红外探测器的最新进展

首先,简述了红外光电探测器的发展历史以及分类,可分为室温探测器和低温探测器。然后对每种探测器所使用的材料进行了介绍,室温探测器介绍了氧化钒、无定型硅,低温探测器介绍了碲镉汞（HgCdTe）、量子阱和锡化物超晶格,以及它们在三代红外光电探测器方面的研究进展。最后,介绍了黑硅材料以及黑硅在探测器应用中的最新进展。     

用作多通道长波光谱仪的量子格栅红外光电探测器列阵

美国陆军研究实验室的研究人员制备出了一种可用作多通道长波红外光谱仪的量子格栅红外光电探测器列阵．这种量子格栅红外光电探测器列阵是利用在7μm～16μm波长范围内具有宽带吸收特性的量子阱红外光电探测器材料结构制备的．用这种量子阱红外光电探测器材料制备量子格栅红外光电探测器器件的好处是,在该材料吸收范围内的各个相关波长上的光散射,可以在每个器件中形成一种窄带探测。     

红外光电探测器的前沿热点与变革趋势

红外光电探测技术通常工作在无源被动的传感模式,具有作用距离远、抗干扰性好、穿透烟尘雾霾能力强、全天时工作等优点,在航天遥感、军事装备、天文探测等方面都有广泛应用。至今,二代、三代红外光电探测器已大规模进入装备,高端三代也在逐步推进实用化,并出现了前沿前瞻性的新概念、新技术、新器件。本文聚焦国内外的红外技术研究现状,重点介绍红外光电探测器当前的研究热点与未来的发展趋势。首先,介绍针对战术泛在化、战略高性能的SWaP³概念。其次,综述以超高空间分辨率、超高能量分辨率、超高时间分辨率、超高光谱分辨率为特征的高端三代红外光电探测器,分析挑战光强探测能力极限的红外探测器的技术特征与实现方法。然后,论述基于人工微结构的四代红外光电探测器,重点介绍偏振、光谱、相位等多维信息融合的实现途径与技术挑战。最后,从片上数字化升级为片上智能化的角度,探讨未来极具变革性趋势的红外探测器。     

为第三代红外系统选择探测器

为第三代热成像系统选择正确的探测器技术的决定直接产生于对这些系统的期望和要求。现已明确,第三代热成像器仍需要更高的分辨率以及进行多光谱探测和敏感偏振光的能力。本文分析四种可以选择的技术,它们是HgCdTe探测器、非致冷微测辐射热计、基于锑化物的材料和量子阱红外光电探测器。根据每种技术的成熟度、所冒的风险以及技术之间的差距,本文断言,量子阱红外光电探测器最适合非战略应用(非低背景状态)。从理论上来看,以三元和超晶格锑化物为基础的材料族是最佳选择对象,但考虑到其不够成熟的工艺以及所冒的风险,本文并未推荐这种材料。本文预料非致冷探测器将广泛进入低端和中端市场。由于源源不断的资金以及在战略上的重要性,HgCdTe探测器仍将不断取得进步。     

红外技术与应用XXXIV

SPIE Vol.6940第一部分一、量子阱红外光电探测器、量子点红外光电探测器、阱中量子点及量子阱子带内光电探测器焦平面列阵1.阱中量子点红外光电探测器的探测波长的调节(Linda H(?)glund等)     

多量子阱红外光电探测器

在红外传感器中,量子阱红外光电探测器是可以控制探测波长范围的。因此,如果用具有许多个探测波长范围的量子阱红外光电探测器获取许多个波长范围的信息的话,那么武器制导和防御系统便可以获得更加详细的信息。     

双色探测器的集成焦平面技术

本文总结了国外双色探测器近１０年来的发展,包括各种双色探测器的优点和发展趋势。主要是各种类型的碲镉汞（ＨgCdTe）光二极管集成式双色探测器的结构、关键工艺和性能,简略地介绍了量子阱红外光探测（ＱＷＩＰ）的双色探测器结构和性能。     

第三代焦平面列阵红外探测组件与应用

第三代红外探测组件预计将能够提供视频分辨率、更多的像素以及诸如多色或多波段、高帧速和较好的热分辨率之类的先进功能。本文简要介绍德国AIM公司的基于碲镉汞和量子阱红外光电探测器的红外技术的现状以及它们的一些应用。     

红外量子点及其光电探测器研究进展

红外技术为现代社会提供了包括遥感、成像、计量、产品检验、环境监测及生物医学诊断等诸多领域的应用价值。第三代红外光电探测器对易制造、低成本、可调节的红外光电材料的需求,推动了红外量子点的发展。本文阐述红外量子点的制备方法,概述了红外胶体量子点探测器研究发展历程,并列举了红外胶体量子点在光电领域的代表性研究成果。最后对红外量子点光电探测器研究进展进行了总结,提出了几个亟待解决的研究问题。为红外量子点探测器商业化提出了指导。     

用于中波/长波/甚长波红外探测的三色量子阱红外光电探测器

在美国陆军研究实验室的支持下,美国佛罗里达大学和美国弹道导弹防御组织等单位的研究人员联合设计了一种适用于中波红外/长波红外/甚长波红外探测的三叠层三色量子阱红外光电探测器。 红外焦平面列阵技术是许多红外应用如外大气层寻的器、天基监视敏感器以及卫星测绘等所必需的。随着量子阱红外光电探测器技术     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.