Combined experimental setup for spin- and angle-resolved direct and inverse photoemission

We present a combined experimental setup for spin- and angle-resolved direct and inverse photoemission in the vacuum ultraviolet energy range for measurements of the electronic structure below and above the Fermi level. Both techniques are installed in one ultrahigh-vacuum chamber and, as a consequence, allow quasisimultaneous measurements on one and the same sample preparation. The photoemission experiment consists of a gas discharge lamp and an electron energy analyzer equipped with a spin polarization detector based on spin-polarized low-energy electron diffraction. Our homemade inverse-photoemission spectrometer comprises a GaAs photocathode as spin-polarized electron source and Geiger-Muller counters for photon detection at a fixed energy of 9.9 eV. The total energy resolution of the experiment is better than 50 meV for photoemission and better than 200 meV for inverse photoemission. The performance of our combined direct and inverse-photoemission experiment with respect to angular and energy resolutions is exemplified by the Fermi-level crossing of the Cu(111) L-gap surface state. Spin-resolved measurements of Co films on Cu(001) are used to characterize the Sherman function of the spin polarization detector as well as the spin polarization of our electron source.     

Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting from the pulsing duty cycle, without sacrificing angular resolution. A total energy resolution better than 150 meV (full width at half maximum) at scattered energies of 0.5-3 eV is achieved by monochromating the electron beam prior to pulsing it. The results of a precision measurement of the differential cross section for electron-impact excitation of helium, at an energy of 22 eV, are used to assess the sensitivity and resolution of the spectrometer.     

Time-of-flight photoelectron spectroscopy of gases using synchrotron radiation

A gas-phase time-of-flight (TOF) photoelectron spectrometer has been developed for use with synchrotron radiation. The excellent time structure of the synchrotron radiation at the Stanford Positron Electron Accelerator Ring (SPEAR) has been used as the time base for the TOF measurements. The TOF analyzer employs two multichannel plates (MCPs) in tandem as a fast electron multiplier with a matched 50-Omega anode to form an electron detector with a timing resolution of 相似文献   

An electron energy loss spectrometer designed for studies of electronic energy losses and spin waves in the large momentum regime

Based on 143° electrostatic deflectors we have realized a new spectrometer for electron energy loss spectroscopy which is particularly suitable for studies on surface spin waves and other low energy electronic energy losses. Contrary to previous designs high resolution is maintained even for diffuse inelastic scattering due to a specific management of the angular aberrations in combination with an angle aperture. The performance of the instrument is demonstrated with high resolution energy loss spectra of surface spin waves on a cobalt film deposited on the Cu(100) surface.     

Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer

Diffraction patterns of backscattered electrons can provide important crystallographic information with high spatial resolution. Recently, the dynamical theory of electron diffraction was applied to reproduce in great detail backscattering patterns observed in the scanning electron microscope (SEM). However, a fully quantitative comparison of theory and experiment requires angle-resolved measurements of the intensity and the energy of the backscattered electrons, which is difficult to realize in an SEM. This paper determines diffraction patterns of backscattered electrons using an electrostatic analyzer, operating at energies up to 40 keV with sub-eV energy resolution. Measurements are done for different measurement geometries and incoming energies. Generally a good agreement is found between theory and experiment. This spectrometer also allows us to test the influence of the energy loss of the detected electron on the backscattered electron diffraction pattern. It is found that the amplitude of the intensity variation decreases only slowly with increasing energy loss from 0 to 60 eV.     

Improving energy resolution of EELS spectra: an alternative to the monochromator solution

In this paper, we propose a numerical method which can routinely improve the energy resolution down to 0.2-0.3eV of electron energy-loss spectra acquired in a transmission electron microscope. The method involves measurement of the point-spread function (PSF) corresponding to the spectrometer aberration and to the incident energy spread, and then an inversion of this PSF so as to restore the spectrum. The chosen algorithm is based on an iterative calculation of the maximum likelihood solution known to be very robust against small errors in the PSF used. Restorations have been performed on diamond and graphite C-K edges acquired with an initial energy resolution of around 1eV. After reconstruction, the sharp core exciton lines become clearly visible for both compounds and the final energy resolution is estimated to be about 200-300meV. In the case of graphite, restorations involving both energy resolution and angular resolution have been successfully conducted. Finally, restorations of Fe L(2,3) and O-K edges measured for various iron oxides will be shown.     

Full characterization and optimization of a femtosecond ultraviolet laser source for time and angle-resolved photoemission on solid surfaces

A novel experimental apparatus for time and angle-resolved photoemission on solid surfaces is presented. A 6.28 eV laser source operating at 250 kHz repetition rate is obtained by frequency mixing in nonlinear beta barium borate crystals. This UV light source has a high photon flux of 10(13) photons/s with relatively low number of photons/pulse so that Fermi surface mapping over a wide region of the Brillouin zone is possible while mitigating space charge effects. The UV source has been fully characterized spatially, spectrally, and temporally. Its potential for time and angle-resolved photoemission is demonstrated through Fermi surface mapping and photoexcited electron dynamics in Bismuth. True femtosecond time resolution <65 fs is obtained while the energy resolution of 70 meV appears to be mainly limited by the laser bandwidth.     

An experimental setup for high resolution 10.5 eV laser-based angle-resolved photoelectron spectroscopy using a time-of-flight electron analyzer

We present an experimental setup for laser-based angle-resolved time-of-flight photoemission. Using a picosecond pulsed laser, photons of energy 10.5 eV are generated through higher harmonic generation in xenon. The high repetition rate of the light source, variable between 0.2 and 8 MHz, enables high photoelectron count rates and short acquisition times. By using a time-of-flight analyzer with angle-resolving capabilities, electrons emitted from the sample within a circular cone of up to ±15° can be collected. Hence, simultaneous acquisition of photoemission data for a complete area of the Brillouin zone is possible. The current photon energy enables bulk sensitive measurements, high angular resolution, and the resulting covered momentum space is large enough to enclose the entire Brillouin zone in cuprate high-T(c) superconductors. Fermi edge measurements on polycrystalline Au shows an energy resolution better than 5 meV. Data from a test measurement of the Au(111) surface state are presented along with measurements of the Fermi surface of the high-T(c) superconductor Bi(2)Sr(2)CaCu(2)O(8 + δ) (Bi2212).     

Electron imaging with Medipix2 hybrid pixel detector

The electron imaging performance of Medipix2 is described. Medipix2 is a hybrid pixel detector composed of two layers. It has a sensor layer and a layer of readout electronics, in which each 55 microm x 55 microm pixel has upper and lower energy discrimination and MHz rate counting. The sensor layer consists of a 300 microm slab of pixellated monolithic silicon and this is bonded to the readout chip. Experimental measurement of the detective quantum efficiency, DQE(0) at 120 keV shows that it can reach approximately 85% independent of electron exposure, since the detector has zero noise, and the DQE(Nyquist) can reach approximately 35% of that expected for a perfect detector (4/pi(2)). Experimental measurement of the modulation transfer function (MTF) at Nyquist resolution for 120 keV electrons using a 60 keV lower energy threshold, yields a value that is 50% of that expected for a perfect detector (2/pi). Finally, Monte Carlo simulations of electron tracks and energy deposited in adjacent pixels have been performed and used to calculate expected values for the MTF and DQE as a function of the threshold energy. The good agreement between theory and experiment allows suggestions for further improvements to be made with confidence. The present detector is already very useful for experiments that require a high DQE at very low doses.     

Determination of conditions for optimum resolution of a high angle thin window energy dispersive spectrometer.

The energy resolution of an energy dispersive spectrometer (EDS) equipped with an ultrathin window (UTW) and mounted at a high take-off angle (72 degrees) on a transmission electron microscope has been studied under a variety of operating conditions. The spectrometer resolution is close to that specified by the manufacturer, up to count rates of 400 cps. Above 400 cps the resolution deteriorates rapidly, and the MCA dead time and zero width increase. Above 10 keV, the height of the background is much greater than expected for bremsstrahlung and shows the shape which has previously been attributed to backscattered electron flux into the detector. It is postulated that the deterioration in resolution with count rate is caused by backscattered electrons reaching the detector through the UTW.     

A compact, multiangle electron spectrometer for ultraintense laser-plasma interaction experiments

Experiments on the multiterawatt (MTW) laser at the Laboratory for Laser Energetics will study the effect of the focal-spot shape on the forward acceleration and collimation of electrons. A compact electron spectrometer has been developed to record the energy spectra of electrons ejected in the interaction of the laser at multiple angular locations simultaneously. The modular system with replaceable magnets provides an adjustable energy band, currently 0.2-6 MeV. The detector is an array of imaging plates. The device is designed to operate in the high-noise environment (bremsstrahlung and Compton x rays, gamma rays, and scattered electrons), while being compact enough to fit in the 30 cm radius MTW target chamber. The detector geometry and shielding were optimized with the particle/radiation transport code GEANT4. Calibration was performed with beta sources. The required dynamic range, sensitivity, and resolution were confirmed with initial MTW experimental data.     

Transmission EBSD from 10 nm domains in a scanning electron microscope

The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD) methods capable of measuring 120 nm particles. Here, we report a new form of low‐energy transmission Kikuchi diffraction, performed in the SEM. Transmission‐EBSD (t‐EBSD) makes use of an EBSD detector and software to capture and analyse the angular intensity variation in large‐angle forward scattering of electrons in transmission, without postspecimen coils. We collected t‐EBSD patterns from Fe–Co nanoparticles of diameter 10 nm and from 40 nm‐thick Ni films with in‐plane grain size 15 nm. The patterns exhibited contrast similar to that seen in EBSD, but are formed in transmission. Monte Carlo scattering simulations showed that in addition to the order of magnitude improvement in spatial resolution from isolated particles, the energy width of the scattered electrons in t‐EBSD is nearly two orders of magnitude narrower than that of conventional EBSD. This new low‐energy transmission diffraction approach builds upon recent progress in achieving unprecedented levels of imaging resolution for materials characterization in the SEM by adding high‐spatial‐resolution analytical capabilities.     

A photoelectron-photoion coincidence imaging apparatus for femtosecond time-resolved molecular dynamics with electron time-of-flight resolution of sigma=18 ps and energy resolution Delta E/E=3.5%

We report on the construction and performance of a novel photoelectron-photoion coincidence machine in our laboratory in Amsterdam to measure the full three-dimensional momentum distribution of correlated electrons and ions in femtosecond time-resolved molecular beam experiments. We implemented sets of open electron and ion lenses to time stretch and velocity map the charged particles. Time switched voltages are operated on the particle lenses to enable optimal electric field strengths for velocity map focusing conditions of electrons and ions separately. The position and time sensitive detectors employ microchannel plates (MCPs) in front of delay line detectors. A special effort was made to obtain the time-of-flight (TOF) of the electrons at high temporal resolution using small pore (5 microm) MCPs and implementing fast timing electronics. We measured the TOF distribution of the electrons under our typical coincidence field strengths with a temporal resolution down to sigma=18 ps. We observed that our electron coincidence detector has a timing resolution better than sigma=16 ps, which is mainly determined by the residual transit time spread of the MCPs. The typical electron energy resolution appears to be nearly laser bandwidth limited with a relative resolution of DeltaE(FWHM)/E=3.5% for electrons with kinetic energy near 2 eV. The mass resolution of the ion detector for ions measured in coincidence with electrons is about Deltam(FWHM)/m=14150. The velocity map focusing of our extended source volume of particles, due to the overlap of the molecular beam with the laser beams, results in a parent ion spot on our detector focused down to sigma=115 microm.     

Characterization of a 2D soft x-ray tomography camera with discrimination in energy bands

A gas detector with a 2D pixel readout is proposed for a future soft x-ray (SXR) tomography with discrimination in energy bands separately per pixel. The detector has three gas electron multiplier foils for the electron amplification and it offers the advantage, compared with the single stage, to be less sensitive to neutrons and gammas. The energy resolution and the detection efficiency of the detector have been accurately studied in the laboratory with continuous SXR spectra produced by an electronic tube and line emissions produced by fluorescence (K, Fe, and Mo) in the range of 3-17 keV. The front-end electronics, working in photon counting mode with a selectable threshold for pulse discrimination, is optimized for high rates. The distribution of the pulse amplitude has been indirectly derived by means of scans of the threshold. Scans in detector gain have also been performed to assess the capability of selecting different energy ranges.     

Angle-resolved photoemission spectroscopy with a femtosecond high harmonic light source using a two-dimensional imaging electron analyzer

An experimental setup for time- and angle-resolved photoemission spectroscopy using a femtosecond 1 kHz high harmonic light source and a two-dimensional electron analyzer for parallel energy and momentum detection is presented. A selection of the 27th harmonic (41.85 eV) from the harmonic spectrum of the light source is achieved with a multilayer MoSi double mirror monochromator. The extinction efficiency of the monochromator in selecting this harmonic is shown to be better than 7:1, while the transmitted bandwidth of the selected harmonic is capable of supporting temporal pulse widths as short as 3 fs. The recorded E(k) photoelectron spectrum from a Cu(111) surface demonstrates an angular resolution of better than 0.6 degrees (=0.03 A(-1) at E(kin,e)=36 eV). Used in a pump-probe configuration, the described experimental setup represents a powerful experimental tool for studying the femtosecond dynamics of ultrafast surface processes in real time.     

Positive/negative ion velocity mapping apparatus for electron-molecule reactions

In molecular dissociative ionization by electron collisions and dissociative electron attachment to molecule, the respective positively and negatively charged fragments are the important products. A compact ion velocity mapping apparatus is developed for the angular distribution measurements of the positive or negative fragments produced in the electron-molecule reactions. This apparatus consists of a pulsed electron gun, a set of ion velocity mapping optic lenses, a two-dimensional position detector including two pieces of micro-channel plates, and a phosphor screen, and a charge-coupled-device camera for data acquisition. The positive and negative ion detections can be simply realized by changing the voltage polarity of ion optics and detector. Velocity sliced images can be directly recorded using a narrow voltage pulse applied on the rear micro-channel plate. The efficient performance of this system is evaluated by measuring the angular distribution of O(-) from the electron attachments to NO at 7.3 and 8.3 eV and O(+) from the electron collision with CO at 40.0 eV.     

Optimizing a low-energy electron diffraction spin-polarization analyzer for imaging of magnetic surface structures

A newly designed scanning electron microscope with polarization analysis (SEMPA or spin-SEM) for the acquisition of magnetic images is presented. Core component is the spin detector, based on the scattering of low-energy electrons at a W(100) surface in ultrahigh vacuum. The instrument has been optimized with respect to ease of handling and efficiency. The operation and performance of a general low-energy electron diffraction (LEED) detector for SEMPA have been modeled in order to find the optimum operating parameters and to predict the obtainable image asymmetry. Based on the energy dependence of the secondary electron polarization and intensity, the detector output is simulated. For our instrument with optimized performance we demonstrate experimentally 8.6% polarization asymmetry in the domain structure of an iron whisker. This corresponds to 17.2% image contrast, in excellent agreement with the predicted simulated value. A contrast to noise ratio of 27 is achieved at 5 ms acquisition time per pixel.     

A compact digital time differential perturbed angular correlation-spectrometer using field programmable gate arrays and various timestamp algorithms

A user-friendly fully digital time differential perturbed angular correlation (TDPAC)-spectrometer with six detectors and fast digitizers using field programmable gate arrays (FPGA) is described and performance data are given. The new spectrometer has an online data analysis feature, a compact size, and a time resolution such as conventional analog spectrometers. Its calculation intensive part was implemented inside the digitizer. This gives the possibility to change parameters (energy windows, constant fraction trigger delay) and see their influence immediately in the γ-γ correlation diagrams. Tests were performed which showed that the time resolution using a (60)Co source with energy window set at 1.17 MeV and 1.33 MeV is 265 ps with LaBr(3)(Ce) scintillators and 254 ps with BaF(2) scintillators. A true constant fraction algorithm turned out to be slightly better than the constant fraction of amplitude method. The spectrometer performance was tested with a TDPAC measurement using a (44)Ti in rutile source and a positron lifetime measurement using (22)Na. The maximum possible data rate of the spectrometer is 1.1 × 10(6) γ quanta per detector and second.     

Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?

The high throughput of the silicon drift detector energy dispersive X-ray spectrometer (SDD-EDS) enables X-ray spectrum imaging (XSI) in the scanning electron microscope to be performed in frame times of 10-100?s, the typical time needed to record a high-quality backscattered electron (BSE) image. These short-duration XSIs can reveal all elements, except H, He, and Li, present as major constituents, defined as 0.1 mass fraction (10 wt%) or higher, as well as minor constituents in the range 0.01-0.1 mass fraction, depending on the particular composition and possible interferences. Although BSEs have a greater abundance by a factor of 100 compared with characteristic X-rays, the strong compositional contrast in element-specific X-ray maps enables XSI mapping to compete with BSE imaging to reveal compositional features. Differences in the fraction of the interaction volume sampled by the BSE and X-ray signals lead to more delocalization of the X-ray signal at abrupt compositional boundaries, resulting in poorer spatial resolution. Improved resolution in X-ray elemental maps occurs for the case of a small feature composed of intermediate to high atomic number elements embedded in a matrix of lower atomic number elements. XSI imaging strongly complements BSE imaging, and the SDD-EDS technology enables an efficient combined BSE-XSI measurement strategy that maximizes the compositional information. If 10?s or more are available for the measurement of an area of interest, the analyst should always record the combined BSE-XSI information to gain the advantages of both measures of compositional contrast.     

Scanning photoelectron microscope for nanoscale three-dimensional spatial-resolved electron spectroscopy for chemical analysis

In order to achieve nondestructive observation of the three-dimensional spatially resolved electronic structure of solids, we have developed a scanning photoelectron microscope system with the capability of depth profiling in electron spectroscopy for chemical analysis (ESCA). We call this system 3D nano-ESCA. For focusing the x-ray, a Fresnel zone plate with a diameter of 200 μm and an outermost zone width of 35 nm is used. In order to obtain the angular dependence of the photoelectron spectra for the depth-profile analysis without rotating the sample, we adopted a modified VG Scienta R3000 analyzer with an acceptance angle of 60° as a high-resolution angle-resolved electron spectrometer. The system has been installed at the University-of-Tokyo Materials Science Outstation beamline, BL07LSU, at SPring-8. From the results of the line-scan profiles of the poly-Si/high-k gate patterns, we achieved a total spatial resolution better than 70 nm. The capability of our system for pinpoint depth-profile analysis and high-resolution chemical state analysis is demonstrated.