确信电子推出低银无铅波峰焊和返工合金

确信电子推出了最新的ALPHA Vaculoy SACX 0307 Plus低银无铅波峰焊和返工合金,用于替代锡铅和SAC305的高性能产品。这是确信电子最初于2004年推出、深受欢迎的ALPHASACX合金系列后的新一代低银合金。ALPHA SACX 0307 Plus能达到与ALPHA SACX 0307同样高的标准表现,还有较低的铜溶解率的优点。     

无铅焊料的选择与对策

本文通过大量的数据信息分析了各研究机构在无铅焊料方面的研究成果，在目前流行使用的无铅焊料的基础上，进一步研究并比较了其中的Sn—Cu系列与具有专利限制的SnAgcu系列焊料在消费类电子产品组装的波峰焊工艺中使用的可靠性，同时研究并比较Sn—Ag系列焊料与SnAgcu系列焊料在回流焊工艺使用的情况。结果表明，Sn—Cu共晶焊料在消费类电子产品组装的波峰焊工艺中完全可以取代Sn-Ag-Cu系列焊料，同时满足使用要求；而同样技术成熟的Sn—Ag共晶焊料也完全可以取代SnAgCu系列焊料在回流焊工艺使用，焊点的可靠性与成本可以媲美SnAgcu焊料，而且该二元合金在使用维护以及回收利用方面具有相当的优势。因此，国内相关企业应大力推动使用无专利限制的SnAg与SnCu共晶焊料，以改变国外专利产品在电子制造领域的统治地位，使我国企业在无铅化电子制造的潮流中占有一席之地.     

无铅焊料的选择与对策

通过大量的数据信息分析了各研究机构在无铅焊料方面的研究成果,在目前流行使用的无铅焊料的基础上,进一步研究并比较了其中的Sn-Cu系列与具有专利限制的SnAgCu系列焊料在消费类电子产品组装的波峰焊工艺中使用的可靠性,同时研究并比较Sn-Ag系列焊料与SnAgCu系列焊料在回流焊工艺使用的情况.结果表明,Sn-Cu共晶焊料在消费类电子产品组装的波峰焊工艺中完全可以取代Sn-Ag-Cu系列焊料,同时满足使用要求;而同样技术成熟的Sn-Ag共晶焊料也完全可以取代SnAgCu系列焊料在回流焊工艺使用,焊点的可靠性与成本可以媲美SnAgCu焊料,而且该二元合金在使用维护以及回收利用方面具有相当的优势.     

无铅焊料的选择与对策（未完待续）

通过大量的数据信息分析了各研究机构在无铅焊料方面的研究成果，在目前流行使用的无铅焊料的基础上，进一步研究并比较了其中的Sn-Cu系列与具有专利限制的SnAgCu系列焊料在消费类电子产品组装的波峰焊工艺中使用的可靠性，同时研究并比较Sn-Ag系列焊料与SnAgCu系列焊料在回流焊工艺使用的情况。结果表明，Sn-Cu共晶焊料在消费类电子产品组装的波峰焊工艺中完全可以取代Sn-Ag-Cu系列焊料，同时满足使用要求；而同样技术成熟的Sn-Ag共晶焊料也完全可以取代SnAgCu系列焊料在回流焊工艺使用，焊点的可靠性与成本可以媲美SnAgCu焊料。而且该二元合金在使用维护以及回收利用方面具有相当的优势。     

低银无铅焊料润湿及可靠性能研究

利用润湿测量法研究了低银无铅焊料SAC0307、SAC0507和SAC0807的润湿性能,发现上述低银焊料润湿性能几乎相同.通过波峰焊接实验鉴定了其溶解铜焊盘性能,发现所做短时间溶铜实验中上述低银焊料的低银焊料的溶铜速度几乎相同.温度循环实验后检测了金属间化合物生长及裂纹发生情况,确定低银无铅焊料SAC0807裂纹萌生率最低.所作实验研究中皆采用共晶锡银焊料SAC305作为参照焊料.     

锡铜无铅焊料在电路板组装中的应用

在无铅组装工艺中,大多数电路板组装厂优先采用低成本焊料合金。没有添加剂的锡铜无铅焊料本身存在局限性,可是添加某种成份后,就能克服锡铜焊料通常所遇到的不足之处。文章分析了几种锡铜焊料相对于SAC焊料的特点,并叙述了它们在波峰焊和手工焊接工艺中的应用情况。     

新型低银钎料SAC0307X的研究

研究了一种新型低银无铅钎料SAC0307X的合金组织结构、熔化特性、力学性能、润湿性、熔铜性和抗氧化特性,并与SAC0307和SAC305进行了对比,结果显示SAC0307X抗拉强度55 MPa,延伸率48%,与SAC305相当;熔点为212.4~227.5℃,固相线相比SAC0307有所下降;最大润湿力0.54 m N,润湿时间0.79 s,均优于SAC305;另外在熔铜率、抗氧化性等方面均优于钎料SAC305。     

确信电子ALPHA SACX无铅合金系列推出新产品ALPHA SACX0807

为进一步扩展全球公认的低银波峰焊接合金ALPHA SACX0307的能力,确信电子宣布在全球推出新产品--ALPHA SACX0807.该产品能于要求极好润湿能力的复杂双面焊接组件上达致与SAC305般的性能,即使是高压热循环,它仍具有良好的机械可靠性.     

焊料应满足无铅和效益双重要求

对于电子组装制造商而言，无铅电子组装技术主要针对印刷电路板级组装，即使用的单元材料达到无铅的标准，同时使用符合无铅规范材料的设备和工艺以及最终产品达到必需的可靠性要求。其中，在印刷电路板级细装过程的浸焊、波峰焊及回流焊等焊接工艺中，锡丝、锡条、锡膏是最广泛使用的电子焊接焊料，因此拥有广阔的应用市场。对于这类焊接材料，焊料合金成分对于产品的价格、品质性能和效率起着决定性的影响。因此，电子产品制造商迫切需要一种在成本、质量和效率三者之间取得平衡的无铅焊料满足市场对于无铅和效益的双重要求。     

共晶Sn3.8Ag0.7Cu焊料在Fe-Ni镀层上的反应润湿行为

用电镀工艺制备了Fe-Ni镀层,研究了还原气氛保护下共晶Sn3.8Ag0.7Cu焊料在Fe-Ni镀层上的反应润湿行为。结果表明:在共晶Sn3.8Ag0.7Cu与Fe-74Ni反应润湿体系观察到了伪部分润湿行为。在铺展球冠的前沿,可以明显地看到有液态膜伸出主液体铺展前沿。随着回流时间的增加,液态膜逐渐长大。共晶Sn3.8Ag0.7Cu焊料与Fe-74Ni电镀合金层的液固界面生成了一层FeSn2化合物,还有大量Cu/Ni/Sn化合物进入焊料内部。     

Development of lead-free wave soldering process

Lead-free wave soldering was studied in this work using a 95.5Sn/3.8Ag/0.7Cu alloy. A process DOE was developed, with three variables (solder bath temperature, conveyor speed, and soldering atmosphere), using a dual wave system. Four no-clean flux systems, including alcohol- and water-based types, were included in the evaluation. A specially designed "Lead-Free Solder Test Vehicle", which has various types of components, was used in the experiments. Both organic solderability preservative (OSP) and electroless nickel/immersion gold (Ni/Au, or ENIG) surface finishes were studied. Soldering performance (bridging, wetting and hole filling) was used as the responses for the DOE. In addition, dross formation was measured at different solder bath temperatures and atmospheres. Dross formation with Sn/Ag/Cu bath was compared to that with eutectic Sn/Pb bath. Regarding the connector-type component, a pad design giving the best soldering performance was evaluated based on the DOE results. Finally, a confirmation run with the optimum flux and process parameters was carried out using the Sn/Ag/Cu solder, and a comparative run was made with the Sn/Pb solder alloy and a no-clean flux used in production. The soldering results between the two runs indicate that with optimum flux and process parameters, it is possible to achieve acceptable process performance with the Sn/Ag/Cu alloy.     

Effect of Isothermal Aging on the Long-Term Reliability of Fine-Pitch Sn–Ag–Cu and Sn–Ag Solder Interconnects With and Without Board-Side Ni Surface Finish

The combined effects on long-term reliability of isothermal aging and chemically balanced or unbalanced surface finish have been investigated for fine-pitch ball grid array packages with Sn–3.0Ag–0.5Cu (SAC305) (wt.%) and Sn–3.5Ag (SnAg) (wt.%) solder ball interconnects. Two different printed circuit board surface finishes were selected to compare the effects of chemically balanced and unbalanced structure interconnects with and without board-side Ni surface finish. NiAu/solder/Cu and NiAu/solder/NiAu interconnects were isothermally aged and thermally cycled to evaluate long-term thermal fatigue reliability. Weibull plots of the combined effects of each aging condition and each surface finish revealed lifetime for NiAu/SAC305/Cu was reduced by approximately 40% by aging at 150°C; less degradation was observed for NiAu/SAC305/NiAu. Further reduction of characteristic life-cycle number was observed for NiAu/SnAg/NiAu joints. Microstructure was studied, focusing on its evolution near the board and package-side interfaces. Different mechanisms of aging were apparent under the different joint configurations. Their effects on the fatigue life of solder joints are discussed.     

Drop impact reliability of Sn–1.0Ag–0.5Cu BGA interconnects with different mounting methods

The poor drop-shock resistance of near-eutectic Sn–Ag–Cu (SAC) solder interconnects drives the research and application low-Ag SAC solder alloys, especially for Sn–1.0Ag–0.5Cu (SAC105). In this work, by dynamic four-point bend testing, we investigate the drop impact reliability of SAC105 alloy ball grid array (BGA) interconnects with two different surface mounting methods: near-eutectic solder paste printing and flux dipping. The results indicate that the flux dipping method improves the interconnects failure strain by 44.7% over paste printing. Further mechanism studies show the fine interfacial intermetallic compounds (IMCs) at the printed circuit board side and a reduced Ag content inside solder bulk are the main beneficial factors overcoming other negative factors. The flux dipping SAC105 BGA solder joints possess fine Cu₆Sn₅ IMCs at the interface of solder/Cu pads, which increases the bonding strength between the solder/IMCs and the fracture resistance of the IMC grains themselves. Short soldering time of flux dipping joints above the solder alloy liquidus mitigates the growth of interfacial IMCs in size. In addition, a reduced Ag content in flux dipping joint bulk causes a low hardness and high compliance, thus increasing fracture resistance under higher-strain rate conditions.     

Design Envelopes and Optical Feature Extraction Techniques for Survivability of SnAg Lead-free Packaging Architectures Under Shock and Vibration

In this paper, a design-envelope approach based on optical feature extraction techniques has been investigated for drop and shock survivability of electronic packaging has been presented for 6-lead-free solder alloy systems. Solder alloy systems investigated include, Sn1Ag0.5Cu, Sn3Ag0.5Cu, Sn0.3Ag0.7Cu, Sn0.3Ag0.7Cu0.1Bi, Sn0.2Ag0.7Cu0.1Bi-0.1Ni, 96.5Sn 3.5Ag. Previously, digital image correlation (DIC) has been used for measurement of thermally induced deformation and material-characterization. In this paper, DIC has been used for transient dynamic measurements, and optical feature extraction. Board assemblies have been subjected to shock-impact in various orientations including the JEDEC zero-degree drop and the vertical free-drop. Transient deformation has been measured using both digital image correlation and the strain gages. Measurements have been taken on both the package and the board side of the assemblies. Accuracy of high-speed optical measurement has been compared with that from discrete strain gages. Package architectures examined include-flex ball-grid arrays, tape-array ball-grid arrays, and metal lead-frame packages. Explicit finite-element models have been developed and correlated with experimental data. Models developed include, smeared property models, and Timoshenko-beam models. The potential of damage identification and tracking for various solder alloys has been investigated. Data on identification of damage proxies for competing failure mechanisms at the copper-to-solder, solder-to-printed circuit board, and copper-to-package substrate has been presented. Design envelopes have been developed based on statistical pattern recognition. The design-envelope is intended for component integration to ensure survivability in shock and vibration environments at a user-specified confidence level.     

The performance and fracture mechanism of solder joints under mechanical reliability test

The drop resistance and fracture behavior of Sn–37Pb, Sn–3.0Ag–0.5Cu (SAC305), Sn–1.0Ag–0.5Cu (SAC105), and Sn–8.5Zn–0.5Ag–0.01Al–0.1 Ga (SnZn-5e) solder ball joints under the board-level drop test (BLDT) and the ball impact test (BIT) were studied. The results show that the drop reliabilities in terms of the characteristic life ratio from the Weibul plot are SnZn-5e : Sn–37Pb:SAC105:SAC305 = 3.1:2.9:2.1:1. It was observed that failure of Sn–37Pb occurred at the eutectic tin–lead phase whereas it took place at the brittle interface between the (Cu,Ni)₆Sn₅ inter-metallic compound and Ni layer in SAC305. The failure of SAC105 was found to be located within the solder matrix as well as at the interface of the inter-metallic compound. The failure of SnZn-5e depends on the morphology of the interfacial inter-metallic compound. The failure modes of Sn–37Pb and SAC305 after the BIT were similar to those after the BLDT. The maximum impact force (F_max) and the initial fracture energy (E) from the BIT can be used to evaluate the drop reliability of solder joints.     

Enhancing the microstructure and tensile creep resistance of Sn-3.0Ag-0.5Cu solder alloy by reinforcing nano-sized ZnO particles

Sn-Ag-Cu lead-free solders are regarded as a potential substitute for Pb-Sn solder alloys. In the current study, the non-reacting, non-coarsening ZnO nano-particles (ZnO NPs) were successfully incorporated into Sn–3.0Ag–0.5Cu (SAC305) lead-free solder by mechanical mixing of ZnO powders and melting at 900 °C for 2 h. Tensile creep testing was performed for plain SAC305 solder and SAC305-0.7 wt% ZnO NPs composite solders and a Garofalo hyperbolic sine power-law relationship was created from the experimental data to predict the creep mechanism as a function of tensile stress and temperature. Based on the tensile creep results, the creep resistance of SAC305 solder alloy was improved considerably with ZnO NPs addition, although the creep lifetime was increased. From microstructure observation, reinforcing ZnO NPs into SAC305 solder substantially suppressed the enlargement of Ag₃Sn and Cu₆Sn₅ intermetallic compound (IMC) particles and decreased the spacing of the inter-particles between them, reduced the grain size of β-Sn and increased the eutectic area in the alloy matrix. The modification of microstructure, which leaded to a strong adsorption effect and high surface-free energy of ZnO NPs, could result in hindering the dislocation slipping, and thus provides standard dispersion strengthening mechanism. Moreover, the average activation energy (Q) for SAC305 and SAC305-0.7ZnO alloys were 50.5 and 53.1 kJ/mol, respectively, close to that of pipe diffusion mechanism in matrix Sn.     

Properties of Sn3.8Ag0.7Cu Solder Alloy with Trace Rare Earth Element Y Additions

In the current research, trace rare earth (RE) element Y was incorporated into a promising lead-free solder, Sn3.8Ag0.7Cu, in an effort to improve the comprehensive properties of Sn3.8Ag0.7Cu solder. The range of Y content in Sn3.8Ag0.7Cu solder alloys varied from 0 wt.% to 1.0 wt.%. As an illustration of the advantage of Y doping, the melting temperature, wettability, mechanical properties, and microstructures of Sn3.8Ag0.7CuY solder were studied. Trace Y additions had little influence on the melting behavior, but the solder showed better wettability and mechanical properties, as well as finer microstructures, than found in Y-free Sn3.8Ag0.7Cu solder. The Sn3.8Ag0.7Cu0.15Y solder alloy exhibited the best comprehensive properties compared to other solders with different Y content. Furthermore, interfacial and microstructural studies were conducted on Sn3.8Ag0.7Cu0.15Y solder alloys, and notable changes in microstructure were found compared to the Y-free alloy. The thickness of an intermetallic compound layer (IML) was decreased during soldering, and the growth of the IML was suppressed during aging. At the same time, the growth of intermetallic compounds (IMCs) inside the solder was reduced. In particular, some bigger IMC plates were replaced by fine, granular IMCs.     

添加Sb和LaB6对Sn3.0Ag0.5Cu/Cu界面IMC生长的影响

研究了Sb和稀土化合物的添加对Sn3.0Ag0.5Cu无铅焊料焊接界面金属间化合物层生长的影响。研究结果表明,固态反应阶段界面化合物层的生长快慢排序如下:v(SAC0.4Sb0.1LaB6/Cu)v(SAC0.4Sb/Cu)v(SAC0.1LaB6/Cu)v(SAC/Cu)。计算各种界面IMC生长的激活能Q结果表明,Sn3.0Ag0.5Cu/Cu界面IMC生长的激活能最高,为92.789 kJ,其他焊料合金Sn3.0Ag0.5Cu0.4Sb0.1LaB6/Cu,Sn3.0Ag0.5Cu0.1LaB6/Cu和Sn3.0Ag0.5Cu0.4Sb/Cu界面IMC生长的激活能分别为85.14,84.91和75.57 kJ。在老化温度范围内(≤190℃),Sn3.0Ag0.5Cu0.4Sb0.1LaB6/Cu的扩散系数(D)最小,因而其界面化合物的生长速率最慢。     

Interfacial reaction and mechanical reliability of PTH solder joints with different solder/surface finish combinations

The effects of minor Ni addition (0.05 wt.%) on the microstructures and mechanical reliability of the lead-free solder joints used in the pin through hole (PTH) components were carefully investigated using a scanning electron microscope (SEM), a field-emission electron probe x-ray microanalyzer, and a pull tester. The PTH walls (i.e., Cu) of printed circuit boards (PCBs) were coated with organic solderability preservative (OSP) or electroless nickel/immersion gold (ENIG) surface finish before soldering. During soldering, the pins of the electronic components were first inserted into the PTHs deposited with OSP or ENIG, and then joined using a Sn–3Ag–0.5Cu (SAC) solder bath through a typical wave-soldering process. After wave soldering, a rework (the second wave soldering) was performed, where an SAC or Sn–0.7Cu–0.05Ni (SCN) solder bath was employed. The SCN joints were found to possess a higher tensile strength than the SAC ones in the OSP case. The sluggish growth of Cu₃Sn, along with few Kirkendall voids at the solder/Cu interface caused by minor Ni addition into the solder alloy (i.e., SCN), was believed to be the root cause responsible for the increase in the strength value. However, the mechanical strength of the PTH components was revealed to be insensitive to the solder composition in the alternative case where an ENIG was deposited over the PTH walls. The implication of this study revealed that minor addition of Ni into the solder is beneficial for the solder/Cu joints, but for the solder/Ni(P) joints.