covalently binding a thermally decomposable porogen [poly(amidoamine), PAMAM] to a host polymer (hydrogen methyl silsesquioxane, HMSQ) via a coupling agent. The decomposition behavior of the porogen as well as the thermal and dielectric properties of the host polymer heat-treated in different atmospheres have been studied and compared. The dielectric properties of the HMSQ-PAMAM porous films have been investigated as a function of porogen concentration. An average dielectric constant about 2.06 could be obtained with leakage current density on the order of 10^-7 A/cm² for a film with 20-wt.% loading of the PAMAM polymer.     

Monitoring explosive crystallization phenomenon of amorphous silicon thin films during short pulse duration XeF excimer laser annealing using real-time optical diagnostic measurements

Melting and crystallization scenario of amorphous silicon (a-Si) thin films have been investigated using in situ time-resolved optical reflection and transmission measurements. The explosive crystallization phenomenon is observed using a single-mode continuous wave He-Ne probe laser for thickness of 50 nm and 90 nm a-Si thin films upon 25 ns pulse duration of XeF excimer laser irradiation, respectively. The explosive crystallization phenomenon is easier to observe in the large thickness of a-Si thin films, a sample with pure a-Si microstructure and under longer pulse duration of excimer laser irradiation by time-resolved optical reflection and transmission measurements.     

Directional enhancement of refractive index and tunable wettability of polymeric coatings due to preferential dispersion of colloidal TiO2 nanorods towards their surface

We demonstrate the fabrication of nanocomposite coatings, of organic-capped colloidal TiO₂ nanorods dispersed into a poly(methyl methacrylate) matrix, with rising value of refractive index from the bottom to the top layers, and UV-induced surface wettability alteration, in a reversible manner. This behaviour is attributable to preferential dispersion of the TiO₂ nanoparticles towards the superficial layers of the coatings. Above a critical TiO₂ loading, the nanorods at the surface form aggregates deteriorating the optical and the surface properties of the nanocomposites. The optimal conditions for nanocomposite films preparation in terms of optimized nanorods dispersion, optical clarity, and surface smoothness are determined.     

Depth-profiled characterization of complex refractive index of ion implanted optically transparent polymers using multilayer calculations and reflectance data

The material in the ion-modified surface layer formed in polymethylmethacrylate (PMMA) is optically characterized by calculations based on multilayer model and optical reflectance data. PMMA was subjected to a low energy (50 keV) silicon ion implantation at the fluences of 3.2 × 10¹⁵ cm⁻² and 3.2 × 10¹⁶ cm⁻². Both real and imaginary components of the complex refractive index of this optically transparent polymer are modeled in a geometry that includes a gradient of their in-depth spatial distribution.