铜上溅射沉积铀薄膜AES研究

在俄歇电子能谱仪超高真空室内,采用离子束溅射沉积方法在多晶cu上沉积了铀薄膜,采用俄歇电子能谱技术(AES)研究铀薄膜的生长方式,铀、铜的相互作用及退火引起u膜成分结构变化.沉积初期观察到铀与铜发生相互作用,随着铀薄膜厚度的增加,UOPV/CuLMM俄歇跃迁峰强度值变化说明铀薄膜为层状+岛状生长.退火促进了界面扩散,随着温度的升高,铀与铜发生了相互作用和扩散,温度继续升高,铀与碳形成了铀碳化物.     

不同厚度分层沉积对多层NiFeCo/Ag薄膜GMR效应的影响

用射频磁控溅射法制备了调制周期分别为5 nm、10 nm、15 nm、20 nm的NiFeCo/Ag非连续多层膜.用俄歇能谱仪测量薄膜的成分,用原子力显微镜观测NiFeCo膜层及Ag膜层的表面形貌,用四探针法测量了溅射态的及在280℃、360℃、400℃退火后的多层膜的GMR值.结果表明:薄膜厚度越大,NiFeCo膜层及Ag膜层的表面粗糙度越大.在经各种不同温度退火后,具有[NiFeCo(10nm)/Ag(10nm)]×20结构的多层膜的GMR效应均比其它结构的多层膜的GMR效应强.退火温度也会影响多层膜的GMR值.经360℃退火后,在79.6 kA/m的外加饱和场下[NiFeCo(10nm)/Ag(10nm)]×20呈现出最强的巨磁电阻效应,其GMR值达到11%.     

铜与硅之间W/Mo-N薄膜的扩散阻挡层性能

研究了铜与硅之间W／Mo-N薄膜的扩散阻挡性能。在Si(100)基片上利用反应溅射沉积一层Mo-N薄膜,然后再利用直流溅射在Mo-N上面沉积Cu／W薄膜。样品在真空下退火,并利用四点探针、X射线衍射分析、扫描电镜分析、俄歇电子能谱原子深度剖析等测试方法研究了Cu／W／Mo-N／Si的热稳定性及W／Mo-N薄膜对铜与硅的扩散阻挡性能。实验分析表明,Cu／W／Mo-N／Si结构具有非常好的热稳定性,在600℃退火30min仍未发生相变,并能有效的阻挡铜与硅之间的扩散。     

AlSb多晶薄膜的制备及性质

用磁控溅射法制备了Al/Sb多层薄膜,通过X射线衍射(XRD)、X射线荧光(XRF)、Hall效应、暗电导率温度关系及透过谱的测试研究了退火前后薄膜的结构和性质。XRD测试结果表明,刚沉积的薄膜只有Sb的结晶相,而Al则以非晶态形式存在,500℃退火后化合为AlSb多晶,且沿(111)择优取向。Hall效应测试、电导激活能及光能隙的计算结果表明,所制备的AlSb多晶薄膜为P型材料,且载流子浓度为1019cm-3,光能隙为1.64eV,电导率随温度的变化可分为两个过程,在30℃到110℃,薄膜的电导率随温度的增加而缓慢增加,而在110℃到260℃间增加明显,升温电导激活能为0.11eV和0.01eV,这与AlSb多晶薄膜在升温过程中的结构变化有关。将制备的AlSb多晶薄膜应用于TCO/CdS/AlSb/ZnTe:Cu/Au结构的太阳电池器件中,已观察到明显的光伏效应,说明用这种方法制备的AlSb多晶薄膜适于作太阳电池的吸收层。     

多层金属薄膜Au—Ni—Si的扫描俄歇分析

使用 PHI-610型扫描俄歇谱仪,研究了 Si 基底上的多层金属薄膜 Au/Ni,在不同退火温度下的冶金学行为。发现在380℃以下,薄膜及 Si 基底间无明显互扩散;而在380℃时,发生薄膜与 Si 基底间的相互扩散,Ni 层不能作为 Au 与 Si 之间的扩散阻挡层。随着温度升高,Au与 Si 的相互扩散加剧,这种互扩散造成表面电阻的增加。在 450℃时,薄膜中会形成一种 Ni 的硅化物。这种硅化物是在富 Ni 区和 Si 基底界面处形成,并随着富 Au 区中的 Ni 向硅化物的扩散而逐渐长大。     

退火温度对ZnO陶瓷薄膜低压压敏特性的影响

应用新型溶胶-凝胶法制备了ZnO陶瓷薄膜,研究了退火温度对ZnO陶瓷薄膜低压压敏电阻电性能的影响.结果表明,采用溶胶掺杂在550℃退火条件下可形成Zn7Sb2O12及ZnCr2O4相,且在退火温度范围内(550～950℃)基本上没有焦绿石相形成.当退火温度达到750℃以后,Sb2O3已全部转变为稳定性好的尖晶石相,同时存在Bi2O3、ZnO的挥发.采用适当的退火温度,可得到具有优良电性能的ZnO陶瓷薄膜低压压敏电阻,其压敏电压低于5 V,非线性系数可达20,漏电流密度小于0.5μA/mm2.     

缓冲层Ta对退火Co/Cu/Co薄膜微观结构和界面互扩散的影响

用直流磁控溅射法在Si/SiO₂基底上制备了Co/Cu/Co薄膜和加入缓冲层的Ta/Co/Cu/Co薄膜,用扫描电子显微镜、原子力显微镜、X射线衍射和俄歇电子能谱研究了薄膜的微观结构、表面形貌、织构和界面互扩散现象。结果表明:退火后薄膜中均存在{111}和{002}衍射峰,加入缓冲层Ta后,Co/Cu/Co薄膜的衍射峰强度明显增强,并存在较强的{111}纤维织构,薄膜表面孔洞及粗糙度大幅减小。退火后薄膜界面处产生互扩散现象,层状结构被破坏。缓冲层Ta提高了薄膜与基底材料间的润湿性,可有效缓解界面互扩散现象。     

Ti/Si(100)样品在快速退火(RTA)时的界面反应的研究

运用俄歇电子能谱(AES)、X射线光电子能谱(XPS)以及卢瑟福背散射谱(RBS)研究了Ti/Si(100)样品在快速热退火(RTA)过程中的界面反应机理及物种分布。研究结果表明,Ti/Si(100)样品在600℃快速热退火10s后,界面上的钛和硅就发生了明显的界面反应,形成了TiSi_2金属硅化物相。在750℃RTA后,TiSi_2相已基本形成完善,再提高RTA温度,TiSi_2相增加甚少。快速热退火过程不同于一般的慢退火过程,主要通过TiSi_2晶格传递Si,从而促使界面处的钛和硅的继续反应。界面扩散的速度很快,TiSi_2物相的形成速度由Ti和Si的反应速度限制,不受Si扩散效应的影响。此外,俄歇线形分析还揭示了,在硅化物的形成过程中,钛硅物相在各界面层中的存在形式。     

两步退火形成钛硅化物和氮化物的研究

模拟自对准硅化物技术的两步退火工艺，对超高真空（UHV）下制备的Ti／Si样品依次进行低温退火、腐蚀和高温退火。利用俄歇微探针（AES）和X射线衍射（XRD）分析样品的组分及晶相。发现高温退火后，薄膜内同时生成了Ti的硅化物及氮化物，这对发展MOS器件工艺中自对准硅、氮化物技术很有意义。另外，还利用扫描电镜（SEM）观察了薄膜形貌，用VandePauw法测量了薄膜电阻。     

退火对Al-Sb多层薄膜的影响

采用直流磁控溅射法制备Al和Sb交替层,在真空环境下进行高温退火后得到了AlSb多晶薄膜.通过X射线衍射(XRD)、霍尔效应、暗电导率温度关系以及透反射光谱研究了薄膜的结构、电学和光学性质.结果表明,退火后形成的AlSb多晶薄膜呈立方相,沿(111)择优取向,且导电类型是P型,载流子浓度为1019cm-3,吸收系数在可见光波段大于104cm-1.样品在580℃退火后,间接跃迁光能隙为1.64eV,且升温电导激活能为0.01eV和0.11eV.此方法制备的AlSb多晶薄膜应用于TCO/CdS/AlSb/ZnTe:Cu/Au结构的太阳能电池中,得到了107mV的开路电压.     

Transport properties of thin SnO2〈Sb〉 films grown by pulsed laser deposition

Thin SnO₂<Sb> films grown by pulsed laser deposition have been characterized by X-ray diffraction, optical spectroscopy, and scanning electron microscopy. The carrier mobility and concentration in the films have been determined as functions of target composition (0–8 at % Sb) using Hall effect measurements, and the resistivity of the films has been measured by a four-probe technique. The lowest resistivity (ρ = 2 × 10^?3 Ω cm) and the highest transmission (? 85%) of the films in the spectral range 400-800 nm have been obtained at a target composition Sb/(Sn + Sb) = 2 at %. The observed variation in the resistivity of the films is determined by changes in carrier concentration to a greater extent than by changes in carrier mobility. X-ray photoelectron spectroscopy results demonstrate that the predominant charge state of the antimony in the films is Sb⁵⁺.     

锑在直流反应磁控溅射制备二氧化钛薄膜中的作用

用直流反应磁控溅射方法在玻璃基底上制备了Sb修饰TiO2薄膜,利用XRD,Raman光谱以及SIMS研究了Sb对其表面结晶情况的影响并用XPS及SIMS分析了薄膜的成分.结果表明一定程度Sb的修饰对TiO2薄膜成晶有优化作用,起到了类似表面活性剂的作用,并使薄膜表面的光致亲水性能得到改善.当Sb修饰过量时,破坏了TiO2原有的晶格结构,劣化了薄膜表面的光致亲水性.     

Microstructure and photoluminescence studies of Sb-doped SnO2 zigzag nanobelts

SnO2 zigzag nanobelts were successfully Sb-doped by a simple vapor deposition method. Field emission scanning electron microscope (FESEM), high resolution transmission electron microscope (HRTEM), and X-ray diffraction (XRD) were used to characterize these Sb-doped nanobelts. The Sb doping in SnO2 nanobelts was confirmed by Energy Dispersive X-ray spectrum (EDS) and X-ray photoelectron spectroscopy (XPS). It is found that there is no apparent lattice distance difference between the pure SnO2 and the 0.705 at% Sb doped SnO2 nanobelts. A slight blue-shift in the photoluminescence (PL) spectra was shown with the increase of Sb doping concentration and a reasonable explanation was given.     

Structural studies on some doped CdS thin films deposited by thermal evaporation

The influence of the Mn, Se and Sb impurities on the structure and morphology of CdS thin films grown on p⁺ Si wafers was studied. The starting powders were mixed in the same molar ratios (0.3%) and deposited in the same conditions by vacuum thermal evaporation. X-ray diffraction(XRD), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and reflectance studies made on thermal treated thin films (573 K, 2 h in air) evidenced that thin films have a hexagonal oriented structure, and that dopants enter into the CdS lattice merely by substitution. The dopant nature influences the thin film thickness and chemical composition. The doped CdS thin films have roughness in nanometer region and a reflectivity lower than 40%. Silicon substrate acts as a template and favors the retention of Mn and scatters the Sb dopants. The CdS:Se thin film is thicker than CdS:Mn and CdS:Sb ones and is a mixture of doped and undoped nanocrystals.     

Characterizations of SnO2 and SnO2:Sb thin films prepared by PECVD

Structural characterizations of tin oxide (SnO₂) thin films, deposited by plasma-enhanced chemical vapor deposition (PECVD), were investigated with scanning electron microscope (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The results show that the films are porous, the crystalline structure transforms from crystalline to amorphous phase as deposition temperature changes from 500°C to 200°C, and the chemical component is non-stoichiometric (Sn:O is 1.0716 prepared at 450°C with a value of O₂ flow 3.5 l/min). Sheet resistance of the thin films decreases with increasing of deposition temperature. Whereas, sheet resistance increases with increasing of oxygen flow. Tin oxide doped with antimony (SnO₂:Sb) thin films prepared by same method have a better selectivity to alcohol than to carbon monoxide; the maximum sensitivity is about 220%. The gas-sensing mechanism of SnO₂ thin films is commentated.     

Preparation of new antimony(0)/polyaniline nanocomposites by a one-pot solution phase method

The new Sb(0)/PANI nanocomposite was successfully synthesized by a one-pot solution phase method. Sb(0) particles were first prepared by the reduction of SbCl₅ or SbCl₃ using t-BuONa-activated NaH in THF. A ligand exchange with aniline on t-BuONa-stabilized Sb(0) particles yielded aniline-stabilized particles. The Sb(0)/PANI nanocomposite was finally obtained by polymerizing aniline-stabilized Sb(0) particles by using ammonium persulfate. The morphology and the structure of the nanocomposite was examined by transmission electron microscopy (TEM), selected-area electron diffraction (SAED), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Results obtained show that the Sb(0) precursor has a great influence on the size and the crystallinity of Sb(0) nanoparticles dispersed in PANI.     

Synthesis of Sb2E3 (E = S, Se) nanorods with a flat cross section by a rapid hot injection method

We report herein a simple colloidal synthesis route, i.e., rapid injection of E (E = S, Se) source into a hot solvent (1-octadecence, ODE) containing antimony precursor (antimony stearate), to grow Sb2E3 nanorods. The as-prepared nanorods were extensively characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high-resolution transmission electron microscopy (HRTEM). The mechanism for growth of Sb2E3 nanorods was also clarified from the view of crystal structure-directed growth. We believe that the method present here is a more straightforward and cost-effective route to prepare Sb2E3 nanocrystals with high quality.     

Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy

Atomistic structures of as-deposited and laser-induced-crystallized Ge-Sb-Sn layers have been examined using high-resolution electron microscopy (HREM) and nanobeam electron diffraction (NBED). Cross-sectional observations were performed on Ge-Sb-Sn thin films embedded in a multi-layered structure. Crystalline clusters were frequently observed in the HREM images of the as-deposited amorphous Ge-Sb-Sn thin film. Autocorrelation function analysis of the HREM image indicated a similarity between the structures of the crystalline clusters and that of rhombohedral Sb. Atomic pair-distribution functions obtained from the halo NBED intensity of the as-deposited amorphous Ge-Sb-Sn films also showed development of local structure whose atomic configuration is similar to that of the rhombohedral Sb. NBED revealed that the structure of the crystallized Ge-Sb-Sn thin film is also close to that of rhombohedral Sb. The atomistic structures of Ge-Sb-Sn thin films were compared with those of Ge-Sb-Te thin films and the rapid crystallization mechanism of these materials was discussed.