Dynamics of annular bright field imaging in scanning transmission electron microscopy

We explore the dynamics of image formation in the so-called annular bright field mode in scanning transmission electron microscopy, whereby an annular detector is used with detector collection range lying within the cone of illumination, i.e. the bright field region. We show that this imaging mode allows us to reliably image both light and heavy columns over a range of thickness and defocus values, and we explain the contrast mechanisms involved. The role of probe and detector aperture sizes is considered, as is the sensitivity of the method to intercolumn spacing and local disorder.     

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy

A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra.     

Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: a theoretical study

There is strong interest in lithium imaging, particularly because of its significance in battery materials. However, light atoms only scatter electrons weakly and atomic resolution direct imaging of lithium has proven difficult. This paper explores theoretically the conditions under which lithium columns can be expected to be directly visible using annular bright field scanning transmission electron microscopy. A detailed discussion is given of the controllable parameters and the conditions most favourable for lithium imaging.     

Spatially resolved diffractometry with atomic-column resolution

We demonstrate spatially resolved diffractometry in which diffraction patterns are acquired at two-dimensional positions on a specimen using scanning transmission electron microscopy (STEM), resulting in four-dimensional data acquisition. A high spatial resolution of about 0.1 nm is achieved using a stabilized STEM instrument, a spherical aberration corrector and various post-acquisition data processings. We have found a few novel results in the radial and the azimuthal scattering angle dependences of atomic-column contrast in STEM images. Atomic columns are clearly observed in dark field images obtained using the excess Kikuchi band intensity even in small solid-angle detection. We also find that atomic-column contrasts in dark field images are shifted in the order of a few tens of picometers on changing the azimuthal scattering angle. This experimental result is approximately interpretable on the basis of the impact parameter in Rutherford scattering. Spatially resolved diffractometry provides fundamental knowledge related to various STEM techniques, such as annular dark field (ADF) and annular bright field (ABF) imaging, and it is expected to become an analytical platform for advanced STEM imaging.     

The effect of vacancies on the annular dark field image contrast of grain boundaries: a SrTiO(3) case study

The analysis of grain boundary structure in high resolution electron microscopy is often hindered by contrast variation within the grain boundary region which is not explained by simple models of the grain boundary structure. Recent work suggests that structural disorder along the beam direction and the presence of vacancies contribute significantly to this effect. One might expect a significant reduction in contrast in a Z-contrast image of a grain boundary would imply that vacancies present must result from the absence of heavier elements. Using a [001](210) Σ5 grain boundary in SrTiO₃ as a test case and first principles structure relaxation to calculate stable defect structures, we show that the reduction in the intensity from fully occupied Sr columns due to the structural distortion resulting from a nearby O vacancy can be as great as that due to introducing a Sr vacancy in the column itself. The effect on energy dispersive X-ray spectroscopy signals is also considered, but found to be smaller than that on Z-contrast images.     

Observation of metal nanoparticles at atomic resolution in Pt‐based cancer chemotherapeutics

The chemotherapeutics cisplatin and oxaliplatin are important tools in the fight against cancer. Both compounds are platinum complexes. Aberration‐corrected scanning transmission electron microscopy using the annular dark‐field imaging mode now routinely provides single‐atom sensitivity with atomic number contrast. Here, this imaging mode is used to directly image the platinum within the two drugs in their dried form on an amorphous carbon support film. The oxaliplatin is found to have wetted the supporting amorphous carbon, forming disordered clusters suggesting that the platinum has remained within the complex. Conversely, the cisplatin sample reveals 1.8‐nm‐diameter metallic platinum clusters. The size and shape of the clusters do not appear to be dependent on drying rate nor formed by beam damage, which may suggest that they were present in the original drug solution.     

A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy

A new procedure to quantify the contrast in annular dark field images recorded without lattice resolution in a scanning transmission electron microscope is proposed. The method relies on the use of an in‐column energy filter prior to the annular dark field detector and the acquisition of a series of energy‐filtered images as a function of the inner detection angle. When the image contrast of an interface between two materials in such energy‐filtered annular dark field images is plotted vs. camera length and extrapolated to zero (i.e. infinite scattering angle), the contrast is shown to behave exactly as predicted by Rutherford's scattering formula (i.e. intensity scales ∝Z²). This can then be used to determine the local chemistry at and the effective chemical widths of interfaces or thin films without any additional spectroscopy method for calibration, provided the global chemical composition is known. As examples, the systems SiGe/Si and InGaAs/Ge are considered in detail.     

Characterising the surface and interior chemistry of core-shell nanoparticles using scanning transmission electron microscopy

A method for extracting core and shell spectra from core-shell particles with varying core to shell volume fractions is described. The method extracts the information from a single EELS spectrum image of the particle. The distribution of O and N was correctly reproduced for a nanoparticle with a TiN core and Ti-oxide shell. In addition, the O distribution from a nanoparticle with a Cu core and a Cu-oxide shell was obtained, and the extracted Cu L_2,3-core and shell spectra showed the required change in EELS near edge fine structure. The extracted spectra can be used for multiple linear least squares fitting to the raw data in the spectrum image. The effect of certain approximations on numerical accuracy, such as treating the nanoparticle as a perfect sphere, as well as the intrinsic detection limits of the technique have also been explored. The technique is most suitable for qualitative, rather than quantitative, work.     

Immobilization of DNA on 11-mercaptoundecanoic acid-modified gold (111) surface for atomic force microscopy imaging

Immobilized DNA on preformed 11-mercaptoundecanoic acids (MUDA) self-assembled monolayers (SAMs) on a gold (111) surface was bound by a divalent cation bridges was imaged by atomic force microscopy (AFM). The DNA immobilization was attributed to the formation of ionic bridges between the carboxylate groups of MUDA and the phosphate groups of DNA. AFM images revealed that DNA molecules could be immobilized strongly enough to permit stable and reproducible imaging. The effect of different bridge cations, such as Mg(2+), Zn(2+) and Cu(2+), and the pH of DNA assembled solution on immobilization and conformation of DNA was studied. Plasmid DNA pBR 322/Pst I molecules were straightened by using a molecular combing technique on the MUDA surface.     

Aberration‐corrected STEM for atomic‐resolution imaging and analysis

Aberration‐corrected scanning transmission electron microscopes are able to form electron beams smaller than 100 pm, which is about half the size of an average atom. Probing materials with such beams leads to atomic‐resolution images, electron energy loss and energy‐dispersive X‐ray spectra obtained from single atomic columns and even single atoms, and atomic‐resolution elemental maps. We review briefly how such electron beams came about, and show examples of applications. We also summarize recent developments that are propelling aberration‐corrected scanning transmission electron microscopes in new directions, such as complete control of geometric aberration up to fifth order, and ultra‐high‐energy resolution EELS that is allowing vibrational spectroscopy to be carried out in the electron microscope.     

Reflection electron imaging and spectroscopy studies of aluminium metal reduction at α-aluminium oxide (0,1,2) surfaces

Cleaved α-aluminium oxide (0,1,2) surfaces are studied using combined techniques of scanning reflection electron microscopy and reflection electron energy-loss spectroscopy. An α-aluminium oxide (0,1,2) surface can terminate with a layer of either oxygen or Al atoms depending on where the bonds break. Aluminium metal can be reduced only from the domains initially terminated with oxygen by an intensive electron beam. The interpretation of this damage effect is based on the desorption process of oxygen atoms after Auger decay. The resistance to beam damage of the domains initially terminated with Al is found to be due to the protection of the surface adsorbed amorphous oxygen layer.     

Large-scale, uniform DNA network on 11-mercaptoundecanoic acid modified gold (111) surface: atomic force microscopy study

Large-scale, uniform plasmid deoxyribonucleic acid (DNA) network has been successfully constructed on 11-mercaptoundecanoic acid modified gold (111) surface using a self-assembly technique. The effect of DNA concentration on the characteristics of the DNA network was investigated by atomic force microscopy. It was found that the size of meshes and the height of fibers in the DNA network could be controlled by varying the concentration of DNA with a constant time of assembly of 24 h.     

The electron energy-loss near-edge structure (ELNES) on the N K-edges from the transition metal mononitrides with the rock-salt structure and its comparison with that on the C K-edges from the corresponding transition metal monocarbides

This paper presents the shapes of the electron energy-loss near-edges structure (ELNES) on the N K-edge of the group IV_A (Ti, Zr, Hf) and group V_A (V, Nb, Ta) transition metal mononitrides close to stoichiometry. With the exceptions of NbN and TaN, these compounds have the rock-salt (B1) structure when close to stoichiometry. NbN exists with both the rock-salt structure and a hexagonal structure. Two distinct ELNES shapes were observed from it, one of which corresponds closely with previously published data from the rock-salt structure. Under normal conditions, TaN is considered to exist only in the hexagonal form, the rock-salt form being a high-temperature/high-pressure phase although it has been reported as the result of plasma jet heating of the hexagonal form. Again two distinct ELNES shapes were observed, one of which appeared to fit into the pattern of the shapes from the other compounds with the rock-salt structure. The systematic changes of shape observed are very similar to those observed in the equivalent carbides and qualitatively follow the behaviour expected from theoretical band structures. The change in the chemical shift of the N K-edge on going from a group IV_A nitride to a group V_A nitride is ～-0·8 eV while that on going from a group IV_A carbide to a group V_A carbide is ～+0·8 eV. This difference in behaviour is explained as the result of differences in the densities of states at the Fermi levels of the compounds. The position of the first peak in the ELNES also shows a systematic change in its energy relative to the core state as the number of valence electrons in the compound increases and also as the transition series of the metal species changes. The energies, E_r, of the peaks in the ELNES relative to the threshold follow a relationship similar to that predicted by Natoli, i.e. (E_r - V)a = const. where V is the ‘muffin tin’ potential and a is the lattice parameter. The first peak gives a negative constant in the relationship. The value of constant increases for each subsequent peak up to the sixth becoming positive for the fourth and higher peaks but drops slightly on going from the sixth to the seventh peak. Each peak gives a different value of V in the relationship. The data sets for the carbides and the nitrides are systematically different in a similar way for each peak and there are deviations from linearity within each set. The systematic difference is minimized and the linearity significantly improved if the difference in the energies of two prominent peaks is used instead of E_r. This systematic variation of peak energy with lattice parameter can be used to predict the lattice parameter. If both the nitride and the carbide data for the energy of a prominent peak relative to the threshold are used, this results in a maximum deviation of 4% (or ～0·02 nm). However, if the differences in the energies of two prominent peaks are used and the data for the carbides and the nitrides are treated independently, the maximum deviation drops to 0·4% (or ～0·002 nm). At this level, uncertainties in the lattice parameters themselves come into play and better characterized materials are required to set true limits to the accuracy of the predictions. Finally some applications in the microanalysis of materials are outlined briefly.     

Microstructure characterization of advanced protective Cr/CrN+a‐C:H/a‐C:H:Cr multilayer coatings on carbon fibre composite (CFC)

Studies of advanced protective chromium‐based coatings on the carbon fibre composite (CFC) were performed. Multidisciplinary examinations were carried out comprising: microstructure transmission electron microscopy (TEM, HREM) studies, micromechanical analysis and wear resistance. Coatings were prepared using a magnetron sputtering technique with application of high‐purity chromium and carbon (graphite) targets deposited on the CFC substrate. Selection of the CFC for surface modification in respect to irregularities on the surface making the CFC surface more smooth was performed. Deposited coatings consisted of two parts. The inner part was responsible for the residual stress compensation and cracking initiation as well as resistance at elevated temperatures occurring namely during surgical tools sterilization process. The outer part was responsible for wear resistance properties and biocompatibility. Experimental studies revealed that irregularities on the substrate surface had a negative influence on the crystallites growth direction. Chromium implanted into the a‐C:H structure reacted with carbon forming the cubic nanocrystal chromium carbides of the Cr₂₃C₆ type. The cracking was initiated at the coating/substrate interface and the energy of brittle cracking was reduced because of the plastic deformation at each Cr interlayer interface. The wear mechanism and cracking process was described in micro‐ and nanoscale by means of transmission electron microscope studies. Examined materials of coated CFC type would find applications in advanced surgical tools.