Epitaxial grown K1−xRbxTiOPO4 films with extremely flat surfaces for waveguiding

We report on epitaxial {1 0 0} K_1−xRb_xTiOPO₄ waveguide films for the visible spectral range grown on KTiOPO₄ substrates by liquid phase epitaxy. Using the m-line technique a refractive index increase of Δn_x≈0.007 and Δn_z≈0.004 for TM and TE polarisation has been determined for a K_0.78Rb_0.22TiOPO₄ film. Optical transmission and nearfield distribution are comparable to conventional ion-exchanged waveguides. Typical attenuation of about 1 dB/cm for both TM and TE polarisation was obtained at λ=532 and 1064 nm. Energy-dispersive X-ray spectrometry reveals solid-solution films with graded rubidium composition profiles. X-ray rocking curve analyses confirm the epitaxial growth process and indicate perfect and relaxed K_1−xRb_xTiOPO₄ films. Atomic force microscopy investigations reveal regular step structures with step heights Δh<1.3 nm resulting in rms-roughness values of ≈0.4 nm.     

Ideal 4H-SiC pn junction and its characteristic shunt

The results of a study of forward current–voltage characteristics of 4H-SiC pn structures produced by various methods are presented in this paper. In all pn structure types a forward current was identified which is consistent with the model of recombination in the space charge region via a deep level: J=J_o exp(qU/nkT), where J_o=J_o^* exp[−E_a/(kT)] (or J=J_o^* exp[(qU−2E_a)/nkT)]) with the ideality factor n=2. The values of the other parameters are as follows: J_o(293 K)(10⁻²⁴–10⁻²⁵) A cm⁻², E_a≈1.75 eV, J_o^*(10⁵–10⁶) A cm⁻². In the absence of other leaks, this current represents a natural (intrinsic) shunt for the diffusion current at low biases and determines the value of the injection coefficient of a pn junction. In many of the pn structures the forward current, while showing an exponential dependence on voltage and temperature, was significantly higher than the current described above. The ideality factor, in some instances, was close to unity. A situation with such characteristics can be considered as an ideal extrinsic (due to nonuniformities) barrier type shunt. The potential barrier height of this shunt is ≈1.4 eV. This sort of shunt is characteristic of SiC; earlier a similar object, presumably of the same origin, was identified in 6H-SiC pn structures.     

Optical properties of a-(Se70Te30)100−x(Se98 Bi2)x thin films

Measurements of optical constants (absorption coefficient, refractive index, extinction coefficient, real and imaginary part of the dielectric constant) have been made on a-(Se₇₀Te₃₀)_100−x (Se₉₈Bi₂)_x thin films (where x=0, 5, 10, 15 and 20) of thickness 2000 Å in the wavelength range 450–1000 nm. It is found that the optical bandgap decreases with the increase of Se₉₈Bi₂ concentration in the a-(Se₇₀Te₃₀)_100−x(Se₉₈Bi₂)_x system. The value of refractive index (n) decreases, while the extinction coefficient (k) increases with increasing photon energy. The results are interpreted in terms of concentration of localized states varying effective Fermi level.     

Structural and optical properties of (100 − x)(Li2B4O7) − x(SrO–Bi2O3–0.7Nb2O5–0.3V2O5) glasses and glass nanocrystal composites

Glasses of various compositions in the system (100 − x)(Li₂B₄O₇) − x(SrO–Bi₂O₃–0.7Nb₂O₅–0.3V₂O₅) (10  x  60, in molar ratio) were prepared by splat quenching technique. The glassy nature of the as-quenched samples was established by differential thermal analyses (DTA). The amorphous nature of the as-quenched glasses and crystallinity of glass nanocrystal composites were confirmed by X-ray powder diffraction studies. Glass composites comprising strontium bismuth niobate doped with vanadium (SrBi₂(Nb_0.7V_0.3)₂O_9−δ (SBVN)) nanocrystallites were obtained by controlled heat-treatment of the as-quenched glasses at 783 K for 6 h. High resolution transmission electron microscopy (HRTEM) of the glass nanocrystal composites (heat-treated at 783 K/6 h) confirm the presence of rod shaped crystallites of SBVN embedded in Li₂B₄O₇ glass matrix. The optical transmission spectra of these glasses and glass nanocrystal composites of various compositions were recorded in the wavelength range 190–900 nm. Various optical parameters such as optical band gap (E_opt), Urbach energy (ΔE), refractive index (n), optical dielectric constant and ratio of carrier concentration to the effective mass (N/m^*) were determined. The effects of composition of the glasses and glass nanocrystal composites on these parameters were studied.     

High electrical properties of W-additive Mn-modified PZT–PMS–PZN ceramics for high power piezoelectric transformers

The ceramics were prepared successfully by the addition of WO₃ to the Mn-modified Pb(Zr_0.52Ti_0.48)O₃–Pb(Mn_1/3Sb_2/3)O₃–Pb(Zn_1/3Nb_2/3)O₃ (PZT–PMS–PZN) for high power piezoelectric transformers application. XRD analysis indicated that the ceramics were mainly composed of a tetragonal phase in the range of 0–1.0 wt.% WO₃ addition. The grain size of the ceramics significantly decreased from 10.0 to 2.9 μm by addition of WO₃. Moreover, the addition of WO₃ promoted densification of the ceramics and increased mechanical quality factor (Q_m), planar coupling factor (K_p) and piezoelectric constant (d₃₃) kept high values, whereas, dielectric loss (tan δ) was low. Δf (=f_a − f_r) slightly changed when WO₃ addition was above 0.5 wt.%. The ceramics with 0.6 wt.% WO₃ addition, sintered at 1150 °C showed the optimized piezoelectric and dielectric properties with Q_m of 1852, K_p of 0.58, d₃₃ of 243 pC/N and tan δ of 0.0050. The ceramics are promising candidates for high power piezoelectric transformers application.     

Fabrication and characterization of (1−x)SrBi2Ta2O9–xBi3TaTiO9 layered structure solid solution thin films for ferroelectric random access memory (FRAM) applications

We report on the properties of (1−x)SrBi₂Ta₂O₉–xBi₃TaTiO₉ solid solution thin films for ferroelectric non-volatile memory applications. The solid solution thin films fabricated by modified metalorganic solution deposition technique showed much improved properties compared to SrBi₂Ta₂O₉. A pyrochlore free crystalline phase was obtained at a low annealing temperature of 600°C and grain size was found to be considerably increased for the solid solution compositions. The film properties were found to be strongly dependent on the composition and annealing temperatures. The measured dielectric constant of the solid solution thin films was in the range 180–225 for films with 10–50% of Bi₃TaTiO₉ content in the solid solution. Ferroelectric properties of (1−x)SrBi₂Ta₂O₉–xBi₃TaTiO₉ thin films were significantly improved compared to SrBi₂Ta₂O₉. For example, the observed remanent polarization (2P_r) and coercive field (E_c) values for films with 0.7SrBi₂Ta₂O₉–0.3Bi₃TaTiO₉ composition, annealed at 650°C, were 12.4 μC/cm² and 80 kV/cm, respectively. The solid solution thin films showed less than 5% decay of the polarization charge after 10¹⁰ switching cycles and good memory retention characteristics after about 10⁶ s of memory retention. The improved microstructural and ferroelectric properties of (1−x)SrBi₂Ta₂O₉–xBi₃TaTiO₉ thin films compared to SrBi₂Ta₂O₉, especially at lower annealing temperatures, suggest their suitability for high density FRAM applications.     

The relationship of the volume fraction of martensite vs. plastic strain in an Fe–Mn–Si–Cr–N shape memory alloy

The volume fractions of stress-induced martensite formed by certain plastic strains were determined by X-ray diffraction and quantitative metallography in an Fe–Mn–Si–Cr–N alloy at room temperature. The results are fitted by least square method and are well consistent with an exponential function f_M=1−exp{−β[1−exp(−η)]ⁿ} deduced by Olson and Cohen, who used it to fit with experimental data for AISI304 stainless steel. The similarity of and β, as well as the difference in n for these two alloys are discussed in relation to their nucleation mechanisms.     

Ellipsometry study of poly(o-methoxyaniline) thin films

Spin-coated poly(o-methoxyaniline) (POMA) thin films on various substrates were investigated using spectroscopic ellipsometry (SE) in the 1.5–4.5 eV photon energy range. Spin-coating process parameters are reported (spin speed and concentration). Substrates with higher surface energy were found to increase polymer film thickness and decrease roughness. An optical model was developed using SE data along with complementary data from atomic force microscopy and UV–vis spectroscopy to obtain optical properties—refractive index n and extinction coefficient k for POMA. The model includes Lorentz oscillators for the POMA film and a Bruggeman effective medium approximation for roughness. In-plane film optical anisotropy was not observed, but a small out of plane anisotropy was detected for the polymer.     

Optical properties of N,N′-bis(3-phenoxy-3-phenoxy-phenoxy)-1,4,5,8-naphthalene-tetracarboxylic diimide by spectroscopic ellipsometry

Optical properties of N,N′-bis(3-phenoxy-3-phenoxy-phenoxy)-1,4,5,8-naphthalene-tetracarboxylic diimide were investigated using variable angle spectroscopic ellipsometry in the visible light range. An oscillator model with one Tauc–Lorentzian and three Gaussian oscillators was constructed and found physically consistent with the experimental results. No measurable optical anisotropy is found in-plane or out of the film plane, indicating a random arrangement of molecules in spin cast thin films. Refractive index n and absorption index k are reported in the 1.5–4.5 eV (840 nm to 280 nm) optical range.     

Optical properties of Tl2InGaS4 layered single crystal

The temperature dependence of the optical band gap of Tl₂InGaS₄ single crystal in the temperature region of 300–500 K and the room temperature refractive index, n(λ), have been investigated. The absorption coefficient, which was calculated from the transmittance and reflectance spectra in the incident photon energy range of 2.28–2.48 eV, increased with increasing temperature. Consistently, the absorption edge shifts to lower energy values as temperature increases. The fundamental absorption edge corresponds to an indirect allowed transitions energy gap (2.35 eV) that exhibits a temperature coefficient of −4.03 × 10⁻⁴ eV/K. The room temperature n(λ), calculated from the reflectance and transmittance data, allowed the identification of the oscillator strength and energy, static and lattice dielectric constants, and static refractive index as 16.78 eV and 3.38 eV, 5.96 and 11.77, and 2.43, respectively.     

Photoinduced nonlinear optics in Sb2Se3–BaCl2–PbCl2 glasses

Photoinduced structural transformations in amorphous Sb₂Se₃–BaCl₂–PbCl₂ glasses were studied using a differential IR spectroscopy Fourier technique in the spectral region between 100 and 300 cm⁻¹. A stage of the reversible photodarkening is realized in the Sb₂Se₃ fragments after the first cycle of photoexposure and thermoannealing. The whole scheme of the photo- and thermoinduced transformations in the amorphous system may be explained as a coordination of formation and annihilation of defects. The vibrational density of states calculated using quantum chemical solid state methods confirms our experimental results and their interpretation. Photoinduced photodarkening changes using a CO₂ pulse laser (λ=10.6 μm) in new synthesized Sb₂Se₃–BaCl₂–PbCl₂ glasses were investigated. At the same time we have studied photoinduced second harmonic generation (SHG) and two-photon absorption (TPA). The possibility of using this glass as perspective materials for IR optoelectronics and nonlinear optics was shown.     

Thermally and optically induced irreversible changes in some Ge–As–S amorphous thin films

Thermally and optically induced irreversible changes in the optical gap and refractive index were studied for sulphur rich, nearly stoichiometric and sulphur poor Ge–As–S amorphous films prepared by thermal evaporation. For films studied the optical gap in the virgin state decreases from 2.55₉ (Ge_0.121As_0.172S_0.707) to 1.63₂ eV (Ge_0.254As_0.294S_0.452) and simultaneously the refractive index increases from 2.21 to 2.87, respectively. The most sensitive composition to illumination seems to be nearly stoichiometric film (Ge_0.153As_0.201S_0.646), where the blue shift of the gap is observed close to 150 meV. Sulphur poor film (Ge_0.254As_0.294S_0.452) was found insensitive to illumination. Highest thermally induced blue shift of the gap, close to 250 meV, we observed just for Ge_0.254As_0.294S_0.452 film and for this film it was observed also nearly “giant” decrease in refractive index from 2.85 to 2.42. The behaviour of Ge_0.254As_0.294S_0.452 film is qualitatively discussed using the concept of network rigidity (insensitivity to illumination) and assuming thermally induced changes in bonding arrangement (refractive index changes).     

Thermal optical properties of TiO2 films

A fibre optic experimental arrangement was used to determine the thermo-optic coefficient (dn/dT) of electron beam deposited titanium dioxide coatings on the cleaved end faces of multimode optical fibres for a wavelength range between 600 and 1050 nm. The temperature-induced change in the index of refraction (n) and extinction coefficient (k) were successfully determined from reflection spectra. Measurements of n and k at various wavelengths for different temperatures enabled the determination of dn/dT and dk/dT. It was found that dn/dT takes different values at different temperature ranges. For example, at 800 nm, dn/dT was (−1.77±0.7)×10⁻⁴ K⁻¹, between 18°C and 120°C, and took a value of (−3.04±0.7)×10⁻⁴ K⁻¹ between 220°C and 325°C.     

Structural and optical properties of thermally evaporated 1,4,8,11,15,18,22,25-octahexylphthalocyanine thin films

Metal-free 1,4,8,11,15,18,22,25-octahexylphthalocyanine was prepared directly by the cyclotetramerization of 3,6-dihexylphthalonitrile using lithium butoxide in butanol. Thin films of the material were deposited on glass substrates by the thermal evaporation technique. The structure of the films was found to be in the form, and showed a strong peak indicating preferential orientation. The surface morphology of the thin films was investigated by atomic force microscopy and showed that the molecules of 1,4,8,11,15,18,22,25-octahexylphthalocyanine grow in stacks of parallel rows. The spectrophotometric measurements of transmittance and reflectance were carried out in the wavelength range 190–3000 nm. The refractive index, n, and absorption index, k, were found to be independent of annealing at 373 K. The B band absorption occurred at 356 nm, and the Q band showed a doublet at 667 and 739 nm. Other optical parameters, such as absorption coefficient and optical dielectric constant ε, were determined.     

Optical transitions near the band edge in bulk CuInxGa1−xSe2 from ellipsometric measurements

From the analysis of the variation of optical absorption coefficient with incident photon energy between 0.8 and 2.6 eV, obtained from ellipsometric data, the energy E_G of the fundamental absorption edge and E_G′ of the forbidden direct transition for CuIn_xGa_1−xSe₂ alloys are estimated. The change in E_G and the spin-orbit splitting Δ_SO=E_G′−E_G with the composition x can be represented by parabolic expression of the form E_G(x)=E_G(0)+ax+bx² and Δ_SO(x)=Δ_SO(0)+a′x+b′x², respectively. b and b′ are called “bowing parameters”. Theoretical fit gives a=0.875 eV, b=0.198 eV, a′=0.341 eV and b′=−0.431 eV. The positive sign of b and negative sign of b′ are in agreement with the theoretical prediction of Wei and Zunger [Phys. Rev. B 39 (1989) 6279].     

The optical and electrical properties of copper indium di-selenide thin films

Thin films of copper indium di-selenide (CIS) with a wide range of compositions near stoichiometry have been formed on glass substrates in vacuum by the stacked elemental layer (SEL) deposition technique. The compositional and optical properties of the films have been measured by proton-induced X-ray emission (PIXE) and spectrophotometry (photon wavelength range of 300–2500 nm), respectively. Electrical conductivity (σ), charge-carrier concentration (n), and Hall mobility (μ_H) were measured at temperatures ranging from 143 to 400 K. It was found that more indium-rich films have higher energy gaps than less indium-rich ones while more Cu-rich films have lower energy gaps than less Cu-rich films. The sub-bandgap absorption of photons is minimum in the samples having Cu/In ≈ 1 and it again decreases, as Cu/In ratio becomes less than 0.60. Indium-rich films show n-type conductivities while near-stoichiometric and copper-rich films have p-type conductivities. At 300 K σ, n and μ_H of the films vary from 2.15 × 10⁻³ to 1.60 × 10⁻¹ (Ω cm)⁻¹, 2.28 × 10¹⁵ to 5.74 × 10¹⁷ cm⁻³ and 1.74 to 5.88 cm² (V s)⁻¹, respectively, and are dependent on the composition of the films. All the films were found to be non-degenerate. The ionization energies for acceptors and donors vary between 12 and 24, and 3 and 8 meV, respectively, and they are correlated well with the Cu/In ratios. The crystallites of the films were found to be partially depleted in charge carriers.     

Temperature dependence of the band gap, refractive index and single-oscillator parameters of amorphous indium selenide thin films

InSe thin films are obtained by evaporating InSe crystal onto ultrasonically cleaned glass substrates under pressure of 10⁻⁵ Torr. The structural and compositional analysis revealed that these films are of amorphous nature and are atomically composed of 51% In and 49% Se. The reflectance and transmittance of the films are measured at various temperatures (300–450 K) in the incident photon energy range of 1.1–2.1 eV. The direct allowed transitions band gap – calculated at various temperatures – show a linear dependence on temperature. The absolute zero value band gap and the rate of change of the band gap with temperature are found to be (1.62 ± 0.01) eV and −(4.27 ± 0.02) × 10⁻⁴ eV/K, respectively. The room temperature refractive index is estimated from the transmittance spectrum. The later analysis allowed the identification of the static refractive index, static dielectric constant, oscillator strength and oscillator energy.     

D.c. properties of ZnO thin films prepared by r.f. magnetron sputtering

In the development of ZnO-based varistors the electrical properties of ZnO/Bi₂O₃ junctions and of the two individual oxides are being investigated. Following our recent work on a.c. conductivity in Al---ZnO---Al sandwich structures we currently report d.c. measurements. The structures were prepared by r.f. magnetron sputtering in an argon/oxygen mixture in the ratio 4:1. Capacitance-voltage data confirm that the Al/ZnO interface does not form a Schottky barrier and measurements of the dependence of capacitance on film thickness indicate that the relative permittivity of the films is approximately 9.7. With increasing voltage the current density changed from an ohmic to a power-law dependence with exponent n≈3. Furthermore measurements of current density as a function of reciprocal temperature showed a linear dependence above about 240 K, with a very low activation energy below this temperature consistent with a hopping process. The higher temperature results may be explained assuming a room-temperature electron concentration n₀ and space-charge-limited conductivity, dominated by traps exponentially distributed with energy E below the conduction band edge according to N = N₀exp(−E/kT_t), where k is Boltzmann's constant. Typical derived values of these parameters are: n₀ = 7.2 × 10¹⁶ m⁻³, N₀ = 1.31 × 10⁴⁵ J⁻¹ m⁻³ and T_t = 623 K. The total trap concentration and the electron mobility were estimated to be 1.13 × 10²⁵ m⁻³ and (5.7−13.1) ×10⁻³m²V⁻¹s⁻¹ respectively.     

Optical band gap studies on xPb3O4–(1−x)P2O5 lead[(II, IV)] phosphate glasses

A series of glasses in the xPb₃O₄–(1−x)P₂O₅ (red lead phosphate) (RLP) system with ‘x' varying from 0.075 to 0.4 were prepared by the single-step melt quenching process from Pb₃O₄ and NH₄H₂PO₄. The optical absorption spectra of these glasses have been recorded in the ultraviolet region from 200 to 400 nm and the fundamental absorption edges have been identified. The optical band gap E_opt values have been determined for all the glasses using the known theories. The (E_opt) values vary from 4.90 to 3.21 eV the highest being 4.57 eV, corresponding to the most stable glass of x=0.225. The absorption edge is attributed to the indirect transitions and the origin of the Urbach energy ΔE is suggested to be thermal vibrations. These glasses promise as potential candidates for application in optical technology compared to simple xPbO–(1−x)P₂O₅ (lead phosphate) (LP) glasses.     

Influence of Mn doping on microstructure and DC-accelerated aging behaviors of ZnO–V2O5-based varistors

The microstructure, electrical properties, dielectric characteristics, and DC-accelerated aging behavior of the ZnO–V₂O₅–MnO₂ system sintered were investigated for MnO₂ content of 0.0–2.0 mol% by sintering at 900 °C. For all samples, the microstructure of the ZnO–V₂O₅–MnO₂ system consisted of mainly ZnO grain and secondary phase Zn₃(VO₄)₂. The incorporation of MnO₂ to the ZnO–V₂O₅ system was found to restrict the abnormal grain growth of ZnO. The nonlinear properties and stability against DC-accelerated aging stress improved with the increase of MnO₂ content. The ZnO–V₂O₅–MnO₂ system added with MnO₂ content of 2.0 mol% exhibited not only a high nonlinearity, in which the nonlinear coefficient is 27.2 and the leakage current density is 0.17 mA/cm², but also a good stability, in which %ΔE_1 mA = −0.6%, %Δ = −26.1%, and %Δtan δ = +22% for DC-accelerated aging stress of 0.85E_1 mA/85 °C/24 h.