Optical properties of the c-axis oriented LiNbO3 thin film

C-axis oriented Lithium Niobate (LiNbO₃) thin films have been deposited onto epitaxially matched (001) sapphire substrate using pulsed laser deposition technique. Structural and optical properties of the thin films have been studied using the X-ray diffraction (XRD) and UV-Visible spectroscopy respectively. Raman spectroscopy has been used to study the optical phonon modes and defects in the c-axis oriented LiNbO₃ thin films. XRD analysis indicates the presence of stress in the as-grown LiNbO₃ thin films and is attributed to the small lattice mismatch between LiNbO₃ and sapphire. Refractive index (n = 2.13 at 640 nm) of the (006) LiNbO₃ thin films was found to be slightly lower from the corresponding bulk value (n = 2.28). Various factors responsible for the deviation in the refractive index of (006) LiNbO₃ thin films from the corresponding bulk value are discussed and the deviation is mainly attributed to the lattice contraction due to the presence of stress in deposited film.     

Properties of LiNbO3 based heterostructures grown by pulsed-laser deposition for optical waveguiding application

Epitaxial LiNbO₃ (LN) thin films have been grown onto (00.1) Al₂O₃ substrates and onto sapphire covered with a conductive ZnO buffer layer. For the two systems, the LN thin films are well crystallised and highly (00.1) oriented. Epitaxial relationships between the different layers are evidenced both on the LN/sapphire film and the LN/ZnO/sapphire heterostructure. The optical waveguiding propagation losses of the LN/sapphire films are very low (1 ± 0.5 dB/cm) while the LN/ZnO/sapphire heterostructure does not exhibit satisfying waveguiding properties mainly due to the high conductivity (600 S m^− 1) of the ZnO buffer layer.     

CuInS2 thin films deposited by sol-gel spin-coating method

CuInS₂ thin films were prepared using a sol-gel spin-coating method. Copper acetate monohydrate (Cu(CH₃COO)₂·H₂O) and indium acetate (In(CH₃COO)₃) were dissolved into 2-propanol and 1-propanol, respectively. The two solutions were mixed into a starting solution. The solution was dropped onto glass substrate, rotated at 1500 rpm, and dried at 300 °C for Cu-In as-grown films. The as-grown films were sulfurized inside a graphite container box. A clear chalcopyrite phase was observed without a secondary phase. Surface roughness of the films sulfurized at 500 °C was 19.1 nm. A Raman spectra measurement confirmed that no Cu-S or In-S compounds were created in the thin films.     

Structural and optical properties of pulsed laser deposited V2O5 thin films

Pulsed laser deposited nanocrystalline V₂O₅ thin films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), high-resolution transmission electron microscopy (HRTEM) and optical spectroscopy. The films were deposited on amorphous glass substrates, keeping the O₂ partial pressure at 13.33 Pa and the substrate temperature at 220 °C. The characteristics of the films were changed by varying the laser fluence and repetition rate. XRD revealed that films are nanocrystalline with an orthorhombic structure. XPS shows the sub-stoichiometry of the films, that generally relies on the fact that during the formation process of V₂O₅ films, lower valence oxides are also created. From the HRTEM images, we observed the size evolution and distribution characteristics of the clusters in the function of the laser fluence. From the spectral transmittance we determined the absorption edge using the Tauc plot. Calculation of the Bohr radius for V₂O₅ is also reported.     

Characteristics of the precursors and their thermal decomposition during the preparation of LiNbO3 thin films by the Pechini method

Lithium niobate thin films have been deposited on Pt/Ti/SiO₂/Si(100) substrates by Pechini method. Characterization of the initial precursor solutions containing citric acid (CA), niobium and lithium ions has been performed by Fourier transform infrared spectroscopy, Raman spectroscopy and carbon nuclear magnetic resonance spectroscopy. The results indicate that citric acid coordinate to niobium ions to form a niobium-CA complex through one terminal carboxyl group, the hydroxyl group and the central carboxyl group as a tridentate ligand. The thermal decomposition of the Li-Nb precursors gel powder has been studied and the results show that LiNbO₃ phase is formed directly from the thermal decomposition of the precursor gel. By heat-treatment at 600 °C for 2 h, polycrystalline LiNbO₃ thin films with smooth and crack-free surface could be achieved.     

Structural and optical properties of Er-doped Y2Ti2O7 thin films by sol-gel method

Er³⁺-doped Y₂Ti₂O₇ and Er₂Ti₂O₇ thin films were fabricated by sol-gel spin-coating method. A well-defined pyrochlore phase Er_xY_2-xTi₂O₇ was observed while the annealing temperature exceeded 800 °C. The average transmittance of the Er_xY_2-xTi₂O₇ thin films annealed at 400 to 900 °C reduces from ∼ 87 to ∼ 77%. The refractive indices and optical band gaps of Er_xY_2-xTi₂O₇ (x = 0-2) annealed at 800 °C/1 h vary from 2.20 to 2.09 and 4.11 to 4.07 eV, respectively. The ∼ 1.53 μm photoluminescence spectrum of Er³⁺ (5 mol%)-doped Y₂Ti₂O₇ thin films annealed at 700 °C/1 h exhibits the maximum intensity and full-width at half maximum (∼ 60 nm).     

Spectroscopic ellipsometry studies on the optical constants of Bi4Ti3O12:xNa thin films grown by metal-organic chemical vapor deposition

We have deposited undoped and Na-doped epitaxial Bi₄Ti₃O₁₂ thin films on SrTiO₃(001) substrates using the liquid-delivery spin metal-organic chemical vapor deposition technique. High resolution x-ray diffraction and Raman spectroscopy measurements were employed to investigate the structural perfection and incorporation of Na ions into the film. The ellipsometric measurements were carried out in the energy range 1.49-2.75 eV and the corresponding experimental data were fitted. Two different dispersion relations, Cauchy's absorbent and Tauc-Lorentz, have been used to determine the optical constants of the films. It is observed that there is a decrease in optical band gap for increasing sodium content. Furthermore, it has been found that the refractive index and extinction coefficient also depend on the sodium content. The refractive index dispersion data obeyed the single oscillator of the Wemple-DiDomenico model, from which the dispersion parameters were determined. The optical constants tend to decrease with increasing doping content.     

New LaCu0.5Mn0.5O3 thin films deposited by the sol-gel process on different substrates

New LaCu_0.5Mn_0.5O₃ thin films deposited by the sol-gel process on ceramic Al₂O₃ and ZrO₂, glass ceramic and 101 single-crystal quartz, using the sol-gel process. It was found in all cases that the films are polycrystalline and single phase without preferred orientation. The morphology of the films depends strongly on the nature of the substrate. The films deposited on Al₂O₃ exhibit morphological characteristics making them suitable as possible sensors and catalysts.     

Characterization of Al2O3/ZrO2 nano multilayer thin films prepared by pulsed laser deposition

Microstructural characterization of pulsed laser deposited Al₂O₃/ZrO₂ multilayers on Si (1 0 0) substrates at an optimized oxygen partial pressure of 3 × 10⁻² mbar and at room temperature (298 K) has been carried out. A nanolaminate structure consisting of alternate layers of ZrO₂ and Al₂O₃ with 40 bi-layers was fabricated at different zirconia layer thicknesses (20, 15 and 10 nm). The objective of the work is to study the effect of ZrO₂ layer thickness on the stabilization of tetragonal ZrO₂ phase for a constant Al₂O₃ layer thickness of 5 nm. The Al₂O₃/ZrO₂ multilayer films were characterized using high temperature X-ray diffraction (HTXRD) in the temperature range 298–1473 K. The studies showed that the thickness of the zirconia layer has a profound influence on the crystallization temperature for the formation of tetragonal zirconia phase. The tetragonal phase content increased with the decrease of ZrO₂ layer thickness. The cross-sectional transmission electron microscope (XTEM) investigations were carried out on a multilayer thin films deposited at room temperature. The XTEM studies showed the formation of uniform thickness layers with higher fraction of monoclinic and small fraction of tetragonal phases of zirconia and amorphous alumina.     

Microstructural evolution of sol-gel derived ZnO thin films

Zinc oxide thin films, with thicknesses between ∼ 20 and 450 nm, were prepared by spin-coating a sol-gel precursor solution (zinc acetate dihydrate and monoethanolamine in an isopropanol solvent) onto glass substrates, followed by heat treatment at temperatures through 773 K. At 298 and 373 K, the films exhibited the structure of a lamellar ZnO precursor, Layered Basic Zinc Acetate (LBZA). At higher temperatures, LBZA released intercalated water and acetate groups and dehydroxylated to form zinc oxide nanograins with wurtzite structure, which were preferentially oriented in the c-axis direction. Both the degree of the films' c-axis orientation and the topography of their surfaces varied with heat treatment and precursor concentration. For films calcined at 773 K, a minimum of micron-scale surface wrinkles coincided with a maximum in c-axis preference at intermediate concentrations, suggesting that release of mechanical stress during densification of thicker films may have disrupted the ordering process that occurs during heat treatment.     

Fabrication and characterization of Cu2ZnSnS4 thin films deposited by spray pyrolysis technique

We have investigated synthesis conditions and some properties of sprayed Cu₂ZnSnS₄ (CZTS) thin films in order to determine the best preparation conditions for the realization of CZTS based photovoltaic solar cells. The thin films are made by means of spraying of aqueous solutions containing copper chloride, zinc chloride, tin chloride and thiourea on heated glass substrates at various temperatures. In order to optimize the synthesis conditions of the CZTS films, two series of experiments are performed. In the first series the sprayed duration was fixed at 30 min and in the second it is fixed at 60 min. In each series, the substrate temperature was changed from 553°K to 633°K. The X-ray diffraction shows, on one hand, that the best crystallinity was obtained for 613°K as substrate temperature and 60 min as sprayed duration. On the other hand, these CZTS films exhibit the kesterite structure with preferential orientation along the [112] direction. Atomical Force Microscopy was used to determine the grain sizes and the roughness of these CZTS thin film. After the annealing treatment, we estimated the optical band-gap energy of the CZTS thin film exhibiting the best crystallinity as 1.5 eV which is quite close to the optimum value for a solar cell.     

Epitaxial growth of LiNbO3 thin films in a microwave oven

Oriented LiNbO₃ thin films were prepared using a polymeric precursor solution deposited on (0001) sapphire substrate by spin coating and crystallized in a microwave oven. Crystallization of the films was carried out in a domestic microwave oven. The influence of this type of heat treatment on the film orientation was analyzed by X-ray diffraction and electron channeling patterns, which revealed epitaxial growth of films crystallized at 550 and 650 °C for 10 min. A microstructural study indicated that the films treated at temperatures below 600 °C were homogeneous and dense, and the optical properties confirmed the good quality of these films.     

Structural evolution and hydrogen sulfide sensing properties of NiTiO3-TiO2 sol-gel thin films containing Au nanoparticles

Thin films composed of a matrix of titanium and nickel oxides, doped with gold nanoparticles have been prepared with the sol-gel method and annealed at different time/temperature combinations. Structural characterizations demonstrate the crystallization of nickel titanate and of TiO₂-rutile due to nickel capability to promote rutile crystallization over anatase. Optical characterizations show a tunable refractive index of the samples according to the Ti/Ni ratio, and a high amount of residual porosity even after high temperature annealing. Sensor functionality measurements were performed with H₂, CO and H₂S: high sensitivity for hydrogen sulfide detection has been proved, and the cross sensitivity to the other two gases can be tuned by controlling the nickel amount. For high Ni concentrations, the matrix is composed of NiTiO₃ and TiO₂-rutile, and no cross sensitivity is experienced. For lower Ni amounts, TiO₂-anatase starts to crystallize and the films become sensitive to H₂ and CO.     

Structural and optical analysis of nanocrystalline thin films of mixed rare earth oxides (Y1-xErx)2O3

Nanocrystalline thin films of mixed rare earth oxides (Y_1-xEr_x)₂O₃(0.1 ≤ x ≤ 1) were deposited by electron beam evaporation technique on polished fused silica glass at different substrate temperatures (200-500 °C). The effect of the substrate temperature as well as the mixing parameter (x) on the structural and optical properties of these films has been investigated by using X-ray diffraction (XRD), energy dispersive x-ray analysis and optical spectrophotometry. XRD investigation shows that mixed rare earth oxides film (Y_1-xEr_x)₂O₃ grown at lower substrate temperature (T_s ≤ 300 °C) are poorly crystalline, whereas films grown at higher substrate temperatures (T_s ≥ 400 °C) tend to have better crystallinity. Furthermore, the mixing parameter (x) was found to stabilize the cubic phase over the entire of 0.1 ≤ x ≤ 1. The crystallite size of the films was found to vary in the range from 25 to 39 nm. Optical band gap of the films was deterimined by analysis of the absoprtion coeffifcient. For films deposited at different substrate temperatures direct and indirect transitions occur with energies varied from 5.29 to 5.94 eV and from 4.23 to 4.51 eV, respectively. However, films of different composition x, give optical band gap varied from 6.14 to 5.86 eV for direct transition and from 5.23 to 4.22 eV for indirect transitions. Consequently, one may conclude that it is possible to tune the energy band gap by relative fraction of constituent oxides. It was found that optical constants increase with increasing the substrate temperature. Nevertheless, the values of n and k decrease with increasing the mixing parameter, x.     

Pyrite (FeS2) thin films deposited by sol-gel method

Nanocrystalline pyrite (FeS₂) films were achieved by the sol-gel dip-coating process and sulfurization treatment. The microstructural, optical and electrical characteristics were investigated and the effect of sulfurization time on film properties was discussed. The XRD spectra show that FeS₂ film can be obtained for 1 h sulfurization and no other phase appears. The morphology of the precursor Fe₂O₃ films shows a porous and loose structure. However, with the sulfurization time increasing, the precursor films completely transformed into the pyrite films which have a compact and smooth structure. The pyrite films with a different sulfurization time have the optical absorption edges changed in the range of 0.90-0.99 eV. With the increase of sulfurization time, the carrier concentration increases and the carrier mobility decreases. It is speculated that crystallographic defects in the films could play an important role in film properties.     

Effects of Co doping on structure and optical properties of TiO2 thin films prepared by sol-gel method

Co-doped TiO₂ thin films were synthesized on quartz substrates by sol-gel method. Atomic force microscopy results indicate that the surfaces of the Ti_1 − xCo_xO₂ (0 ≤ x ≤ 0.10) films become smooth and compact with increasing Co content. X-ray diffraction results show that all the films are rutile phase structure and Co doping leads to lattice contraction. X-ray photoelectron spectroscopy results reveal that the predominant oxidation state of Co is divalent. Peak positions of Raman-active modes (B_2g, A_1g and E_g) shift to lower frequency with increasing Co content. The refractive index n at 670 nm from transmittance spectra increases with increasing Co content. The OBG varies between 3.10 and 3.26 eV. Note that optical band gap (OBG) first increases and then decreases with increasing Co content, reaching its maximum value when x is 0.03. These results suggest that the increasing mechanism of OBG is related to the decrease of grain size, compressive stress, and reduction of rutile TiO₂, and the decreasing mechanism of OBG is involved with defect and impurity. The competition of the two mechanisms leads to the strange change of OBG.     

Densification of amorphous sol-gel TiO2 films: An X-ray reflectometry study

Sol-gel TiO₂ thin films were dip coated on soda lime glass substrate using tetraisopropoxide as titania precursor. Four withdrawal speeds were tested and the resulting dried thin films have been annealed at 400 °C, 450 °C and 500 °C for 1 h. Glancing Incidence X-ray Diffraction has revealed the amorphous nature of the thin films whatever is the annealing temperature. In order to study the thin films densification, X-ray Reflectometry curves have been fitted by a three layers Parrat model and by the Distorded Wave Born Approximation (DWBA) box model which provides more details on the Electron Density Profile. The presence of high density layers localized at the film surface and at the substrate-film interface has been evidenced for the annealed films. The DWBA fitting method allows us to point out a density gradient, probably arising from the initial packing density and to the constraint due to the substrate, along the film thickness.     

Pulsed laser deposition of La0.67Ca0.33MnO3 thin films on LiNbO3 and surface acoustic wave studies

Surface Acoustic Waves on piezoelectric substrates can be used to investigate the dynamic conductivity of thin films in a non-contact and very sensitive way, especially at low conductivities. Here, we report on such surface acoustic wave studies to characterize thin manganite film like La_0.67Ca_0.33MnO₃, exhibiting a Jan Teller effect with a strong electron phonon interaction and a metal insulator transition at high temperatures.

We report on the deposition of La_0.67Ca_0.33MnO₃ on piezoelectric substrates (LiNbO₃ in different crystal cuts, employing a pulsed laser deposition technique. The structural quality of the thin films are examined by X-Ray Diffraction, Scanning Electron Microscope and Energy Dispersive X-ray spectroscopy. For the electrical characterization, we employ the surface acoustic wave technique, accompanied by conventional direct current resistance measurements for comparison.     

Microstructural study of SnO2 thin layers deposited on sapphire by sol-gel dip-coating

Tin oxide (SnO₂) films have been grown onto (006) sapphire substrates by sol-gel dip-coating using tin alkoxide solutions. It is shown, using grazing-incidence X-ray diffraction, reciprocal space mapping and atomic force microscopy, that thermal annealing at 500 °C induces the crystallization of SnO₂ in the rutile-type phase. Further annealing treatments at temperatures lower than 1100 °C give rise to slow grain growth controlled by surface diffusion, whereas rapid grain growth (controlled by an evaporation-condensation mechanism) takes place at temperatures higher than 1100 °C. Concomitantly, the film splits into isolated islands and a fibre texture occurs at higher temperatures.     

Characterization and optoelectronic properties of sol-gel-derived CuFeO2 thin films

In this study, CuFeO₂ thin films were deposited onto quartz substrates using a sol-gel and a two-step annealing process. The sol-gel-derived films were annealed at 500 °C for 1 h in air and then annealed at 600 to 800 °C for 2 h in N₂. X-ray diffraction patterns showed that the annealed sol-gel-derived films were CuO and CuFe₂O₄ phases in air annealing. When the films were annealed at 600 °C in N₂, an additional CuFeO₂ phase was detected. As the annealing temperature increased above 650 °C in N₂, a single CuFeO₂ phase was obtained. The binding energies of Cu-2p_3/2, Fe-2p_3/2, and O-1s were 932.5 ± 0.1 eV, 710.3 ± 0.2 eV and 530.0 ± 0.1 eV for CuFeO₂ thin films. The chemical composition of CuFeO₂ thin films was close to its stoichiometry, which was determined by X-ray photoelectron spectroscopy. Thermodynamic calculations can explain the formation of the CuFeO₂ phase in this study. The optical bandgap of the CuFeO₂ thin films was 3.05 eV, which is invariant with the annealing temperature in N₂. The p-type characteristics of CuFeO₂ thin films were confirmed by positive Hall coefficients and Seebeck coefficients. The electrical conductivities of CuFeO₂ thin films were 0.28 S cm^− 1 and 0.36 S cm^− 1 during annealing at 650 °C and 700 °C, respectively, in N₂. The corresponding carrier concentrations were 1.2 × 10¹⁸ cm^− 3 (650 °C) and 5.3 × 10¹⁸ cm^− 3 (700 °C). The activation energies for hole conduction were 140 meV (650 °C) and 110 meV (700 °C). These results demonstrate that sol-gel processing is a feasible preparation method for delafossite CuFeO₂ thin films.