Ni元素对Sn2.5Ag0.7Cu0.1RE/Cu无铅微焊点界面IMC和力学性能的影响

以Sn2.5Ag0.7Cu0.1RE无铅钎料为研究对象,借助扫描电镜和X衍射等检测方法研究了Ni元素对Sn2.5Ag0.7Cu0.1RE/Cu无铅微焊点界面IMC和力学性能的影响.结果表明,添加适量Ni元素能显著细化Sn2.5Ag0.7Cu0.1RE钎料合金初生β-Sn相和共晶组织,抑制焊点界面区(Cu,Ni)6Sn5金属间化合物的生长和表面粗糙度的增加,提高无铅焊点抗剪强度.当Ni元素添加量为0.1%时,钎料合金组织细小均匀,共晶组织所占比例较多;焊点界面IMC薄而平整,(Cu,Ni)6Sn5颗粒尺寸小,对应焊点抗剪强度最高为45.6 MPa,较未添加Ni元素焊点提高15.2%.     

快速凝固对Sn-8Zn-3Bi合金特性及高温时效钎料/铜焊点结构演变的影响（英文）

研究了快速凝固工艺对Sn-8Zn-3Bi合金显微组织和熔化特性的影响,分析了经150°C高温时效后钎料/铜焊点显微组织演变以评估连接的可靠性。结果表明:经快速凝固后,Sn-8Zn-3Bi合金中的Bi完全固溶于Sn基体并形成枝晶结构;与常规熔铸态合金相比,Bi在Sn基体中的过饱和固溶导致快速凝固态钎料的熔点上升至接近Sn-Zn共晶合金熔点,但同时减小了由于Bi添加对Sn-Zn合金熔化行为产生的不利影响,钎料/铜焊点界面金属间化合物(IMC)层更为致密和均匀;使用快速凝固态钎料能够显著抑制高温时效过程中钎料/铜焊点界面IMC的形成与生长并改善其界面高温稳定性。     

RE对Sn2.5Ag0.7Cu/Cu焊点性能的影响

利用X射线衍射分析仪(XRD)和JSM-5610LV扫描电镜(SEM)研究RE含量对Sn2.5Ag0.7Cu/Cu焊点界面区显微组织、剪切强度和蠕变断裂寿命的影响。结果表明:Sn2.5Ag0.7CuxRE焊点界面区金属间化合物由靠近钎料侧Cu6Sn5和靠近Cu基板侧Cu3Sn构成;添加微量RE可细化Sn2.5Ag0.7Cu焊点内钎料合金的显微组织和改善钎焊接头界面区金属间化合物的几何尺寸及形态;当RE添加量为0.1%时,焊点的剪切强度最高,蠕变断裂寿命最长。     

微量Ni对Sn2.5Ag0.7Cu钎料组织和性能的影响

研究微量Ni元素对Sn2.5Ag0.7Cu钎料显微组织和力学性能的影响。结果表明,Sn2.5Ag0.7Cu合金主要由β-Sn相、Ag3Sn相和Cu6Sn5相组成;添加微量的Ni元素后,可以有效地细化合金的内部组织,且共晶组织内部产生以Cu6Sn5相为基的(Cu,Ni)6Sn5相,或Ag3Sn相为基的(Ag,Ni)3Sn相。焊点界面主要为Cu基体、IMC层和钎料3个区域;随着钎焊时间的延长或钎焊温度的增加,IMC层在Cu基体侧较为光滑平坦,而钎料侧呈现扇贝状分布;钎焊接头的剪切强度都是呈先增大后减小趋势,在钎焊时间240 s和钎焊温度300℃达到最大值48 MPa。     

Ni改性GNSs对SnAgCuRE/Cu钎焊接头热老化特性的影响

以Sn2.5Ag0.7Cu0.1RE0.05Ni无铅钎料合金为研究对象,基于石墨烯纳米片（GNS）独特的结构、优异的物理性能和力学性能,以其为复合钎料的增强相,开展基于Ni改性GNSs（Ni-GNSs）增强SnAgCuRE系复合钎料/Cu的钎焊和钎焊接头热老化试验,探讨Ni-GNSs对复合钎料组织及钎焊接头热老化失效断裂机制的影响。结果表明：Ni-GNSs的加入,抑制了复合钎料的线膨胀,产生晶格畸变,导致位错产生,金属间化合物（IMC）颗粒分布在位错线附近,与位错发生交互作用,阻碍位错运动,强化复合钎料,进而强化复合钎料接头。随着热老化时间延长,钎焊接头界面IMC层厚度增加,剪切强度降低;其中,添加0.05%（质量分数）GNSs的复合钎料接头剪切强度降幅最小,为8.9%,且热老化384 h后,其剪切强度仍高于Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu合金接头热老化前的剪切强度。Ni-GNSs的加入,使复合钎料钎焊接头界面IMC的生长系数明显降低,有效缓解了复合钎料/Cu钎焊接头热老化过程中力学性能的降低,进而改变复合钎料/Cu钎焊接头的热老化失效断裂机制,最终影响接头的可靠性。Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu钎焊接头的断裂位置由热老化前的钎缝区向钎缝/界面IMC移动,变为韧脆混合断裂;而添加0.05%（质量分数）GNSs复合钎料接头的断裂位置均在钎缝区,为韧性断裂,钎焊接头可靠性较高。     

不同Ag元素含量Sn-Ag-Cu无铅钎料性能分析

分别研究了Ag元素含量(质量分数,%)为0.3,1.0,2.0,3.0,3.8的Sn-Ag-Cu(SAC)无铅钎料合金的显微结构、熔化行为、力学性能、润湿性和界面金属间化合物(IMC)形貌.结果表明,随着Ag元素含量的增加,钎料内部金属间化合物晶粒越小,晶粒在钎料中的密度越高,晶粒间距越小,金属间化合物产生的弥散强化越明显,钎料的抗拉强度越高,但韧性越低.随Ag元素含量的提高,钎料越接近共晶成分,熔化温度范围越小.Ag元素含量对润湿性影响不明显,SAC0307/Cu焊点界面IMC晶粒比其它钎料细小.     

热冲击下Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu钎焊接头组织与性能

借助于SEM、EDS、XRD等检测手段对Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu钎焊接头进行观察分析,研究了钎焊工艺参数及热冲击条件对Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu钎焊接头界面金属间化合物和力学性能的影响。结果表明:添加0.05%(质量分数)Ni能细化Sn2.5Ag0.7Cu0.1RE钎料合金的初生β-Sn相和共晶组织;钎焊温度270℃和钎焊时间240 s时,钎焊接头抗剪切强度最大达26.9 MPa,较未添加Ni的钎焊接头提高8.9%;随着热冲击周期的增加,钎焊接头界面金属间化合物层平均厚度增加,界面粗糙度先增大后减小,钎焊接头强度降低;添加0.05%Ni能够抑制接头界面金属间化合物的成长、钎焊接头强度的降低,有利于改善接头可靠性。     

超声波和电场共同作用下SnAgCuRE/Cu钎焊接头的时效特性

研究了时效对电场和超声振动共同作用下Sn2.5Ag0.7Cu0.1RE/Cu钎焊接头组织与性能的影响。结果表明:Sn2.5Ag0.7Cu0.1RE/Cu钎焊接头界面生成的IMC主要由靠近钎料合金一侧的Cu6Sn5相,而时效后界面靠近Cu一侧出现Cu3Sn。时效过程中,随着时效时间和时效温度的增加,Sn2.5Ag0.7Cu0.1RE/Cu界面区生长受扩散机制控制,IMC总厚度增加,力学性能下降。     

快速凝固型Sn-Ag-Cu系钎料合金制备及钎焊工艺试验

采用单辊法制备了快速凝固型Sn2.5Ag0.7Cu钎料合金,在对其进行XRD检测、熔化特性测定和钎焊工艺试验后,对一定钎焊工艺条件下钎焊接头的力学性能和显微组织进行了测试分析,结果表明:所制备的钎料合金的熔化特性和钎焊接头力学性能满足要求,钎缝-母材界面上金属间化合物呈不均匀分布,且朝向钎焊缝中心生长.     

苛刻热循环对Sn2.5Ag0.7Cu0.1RExNi/Cu钎焊界面及接头性能的影响EI北大核心CSCD

采用SEM、EDS、XRD等对苛刻热循环下Sn2.5Ag0.7Cu0.1RExNi/Cu钎焊界面IMC及接头性能进行研究。结果表明:苛刻热循环下Sn2.5Ag0.7Cu0.1RExNi/Cu钎焊界面IMC由(Cu,Ni)_6Sn_5和Cu_3Sn相组成;随热循环周期的增加,钎焊接头的界面IMC(Cu,Ni)_6Sn_5形态由波浪状转变为局部较大尺寸的"笋状",IMC平均厚度和粗糙度增大,相应接头剪切强度降低。添加适量Ni 0.05%(质量分数)的钎焊接头界面IMC平均厚度和粗糙度最低,接头剪切强度最高。在100热循环周期内,随热循环周期增加,Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu钎焊接头剪切断口由呈现钎缝处的韧性断裂向由钎缝和IMC层组成以韧性为主的韧-脆混合断裂转变。     

Electromigration in solder joints and solder lines

Electromigration may affect the reliability of flip-chip solder joints. Eutectic solder is a two-phase alloy, so its electromigration behavior is different from that in aluminum or copper interconnects. In addition, a flipchip solder joint has a built-in currentcrowding configuration to enhance electromigration failure. To better understand electromigration in SnPb and lead-free solder alloys, the authors prepared solder lines in v-grooves etched on Si (001). This article discusses the results of those tests and compares the electromigration failure modes of eutectic SnPb and SnAgCu flip-chip solder joints along with the mean-timeto-failure.     

CuSnTi钎料焊膏与焊片钎焊性能对比

为验证CuSnTi_8-5焊膏的熔化条件可以使用与焊片相同的焊接工艺,以及其钎焊接头性能不低于焊片接头性能,分别使用差热分析(DSC)、铺展性试验及测试接头力学性能,并使用扫描电子显微镜(SEM)与能谱仪(EDS)对接头进行组织分析,研究比较了焊膏与焊片相关性能表现。试验结果表明,CuSnTi_8-5焊膏与焊片有着接近的固液相温度,其完全满足焊片的焊接工艺;焊膏的润湿铺展性能优于焊片,且其钎焊接头强度高于焊片接头。分析其原因,在于同样的钎焊温度下,焊膏与基材作用时间长,可获得更多的润湿动能,因此呈现更高的铺展系数。另外,焊片无法像焊膏在焊缝周围形成明显的润湿圆角,影响了接头力学性能。通过组织分析,二者钎缝与母材间形成的Cu-Ti固溶体状态不同是造成了润湿性与接头力学性能差异的原因。     

Sn-Ag-Cu焊膏掺杂Mn改善BGA焊点可靠性

在SAC105合金中,掺杂不同组分的Mn时,对改善电路主板抗跌落冲击表现出非常积极的效果,通过试验分析发现,其中SAC0.13Mn的效果最为突出.锰趋向于向IMC迁移,并以MnSn2微粒的形式在IMC层附近聚积起来,使得SAC0.13Mn的抗跌落冲击性能明显优于SAC105合金焊膏,而SAC105合金的熔化特性、合金的...     

Electromigration performance of Pb-free solder joints in terms of solder composition and joining path

The electromigration (EM) performance of Pb-free solder joints is investigated in terms of solder composition (Sn-0.5Cu vs. Sn-1.8Ag) and joining path to Cu vs. Ni(P) under bump metallization (UBM). In the double-sided joints of Ni(P)/solder/Cu, the micro-structure of solder joints and the interfacial intermetallic compound (IMC) layers are significantly affected by solder composition and joining path. The as-reflowed microstructure of Sn-0.5Cu joints consists of small columnar grains with thin IMC layers at both UBM interfaces, independent of the joining path, while Sn-1.8Ag joints have a few large grains of low-angle grain boundaries with thick IMC layers when joined first to Ni(P) UBM, but a few 60° twins with thin IMC layers when joined first to Cu UBM. The EM stressing under high current densities at 150°C reveals that Sn-1.8Ag joints have a superior lifetime compared to Sn-0.5Cu joints. In addition, the EM lifetime of Sn-1.8Ag joints reflowed first on Ni(P) UBM is the longest among four groups of the solder joints examined.     

无铅钎焊材料的研究

介绍了无铅钎料开发和应用上存在的一些问题和基本要求,通过分析国内外Sn-Ag、Sn-Bi、Sn-Zn、Sn-In几大合金系无铅钎料的合金元素、微观组织、润湿性、熔点、腐蚀行为等方面,逐一阐述了近几年来无铅钎料的研究动态和发展趋势,以期为今后无铅钎料开发和应用提供一些有益指导.     

Capillary wave formation on excited solder jet and fabrication of lead-free solder ball

A survey of solder ball production processes especially focusing on disturbed molten metal jet breakup process was made. Then the formation of capillary wave on tin melt jet in the way of rapid solidification was studied. A semi-empirical formula, which can be written as λ = Cvib （σ/ρ）^1/3 f^-2/3 to predict the relationship between wavelength of capillary wave and frequency of imposed vibration was obtained. Sn-4.0Ag-0.5Cu lead free solder ball was successfully produced with tight distribution and good sphericity. The excited jet breakup process is promising for cost effectively producing solder ball.     

Effect of solidification on solder bump formation in solder jet process： Simulation and experiment

To investigate the influence of the solidification on the solder bump formation in the solder jet process, the volume of fluid （VOF） models of the solder droplets impinging onto the fluxed and non-fluxed substrates were presented. The high speed camera was used to record the solder impingement and examine the validity of the model. The results show that the complete rebound occurs during the process of the solder droplet impinging onto the fluxed substrate, whereas a cone-shaped solder bump forms during the process of the solder droplet impinging onto the non-fluxed substrate. Moreover, the solder solidification results in the lift-up of the splat periphery and the reduction in the maximum spread factor.     

新型无铅钎料的优化设计

利用正交设计得出27组试验钎料配方,并测试了钎料的熔化温度、润湿性和搭接接头强度.选取熔化温度、润湿面积、抗剪强度的试验数据作为参数,根据回归设计理论,通过计算机辅助计算建立起关于五个合金元素(Cu、Ag、Sh、Bi、Re)与性能指标之间的函数方程,即二次回归方程.在满足回归方程的基础上,依据最优化原理,通过计算机编程...     

Sn-Ag-Cu-In无铅钎料润湿性能及显微组织

在Sn-1.2Ag-0.6Cu合金中添加0～1.0%的In元素,研究了Sn-Ag-Cu-In无铅钎料的熔化温度、润湿性能及显微组织.结果表明,添加In元素对钎料的熔化温度有一定的降低作用,在相同的试验温度下,含铟钎料粘度更低,流动性更强,钎料的润湿性能随之改善.低银Sn-Ag-Cu钎料在空气中的润湿时间在260℃才达到...