一种采用电压补偿技术的DC/DC开关电源软启动电路

提出了一种采用BiCMOS工艺和电压补偿技术实现的软启动控制电路。该电路消除了浪涌电流现象，避免了开关电源重启动。HSPICE模拟表明，对于一个输入电压为10V、输出电压为3.3V的降压型开关电源系统，负载电流为3.3A的条件下，利用该软启动电路，电感电流和输出电压近似分别以3.3mA/μs和2.5mV/μs速度平稳上升，表明该软启动电路的控制能力很强。此控制思想和结构适合各种DC/DC开关电源的软启动电路设计。     

Buck型DC/DC转换器自适应斜坡补偿电路设计

提出了一种可提高Buck型DC/DC转换器带载能力的斜坡补偿设计。针对电流模DC/DC转换器在大占空比下的不稳定性,以及采用斜坡补偿后系统带载能力下降等问题,通过产生分段线性斜坡补偿信号,既保证了系统的稳定性,又提高了系统的带载能力。该电路基于0.5 μm CMOS工艺设计,经Cadence仿真验证,达到了设计目标。     

一种电流型升压DC/DC变换器斜坡补偿电路

设计了一种用于峰值电流模式PWM升压型DE/DC变换器的斜坡补偿电路.该电路结构简单,消除了峰值电流模式开关电源双环控制产生的系统不稳定问题,避免了因补偿不当带来的系统瞬态响应慢和带栽能力低等不良影响,提高了开关电源的稳定性.设计基于TSMC的0.35 μm CMOS工艺实现.Spectre仿真结果表明,该系统在电感电流发生扰动的情况下,没有产生长时间振荡,能稳定地输出电压.     

带有箝位二极管的ZVS全桥三电平DC/DC变换器的研究

介绍了一种改进型的带有箝位二极管的零电压开关(ZVS)全桥三电平DC/DC变换器,详细分析了电路的工作原理。设计实例和仿真结果验证了理论分析的正确性。     

一种新型高电压ZVZCS三电平DC/DC变换器的研究

介绍一种适用于高电压场合的新型ZVZCS三电平DC／DC变换器，详细分析了电路的工作原理。设计实例和仿真结果验证了理论分析的正确性。     

基于双通路跨导运放的电压模DC/DC片内频率补偿电路

提出了一种新颖的电压模DC/DC频率补偿电路. 通过在内部跨导运放的两条小信号通路中构造阻容网络,此电路能够产生双零点以实现环路高稳定性. 由于其结构简单,易于完全集成,因此有效地减少了外围应用器件数目及印制板面积. 同时, 通过对跨导运放的优化设计进一步提高环路瞬态响应性能. 采用此电路的一款电压模DC/DC转换器已在一0.5 μm CMOS 工艺线投片,测试结果表明环路稳定性良好, 负载调整率及线性调整率均小于0.3%, 400 mA负载阶跃对应输出电压响应时间小于15 μs, 同时补偿器件面积小于裸片面积的2%, 印制板面积减小了11%. 整个芯片的效率高达95%.     

Buck型DC/DC转换器二次斜坡补偿电路设计

提出了一种应用于电流型DC/DC转化器的二次斜坡补偿电路的设计,该方法使补偿的斜率随着占空比动态变化,不仅提高了芯片的带载能力以及消除了占空比＞50％时出现的开环不稳定和亚谐波振荡和对噪声敏感等缺点。同时也避免了系统的过补偿和带载能力降低的问题。电路基于TSMC的0.35 μm BCD工艺设计,经Cadence仿真验证,达到设计目标。     

一种双向DC/DC变换器的研究与设计

本系统以TPS4530为核心设计了高效率的DC/DC变换电路,此电路是用脉宽调制工作方式,通过开关管把直流电斩成方波并调节方波的占空比来改变电压,来达到对电池恒流充电的效果;通过L7805CV正电压稳压器模块作为系统的辅助电源,方便控制。本系统具有过流保护及热关断功能,并以数码管显示其电流的变化。     

一种基于DC/DC变换器的LED驱动电路的设计

提出一种基于电流模式DC/DC变换器的驱动控制电路。该电路可以与恒流电路结合在一起,用作LED驱动。电路由误差放大器、斜坡信号产生电路、电流采样与叠加电路以及PWM比较器四部分构成。采用华虹BCD350工艺进行仿真验证,结果显示,电路成功实现了电流采样信号与斜坡补偿信号的叠加,在Vea信号的控制下,输出了控制功率管关断的PWM脉冲信号。     

用于晶体振荡器温度补偿的次方电压产生方法

为了获得更高精度的时钟源,需要对晶体振荡器进行温度补偿以便减小频率随温度的变化。对比晶体振荡器不同的温度补偿方式,模拟温度补偿具有较高的性能,而模拟温度补偿电路的主要模块就是获取与温度成次方关系的补偿电压。文中采用了一种模拟乘法器的方法来获得与温度成不同指数关系的电压,在全差分放大器的输入端接入4个MOS管,利用其工作于线性区时的电流电压关系并结合全差分放大器来实现两个模拟量之间的相乘,进而获得与温度成1次方、2次方、3次方、4次方和5次方关系的补偿电压。获得的这些电压通过加和电路叠加后即可用于晶体振荡器的高阶温度补偿。通过仿真,得到全差分放大器的差模增益为78.6 dB,乘法器可以实现两个信号的相乘,且应用该方法进行补偿的晶体振荡器的频率偏移为±2 ppm。     

模拟/数字电路的协调设计

设备厂家正在应付有关模拟性在设备设计中发挥作用,这就是模 模拟性质的故障指的是电路中质的各种问题:为了抑制噪声而支 拟/ 数字电路协调设计—对于噪声模拟性质的行为所引发的电磁辐射付的元器件费用激增;购买的集成引发的故障等防患于未然。而且, 噪声、信号完整性、电源的抖动等电路达不到技术规格标明的性能避免芯片“黑盒子”化并发挥其性问题。在很短的开发周期内,设计等。在这当中,新型的设备设计工 能,削减开发成本又缩短开发周工程师要利用有限的成本制定出解程师正在成为模拟技术和数字技术…     

New Gate-Bias Voltage-Generating Technique With Threshold-Voltage Compensation for On-Glass Analog Circuits in LTPS Process

A new proposed gate-bias voltage-generating technique with threshold-voltage compensation for analog circuits in the low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) is proposed. The new proposed gate-bias voltage-generating circuit with threshold-voltage compensation has been successfully verified in an 8-mum LTPS process. The experimental results have shown that the impact of TFT threshold-voltage variation on the biasing circuit can be reduced from 30% to 5% under a biasing voltage of 3 V. The new proposed gate-bias voltage-generating technique with threshold-voltage compensation enables the analog circuits to be integrated and implemented by the LTPS process on glass substrate for an active matrix LCD panel.     

模拟集成电路的发展动态

本文介绍了Ａ／Ｄ与Ｄ／Ａ转换器、超高速ＳＯＩ器件及电路、超高速双极电路、ＧｅＳｉ／Ｓｉ异质结器件和电路、智能功率等模拟集成电路的发展概况。     

模拟电路之美

模拟电路以其面向实际应用、电路形式多样化、非线性有源器件的引入等特点,成为电子技术一个重要的分支,几乎所有的电子产品设计中都蕴含着模拟电路的相关知识.本文拟从建模、对偶、对称、精巧、功能和均衡等方面讨论模拟电路之美.力图通过深入挖掘模拟电路之美,充分展示其魅力.     

模拟电路之美

模拟电路以其面向实际应用、电路形式多样化、非线性有源器件的引入等特点,成为电子技术一个重要的分支,几乎所有的电子产品设计中都蕴含着模拟电路的相关知识.本文拟从建模、对偶、对称、精巧、功能和均衡等方面讨论模拟电路之美.力图通过深入挖掘模拟电路之美,充分展示其魅力.     

等离子清洗技术在DC/DC混合电路中的应用

等离子清洗是一种干法清洗技术,在电子封装领域应用广泛。总结了射频等离子清洗技术在DC/DC混合电路各组装工艺环节中的应用,射频等离子清洗可有效提高DC/DC混合电路组装质量及可靠性,但不当的清洗工艺或清洗流程会对DC/DC混合电路的组装质量产生不良影响,针对产生的不良影响也提出了改进措施。     

Control and Observation Structure for Analog Circuits with Current Test Data

This work presents a current-mode control and observation structure (CMCOS) for analog circuits with current test data. Current store cells (CSCs) are used in the proposed CMCOS to enhance the controllability and observability. The proposed CMCOS can be used to observe several test points, which can be simultaneously sampled and controlled using current test data. Additionally, the proposed CMCOS enables designers to use one channel of an oscilloscope to monitor simultaneously several output waveforms of analog circuits or systems. The physical chip of a two-stage CMCOS was fabricated using TSMC 1P4M CMOS 0.35 um technology. Also, experiments were performed to confirm the theoretical analysis.     

模拟集成电路发展概况

模拟集成电路(IC)是现实世界和数字化系统之间的桥梁，是现代信息化系统的关键技术之一。从总市场、分类市场、设计和工艺技术、产品水平以及技术发展趋势等方面，介绍了模拟集成电路的发展状况，并提出了发展中国模拟集成电路技术的基本观点。     

Multi-VDD Testing for Analog Circuits

We present industrial results of a quiescent current testing technique suitable for RF testing. The operational method consists of ramping the power supply and of observing the corresponding quiescent current signatures. When the power supply is swept, all transistors are forced into various regions of operation. This has as advantage that the detection of faults is done for multiple supply voltages and corresponding quiescent currents, enhancing in this form the detectability of faults. We found that this method of structural testing yields fault coverage results comparable to functional RF tests making it a potential and attractive technique for production wafer testing due to its low cost, low testing times and low frequency requirements.José Pineda de Gyvez received the Ph.D. degree from the Eindhoven University of Technology. He is currently a principal scientist at Philips Research Laboratories, The Netherlands. Dr. Pineda was Associate Editor in IEEE Transactions on Circuits and Systems Part I and also Associate Editor for Technology in IEEE Transactions on Semiconductor Manufacturing. His research interests are in the general areas of design for manufacturability and analog signal processing.Guido Gronthoud received the electrical engineering degree from the Delft University in 1975. From 1976 to 1980 he worked at the Delft University on the design of Microwave systems. From 1980 he works with Philips. He has been working in the fields of circuit simulation and modelling for IC designs, CAD development for PCB design and electronic circuits and systems reliability. Since 1998 he is working on test innovation of digital and mixed-signal circuits. His interests are Defect Oriented Test, fault modeling and Process Related Test. He has authored and co-authored technical papers.     

Analog Computation Using Single-Electron Circuits

Analog computation is a processing method that solves a given problem by utilizing an analogy of a physical system to the problem. An idea is presented here for relating the behavior of single-electron circuits to analog computation. As an instance, a method is proposed for solving a combinatorial problem, the three-colorability problem, by using the properties of single-electron circuits. In problem solving, a single-electron circuit is constructed that is analogous to a given problem; then, through an annealing procedure, the circuit is made to settle down to its minimun energy state. The correct solution to the problem can be obtained by checking the final arrangement of electrons in the circuit. Analog computation is a promising architecture for single-electron computing systems.