共查询到18条相似文献,搜索用时 140 毫秒
1.
2.
扫描探针显微镜(SPM)作为一种广泛应用的表面表征工具,不仅可以表征三维形貌,还能定量地研究表面的粗糙度、孔径大小和分布及颗粒尺寸,在许多学科均可发挥作用.以纳米材料为主要研究对象,综述了国外最新的几种扫描探针显微表征技术,包括扫描隧道显微镜(STM)、原子力显微镜(AFM)和近场扫描光学显微镜(SNOM)等方法,展示了这几种技术在纳米材料的结构和性能方面的应用. 相似文献
3.
激光原子力显微镜及其对光学表面粗糙度的研究 总被引:1,自引:1,他引:0
自一九八五年,Binnig与斯坦福大学的Quate和IBM公司苏黎士实验室的Christoph合作推出了世界上第一台原子力显微镜(简称AFM)以来,AFM的研究及应用迅速扩展。它不仅象扫描隧道显微镜那样能从原子尺度上对导体、半导体表面而且还能对非导体的表面进行成像,拓宽了STM的应用范围。 相似文献
4.
基于STM的多模式扫描探针显微镜的建立 总被引:5,自引:2,他引:3
在已有的扫描隧道显微镜(STM)基础上设计了一套集STM、 光子扫描隧道显微镜(PSTM)、近场扫描光学显微镜(NSOM)、扫描近场声学显微镜(SNAM)为一体的多模式扫描探针显微系统(SPM)。系统的4种模式可通过转换开关方便地切 换,探头的更换也很容易。利用本系统对典型样品进行了扫描成像。测试表明,系统具有良好的稳定性和超高分辨率。 相似文献
5.
扫描隧道显微镜(STM)和原子力显微镜(AFM)由于具有原子量级的分辨率,所以在表面物理、化学、生物等领域得到了越来越广泛的应用。但是,他们在工作上不能彼此兼容。为此,研制了一台新仪器,既可用作STM,又可作为AFM。本文介绍了该仪器的反馈控制系统及其设计。实验表明,这套反馈系统工作稳定可靠,它使仪器至少可达到纳米量级的分辨率。 相似文献
6.
7.
8.
9.
SPM通用平台是一套扫描探针显微镜开发工具系统,它提供了一种开发生产SPM新的思路和方法,使SPM成为通用、开放、兼容的仪器体系.本文介绍了SPM通用平台的原理、指标和在其上扩展扫描隧道显微镜、原子力显微镜等功能模块的方法,以及智能型SPM通用平台的研究思路. 相似文献
10.
溶液中细胞色素b6f的原子力显微镜和扫描隧道显微镜观测 总被引:2,自引:0,他引:2
本文用原子力显微镜(atomic force microscope,AFM)和扫描隧道显微镜(scanning tunneling microscope,STM)在Tricine-NaOH-OG缓冲溶液中研究了细胞色素b6f(Cytochrome b6f,Cyt b6f)在固体表面上的吸附形态。首先用AFM观察了吸附在云母表面上的cyt b6f复合体,观察到了分散较好的蛋白质颗粒。进一步用高分辨率的电化学STM(EC-STM)观察了吸附在Au(111)表面上的cyt b6f分子,在浓度较低时发现了其二聚体的吸附形态,而在浓度较高时cyt b6f分子在Au(111)表面聚集成薄膜。 相似文献
11.
12.
13.
The tunnelling electrons in a scanning tunnelling microscope (STM) may be able to induce photons containing information about the sample surface material using the high lateral resolution of an STM. By utilizing as much of the solid angle as possible, the luminescence is collected by an ellipsoidal mirror and focused on a photon counting system. In contrast to earlier assumptions, very low light intensities are emitted from real and technical specimen too. The photon map, recorded simultaneously with the topography at the metal and semiconductor surfaces, shows differences in the surface material and the coverage with adsorbates 相似文献
14.
R. K. Wild 《Advanced functional materials》1995,5(2):53-70
This review briefly describes some of the techniques available for analysing surfaces and illustrates their usefulness with a few examples. In particular, Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), sputter neutral mass spectroscopy (SNMS) and laser Raman spectroscopy are all described. In analysing a surface, AES and XPS would normally be considered first, with AES being applied where high spatial resolution is required and XPS where chemical state information is needed. SIMS and SNMS can be performed together and can detect smaller surface concentrations. Laser Raman spectroscopy is useful for determining molecular bonding. Techniques which give topographic information, such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM), have not been considered. 相似文献
15.
16.
Many attempts have been made to detect the current carrying filaments in electroformed metal-insulator-metal (MIM) structures (Pagnia and Sotnik 1988, Pagnia 1990). Transmission and scanning electron microscopes have been used without real success. Even experiments with the scanning tunnelling microscope (STM) could not definitely detect the filaments. We have mapped the potential distribution on an electroformed planar MIM diode (gold on quartz glass) with an STM and found usually only one (sometimes a few) sharp potential drop(s) in the microslit. 相似文献
17.
B. G. Konoplev O. A. Ageev V. A. Smirnov A. S. Kolomiitsev N. I. Serbu 《Russian Microelectronics》2012,41(1):41-50
The paper presents the results of experimental investigations into probe modification for atomic-force microscopy (AFM) and
scanning tunneling microscopy (STM) by etching the point of AFM cantilevers and tungsten STM probes by applying the method
of focused ion beams (FIBs). It is shown that the use of etching by the IB method allows one to obtain the probes with rounding
that is less than 10 nm and with an aspect ratio of 1: 50. The application of these probes increases the resolution and the
reliability of measuring by the AFM and STM methods. The obtained results can be used for developing the technological processes
of production and modification of sensor probes for AFM and STM, as well as the methods for diagnostics of the structures
of microelectronics, nanoelectronics and the microsystem and nanosystem technologies. 相似文献
18.
Stable and reproducible images of photo-electrochemically passivated or alkaline etched GaAs (100) surfaces are obtained by a scanning tunnelling microscope (STM) working in air. Typically the surface roughness ranges around 10 nm at scanning areas down to 400 × 200 nm. Evaporation of Au after chemical treatment produces smoother surfaces which is possibly due to Au accumulation in deepenings. 相似文献