共查询到16条相似文献,搜索用时 125 毫秒
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新型绕组电缆接地特性的研究 总被引:1,自引:0,他引:1
简述了新型具有半导电层的外层接地绕组电缆的应用,介绍了绕组电缆及其接地系统的结构,分析了绕组电缆接地电流的分布规律,研究了接地电流分布对绕组电缆温升及电缆性能的影响.结果表明,采取增加接地面积、改善接地条件、降低接地电流密度和调整端部绕组电缆外半导电层电阻率等措施,可保证绕组电缆系统的可靠运行. 相似文献
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基于舟山混联输电线路工程,应用PSCAD/EMTDC软件,建模仿真研究了500 kV交联聚乙烯海底电缆绝缘和内(绝缘)护层上的各类暂态电压和绝缘配合问题,计算了断路器合闸操作、断路器重击穿和雷电流侵入时电缆绝缘及内护层上暂态电压的分布特性,分析了短路及故障电流、电缆中间段金属护套与铠装短接、电缆接地体阻抗等对电缆内护层感应电压的影响。结果表明:操作空载线路和最大雷电流侵入在电缆绝缘上可分别产生最高850 kV的操作暂态过电压和1 230 kV雷电暂态过电压,通过在断路器上加装合闸电阻和(或)在电缆上并联合适电抗器可以有效限制操作暂态电压;单相金属性短路故障和最大雷电流侵入在电缆内护层可分别产生最高7.5 kV和11.4 kV的暂态电压,电缆中间段金属护套与铠装短接方式可减小电缆内护层上约1/3的暂态电压,而电缆两端三相集中接地体的阻抗对电缆内护层上暂态电压的影响可忽略,各种暂态下电缆绝缘和内护层的绝缘配合满足500 kV电缆的相关标准要求。 相似文献
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电缆中聚乙烯界面微观结构对击穿强度的影响 总被引:1,自引:0,他引:1
本文选用特殊添加剂对电力电缆中半导电层以化学改性,为减薄电缆绝缘厚度,提高交联聚乙烯电缆的击穿强度,提供了有效途径。从理论上定性解释了聚乙烯的击穿强度与界面片晶取向角的关系。由微观结构分析结果表明,改性半导电层经热压后,会改变聚乙烯界面结晶取向,改善半导电层中碳粒凝聚状态。最后,由电缆模型试片的击穿强度结果予以证实:改性半导电层比普通半导电层,可使聚乙烯的1%威布尔击穿强度提高89%。平均击穿强度提高40%。本文结果对提高交联聚乙烯电缆质量是有意义的。 相似文献
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加铜罩对XLPE电缆绕组外端口特性的影响 总被引:2,自引:0,他引:2
交联聚乙烯(XLPE)电缆绕组变压器[1-5]在运行时,由于铁心和外防护罩的影响,使得电缆绕组电感值发生变化和外半导电层对地电容比试验空心绕组的外半导电层对地电容增大许多.因此了解铁心和外防护罩对电缆绕组外端口特性的影响是很有必要的.本文用加铜罩的方法模拟防护罩的作用的方法,对试验绕组进行了对比试验,并在前期研究[6]的基础上建立了考虑外半导电层对地电容影响电缆绕组外端口等效电路模型.为该种新型变压器的设计、保护及试验技术提供了依据. 相似文献
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在交联聚乙烯电缆交联度测试中,热延伸法测量表明,高压交联电缆绝缘内层的延伸率大于外层,说明绝缘内层的交联度小于外层,但凝胶含量试验方法的测试结果却与热延伸试验的结果完全相反,通过分析认为是内、外层绝缘结晶形态和结晶度的不同导致了凝胶含量试验法测试交联度的不准确性;此外,通过物理机械性能试验,发现绝缘内层的抗拉强度和伸长率小于外层,这些结果说明电缆绝缘交联度存在径向的非均匀性。 相似文献
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The features of a long-distance underground line, using 275-kV cross-linked polyethylene (XLPE) cable with extrusion-type molded joints (EMJs) are described. The line has a transmission capacity of 440 MW/cct and a 9.5-km section length. The cable has a cross-sectional area of 1400 mm2 and insulation thickness of 17 mm. The EMJ, which was developed to withstand the higher stresses of the 275-kV cable, has the following features: (1) the conductor is connected using a copper ferrule, (2) semiconducting heat-shrinkable tubes are used for both inner and outer semiconducting layers, and (3) the insulation unit, applied on top of the stress-relieving cone, is made of insulating and semiconducting XLPE parts cured together in the factory. The fabrication, of the joint is described 相似文献
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Tanaka T. Okamoto T. Hozumi N. Suzuki K. 《Dielectrics and Electrical Insulation, IEEE Transactions on》1996,3(3):345-350
An interfacial diffusion method was devised to reduce insulation thickness by improving the interfacial properties of XLPE cable insulation. This method is based on a proposed concept of the facilitation of oriented lamellar growth at the interface by addition of special ingredients to the semiconducting layer, which would diffuse into polyethylene in the three layer simultaneous extrusion process for cable manufacture. Diffusion of the ingredients would facilitate lamellae to grow perpendicularly to the semiconducting layers, as predicted theoretically from a free energy model. It was clarified experimentally that oriented lamellar growth would increase the breakdown strength of XLPE insulation. It is suggested the XLPE cables manufactured by this method could be reduced in thickness especially for extra-high voltage, or the cable could be upgraded from 65 to 154 kV as the insulation thickness remains 9 mm 相似文献