基于降低有机场效应晶体管泄漏电流的研究进展

近年来,由于有机场效应晶体管(OFET)具有成本低、机械柔性优异且可大面积制备等优点成为国际研究的前沿领域之一.迄今为止,OFET的载流子迁移率已超过了非晶硅薄膜晶体管,在柔性集成电路中表现出了巨大的应用潜力.随着技术的不断改进,OFET的工作频率不断提高.首先阐述了泄漏电流的来源;然后介绍了影响OFET静态功耗的最主要因素是栅极泄漏电流,总结了近年来降低OFET栅极泄漏电流的主要方法,如构建多层结构的栅介质、开发新型栅介质材料和交联栅介质材料;最后对降低OFET泄漏电流的方法进行了展望.     

聚合物栅绝缘层厚度对并五苯有机场效应管性能的影响

采用不同厚度的聚甲基丙烯酸甲酯(PMMA)作为栅绝缘层,制备了并五苯有机场效应晶体管(OFET)。测量了不同厚度的PMMA的介电特性,并详细分析了栅绝缘层厚度对器件性能的影响。其中,采用260nm厚的PMMA栅绝缘层的OFET具有比采用其它厚度的器件更优越的性能,其场效应迁移率、阈值电压与开关电流比分别达到3.39×10-3 cm2/Vs、-19V和103。     

聚酰亚胺为栅绝缘层的并五苯场效应晶体管

以真空蒸发的有机半导体材料并五苯为有源层,以旋涂的聚酰亚胺作为栅绝缘层,以真空蒸发的Al为栅、源和漏电极,成功制作了顶接触式并五苯有机场效应晶体管(OFET).测试表明,在源漏电压为70 V时,器件的载流子迁移率μ为0.079 cm2/V·s,器件的开关电流比为1.7×104.     

一种廉价电极的并五苯场效应晶体管

采用底栅顶接触结构,研究制备了以并五苯为有源层、聚甲基丙烯酸甲酯(PMMA)为绝缘层的全有机场效应晶体管(OFET),其中绝缘层采用溶液旋涂法制备,电极采用MoO3/Al双层电极。与传统采用单一Au为电极的器件相比,采用双层电极的器件性能大幅提高,经测试,器件的迁移率达到了0.133cm2/Vs,开关电流比可以达到2.61×105。对采用MoO3修饰层提高性能的作用机理进行了详细论证。     

C60场效应晶体管的制备及修饰层对器件性能影响的研究

以重掺杂Si片作为衬底,SiOe／聚甲基丙烯酸甲酯（PMMA）为双栅绝缘层,C60为有源层,制备了不同修饰层的有机场效应晶体管（OFETs）;研究了不同修饰层的器件对于场效应性能的影响。实验表明,与未加修饰层的器件相比,经过修饰的器件性能有一定的提高,其中Alqa／LiF双修饰层器件的场效应迁移率达到最大,为1．6×1...     

高性能有机薄膜晶体管(OTFT)制备及其导电机制

详细介绍了在SiO2和高kHfO2介质层上制备并五苯薄膜晶体管方面的研究,特别是利用原子力显微技术(AFM)和静电力显微技术(EFM)研究了并五苯分子初始生长模式,揭示了衬底形貌、表面化学性能(包括化学清洗和聚合物层修饰)对有机半导体成膜结构和薄膜场效应晶体管性能之间的关联,包括晶体管迁移率、开关比和阈值电压等;针对并五苯初始生长成核模式的差异,分析了不同岛(畴)间畴边界对载流子在有机薄膜内输运的影响,有助于理解有机半导体薄膜导电机理。通过优化和控制介电层和有机半导体薄膜层的界面化学性质,在SiO2介质层上成功制备出迁移率为1.0cm2/V.s、开关电流比达到106的OTFT器件;在高kHfO2介质层上获得的OTFT器件的工作电压在-5V以下,开关电流比达到105,载流子迁移率为0.6cm2/V.s;器件性能指标已经达到目前国际上文献报道的最好水平。     

基于聚合物电介质的并五苯场效应晶体管

采用顶接触结构分别在SiO2、聚甲基丙烯酸甲酯(PMMA)绝缘层上制备了以并五苯为有源层的两种有机场效应晶体管(OFET),其中SiO2绝缘层采用热生长法制备,PMMA绝缘层采用溶液旋涂法制备。与常规基于无机绝缘层的器件相比,采用聚合物为绝缘层后,不但器件的制作工艺简化和成本降低,而且器件性能大幅提高,经测试,器件的迁移率提到0.153cm2/Vs,而阈值电压降低6V。采用原子力显微镜(AFM)、X射线衍射(XRD)等对器件性能提高的原因进行了详细分析。     

高性能有机薄膜晶体管（OTFT）制备及其导电机制

详细介绍了在SiO2和高kHfO2介质层上制备并五苯薄膜晶体管方面的研究,特别是利用原子力显微技术（AFM）和静电力显微技术（EFM）研究了并五苯分子初始生长模式,揭示了衬底形貌、表面化学性能（包括化学清洗和聚合物层修饰）对有机半导体成膜结构和薄膜场效应晶体管性能之间的关联,包括晶体管迁移率、开关比和阈值电压等;针对并五苯初始生长成核模式的差异,分析了不同岛（畴）间畴边界对载流子在有机薄膜内输运的影响,有助于理解有机半导体薄膜导电机理。通过优化和控制介电层和有机半导体薄膜层的界面化学性质,在SiO2介质层上成功制备出迁移率为1.0cm^2/V.s、开关电流比达到10^6的OTFT器件;在高kHfO2介质层上获得的OTFT器件的工作电压在-5V以下,开关电流比达到10^5,载流子迁移率为0.6cm^2/V.s;器件性能指标已经达到目前国际上文献报道的最好水平。     

高温及关态应力条件下GaAs pHEMT器件的性能退化研究

研究了高温和电学应力下砷化镓赝晶高电子迁移率晶体管的直流特性退化机理。高温下陷阱辅助发射电流引起器件关态漏电上升,而载流子迁移率的退化引起跨导降低;当温度达到450 K时,栅金属的沉降效应会导致跨导异常升高。进一步研究了不同温度下关态电学应力对器件性能退化的影响,结果与高温下栅沉降效应相吻合。     

一种基于聚合物绝缘层的TIPS-pentacene晶体管性质研究

采用顶接触结构研究制备了以TIPS-pentacene为有源层、聚甲基丙烯酸甲酯(PMMA)为绝缘层的有机场效应晶体管(OFET),其中绝缘层采用溶液旋涂法制备,电极采用Au电极。通过原子力显微镜(AFM)和X射线衍射(XRD)技术对TIPS-pentacene在PMMA上的生长特性进行了详细分析,结果表明,器件获得了良好的电学特性,其场效应迁移率、阈值电压以及开关电流比分别为0.137 cm2/Vs、-19 V和9.74×104。对器件的稳定性也做了详细研究。     

Cardanol-based polymeric gate dielectric for solution-processed organic field-effect transistors on flexible substrates

A cardanol-based polymer, poly(2-hydroxy-3-cardanylpropyl methacrylate) (PHCPM), was utilized as the gate dielectric of an organic field-effect transistor (OFET). PHCPM has good surface properties, appropriate gate dielectric characteristics, and good compatibility with solution-processed semiconducting polymers. The electrical properties of an FET that was prepared with natural resource-based PHCPM as a gate dielectric layer and solution-processed poly[2,5-bis(3-dodecylthiophen-2-yl)thieno[3,2-b]thiophene] (PBTTT) as a semiconducting layer were investigated on flexible substrates. The flexible PBTTT-OFET device with the PCHPM gate dielectric exhibited high mobility and reliable performance, even in the bending state, without significant hysteresis.     

Porous Organic Field‐Effect Transistors for Enhanced Chemical Sensing Performances

The thin‐film structures of chemical sensors based on conventional organic field‐effect transistors (OFETs) can limit the sensitivity of the devices toward chemical vapors, because charge carriers in OFETs are usually concentrated within a few molecular layers at the bottom of the organic semiconductor (OSC) film near the dielectric/semiconductor interface. Chemical vapor molecules have to diffuse through the OSC films before they can interact with charge carriers in the OFET conduction channel. It has been demonstrated that OFET ammonia sensors with porous OSC films can be fabricated by a simple vacuum freeze‐drying template method. The resulted devices can have ammonia sensitivity not only much higher than the pristine OFETs with thin‐film structure but also better than any previously reported OFET sensors, to the best of our knowledge. The porous OFETs show a relative sensitivity as high as 340% ppm^?1 upon exposure to 10 parts per billion (ppb) NH₃. In addition, the devices also exhibit decent selectivity and stability. This general and simple strategy can be applied to a wide range of OFET chemical sensors to improve the device sensitivity.     

具有双绝缘层的有机薄膜晶体管

为了提高SiO2单绝缘层器件的性能,在SiO2绝缘层的表面用旋涂的方法制备一层大约50 nm厚度的PMMA.实验结果表明用无机/有机双绝缘层可以有效的提高器件的性能同时降低器件的漏电流.计算出了载流子迁移率和开关电流比,基于PMMA/SiO2双绝缘层器件的载流子迁移率和开关电流比分别是4.0×10-3cm2/Vs和104.     

Precise Extraction of Charge Carrier Mobility for Organic Transistors

Unreliable mobility values, and particularly greatly overestimated values and severely distorted temperature dependences, have recently hampered the development of the organic transistor field. Given that organic field‐effect transistors (OFETs) have been routinely used to evaluate mobility, precise parameter extraction using the electrical properties of OFETs is thus of primary importance. This review examines the origins of the various mobilities that must be determined for OFET applications, the relevant extraction methods, and the data selection limitations, which help in avoiding conceptual errors during mobility extraction. For increased precision, the review also discusses device fabrication considerations, calibration of both the specific gate‐dielectric capacitance and the threshold voltage, the contact effects, and the bias and temperature dependences, which must actually be handled with great care but have mostly been overlooked to date. This review serves as a systematic overview of the OFET mobility extraction process to ensure high precision and will also aid in improving future research.     

High Tg Cyclic Olefin Copolymer Gate Dielectrics for N,N′‐Ditridecyl Perylene Diimide Based Field‐Effect Transistors: Improving Performance and Stability with Thermal Treatment

A novel application of ethylene‐norbornene cyclic olefin copolymers (COC) as gate dielectric layers in organic field‐effect transistors (OFETs) that require thermal annealing as a strategy for improving the OFET performance and stability is reported. The thermally‐treated N,N′‐ditridecyl perylene diimide (PTCDI‐C13)‐based n‐type FETs using a COC/SiO₂ gate dielectric show remarkably enhanced atmospheric performance and stability. The COC gate dielectric layer displays a hydrophobic surface (water contact angle = 95° ± 1°) and high thermal stability (glass transition temperature = 181 °C) without producing crosslinking. After thermal annealing, the crystallinity improves and the grain size of PTCDI‐C13 domains grown on the COC/SiO₂ gate dielectric increases significantly. The resulting n‐type FETs exhibit high atmospheric field‐effect mobilities, up to 0.90 cm² V^?1 s^?1 in the 20 V saturation regime and long‐term stability with respect to H₂O/O₂ degradation, hysteresis, or sweep‐stress over 110 days. By integrating the n‐type FETs with p‐type pentacene‐based FETs in a single device, high performance organic complementary inverters that exhibit high gain (exceeding 45 in ambient air) are realized.     

Forming semiconductor/dielectric double layers by one-step spin-coating for enhancing the performance of organic field-effect transistors

We report one-step formation of the gate dielectric and conduction channel for enhancing the performance of organic field effect transistors (OFETs). The resulting OFET with the semiconductor/dielectric bi-layers spun in ambient conditions exhibits μ_FET up to 1.6 cm²/V s and on–off ratio higher than 10⁶, no additional treatment needed. Contact angle measurements and absorption spectra reveals that a well-defined semiconductor-top and dielectric-bottom film form after spin-coating the mixture of the two components, which is due to the surface induced self-organized phase separation. Compared to the single layer semiconductor film, the staggered film exhibits over 5 times higher mobility and nearly 90% reduced hysteresis in OFET. The higher performance is attributed to the simultaneous optimization in the dielectric interface and semiconductor crystallization. The approach is significant for the fabrication of low cost, easy processed and high performance OFETs.     

Organic Electronics: High Tg Cyclic Olefin Copolymer Gate Dielectrics for N,N′‐Ditridecyl Perylene Diimide Based Field‐Effect Transistors: Improving Performance and Stability with Thermal Treatment (Adv. Funct. Mater. 16/2010)

A novel application of ethylene‐norbornene cyclic olefin copolymers (COC) as gate dielectric layers in organic field‐effect transistors (OFETs) that require thermal annealing as a strategy for improving the OFET performance and stability is reported. The thermally‐treated N,N′‐ditridecyl perylene diimide (PTCDI‐C13)‐based n‐type FETs using a COC/SiO₂ gate dielectric show remarkably enhanced atmospheric performance and stability. The COC gate dielectric layer displays a hydrophobic surface (water contact angle = 95° ± 1°) and high thermal stability (glass transition temperature = 181 °C) without producing crosslinking. After thermal annealing, the crystallinity improves and the grain size of PTCDI‐C13 domains grown on the COC/SiO₂ gate dielectric increases significantly. The resulting n‐type FETs exhibit high atmospheric field‐effect mobilities, up to 0.90 cm² V^?1 s^?1 in the 20 V saturation regime and long‐term stability with respect to H₂O/O₂ degradation, hysteresis, or sweep‐stress over 110 days. By integrating the n‐type FETs with p‐type pentacene‐based FETs in a single device, high performance organic complementary inverters that exhibit high gain (exceeding 45 in ambient air) are realized.     

基于插入WO3缓冲层并五苯有机场效应晶体管性能的研究

The pentacene-based organic field effect transistor （OFET） with a thin transition metal oxide （WO3） layer between pentacene and metal （AI） source/drain electrodes was fabricated. Compared with conventional OFET with only metal AI source/drain electrodes, the introduction of the WO3 buffer layer leads to the device performance enhancement. The effective field-effect mobility and threshold voltage are improved to 1.90 em2/（V.s） and 13 V, respectively. The performance improvements are attributed to the decrease of the interface energy barrier and the contact resistance. The results indicate that it is an effective approach to improve the OFET performance by using a WO3 buffer layer.     

High performance n-channel thin-film field-effect transistors based on angular-shaped naphthalene tetracarboxylic diimides

We report on the performance of organic field-effect transistors (OFETs) by using a series of angular-shaped naphthalene tetracarboxylic diimides as active layers. The fabricated OFET devices exhibit n-type semiconducting characteristics. The performance of OFETs can be substantially improved by modifying the surface of the gate dielectric chemically prior to the deposition of the organic semiconductors. An increased electron mobility of the OFETs was found owing to the improved crystallinity and enlarged grain sizes, which are attributed to the elevating substrate temperature during the semiconductor deposition. The highest mobility of 0.515 cm²/V s was achieved from a device fabricated at substrate temperature of 130 °C with octadecyltrichlorosilane (OTS) surface modification.