Combining high mass resolution and velocity imaging in a time-of-flight ion spectrometer using pulsed fields and an electrostatic lens

We describe a momentum resolving time-of-flight ion mass spectrometer that combines a high mass resolution, a velocity focusing condition for improved momentum resolution, and field-free conditions in the source region for high resolution electron detection. It is used in electron-ion coincidence experiments to record multiple ionic fragments produced in breakup reactions of small to medium sized molecules, such as F(3)SiCH(2)CH(2)Si(CH(3))(3). These breakup reactions are caused by soft x rays or intense laser fields. The ion spectrometer uses pulsed extraction fields, an electrostatic lens, and a delay line detector to resolve the position. Additionally, we describe a simple analytical method for calculating the momentum from the measured hit position and the time of flight of the ions.     

A momentum imaging microscope for dissociative electron attachment

We describe an experimental approach to image the three-dimensional (3D) momentum distribution of the negative ions arising from dissociative electron attachment (DEA). The experimental apparatus employs a low energy pulsed electron gun, an effusive gas source and a 4π solid-angle ion momentum imaging spectrometer consisting of a pulsed ion extraction field, an electrostatic lens, and a time- and position-sensitive detector. The time-of-flight and impact position of each negative ion are measured event by event in order to image the full 3D ion momentum sphere. The system performance is tested by measuring the anion momentum distributions from two DEA resonances, namely H(-) from H(2)O(-) ((2)B(1)) and O(-) from O(2)(-) ((2)Π(u)). The results are compared with existing experimental and theoretical data.     

A photoelectron-photoion coincidence imaging apparatus for femtosecond time-resolved molecular dynamics with electron time-of-flight resolution of sigma=18 ps and energy resolution Delta E/E=3.5%

We report on the construction and performance of a novel photoelectron-photoion coincidence machine in our laboratory in Amsterdam to measure the full three-dimensional momentum distribution of correlated electrons and ions in femtosecond time-resolved molecular beam experiments. We implemented sets of open electron and ion lenses to time stretch and velocity map the charged particles. Time switched voltages are operated on the particle lenses to enable optimal electric field strengths for velocity map focusing conditions of electrons and ions separately. The position and time sensitive detectors employ microchannel plates (MCPs) in front of delay line detectors. A special effort was made to obtain the time-of-flight (TOF) of the electrons at high temporal resolution using small pore (5 microm) MCPs and implementing fast timing electronics. We measured the TOF distribution of the electrons under our typical coincidence field strengths with a temporal resolution down to sigma=18 ps. We observed that our electron coincidence detector has a timing resolution better than sigma=16 ps, which is mainly determined by the residual transit time spread of the MCPs. The typical electron energy resolution appears to be nearly laser bandwidth limited with a relative resolution of DeltaE(FWHM)/E=3.5% for electrons with kinetic energy near 2 eV. The mass resolution of the ion detector for ions measured in coincidence with electrons is about Deltam(FWHM)/m=14150. The velocity map focusing of our extended source volume of particles, due to the overlap of the molecular beam with the laser beams, results in a parent ion spot on our detector focused down to sigma=115 microm.     

Ultrahigh-resolution spin-resolved photoemission spectrometer with a mini Mott detector

We have developed an ultrahigh-resolution spin-resolved photoemission spectrometer with a highly efficient mini Mott detector and an intense xenon plasma discharge lamp. The spectrometer achieves the energy resolutions of 0.9 and 8 meV for non-spin-resolved and spin-resolved modes, respectively. Three-dimensional spin-polarization is determined by using a 90° electron deflector situated before the Mott detector. The performance of spectrometer is demonstrated by observation of a clear Rashba splitting of the Bi(111) surface states.     

Improvement of sensitivity in high-resolution Rutherford backscattering spectroscopy

The sensitivity (limit of detection) of high-resolution Rutherford backscattering spectroscopy (HRBS) is mainly determined by the background noise of the spectrometer. There are two major origins of the background noise in HRBS, one is the stray ions scattered from the inner wall of the vacuum chamber of the spectrometer and the other is the dark noise of the microchannel plate (MCP) detector which is commonly used as a focal plane detector of the spectrometer in HRBS. In order to reject the stray ions, several barriers are installed inside the spectrometer and a thin Mylar foil is mounted in front of the detector. The dark noise of the MCP detector is rejected by the coincidence measurement with the secondary electrons emitted from the Mylar foil upon the ion passage. After these improvements, the background noise is reduced by a factor of 200 at a maximum. The detection limit can be improved down to 10 ppm for As in Si at a measurement time of 1 h under ideal conditions.     

A photoelectron velocity map imaging spectrometer for experiments combining synchrotron and laser radiations

A velocity map imaging/ion time-of-flight spectrometer designed specifically for pump-probe experiments combining synchrotron and laser radiations is described. The in-house built delay line detector can be used in two modes: the high spatial resolution mode and the coincidence mode. In the high spatial resolution mode a kinetic energy resolution of 6% has been achieved. The coincidence mode can be used to improve signal-to-noise ratio for the pump-probe experiments either by using a gate to count electrons only when the laser is present or by recording coincidences with the ion formed in the ionization process.     

Calibration of a high resolution grating soft x-ray spectrometer

The calibration of the soft x-ray spectral response of a large radius of curvature, high resolution grating spectrometer (HRGS) with a back-illuminated charge-coupled device detector is reported. The instrument is cross-calibrated for the 10-50 A? waveband at the Lawrence Livermore National Laboratory electron beam ion trap (EBIT) x-ray source with the EBIT calorimeter spectrometer. The HRGS instrument is designed for laser-produced plasma experiments and is important for making high dynamic range measurements of line intensities, line shapes, and x-ray sources.     

Time-of-flight photoelectron spectroscopy of gases using synchrotron radiation

A gas-phase time-of-flight (TOF) photoelectron spectrometer has been developed for use with synchrotron radiation. The excellent time structure of the synchrotron radiation at the Stanford Positron Electron Accelerator Ring (SPEAR) has been used as the time base for the TOF measurements. The TOF analyzer employs two multichannel plates (MCPs) in tandem as a fast electron multiplier with a matched 50-Omega anode to form an electron detector with a timing resolution of 相似文献   

Determination of conditions for optimum resolution of a high angle thin window energy dispersive spectrometer.

The energy resolution of an energy dispersive spectrometer (EDS) equipped with an ultrathin window (UTW) and mounted at a high take-off angle (72 degrees) on a transmission electron microscope has been studied under a variety of operating conditions. The spectrometer resolution is close to that specified by the manufacturer, up to count rates of 400 cps. Above 400 cps the resolution deteriorates rapidly, and the MCA dead time and zero width increase. Above 10 keV, the height of the background is much greater than expected for bremsstrahlung and shows the shape which has previously been attributed to backscattered electron flux into the detector. It is postulated that the deterioration in resolution with count rate is caused by backscattered electrons reaching the detector through the UTW.     

High sensitivity imaging Thomson scattering for low temperature plasma

A highly sensitive imaging Thomson scattering system was developed for low temperature (0.1-10 eV) plasma applications at the Pilot-PSI linear plasma generator. The essential parts of the diagnostic are a neodymium doped yttrium aluminum garnet laser operating at the second harmonic (532 nm), a laser beam line with a unique stray light suppression system and a detection branch consisting of a Littrow spectrometer equipped with an efficient detector based on a "Generation III" image intensifier combined with an intensified charged coupled device camera. The system is capable of measuring electron density and temperature profiles of a plasma column of 30 mm in diameter with a spatial resolution of 0.6 mm and an observational error of 3% in the electron density (n(e)) and 6% in the electron temperature (T(e)) at n(e) = 4 x 10(19) m(-3). This is achievable at an accumulated laser input energy of 11 J (from 30 laser pulses at 10 Hz repetition frequency). The stray light contribution is below 9 x 10(17) m(-3) in electron density equivalents by the application of a unique stray light suppression system. The amount of laser energy that is required for a n(e) and T(e) measurement is 7 x 10(20)n(e) J, which means that single shot measurements are possible for n(e)>2 x 10(21) m(-3).     

Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR

An advanced x-ray imaging crystal spectrometer (XICS) for KSTAR tokamak has been developed by utilizing a segmented two dimensional (2D) position-sensitive multiwire proportional counter. The XICS for the KSTAR tokamak provides time-resolved measurements of the radial ion and electron temperature profiles, toroidal plasma rotation velocity, and ionization equilibrium. The segmented 2D detector with delay-line readout and supporting electronics has been adopted to improve the photon count rate capability. The current fabrication status of the XICS for the KSTAR tokamak and the first performance test results of the prototype segmented 2D detector are presented.     

A new approach for 3D reconstruction from bright field TEM imaging: beam precession assisted electron tomography

The successful combination of electron beam precession and bright field electron tomography for 3D reconstruction is reported. Beam precession is demonstrated to be a powerful technique to reduce the contrast artifacts due to diffraction and curvature in thin foils. Taking advantage of these benefits, Precession assisted electron tomography has been applied to reconstruct the morphology of Sn precipitates embedded in an Al matrix, from a tilt series acquired in a range from +49° to -61° at intervals of 2° and with a precession angle of 0.6° in bright field mode. The combination of electron tomography and beam precession in conventional TEM mode is proposed as an alternative procedure to obtain 3D reconstructions of nano-objects without a scanning system or a high angle annular dark field detector.     

A time of flight mass spectrometer with field free interaction region for low energy charged particle-molecule collision studies

A new design of a linear time of flight mass spectrometer (ToFMS) is implemented that gives nearly field-free interaction region without compromising on the mass resolution. The design addresses problems that would arise in a conventional Wiley-McLaren type of ToFMS: (i) field leakages into the charged particle-molecule interaction region from various components of the mass spectrometer, including that through the high transparency mesh used to obtain evenly distributed electric fields; (ii) complete collection and transportation of the ions produced in the interaction region to the detector, which is essential for high sensitivity and cross section measurements. This ToFMS works over a wide range of masses from H(+) to a few hundred Daltons and would be the most suitable for low energy charged particle-molecule interaction studies. Performance of the ToFMS has been tested by measuring the partial ionization cross sections for electron impact on CF(4).     

Ultrahigh resolution soft x-ray emission spectrometer at BL07LSU in SPring-8

An extremely high resolution flat field type slit less soft x-ray emission spectrometer has been designed and constructed for the long undulator beamline BL07LSU in SPring-8. By optimizing the ruling parameters of two cylindrical gratings, a high energy resolution ΔE < 100 meV and/or an E∕ΔE ~ 10 000 are expected for the energy range of 350 eV - 750 eV taking into account the broadening by the spatial resolution (25 μm) of a CCD detector. A coma-free operation mode proposed by Strocov et al., is also applied to eliminate both defocus and coma aberrations. The spectrometer demonstrated experimentally that E/ΔE = 10 050 and 8046 for N 1s (402.1 eV) and Mn 2p (641.8 eV) edges, respectively.     

离子迁移谱仪的温度与流量控制系统设计与实现

离子迁移谱检测仪通过分析不同物质的迁移率实现对被检物的鉴别,而物质的迁移率与温度、气压、电场条件密切相关,因此仪器在工作过程中需要对温度和气体流量等参数进行精确地实时控制。针对嵌入式离子迁移谱仪的应用要求,在ARM+嵌入式Linux系统架构下,利用ARM处理器的PWM功能,并对传统PID控制算法进行改进,设计了一种基于ARM的多路温度和流量控制系统,可以实现对温度及流量的快速而精确的实时控制,结构简单、可靠性高。     

Spectrometer for lanthanides' K x-ray fluorescence

X-ray fluorescence analysis is a highly useful technique for determining the chemical composition of matter. The present article describes the successful development of a wavelength-dispersive x-ray fluorescence spectrometer for a fairly high-energy range, 30-60 keV, that can contribute to studying lanthanides' Kbeta spectra with high-energy resolution. By combining a new high-energy synchrotron light source and the present spectrometer, it has been demonstrated that the full width at half maximum for lanthanum's Kbeta(1) is 32 eV and that all the peaks in the spectra are fully resolved. This corresponds to an energy resolution EDeltaE of 1180, which is ten times better than a conventional system based on a Ge detector, which can detect only two peaks, Kbeta(1) and Kbeta(2), in seven peaks. The present spectrometer can open up a new field in x-ray spectrometry.     

A data acquisition system of the FODS setup

A data acquisition system of the focusing double-arm spectrometer (FODS) setup is described. The information from each recording electronic module is read in response to each trigger by an ЛЭ-74 high-speed controller with a buffer memory and is transmitted by a PCI-7200 extension card to the computer memory at the end of the spill. All crates are read in parallel, ensuring a high speed of operation of the system (8000 events per spill for one spectrometer arm). The system is able to read data from different detectors (drift chambers, proportional chambers, calorimeters, Cherenkov radiation ring spectrometer, etc.), possesses a high flexibility, i.e., ensures readout of information for several types of triggers (inclusive, arm coincidence, two particles in one arm, etc.), and enables calibration of detectors in each spill. The software is based on the MIDAS project with an open initial code and allows one to control operation of all detectors during experiments.     

A fast beam switch for controlling the intensity in electron energy loss spectrometry

The fast deflection system described in this paper is suitable for controlling the intensity reaching the detector of a magnetic sector electron spectrometer mounted below an analytical transmission electron microscope. Amongst other things, this allows the low loss region of the spectrum to be recorded with the same electron probe conditions used to record core losses, something that is essential for high spatial resolution studies. The plate assembly restricts the width of the electron distribution reaching the viewing screen to a strip approximately 17 mm wide in the direction approximately normal to the dispersion direction of the spectrometer. The resulting deflection has no detectable effect on the FWHM of the zero-loss peak for exposure times as short as 1 micros. At incident energies up to 300 keV, positioning the deflection plates in the 35 mm camera port above the viewing chamber allows voltages of < +/- 3 kV to deflect the electrons out of the spectrometer and beyond the edge of the annular detector. When the deflection is switched on, the electrons are deflected out of the spectrometer in < 40 ns and when the deflection is switched off, the electrons return to within 10 microm of the undeflected position within 100 ns. Thus, even at an exposure time of 30 micros, the smallest time likely to be used in practice with a GATAN 666 spectrometer, < 1% of the signal in the spectrum is from electrons whose scattering conditions differ from those in the undeflected position. The performance of the deflection system is such that it will also be suitable for use with the new and much faster GATAN ENFINA spectrometer system. At incident energies up to 200 keV and possibly up to 300 keV, deflection voltages of +/- 3 kV are sufficient to deflect the electrons off a 1 k x 1 k charge coupled device (CCD) camera placed below the photographic camera. Thus the deflection system can be used as a very fast, non-mechanical shutter for such a CCD camera.     

On the role of electron–ion recombination in low vacuum scanning electron microscopy

Here we demonstrate the effects of electron–ion recombination on imaging signals utilized in low vacuum scanning electron microscopes (SEMs). The presented results show that, under normal operating conditions, recombination of ionized gas molecules with secondary electrons (SEs) suppresses a significant fraction of emitted electrons. If the ion flux (and hence the spatial dependence of the SE–ion recombination rate) is laterally inhomogeneous across the imaged region of a specimen, contrast in SE images can be influenced and in some cases (under conditions of high detector field strength and long ionic mean free path) dominated by variations in the recombination rate. Consequently, SE images of features such as topographic asperities can exhibit edge‐darkening, leading to inversion of some topographic contrast. Recognition of the extent and nature of electron–ion recombination is required for a correct understanding of processes occurring in variable pressure SEMs and, subsequently, for models of image formation.     

Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting from the pulsing duty cycle, without sacrificing angular resolution. A total energy resolution better than 150 meV (full width at half maximum) at scattered energies of 0.5-3 eV is achieved by monochromating the electron beam prior to pulsing it. The results of a precision measurement of the differential cross section for electron-impact excitation of helium, at an energy of 22 eV, are used to assess the sensitivity and resolution of the spectrometer.