环境扫描电镜对不同丝胶含量的老化丝纤维的研究

本文应用环境扫描电镜(ESEM)对不同丝胶含量的人工老化蚕丝纤维进行了纵横向形貌观察,目的是了解丝纤维的老化规律和形态变化.研究表明,不同丝胶含量的丝纤维经过光、热老化后会出现不同程度的破坏,呈现出各自不同的形态特点,为研究老化机理、特征及程度提供了有力证据.据此可以判断古代出土丝织品的含胶量.     

有机硅环氧树脂杂化材料抗紫外老化性能研究

以钛酸四丁酯、四正丁氧基锆、γ-(2,3-环氧丙氧)丙基三甲氧基硅烷(GPTMS)为原料,采用溶胶-凝胶法制备一系列不同钛锆比的有机硅环氧树脂杂化膜材料,无机质量含量为10%,并对其进行了人工紫外老化实验。研究了材料组成对杂化膜的耐紫外线性能的影响。采用紫外-可见分光光度计、傅里叶红外光谱、扫描电镜等探讨了不同杂化膜老化后的性能。结果表明,不同钛锆比的杂化膜老化7d后,在可见光区的透过率变化不明显,下降仅为2%~4%。TiO2、Ti10Zr1、Ti3Zr1杂化膜老化7d或14d后,膜层出现开裂或粉化现象;ZrO2、Ti1Zr1老化28d后不开裂。杂化膜老化后的黄变因数都低于10%。     

改善高分子PTC材料可恢复过流保护性能的老化方法

研究了热老化及老化过程对高分子ＰＴＣ材料电阻值的影响, 电老化对耐流、耐压、耐雷击等电性能的影响。结果表明, 不同的热老化条件可使高分子ＰＴＣ材料电阻值发生不同程度的变化, 电老化可有效改善其电性能。     

集成电路动态老化新技术的实施

在集成电路的可靠性评估试验中,动态老化项目是最重要的试验之一。文章提出了利用新技术对集成电路进行动态老化测试的全新方法,该新方法可以对老化线路板的关键电路信息和老化环境进行多路全面测试的监控,全面提高监控范围,及时发现老化过程中的工作异常,并减少人工,提高评估试验的可靠性,和其他方法相比有独特的优势。文中在技术上就集成电路具体实施动态老化试验过程中的技术细节和功能的实现进行探讨,分析和介绍老化技术中老化信号的生成和加载方法以及实时监控、数据采集方案。     

人工加速光老化试验方法综述

根据光源的不同,介绍了多种常见的人工加速光老化试验方法;从光谱能量、试验条件、后续性能测试、与其它试验项目的组合等方面介绍了人工加速光老化试验;对人工加速老化与自然曝晒的相关性和考察侧重点进行了评述。     

继电保护装置单板老化工艺及实施

电子产品的集成化程度越来越高,结构和制造工艺越来越复杂,增加了电子产品潜伏缺陷的可能性.电子产品不但要求有较高的性能指标,而且还要有较高的质量稳定性和可靠性.电子产品的质量稳定性不仅取决于设计的合理性,元器件的性能,而且与整个制造过程及工艺控制手段具有很大的关系.采用高温老化工艺来提高电子产品的稳定性和可靠性,保证出厂的产品能经得起时间的考验.在对电子产品故障原因及周期进行简单介绍的基础上,阐述高温老化原理,并对继电保护装置单板老化工艺进行分析,确定工艺参数,提出生产组织实施方案.     

物联网技术在LED老化库的应用

对物联网技术在LED装配老化库的应用进行研究。首先,对老化库总体结构进行介绍,简述了自动老化库的工艺流程以及装配上线初始化与混流生产的程序流程,然后根据系统设计要求编写专门的管理软件——LED自动老化库信息系统,最后,对老化仓的布置进行设计规划使得系统具有直观可行性。系统能够实现预想的各种要求,大大提高老化库的智能化程度。     

粘土胶老化后性能与结构的研究

由于炭黑价格的不断上涨 ,人们一直寻找价廉的非炭黑补强填料。红粘土可替代ＨＡＦ、ＧＰＦ和ＳＲＦ等炭黑制成橡胶制品[1] 。但粘土胶耐老化性能较差 ,对于其宏观性能与微观结构的关系尚未见报道。本文研究了粘土胶经热氧、光氧和臭氧老化后结构与性能的变化。1　实验将粘土试样与天然胶乳经凝固、压片、干燥等步骤制成粘土胶试样。粘土胶按国家标准进行热氧老化 1 0 0℃× 36ｈ ;氧老化分 30ｈ和 45ｈ及臭氧老化。进行性能测试 ,结构研究在ＰｈｉｌｉｐｓＸＬ 30型扫描电镜上完成。2　结果与讨论粘土胶的力学性能见表 1。表 1　粘土胶老化…     

ITECH负载对电源进行老化测试方案

该文详细介绍了ITECH电子负载和老化软件对于电源产品在长时间通电老化试验中的应用,主要结合本系统中的硬件产品和主要的实现监控界面,实现多个电源产品的老化的同时性和自动化性,可以最大程度地发挥电子负载在老化系统中的作用,可以得到准确的监控数据,可最大程度地节约人力成本。该系统已经应用到实际的老化试验中,并在电源等产品的老化中推广和应用。     

在光缆填料中老化的聚合物机械力学分析

本方法可在进行老化机理研究时，完成对张力和重量增大的研究，并且可以找到聚合物试样失效的原因。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Call for Papers

正Wireless Body-area Networks The last decade has witnessed the convergence of three giant worlds:electronics,computer science and telecommunications.The next decade should follow this convergence in most of our activities with the generalization of sensor networks.In particular with the progress in medicine,people live longer and the aging of population will push the development of wireless personal networks