Effect of rare earth addition on shear strength of SnAgCu lead-free solder joints

In the present study, the effect of adding trace amount of rare earth (RE) on the shear strength of Sn3.8Ag0.7Cu lead-free solder joints has been investigated. The shear strength of the solder joints as-reflowed and after aging at 150 °C for 168 and 336 h was measured at a constant loading rate of 0.3 mm/min and room temperature. The investigation indicates that the shear strength of Sn3.8Ag0.7Cu0.1RE solder joints is lower than that of Sn3.8Ag0.7Cu solder joints. The shear strength of both Sn3.8Ag0.7Cu solder joints and Sn3.8Ag0.7CuRE solder joints was reduced after aging at elevated temperature. However, the shear strength reduction rate of the Sn3.8Ag0.7Cu solder joints was much faster than that of Sn3.8Ag0.7CuRE solder joints. Moreover, the fracture surfaces were examined by scanning electron microscopy (SEM) and the thickness of intermetallic compounds layer (IML) in the solder joints that join Cu substrate was measured. The results indicated that the addition of rare earth elements suppresses the growth of the thickness of intermetallic compounds layer.     

Comparison of drop performance between the Sn37Pb and the Sn3.8Ag0.7Cu solder joints subjected to drop test

This study was concerned with the drop performance between the Sn37Pb and the Sn3.8Ag0.7Cu (wt. %) solder joints when the specimens were subjected to drop test after soldering process. The U-notch butt-jointed specimen was adopted and a lab-designed drop tester was employed. Meanwhile, the electrical resistance values of two kinds of solder joints were measured and recorded after certain drop tests, and finally drop number versus resistance curves were plotted and compared. From the resistance variation with the drop number, it was observed that the Sn37Pb joints presented significantly higher drop performance than the Sn3.8Ag0.7Cu ones. For the Sn3.8Ag0.7Cu specimens, the average drop number before failure was approximately 15-18 and then the resistance values sharply increased. However, the average drop number of the Sn37Pb joints was over 110 and the increasing rate of the electrical resistance was smooth, which is consistent with the results of the board-level drop test. Moreover, one specimen of each kind was picked out and the microstructural observation was carried out to investigate the joint deformation behavior in the dynamic load. It was obvious that the plastic deformation capacity of the Sn37Pb joints was remarkably higher than the one of the Sn3.8Ag0.7Cu joints, proving that most of SnAgCu-based solders presented low deformation compatibility and low energy absorption.     

Solderability, IMC evolution, and shear behavior of low-Ag Sn0.7Ag0.5Cu-BiNi/Cu solder joint

The solderability, intermetallic compounds (IMC) evolution, and shear behavior of the low-Ag Sn0.7Ag0.5Cu-3.5Bi-0.05Ni (SAC0705-BiNi)/Cu solder joint was investigated by comparing with Sn0.7Ag0.5Cu (SAC0705)/Cu and Sn3.0Ag0.5Cu (SAC305)/Cu solder joints. Experimental results demonstrated that the melting temperature of Sn0.7Ag0.5Cu-BiNi solder alloy was lower than that of SAC0705 and SAC305 solder. But the melting range of Sn0.7Ag0.5Cu-BiNi was wider. Compared with the other two kinds of alloys, SAC0705-BiNi showed the best wettability. SAC0705/Cu, SAC0705-BiNi/Cu, and SAC305 solder joints appeared similar IMC morphologies and grain size at the beginning of soldering, but evolved to different appearance as the soldering process proceeded. The growth rate of the IMC grains in SAC0705-BiNi/Cu solder joint was the lowest because of the refinement of Ni. SAC0705-BiNi/Cu solder joint showed the highest shear strength before and after being aged, mainly due to the enhancement of solid solution strengthening and dispersion strengthening of Bi and Ni in the bulk solder, as well as the refinement of Ni at the soldering interface.     

Influence of Thermal Cycling on the Microstructure and Shear Strength of Sn3.5Ag0.75Cu and Sn63Pb37 Solder Joints on Au/Ni Metallization

The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu （SAC） and Sn63Pb37 （SnPb） solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 μm Au finished metallization, respectively. After 1000 thermal cycles between -40℃ and 125℃, a very thin intermetallic compound （IMC） layer containing Au, Sn, Ni, and Cu formed at the interface between SAC solder joints and underneath metallization with 0.1 μm Au finish, and （Au, Ni, Cu）Sn4 and a very thin AuSn-Ni-Cu IMC layer formed between SAC solder joints and underneath metallization with 0.9 μm Au finish. For SnPb solder joints with 0.1 μm Au finish, a thin （Ni, Cu, Au）3Sn4 IMC layer and a Pb-rich layer formed below and above the （Au, Ni）Sn4 IMC, respectively. Cu diffused through Ni layer and was involved into the IMC formation process. Similar interfacial microstructure was also found for SnPb solder joints with 0.9μm Au finish. The results of shear test show that the shear strength of SAC solder joints is consistently higher than that of SnPb eutectic solder joints during thermal cycling.     

Interfacial reaction and properties of Sn0.3Ag0.7Cu containing nano-TiN solder joints

Ultra-low silver Sn0.3Ag0.7Cu (SAC0307) solder is arousing widespread attention because of its low cost. In this paper, the morphology of interfacial intermetallic compounds, microstructure, melting point, wettability and mechanical property of SAC0307 containing nano-TiN solders were investigated using scanning electricity microscope, transmission electron microscopy, micro-joints strength tester and differential scanning calorimetry. Results show that the addition of trace nano-TiN into SAC0307 solder can restrict the growth behavior of interfacial IMC and refine the microstructure of the solder joints. When 0.2 wt% nano-TiN particles were added, the interfacial thickness of SAC0307 solder joint dropped from 2.1 to 1.92 μm. Moreover, the wettability and mechanical property of SAC0307 solder joints were also significantly enhanced, but it has little influence on the melting characteristics of the solder.

     

The combined effects of ultrasonic wave and electric field on the microstructure and properties of Sn2.5Ag0.7Cu0.1RE/Cu soldered joints

The effect of ultrasonic wave (USW) and electric field (E) on the solderability of Sn2.5Ag0.7Cu0.1RE/Cu was investigated. Compared with the sample soldered conventionally, the solder joint obtained with USW and E assisted resulted in significant changes in the microstructure. The thickness and roughness of the interfacial Cu₆Sn₅ intermetallic compound (IMC) layer decreased by 39 and 56 %, respectively. The shear strength of the solder joint increased by 68 %, and the fracture mechanism of the solder joint transformed from brittle fracture occurred in the interfacial IMC layer to ductile fracture occurred in the solder alloy. The results reveal that reliable soldering of Sn2.5Ag0.7Cu0.1RE/Cu can be achieved with USW and E assisted, despite of low-halogen flux.     

Investigation of the fracture morphologies of Sn3.8Ag0.7Cu joints under high-velocity conditions

The lab-designed drop tests and the pendulum-type impact tests were used to study the effect of high-velocity impact on the fracture morphologies of the Sn3.8Ag0.7Cu (wt. %) solder joints. The U-notch butted-type specimen was selected. The typical fracture morphologies created by the high-velocity tests were compared. It is believed that the large Ag₃Sn platelets precipitated at the Cu/solder interfaces after air cooling provided the initiation site for cracking and caused the brittle fracture. Using SEM, the fracture morphologies along the interfacial Ag₃Sn intermetallic compounds (IMCs) were observed on the fracture surfaces. The results showed that the fracture morphologies were a function of the stress state and the orientation of the Ag₃Sn platelets within the solder joints strongly influenced the fracture morphology.     

Effect of addition of TiO2 nanoparticles on the microstructure,microhardness and interfacial reactions of Sn3.5AgXCu solder

In this work, TiO₂ nanoparticles were successfully incorporated into Sn3.5Ag and Sn3.5Ag0.7Cu solder, to synthesize novel lead-free composite solders. Effects of the TiO₂ nanoparticle addition on the microstructure, melting property, microhardness, and the interfacial reactions between Sn3.5AgXCu and Cu have been investigated. Experimental results revealed that the addition of 0.5 wt.% TiO₂ nanoparticles in Sn3.5AgXCu composite solders resulted in a finely dispersed submicro Ag₃Sn phase. This apparently provides classical dispersion strengthening and thereby enhances the shear strength of composite solder joints. After soldering, the interfacial overall intermetallic compounds (IMC) layer of the Sn3.5AgXCu lead-free solder joint was observed to have grown more significantly than that of the Sn3.5AgXCu composite solder joints, indicating that the Sn3.5AgXCu composite solder joints had a lower diffusion coefficient. This signified that the presence of TiO₂ nanoparticles was effective in retarding the growth of the overall IMC layer.     

Degradation of Sn37Pb and Sn3.5Ag0.5Cu solder joints between Au/Ni (P)/Cu pads stressed with moderate current density

Sn37Pb (SP) and Sn3.5Ag0.5Cu (SAC) ball grid array (BGA) solder joints between Au/Ni (P)/Cu pads were stressed with a moderate current density of 6.0 × 10² A/cm² at an ambient temperature of 125°C up to 600 h. The solder joint reliability was evaluated in terms of temperature measurement, microstructural analysis and mechanical strength test. It was confirmed that no obvious electromigration occurred with this moderate current density. However, the local temperature of solder joints rose considerably due to massive Joule heating, which degraded the solder joint reliability seriously. Phase coarsening was observed for both solders and it was particularly apparent in the SP solder joints. Compared to the SP, the SAC was found to be more reactive and hence a thicker intermetallic compound (IMC) was developed during the current stressing. Nevertheless, the IMC thickening was not as remarkable as expected with current stressing at high temperature. It exhibited a sub-parabolic growth manner that was mainly controlled by grain boundary diffusion. However, a sufficiently thick IMC layer initially formed during reflow soldering and the low diffusivity of the Ni atoms retarded the growth. The shear strength of the solder joints was found to decrease severely with the current stressing time. This degradation was attributed to the large stresses arising from localized thermal mismatch, phase coarsening, volume shrinkage of IMC evolution, Ni–P layer crystallization and the pad cracking during current stressing.     

Suppression effect of Cu and Ag on Cu3Sn layer in solder joints

Cu₃Sn intermetallic compound (IMC) layer is usually formed in solder joints. Since the formation of Cu₃Sn could induce large volume shrinkage, and further cause a lot of reliability issues, many works focused on suppressing the formation or growth of the Cu₃Sn layer. This work explored that Cu and Ag alloying elements also have benefit in suppressing the Cu₃Sn growth during isothermal aging stage. The Cu₆Sn₅ IMC layer seems to be much stable in the Sn/Cu solder joint during aged at 150 and 180 °C, its thickness changed little, while the Cu₃Sn IMC layer grew much quickly. After about 300 h, the thickness of Cu₃Sn layer exceeds that of Cu₆Sn₅ layer. For the Sn-3.5Ag/Cu and Sn-0.7Cu/Cu solder joints, the thickness of Cu₃Sn layer is near half of that of Cu₆Sn₅ layer. According to the relation between interface location and aging time, the reaction generated at the Cu₆Sn₅/Cu₃Sn interface, which is governed by atom fluxes, controls the growth of Cu₃Sn IMC layer. Since Ag and Cu alloying elements suppress the coarsening of Cu₆Sn₅ IMC grains, the diffusion paths for Cu atoms toward the solder are more for Ag or Cu containing solder joints. Therefore, the growth of the Cu₃Sn layer by consuming Cu₆Sn₅ layer is slower in the SnAg/Cu and SnCu/Cu solder joints than that in the Sn/Cu joints.     

Sn2.5Ag0.7CuxRE钎料时效焊点界面IMC研究

以Sn2.5Ag0.7CuxRE/Cu钎焊为研究对象,借助于扫描电镜和X衍射检测手段,研究了二硫化钼介质下时效焊点界面IMC组织结构特征及生长行为。实验结果表明:时效焊点界面Cu6Sn5IMC呈现由波浪状→扇贝状→层状的形态变化。焊点界面Cu6Sn5和Cu3Sn IMC的生长厚度与时效时间平方根呈线性关系,Cu6Sn5IMC具有较小的生长激活能、较大的生长系数。添加0.1%(质量分数)RE时,界面Cu6Sn5和Cu3Sn IMC的生长激活能最大,分别为81.74 kJ/mol和92.25 kJ/mol,对应焊点剪切强度最高。     

Effect of nano-TiO<Subscript>2</Subscript> addition on the microstructure and bonding strengths of Sn3.5Ag0.5Cu composite solder BGA packages with immersion Sn surface finish

The effects of nano-TiO₂ particles on the interfacial microstructures and bonding strength of Sn3.5Ag0.5Cu composite solder joints in ball grid array packages with immersion Sn surface finishes have been investigated. Metallography reveals that addition of nano-TiO₂ particle retarded wicker-Cu₆Sn₅ IMC formed in the Sn3.5Ag0.5Cu composite solder joints. The thickness of the interfacial intermetallic compounds of the solder joint was reduced with increased additions of nano-TiO₂ particles (0.25–1.0 wt%), but further additions up to 1.25 wt% decreased the beneficial influence. This indicates that the presence of a small amount of nano-TiO₂ particles is effective in suppressing the growth of the intermetallic compounds layer. In addition, the shear strength of the soldered joints was improved by larger nano-TiO₂ particle additions, with the peak shear strength occurring at 1.0 wt% of nano-TiO₂ particles into the Sn3.5Ag0.5Cu solder. The fracture mode also changed with increased amounts of nano-TiO₂ particles.     

回流次数对无铅焊点组织演变及可靠性的影响

目的研究不同回流次数对焊点形貌以及组织演变的影响,并通过力学性能来表征不同回流次数下焊点的可靠性。方法利用置球法将Sn3Ag0.5Cu小球置于Cu基板表面,随后在回流焊机中形成焊点,并进行不同次数回流焊接得到所需焊点,横截镶样打磨腐蚀后,利用光学显微镜、扫描电子显微镜进行显微组织观察,并用推拉试验机进行剪切测试。结果在焊点反应过程中,由于熔融焊料中析出的过饱和Cu和Sn会在焊料部分形成中空的Cu6Sn5管状物和片状的Sn基体,但随着反应的持续,这些物质逐渐消失。在IMC层的形成过程中,伴随着大量Cu6Sn5颗粒的产生,随着反应的持续,颗粒数量逐渐减少,IMC层厚度逐渐增加,但增加速度减缓。结论在IMC层的生长过程中,大块IMC会吞噬Cu6Sn5小颗粒来增加自身体积,从而抑制小颗粒的产生,最终减缓自身的生长。此外随着回流次数的增加,焊点由韧性断裂逐渐转变为韧脆性混合断裂,对焊点可靠性的降低具有一定影响。     

Microstructure and interfacial reaction of Sn–Zn–x(Al,Ag) near-eutectic solders on Al and Cu substrates

Sn–Zn–x(Al,Ag) near-eutectic solders, namely Sn–8.3Zn–0.73Ag, Sn–8.4Zn–0.44Al and Sn–7.4Zn–0.26Al–0.68Ag (in wt%) with melting points of 200.74, 198.00 and 197.32 °C, respectively, as well as the Sn–9Zn eutectic solder, were used to join Al and Cu substrates. The addition of Ag led to the formation of dendritic AgZn₃ phases, while the addition of Al obviously refined the microstructure of Sn–Zn eutectic, as well as the AgZn₃ phases. The Sn–Zn–Al solder possessed the best wettability on both Cu and Al substrates among the four solders. Al_4.2Cu_3.2Zn_0.7 intermetallic compound (IMC) layers formed at the Sn–Zn–x(Al,Ag)/Cu interfaces while Al-rich (Zn) solid solutions at the Sn–Zn–x(Al,Ag)/Al interfaces of all the as-soldered joints. The shear strength of the Al/Sn–Zn–Al/Cu solder joints was the highest among the four solder joints. The declining degree of the shear strength of the Sn–Zn–x(Al,Ag) solder joints in 3.5 % NaCl solution was in agreement with the corrosion-resistance order of the bulk solders. The Al/Sn–Zn–Ag/Cu joint thus owned the best corrosion resistance.     

Interfacial microstructure and hardness of nickel (Ni) nanoparticle-doped tin–silver–copper (Sn–Ag–Cu) solders on immersion silver (Ag)-plated copper (Cu) substrates

Sn–Ag–Cu composite solder has been prepared by adding Ni nanoparticles. Interfacial reactions, the morphology of the intermetallic compounds (IMC) that were formed, the hardness between the solder joints and the plain Cu/immersion Ag-plated Cu pads depending on the number of the reflow cycles and the aging time have all been investigated. A scallop-shaped Cu₆Sn₅ IMC layer that adhered to the substrate surface was formed at the interfaces of the plain Sn–Ag–Cu solder joints during the early reflow cycles. A very thin Cu₃Sn IMC layer was found between the Cu₆Sn₅ IMC layer and the substrates after a lengthy reflow cycle and solid-state aging process. However, after adding Ni nanoparticles, a scallop-shaped (Cu, Ni)–Sn IMC layer was clearly observed at both of the substrate surfaces, without any Cu₃Sn IMC layer formation. Needle-shaped Ag₃Sn and sphere-shaped Cu₆Sn₅ IMC particles were clearly observed in the β-Sn matrix in the solder-ball region of the plain Sn–Ag–Cu solder joints. Additional fine (Cu, Ni)-Sn IMC particles were found to be homogeneously distributed in the β-Sn matrix of the solder joints containing the Ni nanoparticles. The Sn–Ag–Cu–0.5Ni composite solder joints consistently displayed higher hardness values than the plain Sn–Ag–Cu solder joints for any specific number of reflow cycles–on both substrates–due to their well-controlled, fine network-type microstructures and the homogeneous distribution of fine (Cu, Ni)–Sn IMC particles, which acted as second-phase strengthening mechanisms. The hardness values of Sn–Ag–Cu and Sn–Ag–Cu–0.5Ni on the Cu substrates after one reflow cycle were about 15.1 and 16.6 Hv, respectively–and about 12.2 and 14.4 Hv after sixteen reflow cycles, respectively. However, the hardness values of the plain Sn–Ag–Cu solder joint and solder joint containing 0.5 wt% Ni nanoparticles after one reflow cycle on the immersion Ag plated Cu substrates were about 17.7 and 18.7 Hv, respectively, and about 13.2 and 15.3 Hv after sixteen reflow cycles, respectively.     

Study on creep characterization of nano-sized Ag particle-reinforced Sn–Pb composte solder joints

In the present work, the creep strain of solder joints is measured using a stepped load creep test on a single specimen. Based on the experimental results, the constitutive model on the steady-state creep strain is established by applying a linear curve fitting for the nano-sized Ag particle-reinforced Sn37Pb based composite solder joint and the Sn37Pb solder joint, respectively. It is indicated that the activation energy of the Ag particle-reinforced Sn37Pb based composite solder joints is higher than that of Sn37Pb solder joints. It is expected that the creep resistance of the Ag particle-reinforced Sn37Pb based composite solder joints is superior to that of Sn37Pb solder.     

Effect of praseodymium on the microstructure and properties of Sn3.8Ag0.7Cu solder

Effects of Pr addition on wettability, microstructure of Sn3.8Ag0.7Cu solder were studied, the mechanical properties of solder joints were investigated and the fracture morphologies were also analyzed in this paper. The results indicate that adding appropriate amount of Pr can evidently improve the wettability of solder, and it is also found that Pr can refine the β-Sn dendrites and reduce the intermetallic compounds growth inside the solder due to the fine PrSn₃ particles formed in the solder which can act as heterogeneous nucleation sites. Moreover, the joints soldered with the SnAgCuPr solders possess sound mechanical properties which may result from the finer microstructure improved by the Pr.     

Effect of 1 wt% ZnO nanoparticles addition on the microstructure,IMC development,and mechanical properties of high Bi content Sn–57.6Bi–0.4Ag solder on Ni metalized Cu pads

In the present study, we investigate the performance of 1 wt% ZnO nanoparticles addition to Sn–57.6Bi–0.4Ag lead-free solder and thereby study the effect of nanoparticle addition on the hardness and the inter-metallic compound (IMC) growth, under different reflow conditions. The interfacial morphology of both the plain Sn–57.6Bi–0.4Ag solder and the composite Sn–57.6Bi–0.4Ag/1 % ZnO solder containing nanoparticles on Ni metalized Cu pads ball grid array substrates and the distribution of nanoparticles on the composite solder were characterized metallographically by using scanning electron microscope (SEM). Prior research efforts by others has found strong evidence that the thickness of the IMC layer increases substantially with the increase in the number of reflow cycles. At the interfaces between solder ball and substrate, scallop-shaped Sn–Ni–Cu IMC layer was found in both the plain solder and the composite solder. Meanwhile the SEM results indicated that the growth of IMC of the composite solder joint was different compared to the plain solder with same number of reflow cycles and reflow time. During the shear test, the shear strength of the composite solder samples containing nanoparticle reinforcement were consistently higher than the plain solder joints due to the fact that the IMC growth has been retarded substantially by the nanoparticle addition. The fracture surface of plain solder exhibited a brittle fracture mode with a relatively smooth surface while doped solder joints showed typical ductile failures with very rough dimpled surfaces.     

Microstructure transformation of Sn base solders under isothermal aging and thermal shearing cycling conditions

Abstract

The diffusion of atoms and the growth behaviour of intermetallic compounds (IMCs) at both Sn–3·5Ag–0·5Cu/Cu and 63Sn–37Pb/Cu interfaces under isothermal aging and thermal shearing cycling conditions have been investigated. The results show that a Cu₆Sn₅ IMC layer is formed at both the Sn–Ag–Cu/Cu and Sn–Pb/Cu interfaces, and the morphology of Cu₆Sn₅ changes gradually from scallop structure to plate-like structure with increasing number of thermal shearing cycling, while two IMCs, Cu₆Sn₅ and Cu₃Sn, are formed at the Sn–Ag–Cu/Cu and Sn–Pb/Cu interfaces after isothermal aging for 100 h. The IMC growth follows parabola growth kinetics, implying that the IMC growth is controlled by the diffusion of Cu atoms. In Sn–Ag–Cu solder, Ag₃Sn, forming uniform particles after reflowing, congregates gradually to be chunk-like.     

Effects of Ag particles content on properties of Sn0.7Cu solder

To improve properties of Sn0.7Cu solder, method of particles reinforced was employed. Effects of Ag particle contents (1, 3, 5, 7.5, and 10 vol.%) on spreadability, microstructure, shear strength and creep rupture life of Sn0.7Cu solders have been studied. The experimental results indicate that intermetallic compound (IMC) grows, Shear strength is increased and grains are fined with the increasing of Ag particles. When content of Ag particles is more than 5 vol.%, growth rate of IMC is increased significantly. When the content of Ag is 5 vol.%, the composite solder presents best spreadability and excellent creep rupture property which have maximum spreading area, minimum wetting angle and longest creep rupture life (about 22 times as long as that of Sn0.7Cu solder).