Structure and Magnetic Properties of Sn$_{1 - {rm x}}$ Co$_{rm x}$ O$_{2}$ Powder and Film

We have studied room-temperature ferromagnetism (RTFM) in Sn$_{1 - {rm x}}$Co$_{rm x}$O$_{2}$ powders and films fabricated by the sol-gel method. Our X-ray diffraction, high-resolution transmission microscopy, and X-ray photoelectron spectroscopy results show that all the samples have a pure rutile structure, and Co ions have a chemical valence of 2+. In addition, the magnetic moment per Co ion drops rapidly with the increase of Co content. Interestingly, Sn $_{1 - {rm x}}$Co $_{rm x}$O $_{2}$ films spin-coated on a Si (111) substrate have much larger magnetic moment than powder samples, because film samples have larger domain volumes, which may induce stronger long-range magnetic exchange coupling.      

Thermal Diffusivity and Related Properties of Colossal Magnetoresistive La$_{0.67}$Ca$_{0.33}$MnO $_{3}$ With Various Grain Sizes

Using the open-cell photoacoustic technique, we have measured the room-temperature thermal diffusivities of the colossal magnetoresistive material La$_{0.67}$Ca$_{0.33}$MnO$_{3 }$, sintered between 1100$;^{circ}$ C and 1350$;^{circ}$ C, with average grain sizes 1, 3, 5, and 10 $mu$m. We obtained the thermal diffusivities by analyzing the phase of photoacoustic signals in thermally thick samples using Calderon's method. We found that the insulator-metal transition temperature does not depend on the grain size ($T_{rm IM} sim 272$ K). However, the thermal diffusivity increases with grain size, with values between 0.431 and 0.969 mm $^{2}$s $^{-1}$. Other related electrical and thermal properties, including the electrical conductivity, thermal conductivity, and phonon mean free path, are also dependent on the grain size. The electronic contribution to the thermal conductivity is 2%–3% of the total thermal conductivity for smaller grain sizes (1–5 $mu$m) and increases to about 24% when the grain size is increased to 10 $mu$ m.      

Spin Seebeck Effect in Ni$_{81}$Fe$_{19}$/Pt Thin Films With Different Widths

The spin Seebeck effect (SSE) has been measured in Ni $_{81}$Fe $_{19}$ thin films which have different widths by using the inverse spin Hall effect (ISHE) in a Pt wire. The ISHE voltage induced by SSE is enhanced by lengthening the Pt wire. Combined with ISHE, SSE is applicable to the production of electric generators in which the thermoelectric figures of merit are tunable in terms of device structure.      

Development of a High-k Pr $_{2}$O $_{3}$ Sensing Membrane for pH-ISFET Application

In order to develop a pH sensor having a good pH-sensing characteristic, electrolyte-insulator-semiconductor capacitors using a high-k Pr$_{2}$O$_{3}$ thin film as the sensing membrane were fabricated on silicon substrates by reactive radio frequency sputtering. The structural and morphological features of these films with annealing at various temperatures were studied by X-ray diffraction, atomic force microscopy, and X-ray photoelectron spectroscopy. The Pr$_{2}$O $_{3}$ sensing film after annealing at 900$;^{circ}$C is suggested to the increase in the interfacial SiO $_{2}$ and silicate formation, and the high surface roughness. Therefore, a physical vapor deposition Pr$_{2}$O $_{3}$ film is adopted as a new pH-sensing layer. The result produces a pH response of 52.9 mV/pH $({rm pH}=2hbox{--}12)$, a hysteresis voltage of 17.5 mV $({rm pH}=7 to 4 to 7to 10 to 7)$, and a drift rate of 2.15 mV/h (${rm pH}=7$ buffer solution).      

Microstructure, Electrical, and Magnetic Properties of ZrO$_{2}$ Added MnZn Ferrites

We investigated the influence of ZrO$_{2}$ on the microstructure and electromagnetic properties of MnZn ferrites by characterizing fracture surface micrographs, magnetic properties, and dc resistivity. Powders of Mn $_{0.68}$Zn $_{0.25}$Fe $_{2.07}$O $_{4}$ composition were prepared by the conventional ceramic technique. Toroidal cores were sintered at 1350 $^{circ}$C for 4 h in N$_{2}$/O$_{2}$ atmosphere with 4% oxygen. The results show that the lattice constant and average grain size increase with ZrO$_{2}$ concentration, but excessive ZrO $_{2}$ concentration will result in exaggerated grain growth and porosity increase. The dc resistivity, activation energy, saturation magnetic flux density, and initial magnetic permeability increase monotonically when the ZrO$_{2}$ concentration is not more than 0.04 wt% and then decrease with further increase of ZrO$_{2}$ concentration. On the other hand, the porosity, drift mobility, resonance frequency, and core loss decrease initially and then increase with the increase of ZrO$_{2}$ concentration.      

Effects of Post-Deposition Annealing and Oxygen Content on the Structural and pH-Sensitive Properties of Thin Nd $_{2}$O $_{3}$ Films

This paper describes the structural properties and sensing characteristics of thin Nd$_{2}$O$_{3}$ sensing membranes deposited on silicon substrates by means of reactive sputtering. X-ray diffraction, X-ray photoelectron spectroscopy, and atomic-force microscopy were used to study the chemical and morphological features of these films as functions of the growth conditions (argon-to-oxygen flow ratios of $20/5, 15/10$ and $10/15$; temperatures ranging from 600$~^{circ}$C to 800$~^{circ}$C). The thin Nd$_{2}$O$_{3}$ electrolyte-insulator-semiconductor devices prepared under a 15/10 flow ratio with subsequent annealing at 700$~^{circ}$C exhibited a higher sensitivity (56.01 mV/pH, in the solutions from pH 2 to 12), a smaller hysteresis voltage (4.7 mV in the pH loop $7 to 4 to 7to 10 to 7$), and a lower drift rate (0.41 mV/h in the pH 7 buffer solution) than did those prepared at the other conditions. We attribute this behavior to the optimal oxygen content in this oxide film forming a high density of binding sites and a small surface roughness.      

SiGe/Si Quantum-Dot Infrared Photodetectors With ${bm delta}$ Doping

The multicolor absorption of MOS SiGe/Si quantum-dot (QD) infrared photodetectors is demonstrated using the boron $delta$-doping in Si spacers. The energy-dispersive X-ray spectroscopy shows that the Ge concentration in the wetting layers is much smaller than that in QDs. Most holes stay at the ground state in QDs instead of wetting layers. The energy band structure in QDs is calculated to understand the absorption spectrum. The absorption at 3.7–6 $mu$m is due to the intersubband transition in the SiGe QDs. The other absorption at 6–16 $mu$ m mainly comes from the intraband transition in the boron $delta$ -doping wells. Since the broadband spectrum covers most of the atmospheric transmission windows for infrared, the broadband detection is feasible using this device.      

Editor-in-Chief's Note—I$^{2}$MTC 2008 Special Issue

The 62 papers in this special issue are extended versions of papers presented at the 2008 International Instrumentation and Measurement Technology Conference, held in Victoria, BC, Canada, from May 12 to 15.     

A Very Low Offset Preamplifier for Voltage Measurements in the $muhbox{V}$ Range

A new topology for the implementation of a very low offset voltage preamplifier is presented. The new topology employs a time-varying resistance as a probe for detecting the sign and magnitude of the equivalent input offset of an operational amplifier in a series-shunt feedback configuration and allows for continuously correcting the offset voltage by means of a proper control feedback. The most remarkable feature of the approach we propose is the fact that the offset correction can continuously be performed with the signal voltage source connected to the circuit, as its presence and magnitude do not affect the offset detection circuit. At the same time, the offset cancellation circuit has minimum effect on the output voltage of the preamplifier in the bandwidth of the signal. An actual low-offset preamplifier based on the new approach we propose has been built and tested. While employing a metal–oxide–semiconductor field-effect transistor (MOSFET) input operational amplifier with a typical input offset of 100 $muhbox{V}$ (600- $muhbox{V}$ maximum), a voltage preamplifier with a gain of 201 and an equivalent input offset voltage below 100 nV is consistently obtained, which is independent, by design, of the temperature. While characterized by these excellent performances, the system employs quite standard low-cost components and does not require any calibration procedure.      

Novel Built-In Current-Sensor-Based $I_{rm DDQ}$ Testing Scheme for CMOS Integrated Circuits

This paper presents a new built-in current sensor (BICS)-based $I_{rm DDQ}$ testing scheme for complementary metal-oxide semiconductor (CMOS) integrated circuits (ICs). The proposed BICS will employ short detection times and low power dissipation to effectively ensure the reliability of the BICS and reduce the impact of the circuit under test (CUT) during testing. In addition, an $I_{rm DDQ}$ testing scheme based on the proposed BICS for detecting the abnormal quiescent current is presented. A 16-kB CMOS static random access memory (SRAM) is used as the CUT in this paper to discuss the testing considerations, including fault models and the $I_{rm DDQ}$ testing strategy. The simulation results show that the proposed BICS has a much improved performance compared with that in previous works. In addition, the physical chip design of the proposed BICS-based $I_{rm DDQ}$ testing scheme for SRAM testing applications is also implemented using the Taiwan Semiconductor Manufacturing Company (TSMC) 0.18-$mu hbox{m}$ CMOS technology. The test results show that 100% fault coverage can be achieved with only a 1.23% area overhead penalty.      

AlGaN/GaN Schottky Barrier Photodetector With Multi-${rm Mg}_{rm x} {rm N} _{rm y} $/GaN Buffer

AlGaN/GaN heterostructure Schottky barrier photodetector (PD) with multi-Mg_xN_y/GaN buffer was proposed and fabricated. Compared with AlGaN/GaN heterostructure PD prepared on conventional low-temperature GaN buffer, it was found that we can reduce dark leakage current by more than three orders of magnitude. It was also found that we can use the multi-Mg_xN_y/GaN buffer to suppress photoconductance gain, enhance UV-to-visible rejection ratio, reduce noise level and enhance the detectivity.     

Error Tolerant DNA Self-Assembly Using ( $hbox{2}k-hbox{1}$)$times$( $hbox{2}k-hbox{1}$) Snake Tile Sets

DNA self-assembly has been advocated as a possible technique for bottom-up manufacturing of scaffolds for computing systems in the nanoscale region. However, self-assembly is affected by different types of errors (such as growth and facet roughening) that severely limit its applicability. Different methods for reducing the error rate of self-assembly using tiles as basic elements have been proposed. A particularly effective method relies on snake tile sets that utilize a square block of even size (i.e., 2k times 2k tiles, k = 2, 3,.. .). In this paper, an odd-sized square block [i.e., (2k -1) times (2k - 1)] is proposed as basis for the snake tile set. Compared with other tile sets, the proposed snake tile sets achieve a considerable reduction in error rate at a very modest reduction in growth rate. Growth and facet roughening errors are considered and analytical results are presented to prove the reduction in error rate compared with an even-sized snake tile set. Simulation results are provided.     

Domain Structure in (NiFe/Au/Co/Au)$_{10}$ Multilayers With Perpendicular Anisotropy of Co Layers

Results of domain structures observation of individual Ni $_{80}$Fe $_{20}$ and Co sublayers in sputter deposited (NiFe/Au/Co/Au)$_{10}$ multilayers, using an element-sensitive method: the photoemission electron microscopy combined with soft X-ray magnetic circular dichroism, are presented. Also, overall domain structures were studied with magnetic force microscopy. The studies allowed us to reveal submicron stripe domains in the investigated samples and the replication of the stripe domains from the Co layers with perpendicular anisotropy to the NiFe layers with easy-plane anisotropy.      

Comparison of the ${mbi A}^{*}{-}{mbi A}$ and ${mbi T}, Phi{-}Phi$ Formulations for the 2-D Analysis of Solid-Rotor Induction Machines

We present two eddy-current field potential formulations to solve rotating electrical machine problems by applying the finite-element method (FEM) using the motional ${mbi A}^{*}{-}{mbi A}$-potential formulation and the motional ${mbi T}, {bf Phi}{-}{bf Phi}$-potential formulation. We use the single-phase and three-phase solid-rotor induction motors of Problem No. 30a of TEAM Workshops to compare the potential formulations. We have solved both problems in the time domain and the frequency domain.