共查询到20条相似文献,搜索用时 15 毫秒
1.
C. Popa 《Analog Integrated Circuits and Signal Processing》2010,63(2):233-238
A new superior-order curvature-corrected voltage reference will be presented. In order to improve the temperature behavior
of the circuit, a double differential structure will be used, implementing the linear and the superior-order curvature corrections.
An original ComplemenTary with Absolute Temperature voltage generator will be proposed, using exclusively MOS transistors
biased in weak inversion for a low power operation of the voltage reference, having two great advantages: an important reducing
of the circuit silicon area and an improved accuracy (matched resistors being replaced by matched MOS active devices). The
superior-order curvature-correction will be implemented by taking the difference between two gate-source voltages of subthreshold-operated
MOS transistors, biased at drain currents having different temperature dependencies: PTAT (ProporTional with Absolute Temperature)
and square PTAT. In order to obtain a low-voltage operation of the circuit, the classical MOS transistor, which implements
the elementary voltage reference, could be replaced by a Dynamic Threshold MOS transistor. The SPICE simulations confirm the
theoretical estimated results, showing a temperature coefficient under 6 ppm/K for an extended input range 223 K < T < 333 K and for a supply voltage of 1.8 V and a current consumption of about 1 μA. 相似文献
2.
《Solid-State Circuits, IEEE Journal of》1980,15(3):264-269
A voltage reference in CMOS technology is based upon transistor pairs of the same type except for the opposite doping type of their polysilicon gates. At identical drain currents, the gate voltage difference, close to the silicon bandgap, is 1.2 V/spl plusmn/0.06 V. Circuits for a positive and for a negative voltage reference are presented. Digital voltage tuning improves accuracy. Temperature compensation is provided by proper choice of current ratio or by means of an auxiliary circuit. Voltage drift is about 300 ppm//spl deg/C without compensation, and can be reduced to /spl plusmn/30 ppm//spl deg/C. The circuits work with a supply voltage of 2-10 V and draw a current that is less than 1 /spl mu/A. 相似文献
3.
4.
Tien-Yu Lo Chung-Chih Hung Mohammed Ismail 《Analog Integrated Circuits and Signal Processing》2010,62(1):9-15
A fully CMOS based voltage reference circuit is presented in this paper. The voltage reference circuit uses the difference
between gate-to-source voltages of two MOSFETs operating in the weak-inversion region to generate the voltage with positive
temperature coefficient. The reference voltage can be obtained by combining this voltage difference and the extracted threshold
voltage of a saturated MOSFET which has a negative temperature coefficient. This circuit, implemented in a standard 0.35-μm
CMOS process, provides a nominal reference voltage of 1.361 V at 2-V supply voltage. Experimental results show that the temperature
coefficient is 36.7 ppm/°C in the range from −20 to 100°C. It occupies 0.039 mm2 of active area and dissipates 82 μW at room temperature. With a 0.5-μF load capacitor, the measured noise density at 100 Hz
and 100 kHz is 3.6 and
2 5 \textnV/?{\textHz} , 2 5\,{\text{nV}}/\sqrt {\text{Hz}} , respectively. 相似文献
5.
Ho-Jun Song Choong-Ki Kim 《Solid-State Circuits, IEEE Journal of》1993,28(6):671-677
A temperature-stabilized silicon-on-insulator (SOI) voltage reference is presented. It is based on the threshold voltage difference between enhancement and depletion SOI NMOSFETs that have the same channel doping concentration but of opposite type. The circuit has been realized on a SIMOX wafer using an n+-poly gate and a LOCOS isolation process. The threshold voltages of the enhancement and depletion SOI NMOSFETs show almost the same temperature dependence when a suitable back-gate bias is applied. Experimental results show a temperature coefficient of 33.8 p.p.m./°C over the temperature range of -50 to 75°C. The variation of threshold voltage difference with temperature is small, and this circuit becomes more advantageous as the front-gate oxide is scaled down or the bias current is reduced 相似文献
6.
A CMOS bandgap voltage reference (BVR) circuit is proposed that operates at power supply voltages down to 0.6 V. The BVR is designed in a commercially available 0.13 /spl mu/m digital CMOS technology. No analogue process options are required. 相似文献
7.
比较了传统带运算放大器的带隙基准电压源电路与采用曲率补偿技术的改进电路,设计了一种适合汽车电子使用的带隙基准电压源,该设计电路基于上海贝岭2μm 40V bipolar工艺,采用一阶曲率补偿技术,充分考虑了汽车空间有限,温差大,噪声多的环境特点,没有使用运放,避免其复杂的结构以及所引起的失调,因此降低了电路成本并改善性能,设计中还引入了启动电路,大大降低了附加功耗.用Cadence Spectre对电路仿真,结果表明,电路温度特性好,抗干扰能力强,有较高的电源抑制比(PSRR),达到预期指标. 相似文献
8.
9.
Giustolisi G. Palumbo G. Criscione M. Cutri F. 《Solid-State Circuits, IEEE Journal of》2003,38(1):151-154
In this work, a new low-voltage low-power CMOS voltage reference independent of temperature is presented. It is based on subthreshold MOSFETs and on compensating a PTAT-based variable with the gate-source voltage of a subthreshold MOSFET. The circuit, designed with a standard 1.2-/spl mu/m CMOS technology, exhibits an average voltage of about 295 mV with an average temperature coefficient of 119 ppm//spl deg/C in the range -25 to +125/spl deg/C. A brief study of gate-source voltage behavior with respect to temperature in subthreshold MOSFETs is also reported. 相似文献
10.
A CMOS voltage reference, based on body bias technique, has been proposed and simulated using SMIC 0.18 μm CMOS technology in this paper. The proposed circuit can achieve a temperature coefficient of 19.4 ppm/°C in a temperature range from −20 °C to 80 °C, and a line sensitivity of 0.024 mV/V in a supply voltage range from 0.85 V to 2.5 V, without the use of resistors and any other special devices such as thick gate oxides MOSFETs with higher threshold voltage. The supply current at the maximum supply voltage and at 27 °C is 214 nA. The power supply rejection ratio without any filtering capacitor at 10 Hz and 10 kHz are −88.2 dB and −36 dB, respectively. 相似文献
11.
设计一款应用于电压调整器(LDO)的带隙基准电压源。电压基准是模拟电路设计必不可缺少的一个单元模块,带隙基准电压源为LDO提供一个精确的参考电压,是LDO系统设计关键模块之一。本文设计的带隙基准电压源采用0.5μm标准的CMOS工艺实现。为了提高电压抑制性,采用了低压共源共栅的电流镜结构,并且在基准内部设计了一个运算放大器,合理的运放设计进一步提高了电源抑制性。基于Cadence的Spectre进行前仿真验证,结果表明该带隙基准电压源具有较低的变化率、较小的温漂系数和较高的电源抑制比,其对抗电源变化和温度变化特性较好。 相似文献
12.
13.
通过对DX0231型BSIT栅源低击穿问题的分析,讨论了设计、材料、环境、设备等因素对表面栅BSIT栅源击穿的影响,指出了提高栅源击穿的努力方向。 相似文献
14.
15.
16.
Rodriguez J. Moran L. Pontt J. Osorio R. Kouro S. 《Power Electronics, IEEE Transactions on》2003,18(3):873-879
Common-mode voltages appear in pulse-width modulated current-source inverters (PWM-CSIs) drives due to the operating principles of the input rectifier and the output inverter. This paper presents the modeling and analysis of a medium voltage current-source inverter drive, using the Matlab software. Simulated results of the model are in close agreement with experimental waveforms obtained from an industrial AC drive, which shows overvoltages of up to 100%, generating important insulation stresses at the motor stator terminals. 相似文献
17.
18.
针对传统CMOS带隙电压基准源电路电源电压较高,基准电压输出范围有限等问题,通过增加启动电路,并采用共源共栅结构的PTAT电流产生电路,设计了一种高精度、低温漂、与电源无关的具有稳定电压输出特性的带隙电压源.基于0.5μm高压BiCMOS工艺对电路进行了仿真,结果表明,在-40℃~85℃范围内,该带隙基准电路的温度系数为7ppm/℃,室温下的带隙基准电压为1.215 V. 相似文献
19.