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为了产生驱动高阻脉冲X光管的快前沿平顶脉冲,开展了级联B线主要组成单元Blumlein型脉冲网络的研究。在网络阻抗和电长度一定时,从Blumlein型脉冲形成网络级数、级电容杂散电感、开关参数和隔离电感4个方面开展了影响输出脉冲前沿、过冲、顶降、反冲和预脉冲因素的研究。研究表明级电容杂散电感和开关导通电阻使输出脉冲严重畸变。实验表明设计的网络阻抗7.8Ω,输出脉宽65.2 ns,前沿18.6 ns,与预期一致。 相似文献
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针对云闪反冲流光的电磁辐射问题,基于偶极子法建立了云闪反冲流光过程的三维电磁场计算模型,研究获得了观测方位角、反冲流光传播速度以及通道弯曲对其地面电磁场计算的影响规律.结果表明:除中间过渡场区以内的地面电场外,观测方位角越大,斜向云闪通道地面电磁场的幅值越小;反冲流光传播速度越大,相应地面电磁场的幅值越大、脉冲宽度越窄;云闪通道弯曲将导致地面电磁场波形出现不同程度的起伏波动,但沿斜向通道主干附近出现的随机弯曲,基本不会影响其地面电磁场波形的整体走势. 相似文献
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马军山 《激光与光电子学进展》2000,37(9):19-25
1 前言 飞秒级超短光脉冲的产生技术与脉冲形状及频率啁啾测量方法的研究一同发展起来。适用于这种超短光脉冲的测量方法仅有非线性相关法。其中 ,使用二次谐波产生晶体的强度自相关法正被广泛用于超短光脉冲波形测量。在该法中 ,使被测光脉冲产生一可变的时间延迟 ,使用由非线性光学晶体产生的二次谐波来测量两个脉冲的重合。该法虽然不能测量光脉冲的正确形状 ,但可获得脉冲的大概宽度。相对于此 ,近年提出了基于光电二极管及发光二极管的双光子吸收的自相关测量方法。该法通过测量双光子吸收电流来获得与二次谐波产生测量方法同样的… 相似文献
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为了研究自相似脉冲在Mach-Zehnder干涉仪的压缩特性,采用非线性薛定谔方程对自相似脉冲的演化和压缩进行了模拟,分析了基于级联单模光纤的Mach-Zehnder干涉仪的光纤参数对脉冲压缩的影响。结果表明,在不考虑高阶色散的情况下,当上臂的两种单模光纤长度分别为8.16 m和2.16 m、下臂的单模光纤长度为8.16 m时,获得半峰全宽为27.85 fs、峰值功率为1860.59 W、基座能量比例为10.241%的最佳压缩脉冲;考虑高阶色散时,脉冲在单模光纤中传输呈现出峰值功率增大、基座增大的现象,且脉冲右移不利于输出基座较小的压缩脉冲;当3阶色散系数小于0.001 ps3/km时,利用Mach-Zehnder干涉仪来压缩能获得质量较好的飞秒脉冲。该研究结果对于自相似脉冲的压缩研究具有一定的参考价值。 相似文献
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基于交叉相位调制的高阶孤子压缩效应的研究 总被引:1,自引:0,他引:1
从描述双脉冲传输的耦合非线性薛定谔方程组出发,利用分步傅立叶变换方法,研究了高阶孤子脉冲的压缩效应。结果表明,在交叉相位调制(XPM)的作用下,高阶孤子在传输过程中不仅可被压缩,且存在着最佳压缩光纤长度;采用超高斯脉冲作为初始输入波形更易获得较短的压缩光脉冲;在泵浦脉冲脉宽一定的条件下,信号脉冲的压缩因子随着其初始输入脉宽的增加而增大。 相似文献
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An anomalous output voltage overshoot observed during the turn-off of single short-channel thin-film silicon-on-insulator SOI n-MOSFETs is reported. The parasitic floating-base bipolar device, triggered by impact ionization, is shown to be responsible for this effect. Because switching occurs over a subnanosecond time scale, the charge dynamics related to the bipolar action are essential to explain this voltage overshoot 相似文献
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《Photonics Technology Letters, IEEE》2009,21(5):271-273
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S. Tirano L. PerniolaJ. Buckley J. CluzelV. Jousseaume Ch. MullerD. Deleruyelle B. De SalvoG. Reimbold 《Microelectronic Engineering》2011,88(7):1129-1132
In this paper, a peculiar attention is turned towards the understanding of the current overshoot occurring during the forming operation in resistive switching memory devices. This phenomenon is attributed to the discharge of a parasitic capacitance in parallel to the resistive device in simple 1R (one resistor, no transistor/diode selector) architectures. The impact of such an overshoot is analyzed on both NiO and HfO2-based memory elements by performing measurements with different setups (quasi-static and pulse measurements). We show that the parasitic event is more severe as the forming voltage in the memory device increases. Moreover, it is shown that the post-forming resistance cannot be simply adjusted by a current compliance available on semiconductor parameter analyzers, since this internal limiter is ineffective in the microsecond range for compliance levels lower than the current spike. The current overshoot playing a detrimental role on the electrical performances of resistive devices, it must be carefully monitored when assessing the electrical performances in simple 1R architectures. 相似文献
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A novel scheme to generate a subnanosecond pulse in VUV spectral region is proposed, by applying a dual-wavelength pumping method in conjunction with polarization switching technique to the stimulated rotational Raman scattering process. Optimum conditions for the efficient conversion and short pulse generation are presented through numerical model calculations. It is theoretically shown that the duration of the first anti-Stokes pulse of a VUV pump laser can be shorten to 0.72 ns. Since the anti-Stokes pulse is generated at a frequency within the gain profile of the pump laser, the proposed process is applicable to a seed pulse generation for subnanosecond pulse amplification by the pump laser medium in the VUV region 相似文献
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Shows the results of studies of noise induced by various combinations of parasitic capacitances and inductances. Interconnects are simulated with parameters obtained from a 0.18 /spl mu/m process. The four kinds of noise addressed are (i) crosstalk pulse; (ii) crosstalk speedup and slowdown; (iii) oscillatory noise; (iv) combination of oscillatory noise and crosstalk pulse. The crosstalk effects induced by a combination of mutual capacitance and mutual inductance can be larger than those induced by mutual capacitance alone, even if capacitive crosstalk dominates. For certain interconnects that are capacitively and inductively coupled, transitions in the same direction on an aggressor and victim line can cause speedup or slowdown, depending on timing parameters. A similar observation holds for transitions in opposite directions. We also observe that oscillatory noise can combine with crosstalk pulse under certain skew conditions and give rise to a large magnitude of noise. We show that inductance induced noise can be a problem in medium length interconnects. Because such interconnects can occur in combinational logic blocks, the generation of suitable vectors for test and validation of such logic blocks is of concern. 相似文献
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《Photonics Technology Letters, IEEE》2009,21(12):769-771
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Antenna radiation pattern measurement using time-to-frequency transformation (TFT) techniques 总被引:1,自引:0,他引:1
A method of inferring microwave antenna radiation patterns over wide bandwidths from a series of subnanosecond pulse measurements is described. Monochromatic patterns can be inferred from the time-domain measurements with simple apparatus. Results are presented which show that the method is inherently insensitive to errors caused by reflections from the environment. 相似文献
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Allan David W. Alley Carroll O. Decher Rudolf Vessot Robert F. C. Winkler Gernot 《Geoscience and Remote Sensing, IEEE Transactions on》1982,(3):321-325
The concept of a high-accuracy global time and frequency transfer system is discussed. A hydrogen maser clock onboard a space vehicle combined with a microwave Doppler cancellation system can provide direct frequency transfer with an accuracy of 10-14 and time transfer accurate to 1 ns. The addition of short pulse laser techniques provides subnanosecond time transfer accuracy which can be used to calibrate the microwave system. 相似文献
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How overshoot in the step response of a circuit involving an RLC line can be controlled using a combination of driver and line resistance that depends on the load capacitance is shown. The no-peak condition or its equivalent is used to relate line parameters to the driver and load impedances. This no-peak condition generalizes the impedance matching customarily used for lossless lines, i.e. it provides an alternative to the traditional choice R D=√ L /C . The results allow improved circuit response without risk of overshoot, for example, by reduction of driver resistance below √L /C for cases where line resistance is unavoidable and/or where load capacitance is not negligible compared to line capacitance. The algebraic formulas derived are more effective than case-by-case numerical simulations for analyzing scaling and technology issues, whether on-chip, or at the packaging, board, or system levels 相似文献