全差分结构流水线A/D转换器的研究与仿真

为了研究流水线A／D转换器结构和进一步提高转换器的性能，本文A／D转换器采用全差分结构形式，并利用Pspiee对全差分结构流水线A／D转换器基本模块进行了行为建模和仿真。为了验证行为模型的正确性。利用这些基本模型设计了一个1．5位，级10位流水线A／D转换器系统，并进行了仿真，最后给出了模拟结果。     

超高速数据采集及分析平台的设计与验证

设计并实现了超高速数据采集及分析平台,由FPGA数据采集激励板卡、测试分析软件和PC机构成,该系统用于JESD204C接口协议的模数转换器(ADC)和数模转换器(DAC)的测试分析。从元器件选型、PCB设计与仿真、激励和软件测试三个方面进行平台的搭建,以保证平台能够在JESD204C协议的传输速率下稳定运行。基于该平台对一款6 GSPS双通道16位ADC和12 GSPS四通道16位DAC芯片进行动态性能测试,测试结果显示,ADC的SNR为56.3 dBFS,DAC的SFDR为65.5 dBFS,性能指标与手册值接近,表明该数据采集平台的功能与性能得到验证,可推广至JESD204C接口协议的其他芯片的测试,具备一定的通用性。     

Time domain modelled ADC BIST with ramp noise projection

This paper proposes a time domain modelled built-in self-test (BIST) with ramp noise projection and their effects on analogue to digital converter (ADC) in testing. A self-biased linear ramp generator has been proposed for high precision testing. Threshold inversion quantization (TIQ) comparator based fast switching flash ADC has considered under test. A time domain model of output response analysis technique has been proposed to calibrate the linearity errors of the converter. An ADC has been validated with different input frequencies to characterize the harmonic distortion and average delay of the system. The proposed testing technique requires less time to measures the uncertainties of the ADC since the full computation is performed within one ramp cycle. The testing results of the proposed BIST technique are aimed to characterize, validate and compare to the best results of the existing ADC BIST techniques for test accuracy.     

An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration

This paper presents a self-testing and calibration technique for the embedded successive approximation register (SAR) analog-to-digital converter (ADC) in system-on-chip (SoC) designs. We first proposed a low cost design-for-test (DfT) technique that estimates the SAR ADC performance before and after calibration by characterizing its digital-to-analog converter (DAC) capacitor weights (bit weights). Utilizing major carrier transition (MCT) testing, the required analog measurement range is only about 1 LSB; this significantly reduces test circuitry complexity. Then, we develop a fully-digital calibration technique that utilizes the extracted bit weights to correct the non-ideal I/O behavior induced by capacitor mismatch. Simulation results show that (1) the proposed testing technique achieves very high test accuracy even in the presence of large noise, and (2) the proposed calibration technique effectively improves both static and dynamic performances of the SAR ADC.     

16位流水线ADC系统级建模及仿真

基于MATLAB/Simulink的平台,设计并实现了16bit 100M流水线模数转换器(ADC)系统仿真的理想模型.在充分掌握流水线ADC整体结构基础上,对其基本模块进行建模,充分考虑并加入电路的非理想特性和噪声,使整个系统模型接近实际电路.在输入信号为40MH2,采样时钟频率为100MHz时,分别对理想模型和加入非理想因素后的模型进行仿真比较,得到各项性能指标.对实际电路的设计具有一定的借鉴作用.     

一种0.18μm数字工艺的12bit 100MS/s流水线型ADC设计

描述一个基于TSMC 0.18μm数字工艺的12 bit 100 Ms/s流水线模数转换器的设计实例。该模数转换器采用1.5bit每级结构,电源电压为1.8V。包括十级1.5 bit/stage和最后一级2bit Flash模数转换器,共产生22bit数字码,数字码经过数字校正电路产生12 bit的输出。该模数转换器省去了采样保持电路,电路模块包括:各个子流水级、共模电压生成模块、带隙基准电压生成模块、开关电容动态偏置模块、系统时钟生成模块、时间延迟对齐模块和数字校正电路模块。为了实现低功耗设计,在电路设计中综合采用了输入采样保持放大器消去、按比例缩小和动态偏置电路等技术。ADC实测结果,当以100 MHz的采样率对10MHz的正弦输入信号进行采样转换时,在其输出得到了73.23dB的SFDR,62.75dB的SNR,整体功耗仅为113mW。     

加扰技术对模数转换器性能的影响

分析了加扰技术改善ADC性能的基本原理,通过选择合适的扰动信号注入到理想量化器模型中进行仿真,验证了加扰技术能够随机化量化误差的周期性三角形分布。在加扰技术的实际应用中,首先基于10 bit 25 MS/s Pipelined ADC模型完成加扰仿真,仿真得到ADC的SFDR由74.69 dB提高到了85 dB。然后对两种ADC芯片进行加扰实验,该加扰技术使两种ADC芯片的SFDR分别提高了8.29 dB和5.97 dB。理论仿真和实验验证了加扰技术可以明显提高ADC的SFDR,为后期ADC内部集成加扰电路模块做好了准备工作。     

Efficient Look-Up-Table-Based Modeling for Robust Design of Σ∆ ADCs

The sigma-delta (SigmaDelta) analog-digital converter (ADC) has been widely used in data conversion applications due to its good performance. However, oversampling and complex circuit behaviors render the transistor-level analysis of these designs prohibitively time consuming. The inefficiency of the standard simulation approach also rules out the possibility of analyzing the impacts of a multitude of environmental and process variations critical in modern VLSI technologies. We present a look-up table (LUT)-based modeling technique to facilitate much more efficient performance analysis of SigmaDelta ADCs. Various transistor-level circuit nonidealities are systematically characterized at the building block level and the whole system is simulated much more efficiently using these building block models. Our approach can provide up to four orders of magnitude runtime speedup over SPICE-like simulators, hence significantly shortening the CPU time required for evaluating system performances such as signal-to-noise-and-distortion ratio. The proposed modeling technique is further extended to enable scalable performance variation analysis of complex SigmaDelta ADC designs. Such modeling approach allows us to perform trade-off analysis of various topologies considering not only nominal performances but also their variabilities. Equally important, with our efficient parametric modeling technique, we are able to feasibly extract simulation-based statistical performance correlation models allowing low-cost alternate linearity test of ADC designs.     

一种流水线型ADC的时序改进技术研究

对一种流水线型模数转换器(ADC)的时序电路进行了改进研究。改进时序延长了余量增益单元MDAC部分加减保持相位的时长,可以在不增加功耗与面积的情况下,将一种10位流水线型ADC在20 MS/s采样率下的有效位(ENOB)从9.3位提高到9.8位,量化精度提高了5%;将该ADC有效位不低于9.3位的最高采样率从21 MS/s提高到29 MS/s,转换速度提高了35%。ADC的采样频率越高,改进时序带来的效果越显著。该项技术特别适用于高速高精度流水线型ADC,也为其他结构ADC的高速高精度设计提供思路。     

一种具有采样时间扩展功能的异步SAR ADC

SAR ADC每个转换周期的大部分时间被分配给ADC的量化操作,而只剩下少量的时间用来进行信号采样。在短时间内完成高精度的采样,需要前级电路具有更大驱动能力,同时要求ADC的采样开关具有更低的导通电阻。提出了一种交替采样结构,可以在不减少ADC量化时间的前提下,使得SAR ADC的采样时间等于量化时间,由此极大地降低ADC驱动电路的功耗。本文采用上述技术基于Fujitsu 55 nm工艺,实现了40 Msps 10 bit的异步SAR ADC,测试显示ADC有效位可达9.7 bit。     

ADC模拟输入阻抗测试及窄带网络匹配技术

讨论了高速流水线ADC模拟输入前端的一般结构及其等效模型,在此基础上介绍了该类型ADC模拟输入端的阻抗测量原理和一种适用于窄带应用的ADC模拟输入端谐振匹配网络设计方法。最后,以某14位250 MS/s无缓冲ADC为例,详细介绍了模拟输入阻抗测量以及匹配设计步骤,并给出匹配优化后的测试结果。     

An 8/10 bit 200/100MS/s configurable asynchronous SAR ADC

This paper presents an asynchronous 8/10 bit configurable successive approximation register analog-to-digital converter (ADC). The proposed ADC has two resolution modes and can work at a maximal sampling rate of 200 and 100MS/s for 8 bit mode and 10 bit mode respectively. The ADC uses a custom-designed 1 fF unit capacitor to reduce the power consumption and settling time of capacitive DAC, a dynamic comparator with tail current to minimize kickback noise and improve linearity. Moreover, asynchronous control technique is utilized to implement the ADC in a flexible and energy-efficient way. The proposed ADC is designed in 90 nm CMOS technology. At 100MS/s and 1.0 V supply, the ADC consumes 1.06 mW and offers an ENOB of 9.56 bit for 10 bit mode. When the ADC operates at 8 bit mode, the sampling rate is 200MS/s with 1.56 mW power consumption from 1.0 supply. The resulted ENOB is 7.84 bit. The FOMs for 10 bit mode at 100MS/s and 8 bit mode at 200MS/s are 14 and 34 fJ/conversion-step respectively.     

一种用于高精度ADC片上测试的信号发生器

随着模/数转换器（ADC）性能的提高,如何用最有效的方法对ADC进行准确而快捷的测试,成为当今研究的热点问题。提出了一种应用于高精度ADC片上测试的高精度高线性度模拟三角波信号发生器。该信号发生器由方波积分器和迟滞比较器反馈控制电路组成,可为精度高达14 b的模/数转换器的静态特性测试提供足够精度的片上测试激励。仿真结果表明,该信号发生器所生成的三角波电压范围为82 mV~1.719 V,周期为366 μs,INL小于24 μV,等效精度达到16 b以上,具有非常高的线性度,并且可根据所需要的周期和幅度进行方便而有效的调整。     

ADC测试中INL与THD之间的关系

随着ADC测试技术的不断发展,码密度直方图技术以及采用正弦波输入的离散傅里叶变换(DFT)频域分析技术已经被广泛应用到ADC的仿真和测试分析中。相对于采用DFT进行频域分析获取ADC的动态性能的复杂性来说,采用码密度直方图的方法能简单地得到微分非线性(DNL)和积分非线性(INL)这两个静态性能指标。文章通过对一个10位ADC的行为级模型的仿真分析,阐述了总谐波失真(THD)与INL之间的内在联系,从而提出了通过对INL的测试来评估ADC的THD性能的方法,对今后ADC电路的测试和评估具有指导意义。     

关于ADC测试平台的探讨

介绍了ADC动态指标测试的常用方法和测试平台的基本组成,着重分析了对ADC性能测试时,输入采样时钟抖动对ADC动态性能的影响。同时还对测试信号频率和幅度的选择以及供电电源的指标与ADC动态的关系进行了详细分析。ADC测试平台的研究,对于ADC板卡设计及动态性能测试有一定的指导意义。     

Testing high resolution ΣΔ ADC's by using the quantizer input as test access

A new solution to improve the testability of high resolution ΣΔ Analogue to Digital Converters (ΣΔ ADC's) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, fourth order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques. If only SNR, THD and gain of the ΣΔ ADC are evaluated with the new proposed method the test time is already reduced by 20%.     

The Research and Application of ATM Testing

The Research and Application of ATM Testing     

高速A/D转换器单粒子效应实时评估系统和方法研究

提出了一种在线实时检测评估高速A/D转换器(ADC)的单粒子效应的测试方法。基于该方法搭建了部分模块可复用的单粒子效应测试评估系统。系统由时钟生成模块、待测ADC模块、D/A转换器(DAC)转换输出模块、FPGA控制模块与上位机模块构成。对待测ADC模块进行重构,可完成对不同ADC器件的测试评估,提升了模块可复用性和测试效率。该系统通过监测电源引脚的电流变化、ADC内部寄存器值翻转情况、经过高速DAC转换输出的模拟波形,可实时测试评估ADC器件的单粒子锁定(SEL)、单粒子翻转(SEU)、单粒子瞬态(SET)、单粒子功能中断(SEFI)等效应。基于该系统对自主研发的具有JESD204B接口的12位2.6 GS/s高速ADC进行了单粒子效应试验。试验分析表明,该系统能准确高效评估高速ADC器件的单粒子效应。     

高精度模数转换器积分非线性建模与校正

积分非线性（INL）是影响ADC性能重要的参数。文中采用基于建立动态模型的方法,对高精度模数转换器芯片AD6645的积分非线性进行建模与校正,使得AD6645的性能得到大幅提升。测试结果表明,在30 MHz带宽范围内,ADC的无杂散动态范围、信纳比和有效位数等指标均得到提高。另外,此校准算法具有一定的普适性,有望适用于所有流水线ADC的校准。     

A data optimization test technique for characterizing embedded ADCs

A novel data optimization test technique is presented which utilizes a BIST structure, an ADC model and histogram data to characterize embedded ADCs. A practical 8 bit ADC is modeled and then characterized using 20% less data points then conventional analysis with a 78% reduction in the amount of data required to be shifted off-chip. Comparisons between theoretical, modeled and practical results are also made in the paper.