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1.
Sputtering technique for Cu–In precursor films fabrication using different Cu and In layer sequences have been widely investigated for CuInSe2 production. But the CuInSe2 films fabricated from these precursors using H2Se or Se vapour selenization mostly exhibited poor microstructural properties. The co-sputtering technique for producing Cu–In alloy films and selenization within a close-spaced graphite box resulting in quality CuInSe2 films was developed. All films were analysed using SEM, EDX, XRD and four-point probe measurements. Alloy films with a broad range of compositions were fabricated and XRD showed mainly In, CuIn2 and Cu11In9 phases which were found to vary in intensities as the composition changes. Different morphological properties were displayed as the alloy composition changes. The selenized CuInSe2 films exhibited different microstructural properties. Very In-rich films yielded the ODC compound with small crystal sizes whilst slightly In-rich or Cu-rich alloys yielded single phase CuInSe2 films with dense crystals and sizes of about 5 μm. Film resistivities varied from 10−2–108 Ω cm. The films had compositions with Cu/In of 0.40–2.3 and Se/(Cu+In) of 0.74–1.35. All CuInSe2 films with the exception of very Cu-rich ones contained high amount of Se (>50%).  相似文献   

2.
Cu2Se/InxSe(x≈1) double layers were prepared by sequentially evaporating In2Se3 and Cu2Se binary compounds at room temperature on glass or Mo-coated glass substrates and CuInSe2 films were formed by annealing them in a Se atmosphere at 550°C in the same vacuum chamber. The InxSe thickness was fixed at 1 μm and the Cu2Se thickness was varied from 0.2 to 0.5 μm. The CuInSe2 films were single phase and the compositions were Cu-rich when the Cu2Se thickness was above 0.35 μm. And then, a thin CuIn3Se5 layer was formed on the top of the CuInSe2 film by co-evaporating In2Se3 and Se at 550°C. When the thickness of CuIn3Se5 layer was about 150 nm, the CuInSe2 cell showed the active area efficiency of 5.4% with Voc=286 mV, Jsc=36 mA/cm2 and FF=0.52. As the CuIn3Se5 thickness increased further, the efficiency decreased.  相似文献   

3.
Gas phase selenization of vacuum deposited Cu and In thin films employing an elemental Se vapour source is demonstrated as an essential first step in the search for optimized process parameters for the formation of single phase CuInSe2 materials suitable for solar cell applications. The selenization was accomplished in Se vapour, derived from an elemental Se source, held at 240–260°C. This source was placed in a flow of nitrogen gas at 500 Torr to transport the Se vapour to the metal films. The selenization reaction readily occurs at Cu and In films kept at 340–400°C. Lower selenization temperatures invariably lead to the formation of Cu and In selenides with well defined crystalline microstructures. Hexagonal CuSe with an excess of Se in the matrix is the equilibrium growth phase, while the cubic Cu2−xSe phase evolves under conditions of excess Se flux. Selenization of the In films consistently led to the formation of the β-form of hexagonal In2Se3. At high selenization temperatures (400°C), while the β-form still emerges as the major component, traces of the α-form of In2Se3 are also detected. Detailed X-ray diffraction, electron probe analysis and microstructure data are presented.  相似文献   

4.
SILAR deposition of CuInSe2 films was performed by using Cu2+–TEAH3 (cupric chloride and triethanolamine) and In3+–CitNa (indium chloride and sodium citrate) chelating solutions with weak basic pH as well as Na2SeSO3 solution at 70 °C. A separate mode and a mixed one of cationic precursor solutions were adopted to investigate effects of the immersion programs on crystallization, composition and morphology of the deposited CuInSe2 films. Chelating chemistry in two solution modes was deducted based on IR measurement. The XRD, XPS and SEM results showed that well-crystallized, smoothly and distinctly particular CuInSe2 films could be obtained after annealing in Ar at 400 °C for 1 h by using the mixed cationic solution mode.  相似文献   

5.
CuInSe2 films have been prepared using the selenization technique. Preparation of the precursor as well as selenization were carried out by the vacuum evaporation technique. The sequence of copper and Indium layer deposition during precursor preparation affects the morphological and structural properties of precursor which directly have effects on the properties of selenized CIS films. A thin layer of amorphous selenium at the substrate/film interface has been used to improve the adherence of the film. The effect of the Se under-layer has been studied on the layers of copper, indium, CuIn precursors and CIS films, using structural, morphological and optical properties. The surface morphology of a single layer of copper and indium, with and without the Selenium under-layer, are quite different and drastically affect the properties of the precursor and selenized films. The Se under-layer does not take part in the chemical reaction of CIS formation during the selenization process. The modified CIS films are uniform, single phase, polycrystalline, chalcopyrite with (1 1 2) preferred orientation showing an energy band gap of 0.99 eV and an absorption coefficient of 105 cm−1, and have good adherence to the substrate for the scotch tape test.  相似文献   

6.
CuInSe2 thin films have been obtained by the sequential evaporation of Cu and In layers, and subsequent reaction at 400°C with elemental selenium vapor. The individual metallic film thickness and the substrate temperature during evaporation have been varied in order to promote intermixing and alloy formation before the selenization. The structure, morphology and photoelectrochemical activity of the CuInSe2 films have been determined by the characteristics of the evaporated metallic precursors. An improvement in the CuInSe2 quantum efficiency, related mainly to the increased homogeneity and smoothing of the sample surface, can be gained by using as precursors multiple stacked Cu–In bilayers evaporated onto unheated substrates.  相似文献   

7.
Thin films based on CuInSe2 have become very successful as absorber layers for solar cells. It is only in the recent past that gallium (Ga) and sulfur (S) were incorporated into CuInSe2 in order to increase the energy band gap of the film to an optimum value with the ultimate aim of producing more efficient devices. This paper focuses on the incorporation of S into partly selenized CuInSe2 films in order to produce CuIn(Se,S)2 films with varying S/Se+S ratios, resulting in different band-gap energies. This was achieved by varying the conditions when selenizing Cu/In alloys in H2Se/Ar, and then exposing these various partly selenized films to H2S/Ar under identical conditions.  相似文献   

8.
CuIn1−xGaxSe2 polycrystalline thin films were prepared by a two-step method. The metal precursors were deposited either sequentially or simultaneously using Cu–Ga (23 at%) alloy and In targets by DC magnetron sputtering. The Cu–In–Ga alloy precursor was deposited on glass or on Mo/glass substrates at either room temperature or 150°C. These metallic precursors were then selenized with Se pellets in a vacuum furnace. The CuIn1−xGaxSe2 films had a smooth surface morphology and a single chalcopyrite phase.  相似文献   

9.
In this article, we present results of a detailed real-time X-ray diffraction (XRD) study on the formation of CuInSe2 from electroplated precursors. The solid-state reactions observed during the selenisation of three different types of precursors are presented. The first type of precursors (I) consists of the nanocrystalline phases Cu2−xSe and InSe at room temperature, which react to CuInSe2 starting at 470 K. The second type of precursor (II) shows an inhibited CuInSe2 formation out of the initial phases Cu2−xSe and γ-In2Se3 starting at 400 K. The third precursor type (III) shows completely different selenisation behaviour. Starting from the intermetallic compound Cu11In9 and amorphous selenium, the formation of the binary selenides In4Se3 and CuSe is observed after the melting point of selenium at 494 K. After selenium transfer reactions, the compound semiconductor CuInSe2 is formed out of Cu2−xSe and InSe. This type (III) reaction path is well known for the selenisation of SEL precursors (stacked elemental layers of sputtered copper and indium and thermally evaporated selenium).  相似文献   

10.
The formation of CuIn(S,Se)2 thin films by thermal diffusion of sulfur (S) and selenium (Se) vapours into co-sputtered Cu–In alloy within a closed-space graphite container is reported. All films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), Four-point-probe and hot-probe measurements. Cu–In alloy films with composition varying from Cu-rich to In-rich were deposited. The synthesized In-rich films yielded CuIn5(S,Se)8 spinel compound which gradually transformed into a single phase CuIn(S,Se)2 as the film composition approached the Cu-rich region. The morphology of the CuIn5(S,Se)8 was found to differ from the stoichiometric and Cu-rich CuIn(S,Se)2 as observed from SEM. EDX composition analysis of the films showed a Cu/In ratio varying from 0.36 to 1.54 and a (S+Se)/(Cu+In) varying from 0.97 to 1.32. The amount of S incorporated in the films was found to differ with changes in the composition. The resistivity of the films ranged between 10−1 and 107 Ω cm and it strongly followed the change in the alloy film composition.  相似文献   

11.
Structural, optical and electrical properties of polycrystalline Cu–In–Se films, such as CuInSe2 and ordered vacancy compounds (OVC), prepared by three-stage process of sequential chemical spray pyrolysis (CSP) of In–Se (first stage), Cu–Se (second stage) and In–Se (third stage) solutions have been studied in terms of substrate temperature at the second stage (TS2). The films grown at TS2420 °C exhibited larger grains in comparison with the Cu–In–Se films grown by the usual CSP method. Optical gap energy was approximately 1.06 eV for 360 °CTS2420 °C, but increased dramatically from 1.06 to 1.35 eV when the TS2 rose from 420 to 500 °C. Conductivity type was p-type for TS2<420 °C, but n-type for TS2>420 °C.  相似文献   

12.
In the present communication, the authors report results on the characterization of electrodeposited and selenized (CuInSe2) (CIS) thin films. The selenization process was carried out using a technique called chemical vapor transport by gas (CVTG). The precursors as well as selenized films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and electron microprobe analysis (EPMA). The film stoichiometry improved after selenization at 550°C. The films were formed with a mixed composition of the binary as well as the ternary phases.  相似文献   

13.
CuInSe2 (CIS) and Cu(In,Ga)Se2 (CIGS) thin films were prepared by electrodeposition and processing. The influence of film deposition parameters such as bath composition, pH, deposition potential and material purity on film properties was studied. The structural, morphological, compositional and opto-electronic properties of electrodeposited and selenized CIS and CIGS thin films were characterized using various techniques. As-deposited as well as selenized films exhibited a compact or a granular morphology depending on the composition. The film stoichiometry was improved after selenization at 550°C in a tubular furnace. The films are formed with a mixed phase composition of CuInSe2 and CuIn2Se3.5 ternary phases.  相似文献   

14.
CuIn1−xGaxSe2 (CIGS) thin films were formed from an electrodeposited CuInSe2 (CIS) precursor by thermal processing in vacuum in which the film stoichiometry was adjusted by adding In, Ga and Se. The structure, composition, morphology and opto-electronic properties of the as-deposited and selenized CIS precursors were characterized by various techniques. A 9.8% CIGS based thin film solar cell was developed using the electrodeposited and processed film. The cell structure consisted of Mo/CIGS/CdS/ZnO/MgF2. The cell parameters such as Jsc, Voc, FF and η were determined from I–V characterization of the cell.  相似文献   

15.
We have investigated the electrochemical deposition of modulated thin films based on the CuxIn2−xSe2 system. CuInSe2 is a leading alternative to silicon for use in thin film photovoltaic solar cells due to its optical absorption and electrical characteristics. Alternating layers of two different compositions based on the CuxIn2−xSe2 system were potentiostatically deposited. These nanometer-scale layers are used to form reduced-dimensionality structures such as superlattices that can be used in concentrator solar cells. We have used X-ray diffraction, energy-dispersive spectroscopy, and scanning tunneling microscopy to characterize our asdeposited thin films. The ability of the scanning tunneling microscope to resolve the individual nanoscale layers of our multilayered thin films is shown and is used to determine modulation wavelengths.  相似文献   

16.
A novel technique was demonstrated for the growth of CuInSe2 (CIS) thin films. The technique used an ink formulation containing sub-micron size particles of Cu–In alloys. A metallic precursor layer was first formed by coating this ink onto the substrate by spraying. The precursor film was then made to react with Se to form the CIS compound. The morphology of the CIS layers depended on the initial composition of the Cu–In particles as well as the post-deposition treatments. Solar cells were fabricated on CIS absorber layers prepared by this low-cost ink-coating approach and devices with a conversion efficiency of over 10.5% were demonstrated.  相似文献   

17.
CuInxGa1−xSe2 (CIGS) polycrystalline thin films with various Ga to In ratios were grown using a new two-step electrodeposition process. This process involves the electrodeposition of a Cu–Ga precursor film onto a molybdenum substrate, followed by the electrodeposition of a Cu–In–Se thin film. The resulting CuGa/CuInSe bilayer is then annealed at 600°C for 60 min in flowing Argon to form a CIGS thin film. The individual precursor films and subsequent CIGS films were characterized by X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy and Auger electron spectroscopy. The as-deposited precursor films were found to be crystalline with a crystal structure matching that of CuGa2. The annealed bi-layers were found to have the same basic chalcopyrite structure of CuInSe2, but with peak shifts due to the Ga incorporation. Energy dispersive spectroscopy results show that the observed shifts correlate to the composition of the films.  相似文献   

18.
Polycrystalline chalcopyrite thin films were potentiostatically electrodeposited from ethylene glycol solution onto SnO2-coated glass substrates at 150 °C. The thickness of the layers was estimated using talysurf at 1.0 μm after deposition for 60 min. X-ray diffraction (XRD), X-ray fluorescence (XRF), scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) analyses were used to identify and characterise compounds formed at different potentials. It was found that Cu1.75Se formation was dominant at −0.80 V vs Se and indium assimilation increased at more negative voltages forming a mixture of compounds including numerous Cu-Se binary phases and copper indium diselenide (CuInSe2) at the cathode. As-deposited materials showed poor crystallinity and therefore films were annealed in Ar/5%H2 in the presence of Se to improve the material quality for all investigations. Although the films were deposited at 150 °C, no noticeable improvement of the CuInSe2 was observed, suggesting growth from aqueous media at room temperature to be preferable.  相似文献   

19.
CuInSe2 (CIS) thin films with a range of Cu/In ratios were grown by molecular beam epitaxy on GaAs (0 0 1) at substrate temperatures of Ts = 450–500°C and the effects of annealing under various atmospheres have been investigated. Photoluminescence spectra obtained from an ex-situ vacuum annealed CIS film at a temperature of TA = 350°C showed a red-shift and a broadening of an emission peak (peak c) which originally appeared at 0.970 eV before annealing and the red-shifted peak c was found to consist of two overlapping peaks. The excitation power dependence of these overlapping peaks indicated the radiative recombination processes associated with the emissions to be a conduction band to acceptor transition (peak at 0.970 eV) and a transition due to donor-acceptor pairs (peak at 0.959 eV), indicating the formation of a shallow donor-type defect during the vacuum annealing process. The origin of this defect has tentatively been attributed to Se vacancies. On the other hand, the molar fraction of oxygen increased with increasing annealing temperature in dry-air. An epitaxially grown In2O3 phase was found both in Cu-rich and In-rich films annealed at TA 350°C, which was not observed in the films annealed in Ar atmosphere. Thermodynamic calculations based on the Cu---In---Se---O---N system showed In2O3 to be the most stable phase in good agreement with the experimental results.  相似文献   

20.
A novel pathway for the formation of copper–indium (gallium) diselenide has been developed. This two-stage process consists of (a) the formation of Cu–In–(Ga)–Se precursors, and (b) subsequent thermal treatment to form CuIn(Ga)Se2. The morphology, structure and growth mechanism for several different precursor structures prepared under various conditions were studied and correlated to the deposition parameters as well as the structure and morphology of the annealed films. Photovoltaic devices prepared from CuInSe2 and CuIn0.75Ga0.25Se2 resulted in efficiencies of 10% and 13%, respectively.  相似文献   

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