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本文介绍一种并联式横向激励大气压氮激光器。其结构非常简单,仅采用了一个简单的Blumlein放电电路,在其上并联了不同量值的陶瓷电容器,以增加传输线和储能电容器的容量。实验结果表明激光输出能量随并联电容量增加而线性增加。 相似文献
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氮分子激光器是一种结构简单又应用较广的器件。此种器件的上能级寿命很短,介质放大系数很大,其粒子数反转是通过介质放电过程中基态分子直接与高能电子碰撞激励产生的。它的输出功率主要受气体密度、电场强度、电流密度、电流脉冲的上升时间和器件的几何结构等影响。如果以上几个方面匹配恰当,会获得较大功率的脉冲输出。其中特别是气体密度一项尤为重要。因为一定体积内的受激分子数直接依赖于气 相似文献
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2.横向激励型氮激光器如前文所述,纵向氮激光器的优点是方向性好,结构紧凑,体积小。缺点是峰值功率不太大,其主要原因是用同轴电缆馈电,阻抗较大;放电管孔径较细;充气压力较低;放电管长度受到限制,一般不超过氮气的击穿速度与激光上能级辐射寿命之乘积。 相似文献
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氮分子紫外脉冲激光器(以下简称氮激光器),于1963年问世,它的基本特征是:峰值功率大,一般在数兆瓦量级,最高已达60兆瓦;脉冲宽度窄,一般在10毫微秒左右,最窄已达0.6毫微秒;重复工作频率高,一般可达每秒几十次到一百次,最高已达1300次/秒;输出激光处在紫外波段,波长为3371埃;结构简单,制造容易,造价较低。氮激光器应用很广,它所发出的3371埃紫外光广泛应用于泵浦染料激光器及激光光谱、污染探测、集成光学、农业育种、癌症诊断、石油勘探等方面。 相似文献
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An air cooled N2O waveguide laser with pulsed longitudinal DC excitation is described. It can oscillate in 70 lines, and, at a pressure of 80 mbar, it can be tuned single line and single mode over a tuning range of 350 MHz in a number of stronger lines. The laser performance is studied for different gas mixtures, involving He, N 2, and CO, and for various resonator configurations and cooling schemes. Operation at the required pressure is possible only if CO is used in the gas mixture. The potential of the laser for Doppler limited spectroscopy is illustrated through measurements of NH3 相似文献
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Diffusion-cooled and convective-cooled CW CO2 lasers have significantly different N2 partial pressure in their optimum laser gas mixture. While in diffusion-cooled lasers the N2 fractional concentration is normally within 20% of the total gas pressure, it ranges up to 60% in convective-cooled lasers. By considering various effects of N2 and solving a simplified rate-equation model analytically, the large difference in the optimum N 2 concentrations in these two types of CO2 laser is explained 相似文献
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考察了一些混合染料的乙醇溶液在N_2激光泵浦下所发射的光谱.这些混合染料分别是Rh6G加甲酚紫、RhB加甲酚紫、Rh6G加RhB以及Rh6G加RhB加甲酚紫.讨论了其中的能量转移过程.证实混合染料对拓宽激光可调谐范围、提高某些染料的激光效率以及获得双波长激光振荡是可行的. 相似文献
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本文中, 使用开尔文探针显微镜,研究了不同退火气氛(氧气或氮气)情况下氧化铪材料的电子和空穴的电荷保持特性。与氮气退火器件相比,氧气退火可以使保持性能变好。横向扩散和纵向泄露在电荷泄露机制中都起了重要的作用。 并且,保持性能的改善与陷阱能级深度有关。氮气和氧气退火情况下,氧化铪存储结构的的电子分别为0.44 eV, 0.49 eV,空穴能级分别为0.34 eV, 0.36 eV。 最后得到,不同退火气氛存储器件的电学性能也与KFM结果一致。对于氧化铪作为存储层的存储器件而言,对存储特性的定性和定量分析,陷阱能级,还有泄漏机制研究是十分有意义的。 相似文献
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The role of N2 on GaAs etching at 150 mTorr capacitively-coupled Cl2/N2 plasma is reported. A catalytic effect of N2 was found at 20-25% N2 composition in the Cl2/N2 discharges. The peak intensities of the Cl2/N2 plasma were monitored with optical emission spectroscopy (OES). Both atomic Cl (725.66 nm) and atomic N (367.05 nm) were detected during the Cl2/N2 plasma etching. With the etch rate and OES results, we developed a simple model in order to explain the etch mechanism of GaAs in the high pressure capacitively-coupled Cl2/N2 plasma as a function of N2 ratio. If the plasma chemistry condition became positive ion-deficient at low % N2 or reactive chlorine-deficient at high % N2 in the Cl2/N2 plasma, the GaAs etch rate is reduced. However, if the plasma had a more balanced ratio of Cl2/N2 (i.e. 20-25% N2) in the plasma, much higher etch rates (up to 150 nm/min) than that in pure Cl2 (50 nm/min) were produced due to synergetic effect of neutral chlorine adsorption and reaction, and positive ion bombardment. Pure Cl2 etching produced 14 nm of RMS surface roughness of GaAs. Introduction of ?20% N2 gas in Cl2/N2 discharges significantly reduced the surface roughness to 2-4 nm. SEM photos showed that the morphology of photoresist mask was strongly degraded. Etch rate of GaAs slightly increased from 10 to 40 nm/min when RIE chuck power changed from 10 to 150 W at 12 sccm Cl2/8 sccm N2 plasma condition. The surface roughness of GaAs etched at 12 sccm Cl2/8 sccm N2 plasma was 2-3 nm. 相似文献
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《激光杂志》1999,20(5):0-10
Using an in-cavity hot CO2 cell
that is shorter than a TEA CO2 discharge length,conversion characteristic of a
TEA CO2 laser operating on sequence bands is studed.Choosing proper operation
conditions,output can be attained on more than 40 sequence lines and the output energy per
pulse exceeds 1J on more than 10 lines. 相似文献