Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

The total secondary electron emission yields, γ_T, induced by impact of the fast ions Ne^q+ (q = 2-8) and Ar^q+ (q = 3-12) on Si and Ne^q+ (q = 2-8) on W targets have been measured. It was observed that for a given impact energy, γ_T increases with the charge of projectile ion. By plotting γ_T as a function of the total potential energy of the respective ion, true kinetic and potential electron yields have been obtained. Potential electron yield was proportional to the total potential energy of the projectile ion. However, decrease in potential electron yield with increasing kinetic energy of Ne^q+ impact on Si and W was observed. This decrease in potential electron yield with kinetic energy of the ion was more pronounced for the projectile ions having higher charge states. Moreover, kinetic electron yield to energy-loss ratio for various ion-target combinations was calculated and results were in good agreement with semi-empirical model for kinetic electron emission.     

New local model for electronic energy loss and its application to computer simulations of channeling

We used the average of the Thomas-Fermi (TF) electron distribution instead of that of Hartree-Fock (HF) electron distribution as the screening length of an isolated atom. Based on the Firsov theory, we proposed a new Firsov formula of the electronic energy loss which has a simple form ΔE_e(E, b) ∞ S_e(E) exp(γb)/(1 + βb)⁶, where S_e(E) is the electronic stopping cross section, b = p/a, p and a are the impact parameter and the screening length, respectively, and β and γ are the fitting parameters. Using the present screening lengths with the shell effect and the new Firsov formula, the depth distributions of channeling were simulated by the ACOCT code for 20 keV B⁺ ions impinging along the [1 1 0] channel direction of silicon (1 1 0) surface. The ACOCT depth profiles of channeling using the new Firsov (solid) local model for the AMLJ potential are in good agreement with the experimental ones.     

On relationship between surface effective mass and incident angle of oncoming particle in hyperthermal gas-surface scattering

For the purpose of analyzing the interactive mechanisms between hyperthermal particles and a solid surface, a formal expression describing the dependency of surface effective mass upon the incident angle of the oncoming particle is presented. The formulation is deduced based on the interrelationships among the surface effective mass, the distance of impulse propagation and the non-conservative tangential momentum of the oncoming particle. Following the deduction, some reasoning is attempted toward the viewpoint adopted frequently by the exiting works where the mass is assumed to be constant.     

Combined computational and experimental study of Ar beam induced defect formation in graphite

Irradiation of graphite, commonly used in nuclear power plants, is known to produce structural damage. Here, experimental and computational methods are used to study defect formation in graphite during Ar irradiation at incident energies of 50 eV. The experimental samples are analyzed with scanning tunneling microscopy to quantify the size distribution of the defects that form. The computational approach is classical molecular dynamic simulations that illustrate the mechanisms by which the defects are produced. The results indicate that defects in graphite grow in concentrated areas and are nucleated by the presence of existing defects.     

K X-ray emission induced by C and O ion impact on selected lanthanoids

Measurements of K-shell X-ray production cross sections by ¹²C⁴⁺ (beam energies between 12 MeV and 14 MeV), and ¹⁶O⁵⁺ ions (with energies between 12.5 MeV and 15 MeV) are presented. The target elements were selected lanthanoids (Ce, Gd, Dy, Ho and Er). The resulting measurements are evaluated through comparisons with the eECPSShsR-UA theory, the MECPSSR model and the adiabatic perturbation (also known as direct molecular orbital, MO) theory, using a scaling based on the reduced velocity parameter . Consideration is given to multiple ionization effects and electron capture contribution to K-shell ionization. An evaluation with previously published values is also given. It is shown that the behavior of the ratios of experimental to theoretical cross sections is different for both ions. The models do not seem to be accurate to predict the X-ray production cross sections for ¹²C⁴⁺ ions, while the MECPSSR theory predicts much better the experimental data for ¹⁶O⁵⁺ than the eECPSShsR-UA.     

New method of evaluation for interatomic interaction potential in LEIS with large-angle scattering using the two-atom scattering model

The interaction potential between an incident ion and a target atom in impact-collision ion scattering spectroscopy (ICISS), which is a specialization of low energy ion scattering (LEIS) and its variants, i.e. ICISS with detection of neutrals (NICISS), coaxial ICISS (CAICISS) and impact-collision atom scattering spectroscopy with detection of neutrals (NICASS), has been evaluated by the new method using the dependence of the total scattering angle on the impact parameter for the first collision in the numerical calculations based on the two-atom scattering model (TWASM). From the comparison of determined values of scaling factor for the Firsov screening length by three-dimensional computer simulations with calculated ones by TWASM, it became obviously that the interatomic potentials for the various combinations of an incident ion and a target atom in LEIS are suitably given by the Moliere potential with the reduced Firsov screening length employing the scaling factor obtained in TWASM calculations.     

Light ion induced L X-ray production cross-sections in Au and Pb

Experimental proton-induced L_α, L_β, L_γ, L_? and L_tot absolute X-ray production cross-sections for Au and Pb in the incident proton energy range between 1 and 2.5 MeV are presented. The experimental results for X-ray production cross-sections are compared to available data given in Sokhi and Crumpton [R.S. Sokhi, D. Crumpton, At. Data Nucl. Data Tables 30 (1984) 49], Jesus et al. [A.P. Jesus, J.S. Lopes, J.P. Ribeiro, J. Phys. B: At. Mol. Phys. 18 (1985) 2456; A.P. Jesus, T.M. Pinheiro, I.A. Nisa, J.P. Ribeiro, J.S. Lopes, Nucl. Instrum. Methods B15 (1986) 95] and Goudarzi et al. [M. Goudarzi, F. Shokouhi, M. Lamehi-Rachti, P.Olialiy, Nucl. Instrum. Methods Phys. Res. B247 (2006) 218]. The given data are also compared with the predictions of ECPSSR model [W. Brandt, G. Lapicki, Phys. Rev. A23 (1981) 1717].     

On the origin of the LEIS signal in TOF- and in ESA-LEIS

The ion fraction analysis of ⁴He⁺ ions backscattered from various faces of copper single crystals is performed by using time-of-flight (TOF) and electrostatic analyzer (ESA) low-energy ion scattering (LEIS) techniques. When an experiment that integrates over 2π azimuth (typical ESA-LEIS setup) is used, the yield of ions backscattered from the Cu(1 1 0) surface may be given by projectiles penetrated much deeper than just one or two monolayers. The threshold energy for reionization processes for ⁴He⁺ and Cu found earlier by TOF-LEIS is experimentally confirmed by ESA-LEIS.     

Molecular dynamics simulations of C2, C2H, C2H2, C2H3, C2H4, C2H5, and C2H6 bombardment of diamond (1 1 1) surfaces

The sticking and erosion of C₂H_x molecules (where x=0-6), at 300 and 2100 K onto hydrogenated diamond (1 1 1) surfaces was investigated by means of molecular dynamics simulations. We employed both quantum-mechanical and empirical force models. Generally, the sticking probability is observed to somewhat increase when the radical temperature increases and strongly decrease with increasing number of H atoms in the molecule.     

Information about TS-1 and TS-2 double ionization mechanisms for positron and electron impact ionization of argon

Ejected electron angular distributions are measured for single and double ionization of argon by 500 eV positron and electron impact. Double to single ionization ratios show marked differences as a function of projectile charge. Combinations of the positron and electron data and a simple double ionization model are used to obtain differential information about the TS-1 and TS-2 mechanisms. Our analysis suggests that both mechanisms contribute roughly equally to the emission of two electrons and that interference between the two mechanisms significantly alters the ejected electron spectra.     

掺入Dy和Mn的MgSO4磷光体的热释光发光光谱

用光学多道分析器和微机控制线性升温法研究了MgSO4:Dy和MgSO4:Dy,Mn热释光材料的发光光谱,测定不同温度和波长的发光光谱,得到了热释光三维光谱图。观察到MgSO4掺入稀土元素Dy的两个发光谱带为480nm和580nm,每个光谱带有多个发光峰。与掺入Dy的CaSO4的三维发光谱相比较,掺入稀土元素Dy的热释光材料的发光谱带的波长主要取决于掺入Dy^3 的能级间的跃迁。MgSO4同时掺入Dy和Mn后,480nm发光谱带受到很大的抑制,所有发光峰的发光效应显著减小;波长为580nm谱带的多个发光峰中,温度低于300℃的发光峰的发光效率显著减小,在380℃附近的发光峰的发光强度最大。这说明掺入Mn杂质后,不同深度的陷阱的相对分布发生了变化。     

Monte Carlo study of ion-induced backward and forward secondary electron emission from thin Al foil

A direct Monte Carlo program has been developed to calculate the backward (γ_b) and forward (γ_f) electron emission yields from 20 nm thick Al foil for impact of C⁺, Al⁺, Ar⁺, Cu⁺ and Kr⁺ ions having energies in the range of 0.1-10 keV/amu. The program incorporates the excitation of target electrons by projectile ions, recoiling target atoms and fast primary electrons. The program can be used to calculate the electron yields, distribution of electron excitation points in the target and other physical parameters of the emitted electrons. The calculated backward electron emission yield and the Meckbach factor R = γ_f/γ_b are compared with the available experimental data, and a good agreement is found. In addition, the effect of projectile energy and mass on the longitudinal and lateral distribution of the excitation points of the electrons emitted from front and back of Al target has been investigated.     

Measurement of the energy deposition profile for U ions with specific energy 500 and 950 MeV/u in stainless steel and copper targets

The paper presents the results of precision measurements of the total stopping range and energy deposition function of ²³⁸U ions with specific energies E = 500 and 950 MeV/u in stainless steel and copper targets. The experiment was performed at the SIS-18 facility (GSI Darmstadt) in the experimental area Cave A in September 2004-May 2005.The measured energy deposition profiles are compared with calculations using the codes ATIMA, PHITS, SHIELD and SRIM.     

Ion bombardment induced changes in the optical and electrical properties of polycarbonate

The changes in the optical and electrical properties of polycarbonate (PC) films, bombarded with He and Ar ion beams, have been studied. The PC films were divided into two groups where the first group was bombarded with 130 keV He ions of fluences ranged from 1 × 10¹⁴ cm⁻² to 2 × 10¹⁶ cm⁻², while the second one was bombarded with 320 keV Ar of fluences (1 × 10¹³ cm⁻² and 1 × 10¹⁵ cm⁻²). The surface morphology of the unirradiated and irradiated PC films was studied using scanning electron microscopy (SEM) technique. The optical properties of the two groups have been carried out using UV-Vis spectrophotometer and the direct current (DC) electrical conductivity was also performed. The obtained results showed a decrease in the optical energy gap, the optical activation energy and the electrical activation energy with increasing the fluence of both He and Ar ions. Meanwhile, an increase in the DC conductivity was obtained with increasing the fluence of the ions. The bombardment of the PC films with He and Ar ion beams induced formation of carbon clusters near the polymer surface and, also, resulted in scission in the polymer chains.     

掺入Dy和Mn的MgSO_4磷光体的热释光发光光谱

用光学多道分析器和微机控制线性升温法研究了MgSO4 :Dy和MgSO4 :Dy ,Mn热释光材料的发光光谱。测定不同温度和波长的发光光谱 ,得到了热释光三维光谱图。观察到MgSO4 掺入稀土元素Dy的两个发光谱带为 4 80nm和 580nm ,每个光谱带有多个发光峰。与掺入Dy的Ca SO4 的三维发光谱相比较 ,掺入稀土元素Dy的热释光材料的发光谱带的波长主要取决于掺入Dy3+的能级间的跃迁。MgSO4 同时掺入Dy和Mn后 ,4 80nm发光谱带受到很大的抑制 ,所有发光峰的发光效率显著减小 ;波长为 580nm谱带的多个发光峰中 ,温度低于 30 0℃的发光峰的发光效率显著减小 ,在 380℃附近的发光峰的发光强度最大。这说明掺入Mn杂质后 ,不同深度的陷阱的相对分布发生了变化。     

Damages induced by heavy ions in titanium silicon carbide: Effects of nuclear and electronic interactions at room temperature

Thanks to their refractoriness, carbides are sensed as fuel coating for the IVth generation of reactors. Among those studied, the Ti₃SiC₂ ternary compound can be distinguished for its noteworthy mechanical properties: the nanolamellar structure imparts to this material some softness as well as better toughness than other classical carbides such as SiC or TiC. However, under irradiation, its behaviour is still unknown. In order to understand this behaviour, specimens were irradiated with heavy ions of different energies, then characterised. The choice of energies used allowed separation of the effects of nuclear interactions from those of electronic ones.     

The interaction of antihydrogen with simple atoms and molecules

In this paper, we describe calculations that we have carried out of cross sections for rearrangement processes in very low-energy helium + antihydrogen scattering that result in or or . A significantly more accurate method from that used previously [E.A.G. Armour, S. Jonsell, Y. Liu, A.C. Todd, Nucl. Instr. and Meth. B 247 (2006) 127] is used to calculate the entrance channel wave function. Results are presented for the first two processes. Mention is made of the use of the method in calculations of low-energy e⁺H₂ scattering.     

Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5-7.9 MeV/amu energy range

We report on the secondary electron yields of Au and oxidized aluminum (Al₂O₃) by impact of heavy ions with energies ranging from 7.92 MeV/amu (¹²C₆) to 2.54 MeV/amu (¹⁰⁷Ag₄₇). The obtained results, the first in this energy range using medium-heavy ions, extend the validity of proposed scaling laws obtained with lighter ions. Measurements have been performed using the SIRAD irradiation facility at the 15 MV Tandem of the INFN Laboratory of Legnaro (Italy), to evaluate the performance of ion electron emission microscopy at SIRAD.     

Correlation of Neutron and X-ray Emission from Plasma Focus with Pre-ionization

The effect of pre-ionization caused by depleted uranium (₉₂U²³⁸) on the correlation of neutron and X-ray emission from 1.8 kJ plasma focus is investigated by employing photomultiplier tubes (XP2020) coupled with fast (50 × 50) mm² cylindrical plastic scintillators (NE102A) along with GM tube and Quantrad Si PIN diodes with a pair of appropriate filters. It is found that neutron and Cu–K_α emission along with total X-ray yield are significantly increases with pre-ionization as compared to those without pre-ionization. Moreover, pre-ionization improves the shot to shot reproducibility of the system and broadens the operating pressure regime both for neutron and X-ray emission.