Magneto-optical contrast in near-field optics

We propose a simple calculation of near-field magneto-optical (MO) images based on the beam propagation method. We calculate both Faraday rotation and circular dichroism contrasts of planar magnetic structures such as as-grown thin films and ion-irradiated samples. High-contrast near-field MO images are obtained, in good agreement with our experimental observations.     

Magneto-optical contrast in near-field optics

We propose a simple calculation of near-field magneto-optical (MO) images based on the beam propagation method. We calculate both Faraday rotation and circular dichroism contrasts of planar magnetic structures such as as-grown thin films and ion-irradiated samples. High-contrast near-field MO images are obtained, in good agreement with our experimental observations.     

Apertureless scanning near-field magneto-optical microscopy of magnetic multilayers

We imaged magnetic domains in Pt/Co/Pt multilayers using an apertureless scanning near-field optical microscope operating in reflection mode. As the magneto-optical effects are weak for this kind of structure, a polarization modulation technique with a photoelastic modulator was used to reveal the contrast between magnetic domains. In the case of a Pt/Co/Pt trilayer structure, a strong improvement in lateral resolution is observed compared with far-field magneto-optical images and good sensitivity is achieved. In the case of a Pt/[Co/Pt]Pt multilayer structure, stripe domains of 200 nm width could be resolved, in good agreement with images obtained by magnetic force microscopy on the same structure.     

Apertureless scanning near-field magneto-optical microscopy of magnetic multilayers

We imaged magnetic domains in Pt/Co/Pt multilayers using an apertureless scanning near-field optical microscope operating in reflection mode. As the magneto-optical effects are weak for this kind of structure, a polarization modulation technique with a photoelastic modulator was used to reveal the contrast between magnetic domains. In the case of a Pt/Co/Pt trilayer structure, a strong improvement in lateral resolution is observed compared with far-field magneto-optical images and good sensitivity is achieved. In the case of a Pt/[Co/Pt]Pt multilayer structure, stripe domains of 200 nm width could be resolved, in good agreement with images obtained by magnetic force microscopy on the same structure.     

Spectroscopic scanning near-field optical microscopy with a free electron laser: CH2 bond imaging in diamond films

Hydrogen chemistry in thin films and biological systems is one of the most difficult experimental problems in today's science and technology. We successfully tested a novel solution, based on the spectroscopic version of scanning near-field optical microscopy (SNOM). The tunable infrared radiation of the Vanderbilt free electron laser enabled us to reveal clearly hydrogen-decorated grain boundaries on nominally hydrogen-free diamond films. The images were obtained by SNOM detection of reflected 3.5 µm photons, corresponding to the C–H stretch absorption, and reached a lateral resolution of 0.2 µm, well below the λ/2 (λ= wavelength) limit of classical microscopy.     

Polarization properties of bent-type optical fibre probe for magneto-optical imaging

Quantitative evaluation of magneto-optical parameters is necessary in order to apply scanning near-field optical microscope (SNOM) technology to the study of magnetism on the mesoscopic scale. For this purpose, quantitative knowledge of polarization transmission properties through an optical fibre probe is required. We therefore determined the Stokes parameters of the bent-type optical fibre probe that is used as a cantilever for atomic force microscope operation in our SNOM system. As a result, it is found that the degree of polarization is maintained in the light emitted from the probe, although the probe acts as if it were a wave plate. This anisotropic polarization state of the light emitted from the probe was compensated for by using a Berek compensator placed in front of the fibre coupler.     

Polarization properties of bent-type optical fibre probe for magneto-optical imaging

Quantitative evaluation of magneto-optical parameters is necessary in order to apply scanning near-field optical microscope (SNOM) technology to the study of magnetism on the mesoscopic scale. For this purpose, quantitative knowledge of polarization transmission properties through an optical fibre probe is required. We therefore determined the Stokes parameters of the bent-type optical fibre probe that is used as a cantilever for atomic force microscope operation in our SNOM system. As a result, it is found that the degree of polarization is maintained in the light emitted from the probe, although the probe acts as if it were a wave plate. This anisotropic polarization state of the light emitted from the probe was compensated for by using a Berek compensator placed in front of the fibre coupler.     

Reflection mode scanning near-field optical microscopy analyses of integrated devices

Ultra-large-scale integrated devices have been investigated by a reflection mode scanning near-field optical microscope designed for semiconductor analyses. Although it could be found that imaging the reflectivity of metal structures buried underneath thin, optically transparent passivation layers is practicable, shading of the reflected light by the SNOM probe complicated the interpretability of the achieved results. This issue has been overcome by using the SNOM probe as both illumination source and detector, simultaneously. The application of focused ion beam milling to the probes has allowed the increase of the transmittivity of the probes to such an extent that coated fibres could be utilized and the interpretability of the results could be enhanced. Furthermore, the investigated structures are of great interest for an investigation of z-motion artefacts, as the presence of the polished passivation layers allows topographical influences to be distinguished from pure optical contrast.     

Reflection mode scanning near-field optical microscopy analyses of integrated devices

Ultra-large-scale integrated devices have been investigated by a reflection mode scanning near-field optical microscope designed for semiconductor analyses. Although it could be found that imaging the reflectivity of metal structures buried underneath thin, optically transparent passivation layers is practicable, shading of the reflected light by the SNOM probe complicated the interpretability of the achieved results. This issue has been overcome by using the SNOM probe as both illumination source and detector, simultaneously. The application of focused ion beam milling to the probes has allowed the increase of the transmittivity of the probes to such an extent that coated fibres could be utilized and the interpretability of the results could be enhanced. Furthermore, the investigated structures are of great interest for an investigation of z -motion artefacts, as the presence of the polished passivation layers allows topographical influences to be distinguished from pure optical contrast.     

X-ray excited optical luminescence detection by scanning near-field optical microscope: a new tool for nanoscience

Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of x-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning near-field optical microscopy (SNOM) detection of the x-ray excited optical luminescence (XEOL) signal. This new instrumentation offers the possibility to carry out a selective structural analysis of the sample surface with the subwavelength spatial resolution determined by the SNOM probe aperture. In addition, the apex of the optical fiber plays the role of a topographic probe, and chemical and topographic mappings can be simultaneously recorded. Our working XAS-SNOM prototype is based on a quartz tuning-fork head mounted on a high stability nanopositioning system; a coated optical fiber tip, operating as a probe in shear-force mode; a detection system coupled with the microscope head control system; and a dedicated software/hardware setup for synchronization of the XEOL signal detection with the synchrotron beamline acquisition system. We illustrate the possibility to obtain an element-specific contrast and to perform nano-XAS experiments by detecting the Zn K and W L(3) absorption edges in luminescent ZnO and mixed ZnWO(4)-ZnO nanostructured thin films.     

基于多层膜的软X射线偏振测量

综述了过去10年中德国BESSY同步辐射装置在软X射线偏振测量方面所做的工作。在BESSY同步辐射装置中,有10条椭圆波动器光束线,这可使同步加速器辐射的偏振态从线偏振光(水平或者垂直)转变为左旋或右旋圆偏振光。由于很多偏振敏感实验(例如,MCD光谱测量)需要归一化量,因此对偏振度进行量化非常重要。对于偏振实验,即对光的偏振态测量来说,需要两个光学元件分别起相位片和检偏器作用。因此,专门研制了在软X射线区有透射和反射功能的多层膜,并对其做了优化。通过使多层膜参数(周期,厚度比)与构成材料的吸收边相匹配,即可获得共振加强的偏振灵敏度。由此可知,基于多层膜的偏振测量与这些偏振光学元件工作波长处性能测量密切相关,文中对仪器的设置和测试结果做了介绍,同时给出了磁性薄膜或光活化物质的磁光光谱测量和偏振测量的示例(法拉第和克尔效应)。     

Near-field optical microscopy with video signal processor to apply a CCD imaging device as a variable area photo-sensor for improving operability and spectrum mode imaging

We have developed a video signal processor for improving the operability and function of scanning near-field optical microscopy (SNOM). The video signal processor applies a CCD imaging device as a variable area photo-sensor in the SNOM unit instead of conventional photo-detectors. The signal processor converts the intensity of a selected area in video frames to a numerical value with a rate of 30 Hz. Consequently, the CCD imaging device can be used as a photo-detector of variable areas and positions for detecting a small area of a optical probe position. The need for a precise optical axis alignment is relaxed due to the large sensing area of the CCD device. Using the video signal processor, near-field optical and topographic images have been obtained by SNOM/AFM system simultaneously. By adding a spectrometer between the SNOM unit and the CCD device, the spectrum signal of selected wavelength ranges has been monitored by the video signal processor to provide an optical image.     

Fluorescence scanning near-field optical microscopy of polyfluorene composites

Fluorescence scanning near-field optical microscopy (SNOM) is used to investigate binary polyfluorene-based composites of varying composition. The samples investigated contain blends of the polymer poly(9,9'-dioctylfluorene-cobenzothiadiazole), F8BT, with similar polyfluorenes of wider band gap. Images acquired from a film containing 50% by weight F8BT exhibit a high degree of correlation between the topography and fluorescence, with an F8BT-rich phase which protrudes from the surface of the film forming isolated regions with sizes from hundreds of nanometres to several micrometres. A film containing 10% by weight F8BT also has micrometre-size F8BT-rich regions, but also present are small and locally varying proportions of F8BT in the other polyfluorene component phase, indicating a hierarchy of phases within this sample. The fluorescence and topographic images of a third sample studied, containing 90% by weight F8BT, display no correlation, demonstrating that it is not always appropriate to use topographic information to determine the phase structure within polymer blends. The fluorescence SNOM images acquired from these samples are able to assist our understanding of the photovoltaic efficiency of devices fabricated from these films, which are governed by the extent of the interfacial area between these two constituent polymers.     

Scanning near-field optical microscopy (SNOM)

SNOM is a non-contact stylus microscopy analogous to STM. Optical near-field interaction is used to sense approach and optical properties on the nanometre scale (?1 nm normal, 20–50 nm lateral). SNOM was demonstrated in transmission and reflection, in a topographic mode, and with amplitude as well as phase objects. The excitation of plasmons in the SNOM ‘tip’, a very recent development, greatly enhances sensitivity and permits intriguing new optical experiments. Overcoming the limit of diffraction, SNOM turns a long-held dream of optical microscopists into reality.     

Apertureless near-field optical microscopy via local second-harmonic generation

We describe an apertureless scanning near-field optical microscope (SNOM) based on the local second-harmonic generation enhancement resulting from an electromagnetic interaction between a probe tip and a surface. The imaging mechanisms of such apertureless second-harmonic SNOM are numerically studied. The technique allows one to achieve strongly confined sources of second-harmonic light at the probe tip apex and/or surface area under the tip. First experimental realization of this technique has been carried out using a silver-coated fibre tip as a probe. The experiments reveal a strong influence of the tip–surface interaction as well as polarization of the excitation light on images obtained with apertureless second-harmonic SNOM. The technique can be useful for studying the localized electromagnetic excitations on surfaces as well as for visualization of lateral variations of linear and nonlinear optical properties of surfaces.     

Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

Nano-scale structures of the YOYO-1-stained barley chromosomes and lambda-phage DNA were investigated by scanning near-field optical/atomic force microscopy (SNOM/AFM). This technique enabled precise analysis of fluorescence structural images in relation to the morphology of the biomaterials. The results suggested that the fluorescence intensity does not always correspond to topographic height of the chromosomes, but roughly reflects the local amount and/or density of DNA. Various sizes of the bright fluorescence spots were clearly observed in fluorescence banding-treated chromosomes. Furthermore, fluorescence-stained lambda-phage DNA analysis by SNOM/AFM demonstrated the possibility of nanometer-scale imaging for a novel technique termed nano-fluorescence in situ hybridization (nano-FISH). Thus, SNOM/AFM is a powerful tool for analyzing the structure and the function of biomaterials with higher resolution than conventional optical microscopes.     

Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy

Scanning near-field optical microscopy (SNOM) achieves a resolution beyond the diffraction limit of conventional optical microscopy systems by utilizing subwavelength aperture probe scanning. A problem associated with SNOM is that the light throughput decreases markedly as the aperture diameter decreases. Apertureless scanning near-field optical microscopes obtain a much better resolution by concentrating the light field near the tip apex. However, a far-field illumination by a focused laser beam generates a large background scattering signal. Both disadvantages are overcome using the tip-on-aperture (TOA) approach, as presented in previous works. In this study, a finite difference time domain analysis of the degree of electromagnetic field enhancement is performed to verify the efficiency of TOA probes. For plasmon enhancement, silver is deposited on commercially available cantilevered SNOM tips with 20nm thicknesses. To form the aperture and TOA in the probes, electron beam-induced deposition and focused ion beam machining were applied at the end of the sharpened tip. The results show that cantilevered TOA probes were highly efficient for improvements of the resolution of optical and topological measurement of nanostructures.     

Fluorescence imaging and investigations of directly labelled chromosomes using scanning near-field optical microscopy

Scanning near-field optical microscopy (SNOM) has been successfully employed to generate high resolution (<100nm) fluorescence images of directly tagged human chromosomes. Direct tagging, fluorescence in-situ hybridisation processes (with and without amplification) are investigated and their fluorescence response to near-field excitation are compared. Using the simultaneous topography mode of SNOM, chromosome morphology was seen to differ as a result of the two processes; with chromatin collapse more extensive when the amplified direct tagging procedure was used. The results are discussed in the context of developing locus specific direct tags together with high resolution SNOM imaging for the observation of chromosome aberrations.     

Penetration pathways of fluorescent dyes in human hair fibres investigated by scanning near-field optical microscopy

Thin cross-sections of human hairs were investigated by scanning near-field optical microscopy (SNOM) and confocal laser scanning microscopy (CLSM) after penetration of a fluorescent dye. The same samples were measured with both techniques to compare the observed structures. The images obtained from the two methods show nearly identical structures representing pathways of the dye molecules in hairs. The SNOM images provide a higher resolution than the CLSM images. Therefore, SNOM is believed to be a suitable method for investigations at a resolution of 100 nm on penetration pathways of fluorescent dyes such as the cell membrane complex pathway in cross-sections of hairs.     

A novel light source for SICM–SNOM of living cells

We have developed a novel light source for use in a scanning near‐field optical microscope (SNOM or NSOM) based on a nanopipette whose distance from the sample surface is controlled using scanning ion conductance microscopy. The light source is based on the general principle of the chemical reaction between a fluorophore in the pipette and ligand in the bath, to produce a highly fluorescent complex that is continually renewed at the pipette tip. In these experiments we used fluo‐3 and calcium, respectively. This complex is then excited with an Ar⁺ laser, focused on the pipette tip, to produce the light source. This method overcomes the transmission problem of more traditional SNOM probes and has been used to acquire simultaneous high‐resolution topographic and optical images of biological samples in physiological buffer. A resolution of ～220 nm topographic and ～190 nm optical was determined through imaging fixed sea‐urchin sperm flagella. Live A6 cells were also imaged, demonstrating the potential of this system for SNOM imaging of living cells.