Imaging of hydrogen-induced Si(111) surface with the scanning tunnelling microscope

We have directly observed the hydrogen-induced changes of the Si(111)7times7 surface using a scanning tunnelling microscope (STM). The 7times7 reconstructed atomic structure was formed on a clean surface of Si(111). But when the clean surface was dosed with typically 1–2 L [1 L (Langmuir) = 1·33 times 10^?4 Pa. sec] hydrogen, the 7 times 7 image was gradually smeared out and then a 1 times 1 unreconstructed pattern appeared. After dosing with 5–10 L hydrogen, the STM image exhibited a new long-periodic structure together with the 1times1 structure underneath. These experimental results may be ascribed to the chemisorption of hydrogen atoms on clean Si surfaces.     

Variable-temperature independently driven four-tip scanning tunneling microscope

The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both of the multitip STM and SEM with a single computer has also been developed, which enables the four tips to operate either for STM imaging independently and for four-point probe (4PP) conductivity measurements cooperatively. Atomic-resolution STM images of graphite were obtained simultaneously by the four tips. Conductivity measurements by 4PP method were also performed at various temperatures with the four tips in square arrangement with direct contact to the sample surface.     

Surface investigations with a combined scanning electron–scanning tunneling microscope

We have combined a scanning tunneling microscope (STM) with a scanning electron microscope (SEM) for surface investigations of atomically flat surfaces, ultrathin adsorbate films, and material surfaces. The mechanical stability of the hybrid instrument allows high-resolution SEM of samples mounted on the STM stage and atomic resolution with the STM. Experimental results of combined SEM/STM investigations on textured material surfaces, submicron structures, and atomically flat conducting surfaces are presented. An example is given for surface machining with the STM under SEM control.     

Mechanical scanning of the specimen in the scanning electron microscope

A scanning electron microscope (SEM) system equipped with a motor drive specimen stage fully controlled with a personal computer (PC) has been utilized for obtaining ultralow magnification SEM images. This modem motor drive stage works as a mechanical scanning device. To produce ultra-low magnification SEM images, we use a successful combination of the mechanical scanning, electronic scanning, and digital image processing techniques. This new method is extremely labor and time saving for ultra-low magnification and wide-area observation. The option of ultra-low magnification observation (while maintaining the original SEM functions and performance) is important during a scanning electron microscopy session.     

Scanning probe microscopy of biological samples and other surfaces

Scanning probe microscopes derived from the scanning tunnelling microscope (STM) offer new ways to examine surfaces of biological samples and technologically important materials. The surfaces of conductive and semiconductive samples can readily be imaged with the STM. Unfortunately, most surfaces are not conductive. Three alternative approaches were used in our laboratory to image such surfaces. 1. Crystals of an amino acid were imaged with the atomic force microscope (AFM) to molecular resolution with a force of order 10^?8 N. However, it appears that for most biological systems to be imaged, the atomic force microscope should be able to operate at forces at least one and perhaps several orders of magnitude smaller. The substitution of optical detection of the cantilever bending for the measurement by electron tunnelling improved the reliability of the instrument considerably. 2. Conductive replicas of non-conductive surfaces enabled the imaging of biological surfaces with an STM with a lateral resolution comparable to that of the transmission electron microscope. Unlike the transmission electron microscope, the STM also measures the heights of the features. 3. The scanning ion conductance microscope scans a micropipette with an opening diameter of 0·04-0·1 μm at constant ionic conductance over a surface covered with a conducting solution (e.g., the surface of plant leaves in saline solution).     

Nanomanipulation and nanofabrication with multi-probe scanning tunneling microscope: from individual atoms to nanowires

The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.     

Minority carrier lifetime mapping in the SEM

A method is described for obtaining two-dimensional distributions of minority carrier lifetimes in semiconductor materials for optoelectronic applications. The novel features of the system are: on line analogue calculation of the lifetime from the decay of the cathodoluminescence signal after switching off the SEM electron beam; simultaneous computerized mapping of the signals obtained in this manner in the scanning electron microscope. Typically, it permits establishing a map of 1 mm² with 512 times 512 data points in 10 min for lifetimes down to 3 ns.     

Analytical scanning electron microscopy for solid surface

A scanning electron microscope of ultra-high-vacuum (UHV-SEM) with a field emission gun (FEG) is operated at the primary electron energies of from 100 eV to 3 keV. The instrument can form the images that contain information on surface chemical composition, chemical bonding state (electronic structure), and surface crystal structure in a microscopic resolution of several hundred angstroms (Å) using the techniques of scanning Auger electron microscope, scanning electron energy loss microscope, and scanning low-energy electron diffraction (LEED) microscope. A scanning tunneling microscope (STM) also has been combined with the SEM in order to obtain the atomic resolution for the solid surface. The instrumentation and examples of their applications are presented both for scanning LEED microscopy and STM.     

Biological structures imaged in a hybrid scanning transmission electron microscope and scanning tunneling microscope

A hybrid scanning transmission electron microscope (STEM) and scanning tunneling microscope (STM) is described which allows simultaneous imaging of biological structures adsorbed to electron-transparent specimen supports in both modes of scanning microscopy, as demonstrated on uncoated phage T4 polyheads. We further discuss the reproducibility and validity of height data obtained from STM topographs of biomacromolecules and present raw data from topographs of freeze-dried, metal-coated nuclear envelopes from Xenopus laevis oocytes.     

Development of probe-to-probe approach method for an independently controlled dual-probe scanning tunneling microscope

We developed a method of fast probe-to-probe approach for an independently controlled dual-probe scanning tunneling microscope (STM), which is essential to measure the transport property of nanostructures, without scanning electron microscopy (SEM). In the approach method, inchworm motors are used as the coarse positioning devices, which are controlled with a personal computer. The method enables an automatic approach of the probe to the other probe within a short time (typically 30 min). After the approach, a real distance between contact points of each probe tip to a sample can be measured from the overlapped part of the STM images obtained with individual probe. The approach method without SEM is also useful to measure the charge transport in the atmosphere, which will be essential for measurement of the bio molecules.     

World wide web-controlled scanning electron microscope

This paper¹ presents a system for remote control of a scanning electron microscope (SEM) over the Internet using the World Wide Web (WWW). The evolution of the SEM to its current incarnation as a PC-SEM is noted, and the World Wide Web is briefly described. The implementation of the authors' system is detailed in terms of configuration and manner of interaction. The potential commercial applications of the research are described. Related work in microscopy and networking fields is considered. A discussion of the advantages of the described system and expected future directions for research and development concludes the paper.     

Integration of a high‐NA light microscope in a scanning electron microscope

We present an integrated light‐electron microscope in which an inverted high‐NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing high‐resolution optical microscopy and scanning electron microscopy on the same area of a sample simultaneously. Components for light illumination and detection can be mounted outside the vacuum, enabling flexibility in the construction of the light microscope. The light objective lens can be positioned underneath the SEM objective lens during operation for sub‐10 μm alignment of the fields of view of the light and electron microscopes. We demonstrate in situ epifluorescence microscopy in the SEM with a numerical aperture of 1.4 using vacuum‐compatible immersion oil. For a 40‐nm‐diameter fluorescent polymer nanoparticle, an intensity profile with a FWHM of 380 nm is measured whereas the SEM performance is uncompromised. The integrated instrument may offer new possibilities for correlative light and electron microscopy in the life sciences as well as in physics and chemistry.     

STM imaging of the complete bacterial cell sheath of Methanospirillum hungatei

Using a large range scanning tunnelling microscope (STM) we have obtained images of the complete outer cell wall of the archaebacterium Methanospirillum hungatei, deposited on a graphite substrate and over-coated with an Au or Pt evaporated film. The width of the collapsed cylindrical sheath structure was found to be 5000 Å ± ***10%, which agrees closely with the value from previously published electron microscope (EM) studies. The double thickness of the collapsed sheath was found to be 160 Å ± 10%, which is about 20% smaller than that from the EM results. Higher resolution STM images taken on top of the collapsed sheaths show corrugations running perpendicular to the cylinder axis and having widths which are multiples of ～ 30 Å, the minimum period expected from EM studies. The height of the corrugations have a minimum value of about 4 Å. The expected 2-D crystalline structure was not seen in the STM images.     

A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.     

In situ cleavage mechanism for semiconductor single crystals for ultrahigh-vacuum scanning tunneling microscope

A tecnique for cleaving semiconductor single crystals under ultrahigh-vacuum conditions is proposed. A system for in situ cleavage of samples for ultrahigh-vacuum scanning tunneling microscope (STM) has been developed. STM studies of the surfaces of InAs single crystals with n and p-type bulk conduction have been performed on an Omicron ultrahigh-vacuum facility.     

A scanning near-field optical microscope having scanning electron tunnelling microscope capability using a single metallic probe tip

A new microscope system that has the combined capabilities of a scanning near-field optical microscope (SNOM) and a scanning tunnelling microscope (STM) is described. This is achieved with the use of a single metallic probe tip. The distance between the probe tip and the sample surface is regulated by keeping the tunnelling current constant. In this mode of operation, information about the optical properties of the sample, such as its refractive index distribution and absorption characteristics, can be disassociated from the information describing its surface structure. Details of the surface structure can be studied at resolutions smaller than the illumination wavelength. The performance of the microscope is evaluated by analysing a grating sample that was made by coating a glass substrate with gold. The results are then compared with the corresponding SNOM and STM images of the grating.     

A fully automated, ‘thimble-size’ scanning tunnelling microscope

A novel, fully automated high-stability, high-eigenfrequency scanning tunnelling microscope (STM) has been developed. Its key design feature is the application of two piezoelectric ceramic tubes, one for the x-y-z motion of the tip and one for a linear motor (‘nano-worm’) used for the coarse positioning of the tip relative to the specimen. By means of the nano-worm, the tip can be advanced in steps between 16 and 0·2 nm. The walking distance is >2 mm, with a maximum speed of 2000 steps/s. The nano-worm positioning implies that this STM is fully controlled by electronic means, and that no mechanical coupling is needed, which makes operation of the STM extremely convenient. The axial-symmetry construction is rigid, small and temperature-compensated, yielding reduced sensitivity to mechanical and acoustic vibrations and temperature variations. The sample is simply placed on a piece of invar which surrounds the scanner tube and the nano-worm and is held by gravity alone. This allows for easy sample mounting. The performance of the microscope has been tested in air by imaging a variety of surfaces, including graphite and biological samples.     

Reproducibility and accuracy of spatial measurements from digitally captured images in the environmental scanning electron microscope

Accurate spatial measurements in a scanning electron microscope (SEM) require calibration of the magnification as a function of working distance and microscope operating conditions. This work presents the results of the calibration of an environmental SEM for the accurate spatial measurement of dimensions and areas in experiments, both for the measurement of strain in steel specimens under applied loads and the measurement of dimensional changes in timber with changes in relative humidity.     

Atomic resolution imaging using a novel,compact and stiff scanning tunnelling microscope in cryogen-free superconducting magnet

We present the design and performance of a novel scanning tunnelling microscope (STM) operating in a cryogen-free superconducting magnet. Our home-built STM head is compact (51.5 mm long and 20 mm in diameter) and has a single arm that provides complete openness in the scanning area between the tip and sample. The STM head consists of two piezoelectric tubes (PTs), a piezoelectric scanning tube (PST) mounted on a well-polished zirconia shaft, and a large PT housed in a sapphire tube called the motor tube. The main body of the STM head is made of tantalum. In this design, we fixed the sapphire tube to the frame with screws so that the tube's position can be changed quickly. To analyse the stiffness of the STM head unit, we identified the lowest eigenfrequencies with 3 and 4 kHz in the bending modes, 8 kHz in a torsional mode, and 9 kHz in a longitudinal mode by finite element analysis, and also measured the low drift rates in the X–Y plane and in the Z direction. The high performance of the home-built STM was demonstrated by images of the hexagonal graphite lattice at 300 K and in a sweeping magnetic field from 0 T to 9 T. Our results confirm the high stability, vibration resistance, insensitivity to high magnetic fields and the application potential of our newly developed STM for the investigation of low-frequency systems with high static support stiffness in physics, chemistry, material and biological sciences.     

Investigation on infrared laser desorption of solid matrix using scanning electron microscope and fast photography

Infrared light from a pulsed optical parametric oscillator laser system was used to irradiate succinic acid (SA), a usual solid matrix used in matrix‐assisted laser desorption ionization, under vacuum. Ablated SA particles were trapped using a silica plate mounted 3.0 mm above and parallel to the sample surface. The morphology and particle size of ablated particles at different laser fluences were investigated using a scanning electron microscope (SEM). The dynamics of plume propagation for SA desorption process was studied with fast photography at atmospheric pressure. Plume expanding at 1.12 J/cm² laser fluence was recorded using a high‐speed CMOS camera and corresponding propagation distance was measured. The solid matrix desorption was driven by phase explosion according to plume model fitting, which was consistent with the results of SEM. Microsc. Res. Tech. 76:744–750, 2013. © 2013 Wiley Periodicals, Inc.