Precipitation of large Ag3Sn intermetallic compounds in SnAg2.5 microbumps after multiple reflows in 3D-IC packaging

Microbumps have been adopted as interconnects between Si chips in 3D integrated-circuit packaging. The solder volume of a microbump decreases dramatically due to fine-pitch requirement and it is approximately two orders smaller in magnitude than that of a traditional flip-chip solder joint. The metallurgical reactions in the microbumps may behave quite differently to those in flip-ship bumps. Liquid-state metallurgical reactions were examined in SnAg2.5 microbumps with Ni metallization. The results indicate that large particles of Ag₃Sn intermetallic compounds (IMCs) precipitate after a 10-min reflow on microbumps with 4.0-μm-thick solder, which does not occur with flip-chip solder bumps. It is proposed that the Ag concentration in the remaining solder may increase as Sn reacts with Ni. The increase in the Ag concentration is mainly responsible for the occurrence of the large Ag₃Sn precipitates. The formation of these Ag₃Sn IMCs would be detrimental to the mechanical properties of the microbumps.     

Influence of nanoparticle addition on the formation and growth of intermetallic compounds (IMCs) in Cu/Sn–Ag–Cu/Cu solder joint during different thermal conditions

Abstract

Nanocomposite lead-free solders are gaining prominence as replacements for conventional lead-free solders such as Sn–Ag–Cu solder in the electronic packaging industry. They are fabricated by adding nanoparticles such as metallic and ceramic particles into conventional lead-free solder. It is reported that the addition of such nanoparticles could strengthen the solder matrix, refine the intermetallic compounds (IMCs) formed and suppress the growth of IMCs when the joint is subjected to different thermal conditions such as thermal aging and thermal cycling. In this paper, we first review the fundamental studies on the formation and growth of IMCs in lead-free solder joints. Subsequently, we discuss the effect of the addition of nanoparticles on IMC formation and their growth under several thermal conditions. Finally, an outlook on the future growth of research in the fabrication of nanocomposite solder is provided.     

A review on the interfacial intermetallic compounds between Sn–Ag–Cu based solders and substrates

The objective of this review is to study the interfacial intermatallic compounds (IMCs) between Sn–Ag–Cu based solders and common substrates, which play a crucial role in solder joints typically present in Pb-free electronics manufacturing. The microstructural evolution of IMCs at the solder/substrate interfaces is analyzed, while the models and theories describing the formation/growth mechanism of interfacial IMCs are also introduced. We focus on the influence of a variety of factors that have been reported recently, including substrates, minor alloying, mechanical stress, electromigration and thermomigration etc., as full understanding of the mechanisms that determine the formation and growth of interfacial IMCs is important to reach for developing high reliability solder joints. In the end of this review, the characteristics of the IMCs are compared and illustrated, which have marked effect on the mechanical properties and fracture behavior as well as reliability of solder joints.     

Reliability of Pb-free solders for harsh environment electronic assemblies

Abstract

Since 2006 and the implementation of environmental regulations, the electronic industry has moved to Pb-free solders. Harsh environment industries that were exempted from the regulations will soon have to follow suit. However, a suitable replacement solder for use in harsh environments still has to be validated and reliability models are yet to be established. In this review, research that led to the selection of currently used Pb-free alloys and the continuing search for high reliability alloys are described. Sn pest and Sn whiskers, potential major threats for electronics operating in harsh environments, are highlighted. This review also focuses on the microstructure, mechanical properties and deformation mechanisms of Pb-free alloys. Emphasis is placed on Sn–Ag–Cu alloys, now considered to be the alloys of choice for replacement of Sn–Pb solders. The reliability of Pb-free electronic assemblies is studied, focusing on thermal fatigue, believed to be the main source of failure through creep–fatigue mechanisms. The validity of models for Pb-free solder joints life time prediction is assessed and the lack of cohesiveness among the available reliability data is examined.     

Structural characterization and creep resistance of nano-silicon carbide reinforced Sn–1.0Ag–0.5Cu lead-free solder alloy

Nano-sized, non-reacting, non-coarsening SiC particles were successfully fabricated by high energy ball milling. Mechanically mixing was adopted to prepare SiC-particulate reinforced Sn–1.0Ag–0.5Cu (SAC105) composite solders. The effects of SiC addition on the melting behavior, microstructure and the corresponding creep properties were explored. It is found that the addition of 0.35–0.75 wt.% SiC nano-sized particles can effectively decrease the undercooling, while the melting temperature is sustained at the SAC(105) level, indicating that the novel composite solder is fit for existing soldering process. After the addition of 0.35% SiC nano-particles, a fine microstructure of Ag₃Sn and Cu₆Sn₅ IMCs with small spacing appeared in the β-Sn matrix. Moreover, the creep rate of the composite solder exhibited a consistently lower value than that of plain SAC(105) solder due to a second phase dispersion strengthening mechanism as well as a refinement of IMCs. Hence, the composite SAC(105)/0.35% SiC solder displayed a higher creep resistance (3.1 times) and fracture lifetime (3 times) than that of plain solder. However, this effectiveness is reduced when 0.75% SiC addition starts constricting the growth Ag₃Sn and Cu₆Sn₅ IMC and forming a weak interface with the enlarged β-Sn matrix.     

Nanoindentation characterization of intermetallic compounds formed between Sn–Cu (–Ni) ball grid arrays and Cu substrates

The formation of intermetallic compounds (IMCs) at the solder–substrate interface is essential in the manufacturing of solder joints. In this study, the effect of Ni addition into Sn–Cu lead-free solders on mechanical properties of the IMCs formed at the interface between solder ball grid arrays (BGAs) and Cu substrates, which experienced multiple reflows, were investigated. The results from nanoindentation tests showed that elastic modulus and hardness of (Cu,Ni)₆Sn₅ were higher than those of Cu₆Sn₅. The hardnesses of (Cu,Ni)₆Sn₅ were more scattered compared to those of Cu₆Sn₅, which may be attributed to the crystallographic characteristics such as growth texture of the IMCs.     

Formation of Bulk Intermetallic Compound Ag3Sn in Slowly-Cooled Lead-Free Sn-4.0 wt pct Ag Solders

1. IntroductionWith increasing environmental and healthy concernsover the toxicity of lead to ban, the use of lead-basedsolders have provided an inevitable driving force for thedevelopment of lead-free solder alloys. Among these newlead-free solders, Sn-Ag alloy system has emerged as apromising alternative due to its higher strength and supe-rior resistance to creep and thermal fatigue from the for-mation of fine Ag3Sn intermetallic compound (IMCs)[1,2].However, bulk needle-like Ag3Sn IMC…     

Review on microstructure evolution in Sn–Ag–Cu solders and its effect on mechanical integrity of solder joints

The use of Pb-bearing solders in electronic assemblies is avoided in many countries due to the inherent toxicity and environmental risks associated with lead. Although a number of “Pb-free” alloys have been invented, none of them meet all the standards generally satisfied by a conventional Pb–Sn alloy. A large number of reliability problems still exist with lead free solder joints. Solder joint reliability depends on mechanical strength, fatigue resistance, hardness, coefficient of thermal expansion which are influenced by the microstructure, type and morphology of inter metallic compounds (IMC). In recent years, Sn rich solders have been considered as suitable replacement for Pb bearing solders. The objective of this review is to study the evolution of microstructural phases in commonly used lead free xSn–yAg–zCu solders and the various factors such as substrate, minor alloying, mechanical and thermo-mechanical strains which affect the microstructure. A complete understanding of the mechanisms that determine the formation and growth of interfacial IMCs is essential for developing solder joints with high reliability. The data available in the open literature have been reviewed and discussed.     

Issues related to the implementation of Pb-free electronic solders in consumer electronics

Consumer electronic applications are the primary target of the Pb-free initiative and package assembly and performance is affected by the move from eutectic Sn–Pb to Pb-free solder alloys. This paper outlines the key issues and mitigation possibilities for package assembly using Pb-free solders: High temperature reflow, Interfacial reactions, and Reliability. At the high temperatures required to reflow Pb-free alloys, moisture absorbed into the package can result in delamination and failure. The reaction of the Pb-free solder with Ni and Cu metallizations results in interfacial intermetallics that are not significantly thicker than with Sn–Pb but provide a path for fracture under mechanical loading due to the increased strength of the Pb-free alloys. The reliability issues discussed include thermomechanical fatigue, mechanical shock, electromigration and whiskering. The Pb-free alloys tend to improve thermomechanical fatigue and electromigration performance but are detrimental to mechanical shock and whiskering. Design trade-offs must be made to successfully implement Pb-free alloys into consumer applications.     

Retarding intermetallic compounds growth of Zn high-temperature solder and Cu substrate by trace element addition

Since the thickness of layers of intermetallic compounds (IMCs) at the joining interface has an apparent effect on the joint reliability, understanding the growth mechanisms of IMCs is important for die-attachment applications. In the present study, the interfacial reaction between elements (Ca, Mn, Cr, and Ti) added to Zn alloys and Cu substrate were investigated in detail, focusing on IMCs grown by isothermal aging at 150 °C. The reaction layers included two types of Cu–Zn IMCs i.e., γ-Cu₅Zn₈ and ε-CuZn₅ phases. The joining interface with trace elements containing Zn solder reduced the growth rate of the IMCs. In particular, the addition of 0.1 wt% Cr to pure Zn solder decreased the growth rate of the IMCs by approximately 50 %. The mechanism we propose assumes that a phase containing the small Cr atoms exists between the solder and ε-CuZn₅, which suppresses the diffusion of metal atoms. To summarize, the Cr additive showed beneficial effects in terms of suppressing the growth of IMCs during the solid-state isothermal aging.     

Enhanced ductility and mechanical strength of Ni-doped Sn–3.0Ag–0.5Cu lead-free solders

In this paper, the tensile tests were conducted to investigate the effect of adding a small amount of Ni on the microstructure, thermal and mechanical properties of 3.0Ag–0.5Cu(SAC 305) solder. The results indicated that addition of Ni can effectively decrease both the undercooling and the onset melting temperature of SAC(305) solder alloy. The strength and ductility of the SAC(305) solder depend significantly on Ni content. In general, the SAC(305)–0.5%Ni solder reveals superior mechanical properties in terms of maximum strength and ductility when compared to the high Ni-content or plain solders. Microstructure analysis revealed that a new η-(Cu,Ni)₆Sn₅ intermetallic compound (IMC) phase containing large amount of Ni was generated, while the initial Cu₆Sn₅ phase was converted into (Cu,Ni)₆Sn₅ phase after 0.5%Ni addition. Besides, the fine fiber-like Ag₃Sn and finer dot-shaped precipitates rather than needle-like morphology have occurred at the surface of β-Sn matrix easily, which could provide more obstacles for dislocation pile up in the adjacent grains and enhanced the mechanical property. With increasing Ni addition, the Ni-doped SAC(305) solder showed a corresponding deterioration in their mechanical property due to the coarsening of (Cu,Ni)₆Sn₅ IMCs and increasing the inter-particle spacing of Ag₃Sn IMCs in the eutectic colony.     

Reactive wetting of Sn–2.5Ag–0.5Cu solder on copper and silver coated copper substrates

In the present work, wetting characteristics and morphology of intermetallic compounds (IMCs) formed between Sn–2.5Ag–0.5Cu lead-free solder on copper (Cu) and silver (Ag) coated copper substrates were compared. It was found that, Ag coated Cu substrate improved the wettability of solder alloy. The average values of contact angles of solder alloy solidified on Ag coated Cu substrate were reduced to about 50 % as compared to contact angles obtained on Cu substrates. Flow restrictivity for spreading of solder on Ag coated Cu was found to be lower as compared to Cu substrate. The spreading of solder alloy on Ag coated Cu exhibited halo zone. Coarse needle shaped Cu₆Sn₅ IMCs were observed at the solder/Cu substrate interface whereas at the solder/Ag coated Cu interface Cu₆Sn₅ IMCs showed scallop morphology. The formation of Cu₃Sn IMC was observed for the spreading of solder alloy on both substrates. The solder/Ag coated Cu substrate interface exhibited more particulates of Ag₃Sn precipitates as compared to solder/Cu substrate interface. The improved wettability of solder alloy on Ag coated Cu substrate is due to the formation of scallop IMCs at the interface.     

Solder joint reliability of Sn–0·7Cu and Sn–0·3Ag–0·7Cu lead-free solder alloys solidified on copper substrates with different surface roughnesses

Abstract

The bond shear test was used to assess the integrity of Sn–0·7Cu and Sn–0·3Ag–0·7Cu lead-free solder alloy drops solidified on copper substrates with smooth and rough surface finishes. Solder alloys solidified on smooth substrates required higher shear force compared to that on rough substrates. Sn–0·3Ag–0·7Cu alloy required higher shear energy than Sn–0·7Cu alloy. Solder alloys solidified on smooth substrate surfaces exhibited complete ductile failure. On rough copper surfaces, solder alloys showed a transition ridge characterized by sheared intermetallic compounds (IMCs) and the presence of dimples. The peak shear strength decreased with increase in contact area of the solder bond on the substrate. Smooth surface and the presence of minor amount of Ag in the solder alloy enhance the integrity of the solder joint.     

Suppressing the growth of interfacial Cu–Sn intermetallic compounds in the Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joint during thermal aging

Evolution of interfacial phase formation in Sn–3.0Ag–0.5Cu/Cu (wt%), Sn–3.0Ag–0.5Cu–0.1Ni/Cu, Sn–3.0Ag–0.5Cu/Cu–15Zn, and Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joints are investigated. Doping Ni in the solder joint can suppress the growth of Cu₃Sn and alter the morphology of the interfacial intermetallic compounds (IMCs), however it shows rapid growth of (Cu,Ni)₆Sn₅ at the Sn–3.0Ag–0.5Cu–0.1Ni/Cu interface. In comparison with the Cu substrates, the Cu–Zn substrates effectively suppress the formation of Cu–Sn IMCs. Among these four solder joints, the Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joint exhibits the thinnest IMC, and only (Cu,Ni)₆(Sn,Zn)₅ formed at the interface after aging. It is revealed that the presence of Ni acts to enhance the effect of Zn on the suppression of Cu–Sn IMCs in the SAC305–0.1Ni/Cu–15Zn solder joint. The limited formation of IMCs is related to the elemental redistribution at the joint interfaces during aging. The Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn joint can act as a stabilized interconnection due to the effective suppression of interfacial reaction.     

Wetting Behaviors and Interfacial Reaction between Sn-10Sb-5Cu High Temperature Lead-free Solder and Cu Substrate

Sn-10Sb-5Cu lead-free solder was fabricated for high temperature application in electronic package. Wetting behaviors and interfacial reaction between such a high temperature lead-free solder and Cu substrate were investigated and compared with those of 95Pb-Sn solder. The results showed that the wetting properties of Sn-10Sb-5Cu solder are superior to those of 95Pb-Sn solder in maximum wetting force, wetting time and wetting angle in the temperature range of 340-400 ℃. However, the surface of the Sn-10Sb-5...     

Evolution of thermal property and creep resistance of Ni and Zn-doped Sn–2.0Ag–0.5Cu lead-free solders

The effect of small amount of Ni and Zn additions on thermal behavior and creep properties of Sn–2Ag–0.5Cu (SAC 205) lead free solder alloy was investigated. Additions of Ni and Zn, respectively, into SAC (205) solder caused its undercooling temperature to decrease significantly from 26.1 °C to 18.0 and 1.4 °C. The results show that the formation of new (Cu,Ni)₆Sn₅ and Cu₅Zn₈ hard particles in the β-Sn matrix are drastically strengthen the SAC (205) solder. The lead-free SAC (205) – 0.5Zn solder joints showed superior creep resistance in terms of much lower creep rate and elongated creep fracture lifetime over the traditional SAC (205) and SAC (205) – 0.05Ni solders. However, the ductility of SAC (205) – 0.5Zn alloy is lower than that of the other two alloys. This difference was attributed to the lower precipitate coarsening and higher precipitate density of Cu₅Zn₈ and Ag₃Sn IMCs in Zn-doped SAC (205) cast alloy, which could provide more obstacles for dislocation pile up in the adjacent β-Sn grains. Nevertheless, the strengthening effect depends on the undercooling of the solder.     

Effect of Al content on the formation of intermetallic compounds in Sn–Ag–Zn lead-free solder

The effect of addition of Al, up to 1 wt.%, on the formation of intermetallic compounds in the microstructure of Sn–3.7%Ag–0.9%Zn lead-free solder was investigated. The typical microstructure of Sn–Ag–Zn solder is composed of the β-Sn phase and mixed granules which contain the intermetallic compounds (IMCs) of Ag₃Sn and AgZn. After alloying with 0.5 wt.% Al, the microstructure of the explored solder evolves into a mixture of the bulk Agl IMCs and β-Sn phase, and most of the bulk Ag₂Al IMCs distribute on and around the grain boundaries. The addition of 1 wt.% Al into the Sn–Ag–Zn solder brings many granules and bars of the Ag₂Al IMCs, while the amount of the bulk Ag₂Al IMCs decrease greatly. The above observation suggests that the bulk Ag₂Al IMCs is replaced by the granule-like Ag₂Al IMCs appearing along the grain boundaries. Since the grain size of the solder alloyed with 0.5%Al is relatively small as compared to the one alloyed with 1 wt.% Al, the growth of the Ag₂Al IMCs was prompted through the feasible diffusion channels along the grain boundaries. Thus, the addition of Al plays an important role on the morphology of the Ag₂Al IMCs in the final microstructure of the explored Sn–Ag–Zn solder.     

Microstructure and reliability of Mo nanoparticle reinforced Sn–58Bi-based lead-free solder joints

The effect of Mo nanoparticles on the microstructure, wettability and mechanical properties of Sn–58Bi–xMo (x?=?0–2.00) solder joints was investigated. The results showed that the optimal wettability of Sn–58Bi–0.25Mo solder was obtained and the microstructure was refined by adding small amounts of Mo. The intermetallic compounds (IMCs) thickness was increased from Sn–58Bi 2.17?µm to Sn–58Bi–2Mo 2.73?µm. The tensile strength of Sn–58Bi solder joint was improved by adding 0.25?wt-% Mo. The fracture mode of Sn–58Bi solder joint and Sn–58Bi–0.25Mo solder joint was brittle fracture and the mixed mode was ductile failure and brittle fracture, respectively. The microstructure of Sn–58Bi and Sn–58Bi–0.25Mo solder joints was coarsened, IMCs thickness was increased and the mechanical properties were deteriorated with increasing aging time.     

Nano ZrO2 Particulate-reinforced Lead-Free Solder Composite

A lead-free solder composite was prepared by adding ZrO2 nanopowders in eutectic Sn-Ag alloy. Microstrucrural features and microhardness properties of those solders with different ZrO2 nanopowder fraction were examined. Results indicate that the addition of ZrO2 nanopowders reduced the size of β-Sn grains and restrained the formation of bulk Ag3Sn intermetallic compounds （IMCs） due to the adsorption effect of the ZrO2 particles. The Vicker＇s hardness of the obtained lead-free solder composites fits well with the HalI-Petch relationship. The refinement of β-Sn grains favors to improve the microhardness of composite solders.     

Interfacial reaction and mechanical reliability of eutectic Sn–0·7Cu/immersion Ag-plated Cu solder joint

Abstract

In this study, the interfacial reaction and joint reliability of immersion Ag-plated Cu substrate with the Sn–0·7Cu (wt-%) ball–grid array (BGA) solder was investigated. During reflow, the Ag plating layer was dissolved completely into the molten Sn–Cu solder and some of the Cu layer was also dissolved into the molten solder. The dissolved Ag and Cu were precipitated as Ag₃Sn and Cu₆Sn₅ intermetallic compounds (IMCs) in the solder matrix. Upon reflow, the Sn–Cu solder exhibits an off-eutectic reaction to produce the eutectic phase and precipitate (Cu₆Sn₅ and Ag₃Sn). The Cu–Sn IMC layer was formed at the solder/Cu interface after reflow, and the IMC layer grew during aging treatment. During the shear tests, the failure mode switched from a bulk-related failure to an interface-related failure. After aging for 250 h, the joint failed partially at the solder/Cu₆Sn₅ interface. The brittle fracture was linked to the formation of thick Cu–Sn IMC layer.