45nm工艺pn混合下拉网络多米诺异或门设计

提出了一种pn混合下拉网络技术,即在多米诺门的下拉网络中混合使用pMOS管和nMOS管来降低电路的功耗并提高电路的性能.首先,应用此技术设计了多米诺异或门,与标准的n型多米诺异或门相比,新型异或门的静态功耗和动态功耗分别减小了 46%和3%.然后,在此技术的基础上,综合应用多电源电压技术和双阈值技术设计了功耗更低的多米诺异或门,与标准的n型多米诺异或门相比,静态功耗和动态功耗分别减小了82%和21%.最后分析并确定了4种多米诺异或门的最小漏电流状态和交流噪声容限.     

45mm低功耗、高性能Zipper CMOS多米诺全加器设计

提出了电荷自补偿技术,此技术利用P型多米诺电路动态结点的放电对N型多米诺电路的动态结点充电,并在此技术基础上综合应用双阈值技术和多电源电压技术,设计了新型低功耗、高性能Zipper C?dOS多米诺全加器.仿真过程中提出了功耗分布法,精确找到了电荷自补偿技术的最优路径.仿真结果表明,在相同的时间延迟下,与标准Zipper CMOS多米诺全加器、双阈值Zipper CMOS多米诺全加器、多电源电压Zipper CMOS多米诺全加器相比,新型Zipper CMOS多米诺全加器动态功耗分别减小了37%、35%和7%,静态功耗分别减小了41%,20%和43%.最后,分析并得到了新型全加器漏电流最低的输入矢量和时钟状态.     

45nm低功耗、高性能Zipper CMOS多米诺全加器设计

提出了电荷自补偿技术,此技术利用P型多米诺电路动态结点的放电对N型多米诺电路的动态结点充电,并在此技术基础上综合应用双阈值技术和多电源电压技术,设计了新型低功耗、高性能Zipper CMOS多米诺全加器.仿真过程中提出了功耗分布法,精确找到了电荷自补偿技术的最优路径.仿真结果表明,在相同的时间延迟下,与标准Zipper CMOS多米诺全加器、双阈值Zipper CMOS多米诺全加器、多电源电压Zipper CMOS多米诺全加器相比,新型Zipper CMOS多米诺全加器动态功耗分别减小了37%、35%和7%,静态功耗分别减小了41%,20%和43%.最后,分析并得到了新型全加器漏电流最低的输入矢量和时钟状态.     

高性能微处理器中一种改进的高扇入多米诺电路设计与实现

设计实现了一种改进的高扇入多米诺电路结构.该电路的nMOS下拉网络分为多个块,有效降低了动态节点的电容,同时每一块只需要一个小尺寸的保持管.由于省去了标准多米诺逻辑中的尾管,有效地提升了该电路的性能.在0.13μm工艺下对该结构实现的一个64位或门进行模拟,延迟为63.9ps,功耗为32.4μw,面积为115μm2.与组合多米诺逻辑相比,延迟和功耗分别降低了55%和38%.     

高性能微处理器中一种改进的高扇入多米诺电路设计与实现

设计实现了一种改进的高扇入多米诺电路结构. 该电路的nMOS下拉网络分为多个块,有效降低了动态节点的电容,同时每一块只需要一个小尺寸的保持管. 由于省去了标准多米诺逻辑中的尾管,有效地提升了该电路的性能. 在0.13μm工艺下对该结构实现的一个64位或门进行模拟,延迟为63.9ps,功耗为32.4μW,面积为115μm2. 与组合多米诺逻辑相比,延迟和功耗分别降低了55%和38%.     

亚70nm CMOS工艺低漏电流、高噪声容限的低功耗多输入多米诺或门的设计

提出了两种新的电路技术,在降低多输入多米诺"或门"的动态功耗的同时减小了漏电流,并提高了电路的噪声容限.采用新的电路技术设计了八输入多米诺"或门"并基于45nm BSIM4 SPICE 模型对其进行了模拟.模拟结果表明,设计的两种新多米诺电路在同样的噪声容限下有效地降低了动态功耗,减小了总的漏电流,同时提高了工作速度.与双阈值多米诺电路相比,设计的两种电路动态功耗分别降低了8.8%和11.8%,电路速度分别提高了9.5%和13.7%,同时总的漏电流分别降低了80.8%和82.4%.基于模拟结果,也分析了双阈值多米诺电路中求值点的不同逻辑状态对总的漏电流的影响.     

亚70nm CMOS工艺低漏电流、高噪声容限的低功耗多输入多米诺或门的设计

提出了两种新的电路技术,在降低多输入多米诺"或门"的动态功耗的同时减小了漏电流,并提高了电路的噪声容限.采用新的电路技术设计了八输入多米诺"或门"并基于45nm BSIM4 SPICE 模型对其进行了模拟.模拟结果表明,设计的两种新多米诺电路在同样的噪声容限下有效地降低了动态功耗,减小了总的漏电流,同时提高了工作速度.与双阈值多米诺电路相比,设计的两种电路动态功耗分别降低了8.8%和11.8%,电路速度分别提高了9.5%和13.7%,同时总的漏电流分别降低了80.8%和82.4%.基于模拟结果,也分析了双阈值多米诺电路中求值点的不同逻辑状态对总的漏电流的影响.     

低功耗、高性能多米诺电路电荷自补偿技术

提出了一种电荷自补偿技术来降低多米诺电路的功耗,并提高了电路的性能.采用电荷自补偿技术设计了具有不同下拉网络(PDN)和上拉网络(PUN)的多米诺电路,并分别基于65,45和32nm BSIM4 SPICE模型进行了HSPICE仿真.仿真结果表明,电荷自补偿技术在降低电路功耗的同时,提高了电路的性能.与常规多米诺电路技术相比,采用电路自补偿技术的电路的功耗延迟积(PDP)的改进率可达42.37%.此外,以45nm Zipper CMOS全加器为例重点介绍了功耗分布法,从而优化了自补偿路径,达到了功耗最小化的目的.最后,系统分析了补偿通路中晶体管宽长比,电路输入矢量等多方面因素对补偿通路的影响.     

低功耗、高性能多米诺电路电荷自补偿技术

提出了一种电荷自补偿技术来降低多米诺电路的功耗,并提高了电路的性能.采用电荷自补偿技术设计了具有不同下拉网络(PDN)和上拉网络(PUN)的多米诺电路,并分别基于65,45和32nm BSIM4 SPICE模型进行了HSPICE仿真.仿真结果表明,电荷自补偿技术在降低电路功耗的同时,提高了电路的性能.与常规多米诺电路技术相比,采用电路自补偿技术的电路的功耗延迟积(PDP)的改进率可达42.37%.此外,以45nm Zipper CMOS全加器为例重点介绍了功耗分布法,从而优化了自补偿路径,达到了功耗最小化的目的.最后,系统分析了补偿通路中晶体管宽长比,电路输入矢量等多方面因素对补偿通路的影响.     

45nm CMOS工艺下的低泄漏多米诺电路研究

在研究了45nm CMOS工艺下晶体管泄漏电流特性的基础上,提出了一种可以同时减小多米诺逻辑电路亚阈值和栅极氧化层泄漏功耗,带有NMOS睡眠开关并使用双阈值电压、双栅极氧化层厚度的电路技术。该电路技术与标准的双阈值电压多米诺逻辑电路相比,待机模式时消耗的总泄漏功耗在110℃时最高可以减小65.7%,在25℃时最高可以节省达94.1%。     

Lector with Footed-Diode Inverter: A Technique for Leakage Reduction in Domino Circuits

Leakage power consumption is a major technical problem faced in nanometer or deep submicron CMOS circuit technology. A new circuit technique based on “lector stacking” is proposed in this paper for reducing the subthreshold and gate oxide leakage currents in the idle and non-idle modes of operation for domino circuits. In this technique a p-type and an n-type leakage control transistor (LCT) are introduced between the pull-up and pull-down network, and the gate of one is controlled by the source of the other. For any combination of inputs, one of the LCTs will operate near its cut-off region and will increase the resistance between supply voltage and ground, resulting in reduced leakage current. Lector stacking retains the logic state during the idle mode as in the conventional footerless domino logic. Furthermore, the leakage current is suppressed at the output inverter circuit by adding a diode-footed transistor below the n-type transistor of the inverter, offering a more resistive path between supply voltage and ground.The proposed circuit technique for AND2, OR2, OR4, and OR8 circuits reduces the active power consumption by 13.66 % to 44.45 % and by 12 % to 33 % at the low and high die temperatures, respectively, compared to the standard footerless domino logic circuits. During idle mode for the same logic gates, 1.64 % to 79.39 % and 1.2 % to 35.19 % reduction of leakage current is observed with low and high inputs at 25 °C and 110 °C respectively. Similarly, during non-idle mode 0.94 % to 99.3 % and 1.57 % to 98.58 % is observed with low and high inputs at 25 to 110 °C, respectively, when compared to standard footerless domino logic circuits.     

Robust low leakage controlled keeper by current-comparison domino for wide fan-in gates

In this paper, a new design for low leakage and noise immune wide fan-in domino circuits is presented. The proposed technique uses the difference and the comparison between the leakage current of the OFF transistors and the switching current of the ON transistors of the pull down network to control the PMOS keeper transistor, yielding reduction of the contention between keeper transistor and the pull down network from which previously proposed techniques have suffered. Moreover, using the stacking effect, leakage current is reduced and the performance of the current mirror is improved. Results of simulation in high performance 16 nm predictive technology model (PTM) demonstrate that the proposed circuit exhibits about 39% less power consumption, and nearly 2.57 times improvement in noise immunity with a 41% die area overhead for a 64-bit OR gate compared to a standard domino circuit.     

FinFET domino logic with independent gate keepers

Scaling of single-gate MOSFET faces great challenges in the nanometer regime due to the severe short-channel effects that cause an exponential increase in the sub-threshold and gate-oxide leakage currents. Double-gate FinFET technology mitigates these limitations by the excellent control over a thin silicon body by two electrically coupled gates. In this paper a variable threshold voltage keeper circuit technique using independent-gate FinFET technology is proposed for simultaneous power reduction and speed enhancement in domino logic circuits. The threshold voltage of a keeper transistor is dynamically modified during circuit operation to reduce contention current without sacrificing noise immunity. The optimum independent-gate keeper gate bias conditions are identified for achieving maximum savings in delay and power while maintaining identical noise immunity as compared to the standard tied-gate FinFET domino circuits. With the variable threshold voltage double-gate keeper circuit technique the evaluation speed is enhanced by up to 49% and the power consumption is reduced by up to 46% as compared to the standard domino logic circuits designed for similar noise margin in a 32 nm FinFET technology.     

Diode-footed domino: a leakage-tolerant high fan-in dynamic circuit design style

A leakage-tolerant design technique for high fan-in dynamic logic circuits is presented. An NMOS transistor with gate and drain terminals tied together (diode) is added in series with the evaluation network of standard domino circuits. Due to the stacking effect, the leakage of the evaluation path significantly decreases, thereby improving the robustness of the circuit against deep-submicron subthreshold leakage and input noise. To improve the speed of the circuit, a current mirror is also employed in the evaluation network to increase the evaluation current. The proposed technique (diode-footed domino) exhibits considerable improvement in leakage and noise immunity as compared to the standard domino circuits. Simulation results of wide fan-in gates designed using Berkeley Predictive Technology Models of 70-nm technology demonstrate at least 1.9/spl times/ noise-immunity improvement at the same delay compared to the standard domino circuits. Dynamic comparators and multiplexers are designed using the diode-footed domino and conventional techniques to demonstrate the effectiveness of the proposed scheme in improving leakage-tolerance and performance of high fan-in circuits.     

Speed enhancement techniques for Clock-Delayed Dual Keeper Domino logic style

ABSTRACT

Domino circuit topology for high-speed operation, robustness and lower power consumption is quintessential in design of digital systems. In this paper, various high speed and robust mechanisms are proposed to enhance the speed of Clock-Delayed Dual Keeper Domino (CDDK) circuit. Delayed enabling of keeper circuit in CDDK domino circuit reduces contention between keeper circuit and Pull-Down network (PDN). The speed of transition at the dynamic node of the CDDK domino circuit is enhanced through imposing techniques namely (i) controlled clock delay time in enabling the keeper transistor, (ii) keeper control signal voltage swing variation, (iii) sizing of keeper transistors and (iv) deploying an additional conditional discharge path. The robustness of CDDK circuit is increased by upsizing the keeper transistor without degrading the speed by stack arrangement of dual keeper transistors. The simulation of enhancement techniques has been performed using Cadence® Virtuoso ADEL and ADEXL environments employing UMC 90nm technology library. The simulation results of wide fan-in 64-input OR gate demonstrate that CDDK technique with additional discharge path offer 38% increase in speed and CDDK technique with keeper transistor upsizing offers 52% increase in noise gain margin without speed degradation while comparing with the conventional domino logic circuit.     

A high-speed,high fan-in dynamic comparator with low transistor count

In this article, we proposed a high-speed, high fan-in dynamic CMOS comparator with low transistor count. Our approach is to construct the dynamic comparator based on the prior superiority of dynamic CMOS comparator and to further enhance its operating speed. Constructing the comparator with dynamic CMOS architecture, we can save 63.2% transistor count as compared with the conventional static CMOS design. The main contribution to accelerate the speed of dynamic comparator is to solve the problem of ‘weak 0’ existing in the PMOS of pull-down network. Instead, as an alternate to PMOS in the pull-down network, we use NMOS combined with an additional inverter in the front of the NMOS input gate. In this way, we can perform the same function as PMOS, but transmitting with both ‘good 1’ and ’good 0’. As a result, the proposed dynamic comparator can operate with lower propagation delay in the pull-down network. Finally, the proposed 64-bit dynamic comparator circuit can operate correctly under a clock frequency of 450 MHz with 0.18 µm technology while the prior circuit can only operate under 250 MHz at the same time.     

Single-Phase SP-Domino: A Limited-Switching Dynamic Circuit Technique for Low-Power Wide Fan-in Logic Gates

The high switching activity of wide fan-in dynamic domino gates introduces significant power overhead that poses a limitation on using these compact high-speed circuits. This paper presents a new limited-switching clock-delayed dynamic circuit technique, called SP-Domino, which achieves static-like switching behavior, while maintaining the low-area and high-performance characteristics of wide fan-in dynamic gates. SP-Domino is a single-phase footless domino that can be freely mixed with static gates and can provide inverting and non-inverting functions. Simulations on 8 and 16 inputs or gates show that SP-Domino reduces dynamic power by up to 63% compared to same-UNG and same-delay standard footless domino, and up to 56.9% compared to low-contention high-speed standard footless domino.     

A Leakage Current Replica Keeper for Dynamic Circuits

We present a leakage current replica (LCR) keeper for dynamic domino gates that uses an analog current mirror to replicate the leakage current of a dynamic gate pull-down stack and thus tracks process, voltage, and temperature. The proposed keeper has an overhead of one field-effect transistor per gate plus a portion of a shared current mirror. Techniques for properly sizing LCR keepers are presented. Using these sizings, LCR keepers allow design of and-or circuits with 30% more legs than conventional keepers at the same noise margin in a 90-nm, 1.2-V CMOS logic process. Furthermore, 16-24-leg dynamic AO circuits are 25%-40% faster when using the replica keeper. We demonstrated the circuit operation on a 1024 words times 72 bits, 3W/4R embedded SRAM macro using a four-stage LCR-keeper domino structure for a read-out circuit