New trends to grow the n-CdZn (S1−xSex)2/p-CuIn(S1−xSex)2 heterojunction thin films for solar cell applications

The n-CdZn(S_1−xSe_x) and p-CuIn(S_1−xSe_x)₂ thin films have been grown by the solution growth technique (SGT) on glass substrates. Also the heterojunction (p–n) based on n-CdZn (S_1−xSe_x)₂ and p-CuIn (S_1−xSe_x)₂ thin films fabricated by same technique. The n-CdZn(S_1−xSe_x)₂ thin film has been used as a window material which reduced the lattice mismatch problem at the junction with CuIn (S_1−xSe_x)₂ thin film as an absorber layer for stable solar cell preparation. Elemental analysis of the n-CdZn (S_1−xSe_x)₂ and p-CuIn(S_1−xSe_x)₂ thin films was confirmed by energy-dispersive analysis of X-ray (EDAX). The structural and optical properties were changed with respect to composition ‘x’ values. The best results of these parameters were obtained at x=0.5 composition. The uniform morphology of each film as well as the continuous smooth thickness deposition onto the glass substrates was confirmed by SEM study. The optical band gaps were determined from transmittance spectra in the range of 350–1000 nm. These values are 1.22 and 2.39 eV for CuIn(S_0.5Se_0.5)₂ and CdZn(S_0.5Se_0.5)₂ thin films, respectively. J–V characteristic was measured for the n-CdZn(S_1−xSe_x)₂/p-CuIn(S_1−xSe_x)₂ heterojunction thin films under light illumination. The device parameters V_oc=474.4 mV, J_sc=13.21 mA/cm², FF=47.8% and η=3.5% under an illumination of 85 mW/cm² on a cell active area of 1 cm² have been calculated for solar cell fabrication. The J–V characteristic of the device under dark condition was also studied and the ideality factor was calculated which is equal to 1.9 for n-CdZn(S_0.5Se_0.5)₂/p-CuIn(S_0.5Se_0.5)₂ heterojunction thin films.     

Synthesis and transport properties of prospective photovoltaic systems related to CuInSe2 and CuGaSe2

Solid solutions in CuGaSe₂–ZnSe and CuInSe₂–ZnSe systems have been obtained by radio frequency heating. In order to prepare n-type phases based on CuGaSe₂, p-type (CuGa)_1−xZn_2xSe₄ and (CuIn)_1−xZn_2xSe₄ (0.05x0.1) single crystals were doped by Ag, Hg, Cd, Zn implantation. The crystal structure of the solid solutions was studied by X-ray diffraction; the substitutors as well as the implantant valence states were analyzed using X-ray photoelectron spectroscopy. Hall effect, electrical conductivity, and the charge carrier mobility of an n-type zinc-implantated solid solution (CuGa)_1−xZn_2xSe₄ and (CuIn)_1−xZn_2xSe₄ (0.05x0.1) were studied.     

Preparation of CuIn1−xGaxSe2 thin films by sputtering and selenization process

CuIn_1−xGa_xSe₂ polycrystalline thin films were prepared by a two-step method. The metal precursors were deposited either sequentially or simultaneously using Cu–Ga (23 at%) alloy and In targets by DC magnetron sputtering. The Cu–In–Ga alloy precursor was deposited on glass or on Mo/glass substrates at either room temperature or 150°C. These metallic precursors were then selenized with Se pellets in a vacuum furnace. The CuIn_1−xGa_xSe₂ films had a smooth surface morphology and a single chalcopyrite phase.     

Pyrite (FeS2) thin films prepared by spray method using FeSO4 and (NH4)2Sx

A simple spray method for the preparation of pyrite (FeS₂) thin films has been studied using FeSO₄ and (NH₄)₂S_x as precursors for Fe and S, respectively. Aqueous solutions of these precursors are sprayed alternately onto a substrate heated up to 120°C. Although Fe–S compounds including pyrite are formed on the substrate by the spraying, sulfurization of deposited films is needed to convert other phases such as FeS or marcasite into pyrite. A single-phase pyrite film is obtained after the sulfurization in a H₂S atmosphere at around 500°C for 30 min. All pyrite films prepared show p-type conduction. They have a carrier concentration (p) in the range 10¹⁶–10²⁰ cm⁻³ and a Hall mobility (μ_H) in the range 200–1 cm²/V s. The best electrical properties (p=7×10¹⁶ cm⁻³, μ_H=210 cm²/V s) for a pyrite film prepared here show the excellence of this method. The use of a lower concentration FeSO₄ solution is found to enhance grain growth of pyrite crystals and also to improve electrical properties of pyrite films.     

PtxNi1−x nanoparticles as catalysts for hydrogen generation from hydrolysis of ammonia borane

We report on Pt_xNi_1−x (x = 0, 0.35, 0.44, 0.65, 0.75, and 0.93) nanoparticles as catalysts for hydrogen generation from hydrolysis of ammonia borane (NH₃BH₃). The Pt_xNi_1−x catalysts were prepared through a redox replacement reaction with a reverse microemulsion technique. The structure, morphology, and chemical composition of the obtained samples were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM) equipped with energy dispersive X-ray (EDX), and inductively coupled plasma emission spectroscopy (ICP). The results show that the diameters of the Pt_xNi_1−x nanoparticles are about 2–4 nm, and the Pt atomic contents in the catalysts were 35%, 44%, 65%, 75%, and 93%, respectively. It is found that the catalytic activity toward the hydrolysis of NH₃BH₃ is correlated with the composition of the Pt_xNi_1−x catalysts. The annealing of Pt_0.65Ni_0.35 at 300 °C for 1 h increases the crystallinity of the nanoparticles, but shows almost the same activity as that without annealing. Among the as-prepared Pt_xNi_1−x nanoparticles, Pt_0.65Ni_0.35 displays the highest catalytic performance, delivering a high hydrogen-release rate of 4784.7 mL min⁻¹ g⁻¹ and a low activation energy of 39.0 kJ mol⁻¹.     

Composition, surface topography, structure, Raman, and electrochemical/photoelectrochemical characterisation of CdxHg1−xTe films

Cd-rich Cd_xHg_{1 − x}Te films have been electrodeposited under potentiostatic conditions on conducting glass and Ti substrates from an acidic solution containing the respective ions as Cd²⁺:Hg²⁺:HTeO₂⁺ = 100:1:2. Six films one after another have been prepared from a single electrochemical cell. EDAX analysis of the air annealed films show decreasing Hg content in the deposit as the number of film preparation increases. SEM analysis indicate undulatory surface with Hg-rich clusters at the top surface. XRD analysis indicate the presence of Cd_xHg_{1 − x}Te along with . The Cd_xHg_{1 − x}Te alloy formation have been confirmed from Raman shift measurements which change with composition, x. The as-deposited films are n-type but converts to p-type after air annealing. Spectral response measurements gave band gap values that change with Hg content in the deposit. Band gap values ranging from 1.1 eV to 1.45 eV have been estimated. Photoelectrochemical solar cells using polysulphide electrolyte have been fabricated which gave an open-circuit photovoltage and short-circuit photocurrent, respectively, as 325 mV and 5.5 mA/cm² under 60 mW/cm² intensity of illumination.     

Characterization and electrochromic properties of CuxNi1−xO films prepared by sol–gel dip-coating

Cu_xNi_1−xO electrochromic thin films were prepared by sol–gel dip coating and characterized by XRD, UV–vis absorption and electrochromic test. XRD results show that the structure of the Cu_x Ni_1−xO thin films is still in cubic NiO structure. UV–vis absorption spectra show that the absorption edges of the Cu_xNi_1−xO films can be tuned from 335 nm (x = 0) to 550 nm (x = 0.3), and the transmittance of the colored films decrease as the content of Cu increases. Cu_xNi_1−xO films show good electrochromic behavior, both the coloring and bleaching time for a Cu_0.2Ni_0.8O film were less than 1 s, with a variation of transmittance up to 75% at the wavelength of 632.8 nm.     

Optical and electrical studies on molybdenum sulphoselenide [Mo(S1−xSex)2] thin films prepared by arrested precipitation technique (APT)

Nanocrystalline stoichiometric [Mo(S_1−xSe_x)₂] thin films were deposited by using arrested precipitation technique (APT) developed in our laboratory. The precursors used for this are namely, molybdenum triethanolamine complex, thioacetamide and sodium selenosulphite; and various preparative conditions are finalised at the initial stages of deposition. Formation of [Mo(S_1−xSe_x)₂] semiconducting thin films are confirmed by studying growth mechanism, optical and electrical properties. X-ray diffraction analysis showed that the composites are nanocrystalline being mixed ternary chalcogenides of the general formula [Mo(S_1−xSe_x)₂]. The optical studies revealed that the films are highly absorptive (α×10⁴ cm⁻¹) with a band-to-band direct type of transitions and the energy gap decreased typically from 1.86 eV for pure MoS₂ down to 1.42 eV for MoSe₂. The thermoelectrical power measurement shows negative polarity for the generated voltage across the two ends of semiconductor thin films. This indicate that the [Mo(S_1−xSe_x)₂] thin film samples show n-type conduction.     

WO3−x nanowires based electrochromic devices

A simple method was developed to fabricate tungsten oxide (WO_3−x) nanowires based electrochromic devices. The WO_3−x nanowires are grown directly from tungsten oxide powders in a tube furnace. The WO_3−x nanowires have diameters ranging from 30 to 70 nm and lengths up to several micrometers. The WO_3−x nanowires based device has short bleach-coloration transition time and can be grown on a large scale directly onto an ITO-coated glass that makes it potential in many electrochromic applications. The structure, morphology, and composition of the WO_3−x nanowires were characterized using the scanning electron microscopy, transmission electron microscopy, X-ray diffraction, and energy-dispersive spectrometer. The optical and electrochromic performance of the nanowires layer under lithium intercalation was studied in detail by UV–VIS–NIR spectroscope and cyclic voltameter.     

Synthesis of (CuIn)xCd2(1−x)S2 photocatalysts for H2 evolution under visible light by using a low-temperature hydrothermal method

A new series visible-light driven photocatalysts (CuIn)_xCd_2(1−x)S₂ was successfully synthesized by a simple and facile, low-temperature hydrothermal method. The synthesized materials were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), Brunauer–Emmett–Teller (BET) surface area measurement, X-ray photoelectron spectroscopy (XPS) and ultraviolet-visible spectroscopy (UV–Vis DRS). The results show that the morphology of the photocatalysts changes with the increase of x from 0.01 to 0.3 and their band gap can be correspondingly tuned from 2.37 eV to 2.30 eV. The (CuIn)_xCd_2(1−x)S₂ nanocomposite show highly photocatalytic activities for H₂ evolution from aqueous solutions containing sacrificial reagents, SO₃²⁻ and S²⁻ under visible light. Substantially, (CuIn)_0.05Cd_1.9S₂ with the band gap of 2.36 eV exhibits the highest photocatalytic activity even without a Pt cocatalyst (649.9 μmol/(g h)). Theoretical calculations about electronic property of the (CuIn)_xCd_2(1−x)S₂ indicate that Cu 3d and In 5s5p states should be responsible for the photocatalytic activity. Moreover, the deposition of Pt on the doping sample results in a substantial improvement in H₂ evolution than the Pt-loaded pure CdS and the amount of H₂ produced (2456 μmol/(g h)) in the Pt-loaded doping system is much higher than that of the latter (40.2 μmol/(g h)). The (CuIn)_0.05Cd_1.9S₂ nanocomposite can keep the activity for a long time due to its stability in the photocatalytic process. Therefore, the doping of CuInS₂ not only facilitates the photocatalytic activity of CdS for H₂ evolution, but also improves its stability in photocatalytic process.     

Control of conduction band offset in wide-gap Cu(In,Ga)Se2 solar cells

The effects of conduction band offset of window/Cu(In,Ga)Se₂ (CIGS) layers in wide-gap CIGS based solar cells are investigated. In order to control the conduction band offset, a Zn_1−xMg_xO film was utilized as the window layer. We fabricated CIGS solar cells consisting of an ITO/Zn_1−xMg_xO/CdS/CIGS/Mo/glass structure with various CIGS band gaps (E_g≈0.97–1.43 eV). The solar cells with CIGS band gaps wider than 1.15 eV showed higher open circuit voltages and fill factors than those of conventional ZnO/CdS/CIGS solar cells. The improvement is attributed to the reduction of the CdS/CIGS interface recombination, and it is also supported by the theoretical analysis using device simulation.     

Preparation and characterization of semiconducting Zn1−xCdxSe thin films

The electrodeposition of Zn_1−xCd_xSe polycrystalline semiconducting thin films from aqueous acidic bath without any additives onto tin oxide-coated conducting glass and titanium substrates are described. The influence of deposition parameters on the film formation and deposition mechanism based on cyclic voltammetry is discussed. X-ray diffraction studies showed the polycrystalline wurtzite nature for all the films deposited under the proposed conditions. The optical studies revealed the band gap values in the range between 2.82 and 1.72 eV as the film composition changes from ZnSe to CdSe. It has been observed that the concentration of cadmium salt plays an essential role on the alloy formation. The surface morphological studies and composition analysis were carried out and the results are discussed.     

Improved performance of Cu(InGa)Se2 thin-film solar cells using evaporated Cd-free buffer layers

Polycrystalline Cu(InGa)Se₂ (CIGS) thin-film solar cells using evaporated In_xSe_y and ZnIn_xSe_y buffer layers are prepared. The purpose of this work is to replace the chemical bath deposited CdS buffer layer with a continuously evaporated buffer layer. In this study, a major effort is made to improve the performance of CIGS thin-film solar cells with these buffer layers. The relationship between the cell performance and the substrate temperature for these buffer layers is demonstrated. Even at the high substrate temperature of about 550°C for the buffer layer, efficiencies of more than 11% were obtained. Furthermore, the I−V characteristics of the cells using these buffer layers are compared with cells using CdS buffer layers fabricated by chemical bath deposition method. We have achieved relatively high efficiencies of over 15% using both the ZnIn_xSe_y and the CdS buffer layers.     

Determination of Cu(In1−xGax)3Se5 defect phase in MBE grown Cu(In1−xGax)Se2 thin film by Rietveld analysis

Quantitative phase analysis of Cu(In_1−xGa_x)Se₂ (CIGS) thin film grown over Mo coated soda lime glass substrates was studied by Rietveld refinement process using room temperature X-ray data at θ-2θ mode. Films were found to contain both stoichiometric Cu(In_1−xGa_x)Se₂ and defect related Cu(In_1−xGa_x)₃Se₅ phases. Best fitting was obtained using crystal structure with space group I-42d for Cu(In_1−xGa_x)Se₂ and I-42m for Cu(In_1−xGa_x)₃Se₅ phase. The effects of Ga/III (=Ga/In+Ga=x) ratio and Se flux during growth over the formation of Cu(In_1−xGa_x)₃Se₅ defect phase in CIGS was studied and the correlation between quantity of Cu(In_1−xGa_x)₃Se₅ phase and solar cell performance is discussed.     

Issues on the chalcopyrite/defect-chalcopyrite junction model for high-efficiency Cu(In,Ga)Se2 solar cells

Considering the chalcopyrite/defect-chalcopyrite junction model for Cu(In_1−xGa_x)Se₂-based devices and our previously reported findings for the Cu(In_1−xGa_x)₃Se₅ defect chalcopyrites, we have postulated that uniform high-Ga-content photovoltaic structures (with x > 0.35) do not yield acceptable device performance due to the electrical and structural differences between both types of materials (chalcopyrite and defect-chalcopyrite).In this contribution, the structural properties of the surface region of Ga containing absorber materials have been studied by grazing incidence X-ray diffraction. We find that there are significant differences between surface and bulk. A structural model is proposed for the growth of the chalcopyrite/defect-chalcopyrite junction relative to its Ga content. And we demonstrate that closely lattice matched high-Ga-content structures (x > 0.35) can produce solar cells withv acceptable performances. The high-voltage and low-current electrical outputs from high Ga structures are very desirable in module fabrication because overall resistive losses can be substantially reduced.     

Influence of CdS window layer on 2-μm thick CdS/CdTe thin film solar cells

Influence of the CdS window layer on the PV performances of 2-μm thick CdS/CdTe solar cells has been studied as a function of the CdS thickness, d_CdS. With a reduction of d_CdS from 114 to 95 nm, J_SC increases due to an increase in blue response. While, at d_CdS<85 nm, the conversion efficiency largely decreases due to a decrease in V_OC and FF. The deterioration of the crystallinity of CdTe due to a decrease in the sulfur composition x of the CdTe_1−xS_x mixed-crystal layer is concluded to be the most possible mechanism for the large decreases in V_OC and FF.     

Some physical investigations on AgInS2 sprayed thin films

AgInS₂ thin films have been prepared on glass substrates by the spray pyrolysis process using an aqueous solution which contains silver acetate (AgCH₃CO₂), thiourea (SC(NH₂)₂) and indium chloride (InCl₃) as precursors. The depositions were carried out in the range of the substrate temperature from 260 to 420 °C. The value of the concentration ratio in the spray solution of indium and silver elements x=[Ag⁺]/[In³⁺] was varied from 1 to 1.5 with [In³⁺]=10⁻² M and [S²⁻]/[In³⁺] was taken constant, equal to 4. The structural study shows that AgInS₂ thin film, prepared at 420 °C using optimal concentration ratio x=1.3 crystallizes in the chalcopyrite phase with a strong (1 1 2) X-ray diffraction line. Moreover, microprobe analysis (EPMA) shows that a nearly stoichiometric composition is obtained for these experimental conditions. Indeed, the atomic percentage of elements were. 24.5, 25.0, 49.5 for Ag, In and S, respectively. On the other hand from transmission and reflectance spectra, the obtained band gap energy is 1.83 eV for such film.     

Third generation multi-layer graded band gap solar cells for achieving high conversion efficiencies—II: Experimental results

New designs of multi-layer graded band gap solar cell structures were experimentally tested using well-understood Al_xGa_(1−x)As materials grown by the MOVPE technique. Laboratory scale devices (0.5 mm diameter) were processed and measured for their performance as solar cells. Both V_oc (1110 mV) and fill factors (83%) for the best devices have shown drastic improvements over existing cells and the short-circuit current densities measured are in the range (10–20) mA cm⁻² .     

Study of electron-beam evaporated Sn-doped In2O3 films

Electron beam evaporated Sn-doped In₂O₃ films have been prepared from the starting material with composition of (1 − x) In₂O₃ − -x SnO₂, where x = 0.0, 0.010, 0.025, 0.050, 0.090, and 0.120. X-ray photoelectron spectroscopy, Rutherford backscattering spectrometry, and X-ray diffraction analysis were carried out on the films. Luminous transmittance and electrical resistivity of the films, show weak dependence on x. The composition of the film ([Sn]/[In] atomic ratio) was found to differ from that of the starting material. In fact, the atomic ratio was higher in the film than in the starting material by a factor which increases with x (ranging from 1.0 to 2.6). There is a relatively broad resistivity minimum in the layer atomic ratio range Sn/In = 0.06 − -0.09. These results compare well with those reported in the literature for Sn-doped In₂O₃ films, prepared by pyrolitic (spray) method.     

Structural and optical characterization of hot wall deposited CdSexTe1−x films

CdSe_0.3Te_0.7 alloy was prepared from the individual components and its composition and structural analysis were done. Films were prepared by hot wall deposition technique using 0.15 m length tube under a vacuum of 5×10⁻⁵ Torr on well cleaned glass substrates. The composition, structural, morphological, and optical properties of hot wall deposited films were investigated. The XRD analysis revealed that the films are like amorphous in nature for lower thicknesses but with increasing thickness a more preferred orientation along (1 0 1) direction was observed. The crystallite size (D), dislocation density (δ) and strain () were evaluated. From the EDX composition analysis, the individual concentrations of Se and Te in the films were estimated. An analysis of optical measurements shows that all the films have fairly good transparency above 850 nm. The optical band gap was found to be around 1.55 eV and decreases with increasing thickness. Also comparison of band gap with corresponding values for CdSe and CdTe are made.