Optical, electrical and thermoelectric power studies of Al-Sb thin film bilayer structure

The III-V semiconductors are of great importance due to their applications in various electro-optic devices. The Al-Sb thin film was deposited on glass substrate by thermal evaporation method at a pressure of 10^-5 torr. The samples were annealed for 3 h at different constant temperatures in a vacuum chamber at a pressure of 10^-5 torr. The electrical resistance vs temperature studies show phase transformation from metallic to semiconducting. The observed positive thermoelectric power indicates that Al-Sb thin films arep-type in nature. The Rutherford back scattering analysis and optical band gap measurements also indicate that the inter-diffusion concentration varies with temperature.     

Raman spectroscopic investigation of Friedel's salt

Friedel's salt (FS) forms upon chloride binding in monosulphoaluminate (AFm) phase. This removes chlorides from the pore solution, hence, delays the initiation of steel-bar corrosion. Apparently, characterising and, in particular, monitoring the formation and the status of FS facilitate the prediction of the service life of reinforced concrete structures. Raman spectroscopy offers a potential for investigating FS. The current work characterised FS, including the synthesised pure FS, and the FS formed in a Portland cement (PC) paste powder, using a bench-mounted Raman spectrometer. The results revealed the full Raman spectra of pure FS between 200 and 4000 cm⁻¹, including the featured Raman bands at 534/568 cm⁻¹ and 783 cm⁻¹ which correspond to the Al-OH stretching and bending vibration of FS respectively. Furthermore, similar Raman bands of FS were identified in PC paste sample subjected to accelerated chloride attack, further confirming the potential of Raman spectroscopy for distinguishing FS in cementitious materials.     

Flow-based autocorrelation studies for the detection and investigation of single-particle surface-enhanced resonance Raman spectroscopic events

We report on the characterization and detection of single metallic nanoparticles using a combination of correlation spectroscopy and surface-enhanced resonance Raman spectroscopy (SERRS). Minimizing the number of independent characterization steps is critical to efficiently perform such an analysis. In this article, we improve upon conventional diffusion-limited approaches by implementing a flow-based system with high temporal resolution detection. The benefits of flow over diffusion measurements allow for a higher throughput of detected events resulting in shorter analysis times. The nanoparticles are sized using their rotational diffusion time calculated with a modified autocorrelation function. Experiments are performed using Au nanoparticles labeled with the reporter molecule malachite green isothiocyanate on a custom-built Raman spectrometer.     

Thermoelectric properties of boron-carbide thin film and thin film based thermoelectric device fabricated by intense-pulsed ion beam evaporation

Crystallized B₁₃C₂ thin films were fabricated by intense pulsed-ion beam evaporation (IBE) method. Electrical conductivity and Seebeck coefficients of the obtained films were 1×10^—4 l/Ωm and 200 μV/K at 1000 K, respectively. These values were comparable to those of bulks. For the application of the thin films, since reasonable thermoelectric (TE) properties were confirmed for the B₁₃C₂ films fabricated, we attempted to develop ’in-plane’ type TE device using B₁₃C₂ and SrB₆ as p-type and n-type elements, respectively. With applying temperature difference to the fabricated device, thermo-electromotive force and electrical power were generated from the device we made, indicating that the device worked as a TE device. To the best of our knowledge, this is the first demonstration of the TE device composed of only boron-rich solids.     

Raman spectroscopic investigation of sodium borosilicate glass structure

Raman spectra of sodium borosilicate glasses with a wide range of Na₂O/B₂O₃ ratios were systematically measured. Variations of the spectra with glass composition were studied to interpret the implied distribution of Na⁺ ions between silicate and borate units. When Na₂O/B₂O₃ is less than 1, all Na⁺ ions are associated with borate units as indicated by the absence of the 1100 cm⁻¹ band of Si-O⁻ non-bridging bond stretching. For the (1−x)Na₂O · SiO₂ ·xB₂O₃ glass withx≦0.4 the peak-height ratio of the 950 cm⁻¹ band to the 1080 cm⁻¹ band was used to analyse semiquantitatively the distribution of the Na⁺ ions between silicate and borate units. Sodium ions are divided between silicate and borate units approximately in proportion to the amount of SiO₂ and B₂O₃ present in these glasses. Some of the high sodium content glasses were crystallized and their spectra were compared with the bulk glass spectra. The distribution of Na⁺ ions in the glass was quite different from their distribution after crystallization. Spectra of high silica glasses that had been heat-treated for phase separation indicated exclusion of borate units from the silica network and the formation of borate groups. For high boron content glasses, no change was observed on heat treatment. Raman bands due to borate groups seem to be little affected by their environments. Also affiliated with the Department of Geosciences.     

The growth of heavily Mg-doped GaN thin film on Si substrate by molecular beam epitaxy

This paper reports the growth of p-GaN by molecular beam epitaxy. During growth, reflection high electron energy diffraction displayed streaky pattern. Hall Effect measurement indicated a hole concentration of 3.90 × 10²⁰ cm^− 3. Scanning electron microscopy and X-ray diffraction measurements revealed that p-GaN has high structural quality. Photoluminescence spectrum showed that band edge emission was found at 354.1 nm, significantly shifted from usual reported value, i.e. 364 nm. The shift was attributed to Burstein-Moss effect. In addition, a broad emission peak at 387.5 nm was also observed which was due to the transition from conduction band edge to Mg acceptor level. Moreover, the presence of 657 cm^− 1 Raman peak also confirmed the heavy Mg-doped characteristic in p-GaN.     

薄膜充气环动态特性试验研究

充气环是新一代大型空间薄膜结构的主要支撑部件,它具有轻质柔性、局部抗弯刚度低、几何非线性、高阻尼等特点。本文针对薄膜充气环动态特性,建立了一套柔性结构的动态测试系统。由于采用普通力锤极易引起结构的局部变形,本文改进了激励方式,得到薄膜充气环的面内和面外振动频响函数。通过复模态指示函数识别极点数目,采用多项式拟合识别出结构的固有频率,阻尼比和振型。分析不同充气压力下结构动态特性的变化规律,并对薄膜充气结构动态特性测试相关问题进行讨论,实验结果为空间薄膜结构有限元模型有效性验证提供依据。     

Analysis of thermally induced delamination of thermoelectric thin film/substrate system

Thermoelectric thin film/substrate structures have many practical applications such as in heat recovery systems. The general problem of thermally induced delamination between a thermoelectric thin film and a substrate is investigated. The temperature varies along the length direction but is constant along the thickness direction of the film. Analytical solutions of the temperature field in the film and the stress intensity factors (SIFs) at the delamination crack tips are obtained. The combined heat convection and heat radiation between the film surfaces and the surrounding medium (i.e., the air) are taken into account. Numerical results show that the SIFs sharply increase as the tips of the delamination crack approach the ends of the film. The combined heat convection and heat radiation can increase or decrease the SIFs. The mechanism for the delamination propagation in the thermoelectric film/substrate system is examined. The critical (permissible) temperature difference across the film governing the delamination propagation is identified.     

Nanoindentation studies of thin film coated systems

In this paper we report the results of ultralow load indentation (“nanoindentation”) tests carried out on a range of thin film coated systems. In addition to characterizing the properties of each system at high resolutions, a further principal aim has been to explore the extent to which it is possible to generalize the nanoindentation response of the various systems in terms of the relative mechanical properties of the coating and the substrate. In this case we classify the substrate and coating in terms of the relative elastic and plastic responses (i.e. the ratio of yield stress to Young's modulus). Some of the different possible responses are shown together with the transitions in response (elasticity-dominated to plasticity-dominated and vice versa) which can occur. We also report on the various steps which can occur in loading curves and our attempts to relate them, via high resolution scanning electron microscopy, to the fracture patterns (through-thickness cracks and interfacial cracks) within and around the indentations.     

Raman spectroscopic investigation of the structure and crystallization of binary alkali germanate glasses

Raman spectra have been measured on bulk GeO₂ glass and the alkali germanate glasses of composition M₂OxGeO₂ where M=K, Na, Li, and x varies from 19 to 1, as well as on crystallized glasses. The low alkali content glasses (x3) retain a completely polymerized structure of germania polyhedra. Addition of small amounts of alkali oxide to GeO₂ glass does not break the Ge-O-Ge bridging bonds and creates higher co-ordination of germanium atoms. Further addition of alkali oxide eventually breaks up some of the Ge-O-Ge bonds to create Ge-O^– non-bridging oxygens. In the K- and Na-glasses a small number of non-bridging oxygens already exist at x=4.5, while in the Li-glasses they do not exist even at x=4. The structures of the low alkali content glasses start to disappear at x between 4 and 3 and they disappear almost completely at x=2. At x between 2 and 1, glass structures become analogous to the silicate glass structures. At x=2, the glass consists of disordered (Ge₂O₅) _n sheet-like structures and at x=1 disordered (GeO₃) _n chain structures.     

Raman spectroscopic and visible absorption investigation of LiCrSi2O6 pyroxene under pressure

The first observation of the vibrational spectrum of the synthetic pyroxene Li-kosmochlor (LiCrSi2O6) is reported herein. The Raman and visible spectra are reported as a function of pressure. Though the pyroxene retains its P21/c symmetry, changes in the Raman spectra are observed between 6.8 and 7.7 GPa, possibly due to the formation of an additional bond between Li and O3 or some other transition that retains the mineral's P21/c space group. Splitting of the peak appearing at approximately 700 cm(-1), used to characterize the P21/c phase in other studies, is not observed. Comparison is made with the Raman spectra of LiAlSi2O6 and LiFeSi2O6 in the P21/c phase and the visible spectra of NaCrSi2O6 at high pressures.     

Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films

Epitaxial BiCrO₃ thin films were grown onto NdGaO₃ (110)- and (LaAlO₃)_0.3-(Sr₂AlTaO₆)_0.7 (100)-oriented substrates by pulsed laser deposition. High resolution X-ray diffraction and pole figure measurements were performed in order to obtain information about the crystal structure of the films, about their quality and about the mutual crystallographic orientation between the films and the substrates. The monoclinic (111) plane of BiCrO₃ was found out to be parallel to the substrate surface. The epitaxial relation between films and substrates was verified by using polarisation dependent Raman spectroscopic experiments and theoretical calculations based on symmetry.     

Structural investigation of bulk and thin film PLZT using X-ray absorption spectroscopy

Thin film electro-optic and non-linear optical materials are of interest for applications in high-speed integrated optical devices. Materials of the system Pb_1−x/100La_x/100(Zr_y/100 Ti_1−y/100)_1−x/400O₃ or PLZT x/y/(100−y) are attractive since they can be integrated into Si and GaAs substrates using suitable deposition techniques. In this investigation we examine the structural properties of r.f. magnetron sputter-deposited PLZT using X-ray absorption near-edge spectroscopy (XANES). For XANES analysis, four samples were selected: (1) a highly oriented PLZT 28/0/100 film of ≈ 4500 Å deposited on SiO₂; (2) a highly oriented PLZT 28/0/100 film of ≈ 4500 Å deposited on a 2 ωm SiO₂ buffer layer over a Si(100) substrate; (3) a highly oriented PLZT 28/0/100 film of ≈4500 Å deposited on Al₂O₃ (1 02); and (4) a commercial ceramic wafer of PLZT 9/65/35. The XANES experiments were performed at the Stanford Synchrotron Radiation Laboratory (SSRL) using electron yield and fluorescence techniques. Data was taken at the Ti K-edge (4966.4eV) and compared to reference spectra. Of the reference spectra, the Ti K-edge spectra of the PLZT most closely resemble perovskite (SrTiO₃). The surface and bulk thin film are similar and all the 28/0/100 spectra resemble the spectra of 9/65/35, indicating similar cubic perovskite structures for these materials.     

Raman spectroscopic studies of the phase transitions in hexane at high pressure

Raman spectroscopic study of n-hexane was carried out in a cubic zirconia anvil cell up to approximately 2.0 GPa. Under high pressure, the C-H stretching region of the spectrum at 2850-3000 cm(-1) shows measurable changes in frequency, bandwidth, and intensity. These Raman bands shift towards higher frequencies with increasing pressure. At about 1.4 GPa, phase transition from liquid to solid was induced by compression, as was simultaneously observed with the built-in microscope.