CaCu2.7Ti4O12介电性能和J-E特征

采用传统的固相反应法制备了Cu欠量的CaCu3Ti4O12(CaCu2.7Ti4O12)陶瓷,研究了不同烧结时间对CaCu2.7Ti4O12相结构、显微形貌、介电性能和J-E非线性特征的影响。结果表明,延长保温时间降低了CaCu2.7-Ti4O12陶瓷的中低频介电损耗和击穿场强并且显著提高了其介电常数。采用肖特基热电子发射模型对其非线性特征和电学性能的变化机理进行了分析,认为耗尽层宽度是影响电学性能的主要因素。保温30h的CaCu2.7Ti4O12陶瓷有望作为低压压敏电阻应用于半导体电路中。     

CaCu3Ti4O12陶瓷深陷阱松弛特性研究

研究了固相反应法及共沉淀法制备的CaCu3Ti4O12陶瓷深陷阱松弛特性.测试了CaCu3Ti4O12陶瓷在频率为0.1～107Hz,温度为–100～100℃的范围内的介电频谱及温谱.通过对不同温度下介电频谱的分析,研究了双Schottky势垒结构中深陷阱松弛特性.研究表明:在交流小信号作用下,由于Schottky势垒中深陷阱与Fermi能级的上下关系发生变化,引起深陷阱电子发射和俘获即电子松弛过程,在介电频谱中表现为松弛峰;并且由介电谱的分析结果可得深陷阱能级等微观参数.比较不同试样的深陷阱参数可知:在CaCu3Ti4O12陶瓷中,在导带以下约0.52和0.12 eV的能级处存在由本征缺陷产生的深陷阱.介电温谱与频谱的分析类似,二者可以互为补充.     

CaCu3Ti4O12陶瓷高介电性的起因机制

为了探索CaCu3Ti4O12(CCTO)高介电性的起因机制,利用固相反应工艺制备了CCTO陶瓷样品,对其电学性质进行了研究.在40 Hz～100 MHz测量范围内,其室温下的介电频谱在1 MHz附近呈现一个类Debye型弛豫,而高温介电频谱分别在1 kHz以下和1 MHz附近呈现两个类Debye型弛豫.抛除表面层的同一个样品分别溅射金电极和烧渗银电极后升温测量其介电频谱,发现低频介电弛豫对电极的金属类型高度敏感,而高频介电弛豫与电极的金属类型无关,与材料微观结构存在着密切的关系.因此推断:CCTO低频介电弛豫起源于样品与电极之间的耗尽层效应,而高频介电弛豫起源于高阻态的晶界与半导化的晶粒形成内部阻挡层电容效应.     

巨介电常数陶瓷CaCu3Ti4O12的研究进展

CaCu_3Ti_4O_(12)(CCTO)陶瓷具有高介电常数和高热稳定性,这使得CCTO可能在高密度信息储存、高介电电容器、大规模集成电路等领域获得广泛使用。系统地介绍了CCTO高介电常数起源的内禀机制和外禀机制,详细归纳了元素掺杂对CCTO介电特性的影响,阐述了巨介电常数与本征点缺陷的内在关联,肯定了晶粒电导赝极化理论,指出了CCTO巨介电常数陶瓷研究的重点在于:基于外禀机制的IBLC模型,通过晶胞掺杂或晶界掺杂改变晶粒或者晶界的电导,进而调控CCTO的介电损耗,使CCTO保持较高介电常数的前提下,在很宽的频率范围内使介电损耗正切值降低到0.1以下。     

第一性原理对CaTiO3和CaCu3Ti4O12的对比研究

通过Ca替换CaCu_3Ti_4O_(12)晶胞中的所有Cu,建立了包含TiO6八面体扭转的CaTiO3;通过Cu替换CaTiO32×2×2超胞中3/4的Ca,建立了不包含CuO_4正方形的CaCu_3Ti_4O_(12)。采用Materials Studio软件的CASTEP模块,对比了上述晶体和标准晶体成键状况、能带结构、态密度及介电函数,分析了TiO6八面体扭转和CuO_4正方形的影响,发现了Cu-O键或CuO_4正方形对CaCu_3Ti_4O_(12)光频介电常数的关键性作用。研究结果提供了通过内禀机制优化CaCu_3Ti_4O_(12)材料介电性能的新途径。     

ZBL低温助烧CaCu3Ti4O12高介电陶瓷的研究

采用固相合成CaCu_3Ti_4O_(12)(CCTO)微波介质陶瓷基体粉体,通过XRD衍射仪、SEM扫描电镜表征掺杂ZnO-B_2O_3-La_2O_3(ZBL)低软化点玻璃助烧剂的(CCTO)陶瓷的物相组成及结构特点,研究ZBL玻璃的掺杂量对CCTO样品烧结性能及微波介电性能的影响。研究表明:添加10%(质量分数)ZBL玻璃的CCTO陶瓷在960℃烧结3h,能够获得较好的介电性能:εr=112,tanδ=0.0027,τf=-2×10-6/℃。     

Ba0.85Ca0.15Zr0.1Ti0.9O3/CoFe2O4叠层复合陶瓷的制备与磁电耦合效应研究

以CoFe2O4压磁体、掺CuO和CeO2助烧剂的压电体Ba0.85Ca0.15Zr0.1Ti0.9O3为基本叠层材料,采用界面固相熔融渗透法制备了掺助烧剂Ba0.85Ca0.15Zr0.1Ti0.9O3-CoFe2O4叠层复合陶瓷。叠层复合陶瓷的压电压磁相叠层界面结合良好。随着压磁相与压电相厚度比比率的增加,叠层复合陶瓷的饱和磁致伸缩系数–λ从67×10-6增加到134×10-6、压电系数d33从340 pC/N逐渐减小到205 pC/N;磁电耦合系数先增大后减小,在厚度比为2、外磁场为100 mT时得到最大值3200 mV/(cm.mT)。     

多层片式电感器用 NiCuZn铁氧体的低温烧结

本文利用Bi     

多层片式电感器用NiCuZn铁氧体的低温烧结

本文利用Bi₂O₃作为烧结促进剂实现了NiCuZn铁氧体在900℃以下烧结．利用TG、DTA、DDTA等分析手段研究Bi₂O₃的低温烧结机理,并确定最佳烧结温度范围在840～900℃之间．X－ray分析结果表明：加入Bi₂O₃后生成另相化合物Bi₃₆Fe₂O₅₇烧结后期少量Fe的固溶有助于稳定高温γ－Bi₂O₃相的立方结构,避免了冷却过程中的晶型转变．Bi36Fe₂O₅₇另相的存在能有效地阻止晶粒长大,从而达到改性的目的．     

微波介质陶瓷Ca3LiNiV3O12的低温共烧结及性能研究

微波介质陶瓷在现代化的移动通信技术中发挥着越来越重要的作用,而多层片式结构是实现微波电路元器件进一步小型化的重要途径。多层片式结构需要实现微波介质陶瓷同高导电率的电极如Ag、Cu的共烧,然而Ag(961℃)、Cu(1064℃)的熔点相对陶瓷的烧结温度比较低。因此,在保证陶瓷材料良好介电性能的同时,寻找能够与Ag、Cu共烧的低温烧结的微波介质陶瓷将是今后发展的方向。我们研究了一种新的微波介质陶瓷Ca3Li Ni V3O12(CLNV),其最佳烧结温度在900℃,可以达到和熔点较低的Ag电极的共烧,共烧时样品和Ag电极界面处并没有界面反应和发生明显的扩散现象。CLNV陶瓷的相对介电常数εr=11.84;相对密度D=3.48g/cm3。     

Decrease of dielectric loss in giant dielectric constant CaCu3 Ti4 O12 ceramics by adding CaTiO3

CaCu₃ Ti₄ O₁₂–x CaTiO₃ ceramics (x=0,0.1,0.2,0.3,0.4 and 0.5) was studied by X-ray diffraction, scanning electron microscope and dielectric measurements. It was indicated that some CaTiO₃ entered the boundaries of CaCu₃ Ti₄ O₁₂ grains and/or subgrains. Dielectric measurement showed that the addition of CaTiO₃ lowered the dielectric loss remarkably, especially at low frequencies, while the giant dielectric constant still remained. At room temperature, the dissipation factor of the x=0.5 sample was decreased to 0.02 over the frequency range from 50 to 2000 Hz, and the dielectric constant was kept to be 4000. We explain this phenomenon in terms of internal barrier layer capacitance model by using the impedance spectroscopy analysis.     

Dielectric and optical properties of CaCu3Ti4O12 thin films containing Ag nanoparticles

Simple sol-gel techniques are used to prepare thin films of a high dielectric constant perovskite CaCu₃Ti₄O₁₂, containing different amounts of metallic silver nanoparticles. The formations of the silver nanoparticles are verified by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and optical absorption studies. The dielectric properties are found to be significantly affected by the presence of the silver nanoparticles. A maximum in the dielectric constant is observed at an intermediate metal particle concentration. This is explained in terms of the polarization at the particle-dielectric interface and the internal barrier layer capacitor effect. The optical absorption spectrum is compared with Mie theory in electrodynamics for the optical absorption of small particles to extract the particle size of the silver particle. Non-uniform distributions of Ag particles through the thickness of the thin films are reported.     

多铁性BaTiO3/La2/3Sr1/3MnO3复合薄膜的制备及其强磁电效应的研究

使用脉冲激光沉积技术,在(001)取向的LaAlO3(LAO)单晶基片上外延生长了BaTiO3/La2/3Sr1/3MnO3(BTO/LSMO)双层复合薄膜.电学和磁学性能的研究显示复合薄膜具有较低的相对介电常数(εr=263),优良的铁电和铁磁性能以及高于室温的铁磁居里温度(Tc=317 K).复合薄膜的磁电电压系数(αE)为176 mV/A,高于同类结构磁电系统一个数量级,相应的界面耦合系数k值为0.68,表明铁磁层和铁电层界面之间存在较大程度的耦合.     

Elastic modulus and hardness of CaTiO3, CaCu3Ti4O12 and CaTiO3/CaCu3Ti4O12 mixture

Three ceramic systems, CaTiO₃ (CTO), CaCu₃Ti₄O₁₂ (CCTO) and intermediate nonstoichiometric CaTiO₃/CaCu₃Ti₄O₁₂ mixtures (CTO.CCTO), were investigated and characterized. The ceramics were sintered at 1100 °C for 180 min. The surface morphology and structures were investigated by XRD and SEM. Elastic modulus and hardness of the surfaces were studied by instrumented indentation. It was observed that CCTO presented the higher mechanical properties (E = 256 GPa, hardness = 10.6 GPa), while CTO/CCTO mixture showed intermediate properties between CTO and CCTO.     

AlN/FeCoSiB磁电复合薄膜的制备及其逆磁电效应研究

借助射频磁控溅射成功制备了AlN/FeCoSiB磁电复合薄膜, 探讨了退火条件对AlN薄膜压电性能和FeCoSiB薄膜磁性能的影响, 并研究了其逆磁电响应。结果显示, 500℃退火处理的AlN薄膜具有高度(002)择优取向和柱状生长结构; 经过300℃退火后FeCoSiB薄膜的磁场灵敏度提高。该磁电复合薄膜的逆磁电电压系数(α_CME)在偏置磁场(H_dc)为875 A/m时达到最大值62.5 A/(m·V); 且磁感应强度(B)随交变电压(V_ac)的变化呈现优异的线性响应(线性度达到1.3%)。这种AlN/FeCoSiB磁电复合薄膜在磁场或电场探测领域具有广阔的应用前景。     

Microstructural evolution and dielectric properties of Cu-deficient and Cu-excess CaCu3Ti4O12 ceramics

The microstructural evolution and dielectric properties of CaCu_3−xTi₄O_12−x (3 − x = 2.8-3.05) ceramics were investigated. Normal grain growth behavior was observed at Cu/Ca ≤ 2.9, while abnormal grain growth was observed at Cu/Ca ≥ 2.95. A CuO-rich intergranular liquid phase at Cu/Ca ≥ 2.95 and angular grain morphology were the main reasons for abnormal grain growth. However, the abundant intergranular liquid at Cu/Ca = 3.05 significantly affected the relative dielectric permittivity and dielectric loss. The CuO composition is the key parameter that determines the microstructure and dielectric properties of CCTO ceramics.     

Effect of copper-oxide segregation on the dielectric properties of CaCu3Ti4O12 thin films fabricated by pulsed-laser deposition

We investigated the effects of post-deposition cooling conditions on the surface morphologies and dielectric properties of CaCu₃Ti₄O₁₂ (CCTO) thin films grown by pulsed-laser deposition on Pt/TiO₂/SiO₂/Si substrates. CCTO thin films cooled under the typical cooling parameters, i.e., slow cooling (3 °C/min) at high oxygen pressure (66 kPa) showed a severe segregation of nanoparticles near the grain boundaries, which was identified to be copper oxide from electron probe micro analyzer mapping. On the other hand, we could not observe any segregation on the film surface when the samples were cooled fast (∼ 20 °C/min) at relatively low oxygen pressure (100 Pa). The dielectric constant, ε_r, of CCTO thin films deposited at 750 °C with severe surface segregation (ε_r ∼ 750 at 10 kHz) was found to be much lower than that (ε_r ∼ 2000 at 10 kHz) of CCTO thin films with smooth surface. As the copper-oxide segregation becomes more serious, which preferentially occurs at relatively high ambient oxygen pressure and temperature, the degradation in the dielectric properties of CCTO films becomes larger. The variation of dielectric constant of CCTO films with no copper-oxide segregation could be related to the presence of an impurity phase at grain boundaries.     

Electrical properties tailoring in Ni-particle-dispersed (Ba0.95Ca0.05)(Ti0.96Zr0.04)O3 composites

Ni-particle-dispersed (Ba_0.95Ca_0.05)(Ti_0.96Zr_0.04)O₃ (BCTZ/Ni) piezoceramic composites were prepared via sintering at 1300 °C in industrial N₂ gas. Structural characterizations showed that the metallic Ni was not oxidized and the BCTZ preserved the perovskite structure. The Ni particles were uniformly distributed in the BCTZ ceramic matrix. The relative dielectric constant ?_r of the BCTZ/Ni composites increased from 1362 to 3910 with increasing Ni content from 0 to 20 vol.%, which is explained by the Maxwell equation as well as the micro-capacitor model. The percolation theory of insulator–metal transitions is also applied to correlate the rapid increase of dielectric constant with Ni content. The piezoelectric constant d₃₃ gradually decreased from 230 to 50 pC N⁻¹, giving a gradient profile of piezoelectric property. We demonstrate that the electrical properties can be effectively tailored by dispersing metal particles into piezoceramics.