Electron probe x-ray microanalysis of frozen-hydrated biological specimens.

A technique is described for preparing frozen-hydrated bulk samples of biological specimens for electron probe X-ray microanalysis. The method allows reproducible quantitative analyses to be made. Specimens are rapidly frozen, transferred to a vacuum evaporator, fractured under high vacuum at - 180 degrees C and coated with 20 nm of chromium. Transferal to the cryostage of a scanning electron microscope is accomplished without exposure to the atmosphere and without the specimen temperature rising above -120 degrees C. Analyses are made at a temperature of -145 degrees C. Contamination by frost does not occur. Etching and charging of the specimen are eliminated. Specimen charging is shown to be related to temperature. It can be eliminated at low temperature by coating with carbon, aluminium or chromium but consistent elimination could only be achieved with chromium. The chromium coat does not appear to have an absorption effect on quantitative analysis.     

Image deformation in field ion microscopy of faceted crystals

We perform detailed numerical simulations of field ion microscopy images of faceted crystals and compare them with experimental observations. In contrast to the case of crystals with a smooth surface, for a faceted topography we find extreme deformations of the ion image. Local magnification is highly inhomogeneous and may vary by an order of magnitude: from 0.64 to 6.7. Moreover, the anisotropy of the magnification at a point located on the facet edge may reach a factor of 10.     

Efficient sampling for three-dimensional atom probe microscopy data

The best calculation of concentration profiles, isoconcentration surfaces or Gibbsian interfacial excesses from three-dimensional atom-probe microscopy data requires a compromise between spatial positioning error and statistical sampling error. For example, sampling from larger spatial regions decreases the statistical error, but increases the error in spatial positioning. Finding the appropriate balance for a particular calculation can be tricky, especially when the three-dimensional nature of the data presents an infinite number of degrees of freedom in defining surfaces, and when the statistical error is changing from one region of a sample to another due to differences in collection efficiency or atomic density.We present some strategies for approaching these problems, focusing on efficient algorithms for generating different spatial samplings. We present a unique double-splat algorithm, in which an initial, fine-grained sampling is taken to convert the data to a regular grid, followed by a second, variable width splat, to spread the effective sampling distance to any value desired. The first sampling is time consuming for a large dataset, but needs only be performed once. The second splat is done on a regular grid, so it is efficient, and can be repeated as many times as necessary to find the correct balance of statistical and positioning error. The net effect is equivalent to a Gaussian spreading of each data point, without the necessity of calculating Gaussian coefficients for millions of data points. We show examples of isoconcentration surfaces calculated under different circumstances from the same dataset.     

Fabrication of high-aspect ratio Si pillars for atom probe ‘lift-out’ and field ionization tips

A process for fabricating high-aspect ratio (∼1:20), micron-sized Si [0 0 1] pillars using mechanical and chemical size reduction is presented. A dicing saw was used for mechanically patterning an array of square pillars with side lengths of >20 μm. These pillars were then reduced in size using an aqueous NaOH and KOH solution heated to 100 °C. The chemical etch reduces the pillar size within the time range amenable for focus ion beam milling and/or attachment for atom probe ‘lift-out’ specimens. The pillars can be formed with either a flat top surface or into <100 nm tip points for direct field ionization.     

Strategies for fabricating atom probe specimens with a dual beam FIB

A FIB-based lift-out method for preparing atom probe specimens at site specific locations such as coarse precipitates, grain boundaries, interphase interfaces, denuded zones, heat affected zones, implanted, near surface and subsurface regions, shear bands, etc. has been developed. FIB-based methods for the fabrication of atom probe specimens from thin ribbons, sheet stock, and powders have been developed.     

Optimal design and fabrication of three-dimensional calibration specimens for scanning probe microscopy

Micro-/nano-scale roughness specimens are highly demanded to synthetically calibrate the scanning probe microscopy (SPM) instrument. In this study, three-dimensional (3D) specimens with controllable main surface evaluation parameters were designed. In order to improve the design accuracy, the genetic algorithm was introduced into the conventional digital filter method. A primary 3D calibration specimen with the dimension of 10 μm × 10 μm was fabricated by electron beam lithography. Atomic force microscopy characterizations demonstrated that the statistical and spectral parameters of the fabricated specimen match well with the designed values. Such a kind of 3D specimens has the potential to calibrate the SPM for applications in quantitative surface evaluations.     

Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy

Field ion microscope images have been used to measure the local evaporation field of a Al3Zr particle in 7050 Al alloy. Using the matrix Al evaporation field (19 V/nm) as a reference, the evaporation field of Al3Zr has been estimated to be 36 V/nm, similar to the theoretical value for the field evaporation of Al2+ or Zr3+ ions. A strong local magnification effect from the large difference in evaporation fields between the particle and matrix has been found to cause a severe distortion of the apparent particle morphology in a three-dimensional atom probe reconstruction when using parameters based on the Al matrix. Use of the measured evaporation field for Al3Zr has allowed accurate reconstruction of the morphology of the particle. A simple worst-case analysis predicts that trajectory overlaps increase with increasing cross-section of particle, and the calculated overlaps agree well with experimental estimates of approximately 1.4-2.0 nm for variations in the particle cross-section from 7 to 12 nm. The chemical composition of Al3Zr in a 7050 Al alloy has been measured to be 64.8-67.7 at% Al, 23.6-24.8 at% Zr, 6.9-9.1 at% Zn, 0.4-0.7 at% Cu, 0.5-1.2 at% Mg, with a (Al+Zn)/Zr ratio close to 3. Specimen analysis temperatures of either 25 or 80 K show little effect on the measured chemical compositions of the particle.     

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys

Atom probe tomography uses time-of-flight mass spectrometry to identify the chemical nature of atoms from their mass-to-charge-state ratios. Within a mass spectrum, ranges are defined so as to attribute a chemical identity to each peak. The accuracy of atom probe microanalysis relies on the definition of these ranges. Here we propose and compare several automated ranging techniques, tested against simulated mass spectra. The performance of these metrics compare favourably with a trial of users asked to manually range a simplified simulated dataset. The optimised automated ranging procedure was then used to precisely evaluate the very low iron concentration (0.003-0.018 at%) in a zirconium alloy to reveal its behaviour in the matrix during corrosion; oxygen is injected into solution and has the effect of increasing the local iron concentration near the oxide-metal interface, which in turn affects the corrosion properties of the metal substrate.     

Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomography

Whereas transmission electron microscopy (TEM) is a well established method for the analysis of thin film structures down to the sub-nanometer scale, atom probe tomography (APT) is less known in the microscopy community. In the present work, local chemical analysis of sputtered Fe/Cr multilayer structures was performed with energy-filtering transmission electron microscopy (EFTEM) and APT. The single-layer thickness was varied from 1 to 6 nm in order to quantify spatial resolution and chemical sensitivity. While both the methods are able to resolve the layer structure, even at 2 nm thickness, it is demonstrated that the spatial resolution of the APT is about a factor of two, higher in comparison with the unprocessed EFTEM data. By calculating the influence of the instrumental parameters on EFTEM images of model structures, remaining interface roughness is indicated to be the most important factor that limits the practical resolution of analytical TEM.     

A new approach to the interpretation of atom probe field-ion microscopy images.

The field distribution and the ion trajectories close to the tip surface are known to mainly control the contrast of field-ion microscopy and the resolution of the three-dimensional atom probe. The proper interpretation of images provided by these techniques requires the electric field and the ion trajectories to be determined accurately. A model has been developed in order to compute the ion trajectories close to a curved emitting surface modelled at the atomic scale. In this model, both the gradual change of the tip surface and the chemical nature of atoms were taken into account. Predictions and results given by this approach are shown to be in excellent agreement with experiments. The calculated electric field at the tip surface is consistent with field-ion microscopy contrasts. The preferential retention of surface atoms and the order of evaporation were correctly simulated. The ion trajectories were successfully described. In this way, the crucial problem of trajectory overlap and local magnification could be investigated. These simulations not only lead to a new understanding of the physical basis of image formation, but also have a predictive value.     

Correlated ion analysis and the interpretation of atom probe mass spectra

Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data can often be recovered from within the spectrum noise by considering the time-of-flight differences between ions within a multiple event. Correlated ion detection, particularly when associated with shifts in ion energies, may be used to probe the phenomenon of molecular ion dissociation, including the questions of data loss due to ion pile-up or the generation of neutrals in the dissociation process.     

Cryofixation methods for ion localization in cells by electron probe microanalysis: a review

Electron probe microanalysis data on the intracellular content and distribution of electrolyte ions depends critically on the functional state of the cells at the moment of cryofixation. Whereas tissue specimens often require special in-situ freezing techniques, isolated and cultured cells can be frozen within their environmental medium under physiologically controlled conditions. Thus, they represent a feasible system to study functional ion-related intracellular parameters such as the K/Na ratio. Specifically modified freezing devices allow the study of ion shifts related to dynamic processes in cells, for example, locomotion and exocytosis. The time resolution achieved by time-controlled cryofixation is approximately 1 ms.     

Polarization microscopy probe for applications in a high magnetic field

A microscopy probe designed for use in high field magnets is presented. It was developed to observe and continuously measure the position and shape of a magnetically driven grain boundary in a magnetically anisotropic material. The approach utilizes the anisotropy of reflectivity of visible light for orientation contrast to determine the boundary location. The major components of the system are the polarizing microscope with video camera and the sample chamber with a resistive heater for annealing at elevated temperatures up to 500 degrees C in an inert gas atmosphere. The results of test measurements are presented.     

Laser assisted field evaporation of oxides in atom probe analysis

We have investigated the laser assisted field evaporation phenomena of ZnO, and MgO to explore the feasibility of quantitative three dimensional atom probe analyses of insulating oxides. To assist the field evaporation of these oxides, the usage of short wavelength 343 nm ultraviolet (UV) laser was found to be more effective than 515 nm green laser. We observed field ion microscopy (FIM) image expansion and mass peak shifting when 343 nm laser was irradiated on MgO. This phenomenon can be attributed to the laser induced electron excitation which causes the reduction of the resistivity of the specimen.     

Multi-objective optimal design of high frequency probe for scanning ion conductance microscopy

Scanning ion conductance microscopy(SICM) is an emerging non-destructive surface topography characterization apparatus with nanoscale resolution. However, the low regulating frequency of probe in most existing modulated current based SICM systems increases the system noise, and has difficulty in imaging sample surface with steep height changes. In order to enable SICM to have the capability of imaging surfaces with steep height changes, a novel probe that can be used in the modulated current based hopping mode is designed. The design relies on two piezoelectric ceramics with different travels to separate position adjustment and probe frequency regulation in the Z direction. To further improve the resonant frequency of the probe, the material and the key dimensions for each component of the probe are optimized based on the multi-objective optimization method and the finite element analysis. The optimal design has a resonant frequency of above 10 kHz. To validate the rationality of the designed probe, microstructured grating samples are imaged using the homebuilt modulated current based SICM system. The experimental results indicate that the designed high frequency probe can effectively reduce the spike noise by 26% in the average number of spike noise. The proposed design provides a feasible solution for improving the imaging quality of the existing SICM systems which normally use ordinary probes with relatively low regulating frequency.     

Fabrication and characterization of APT specimens from high dose heavy ion irradiated materials

The next generations of advanced energy systems will require materials that can withstand high doses of irradiation at elevated temperatures. Therefore, a methodology has been developed for the fabrication of high-dose ion-irradiated atom probe tomography specimens at a specific dose with the use of a focused ion beam milling system. The method also enables the precise ion dose of the atom probe tomography specimen to be estimated from the local concentration of the implanted ions. The method has been successfully applied to the characterization of the distribution of nanoclusters in a radiation-tolerant 14YWT nanostructured ferritic steel under ion irradiation to doses up to 400 displacements per atom.     

Detection of small displacement of atoms in crystals by atom resolution electron microscopy

Four kinds of works on the detection of displacement of atoms in crystals are shown. The irregular small displacement of atoms has been detected, with an accuracy of about 0.1 Å around dislocations and stacking faults in Au crystals as shown by their electron microscope images. The displacement of the atomic images is recorded by aberration-free focus (AFF). Even when the periodic displacement of atoms in SiC and TaS₂ crystals is around 0.1% of the lattice constant, this displacement has been revealed as the weak-contrast anomaly in the images. Using in situ observations by a TV system attached to an electron microscope, the rapid movements of atoms that have taken place within 1/30 sec have been recorded. Using the technique of successive subtraction of the images by TV system and image sigma, only the images of moving atoms in Au crystal have been recorded each 1/10 sec.     

Standard deviations of composition measurements in atom probe analyses. Part I conventional 1D atom probe

Atom probe is a very powerful instrument to measure concentrations on a sub nanometric scale [M.K. Miller, G.D.W. Smith, Atom Probe Microanalysis, Principles and Applications to Materials Problems, Materials Research Society, Pittsburgh, 1989]. Atom probe is therefore a unique tool to study and characterise finely decomposed metallic materials. Composition profiles or 3D mapping can be realised by gathering elemental composition measurements. As the detector efficiency is generally not equal to 1, the measured compositions are only estimates of actual values. The variance of the estimates depends on which information is to be estimated. It can be calculated when the detection process is known. These two papers are devoted to give complete analytical derivation and expressions of the variance on composition measurements in several situations encountered when using atom probe. In the first paper, we will concentrate on the analytical derivation of the variance when estimation of compositions obtained from a conventional one dimension (1D) atom probe is considered. In particular, the existing expressions, and the basic hypotheses on which they rely, will be reconsidered, and complete analytical demonstrations established. In the second companion paper, the case of 3D atom probe will be treated, highlighting how the knowledge of the 3D position of detected ions modifies the analytical derivation of the variance of local composition data.