A 60 GHz receiver front-end with PLL based phase controlled LO generation for phased-arrays

This paper presents a front-end architecture for fully integrated 60 GHz phased array receivers. It employs LO-path beamforming using a phase controlled phase-locked loop (PC-PLL). To demonstrate the architecture a circuit is implemented featuring a two stage low noise amplifier, two cascaded active mixers, and a PC-PLL. The receiver downconverts the 60 GHz signal in two steps, using LO signals from the 20 GHz QVCO of the PLL. A differential 2nd-order harmonic is coupled from the sources of the current commutating pairs of the QVCO, feeding the LO-port of the first mixer and downconverting the 60 GHz RF signal to a 20 GHz intermediate frequency. Quadrature 20 GHz LO signals are then used in the second mixer to down-convert the IF signal to baseband. The PLL is locked to a relatively high reference frequency, 1.25 GHz, which reduces the size of the PLL loop filter and enables a compact layout. The measurements show an input return loss better than ?10 dB between 57.5 and 60.8 GHz, a 15 dB voltage gain, and a 9 dB noise figure. Two-tone measurements show ?12.5 dBm IIP3, 29 dBm IIP2, and ?24 dBm ICP1. The PC-PLL phase noise is ?105 dBc/Hz at 1 MHz offset from a 20 GHz carrier, and the phase of the received 60 GHz signal is digitally controllable with a resolution of 3.2°, covering the full 360° range with a phase error smaller than 1°. The chip consumes 80 mA from a 1.2 V supply, and measures 1,400 μm × 660 μm (900 μm × 500 μm excluding pads) including LNAs, mixers, and PC-PLL in a 90 nm RF CMOS process.     

Design of high-frequency wide-range all digital phase locked loop in 90 nm CMOS

This paper presents a high-frequency wide tuning range all digital phase locked loop (ADPLL) designed using a 90 nm CMOS process with 1.2 V power supply. It operates in the frequency range of 1.9–7.8 GHz. The ADPLL uses a wide frequency range digital controlled oscillator (DCO) and a two stage acquisition process to obtain the fast lock time. The operation of the ADPLL includes both a frequency acquisition state and a phase acquisition state. A novel architecture is implemented which includes a coarse acquisition stage to obtain a monotonically increasing wide frequency range DCO for frequency acquisition and a fine control stage to achieve resolution of 18.75 kHz for phase tracking. Design considerations of the ADPLL circuit components and implementation using Cadence tools are presented. Spectre simulations demonstrate a peak-to-peak jitter value of <15 ps and a root mean square jitter value of 4 ps when locked at 5.12 GHz. The power consumption at 7.8 GHz is 8 mW and the frequency hopping time is 3.5 μs for a 3.2 GHz frequency change. Spectre simulations demonstrate ADPLL convergence to 5.12 GHz for the typical, fast, and slow process corners to support robust performance considering process variations.     

A 5 GHz 90-nm CMOS all digital phase-locked loop

An all digital phase-locked loop (ADPLL) has been implemented in a 90-nm CMOS process. It uses a phase-frequency detector (PFD) connected to two time-to-digital converters (TDC). To save power the TDCs use delay line cells with uneven delay time. During frequency acquisition an automatic tuning bank controller selects active bank of the digitally controlled oscillator (DCO), which features three separate tuning banks for both high resolution and wide frequency tuning range. To further increase the resolution a high-speed delta-sigma modulator is also used, modulating the DCO fine tuning word. The PLL achieves a measured phase noise of −125 dBc/Hz at 1 MHz offset from a divided-by-2 carrier frequency of 2.58 GHz. The core area is 0.33 mm² and the current consumption is 30 mA from a 1.2 V supply.     

94 GHz down-conversion mixer with gain enhanced Gilbert cell in 90 nm CMOS

This paper introduces an adaptive semiblind background calibration of timing mismatches in a two-channel time-interleaved analog-to-digital converter (TIADC). By injecting a test tone at the frequency of half the overall sampling frequency of TIADC, the timing mismatch between two sub-ADCs can be quickly estimated with great accuracy without affecting the normal operation of the TIADC. The estimated coefficient can then be used in compensation module formed by a fixed structure to calibrate the timing mismatches. Simulation results demonstrate the effectiveness of the proposed estimation and correction technique.     

A PLL based WSN transmitter and I/Q LO signal generator at 430–435 MHz

A fully integrated Phase-Locked Loop (PLL) based transmitter and I/Q Local Oscillating (LO) signal generator used for half-duplex Wireless Sensor Networks (WSN) transceivers is proposed. Instead of one 430–435 MHz PLL for frequency synthesizing, a 1.72–1.74 GHz PLL is designed together with a 1/4 frequency divider. Then the chip area of the inductors in the Voltage-Controlled Oscillator (VCO) is decreased to about 1/16, and I/Q dual-path LO signals can be obtained without additional power consumption. A Gray-code controlled prescaler is proposed to avoid the glitches and uncertain states, and then the frequency dividing accuracy is improved by 17%. A Gauss Frequency Shift Keying (GFSK) transmitter with a pipeline modulator is proposed, the 1st and 2nd Adjacent Channel Power Ratio (ACPR) are −19.9 and −20.7 dBc, respectively. A mathematical spur model of 1/4 frequency dividers is built here, and then a low-spur 1/4 frequency divider composed of our proposed improved Current Mode Logic (CML) latches is designed. The testing results show that the reference spurs are −61.2 dBc@20 MHz and −57.7 dBc@40 MHz at the output of the PLL, and −70.5 dBc@20 MHz and −66.6 dBc@40 MHz at the output of our 1/4 divider. With 2.6-mW power consumption, our proposed 1/4 frequency divider has a phase-noise contribution of only 0.5 dBc/Hz@500 kHz and 0.2 dBc/Hz@1 MHz.     

A zero-crossing based 10-bit 100 MS/s pipeline ADC with controlled current in 90 nm CMOS

In this paper, a new charging technique for low power zero-crossing based circuit pipeline analog-to-digital converters (ADCs) is presented. The charging current sources are implemented as voltage-controlled current sources in order to charge the sampling capacitors based on the error signal. Using this method, the ADC power consumption is reduced while improving the accuracy. The necessary current control block is shared between consecutive stages further reducing the power consumption and die area. The proposed technique is applied to a 10-bit 100 MS/s pipeline ADC designed in a 90 nm CMOS technology with 1 V power supply. Circuit level simulation results using Cadence Spectre show a signal-to-noise and distortion ratio of 55.6 dB with 3.56 mW power consumption resulting in a figure of merit of 72.3 fJ/conv.step without employing any calibration technique.     

A 90–96 GHz CMOS down-conversion mixer with high conversion gain and excellent LO–RF isolation

A 90–96 GHz down-conversion mixer for 94 GHz image radar sensors using standard 90 nm CMOS technology is reported. RF negative resistance compensation technique, i.e. NMOS LC-oscillator-based RF transconductance (GM) stage load, is used to increase the output impedance and suppress the feedback capacitance C_gd of RF GM stage. Hence, conversion gain (CG), noise figure (NF) and LO–RF isolation of the mixer can be enhanced. The mixer consumes 15 mW and achieves excellent RF-port input reflection coefficient of ?10 to ?36.4 dB for frequencies of 85–105 GHz. The corresponding -10 dB input matching bandwidth is 20 GHz. In addition, for frequencies of 90–96 GHz, the mixer achieves CG of 6.3–9 dB (the corresponding 3-dB CG bandwidth is greater than 6 GHz) and LO–RF isolation of 40–45.1 dB, one of the best CG and LO–RF isolation results ever reported for a down-conversion mixer with operation frequency around 94 GHz. Furthermore, the mixer achieves an excellent input third-order intercept point of 1 dBm at 94 GHz. These results demonstrate the proposed down-conversion mixer architecture is very promising for 94 GHz image radar sensors.     

A 400 MHz–1.5 GHz all digital integer-N PLL with a reference spur reduction technique

In this Letter, 400 MHz–1.5 GHz all digital integer-N PLL with a reference spur reduction is proposed. A reference spur is occurred by updating DCO control code at every reference clock period. To reduce a reference spur component, the phase detector which transfers phase error information only when phase error is detected has been designed. The measured clock jitter is 2.528 ps_rms at 1.5 GHz operation, and 3.991 ps_rms at 400 MHz operation. The ADPLL occupies 0.088 mm², and consumes 1.19 mW at 1.5 GHz. This ADPLL is implemented in 65 nm CMOS technology.     

A 186 to 212?GHz Downconverter in 90?nm CMOS

The design and measurements of a 200?GHz downconverter in 90?nm standard CMOS are presented. A positive conversion gain of +6.6?dB, a noise figure of 29.9?dB and an output bandwidth of 3?GHz are measured for an LO power of ?14.9?dBm. The conversion gain remains within 3?dB for an RF frequency between 186 and 212?GHz. Downconversion of BPSK and QPSK signals is demonstrated with eye diagrams and constellation plots with data rates over 4?Gbit/s. A mathematical analysis is made of the MOSFETs in the triode region and a new small-signal parameter κ is introduced, which enables the design of the mixing transistors for minimum conversion loss.     

基于90nm CMOS工艺的12GHz二分频器

采用90 nm CMOS工艺,实现了一个基于电流模式逻辑的12 GHz二分频器.该分频器具有很宽的锁定频率范围(1～12 GHz),在输入信号频率为8 GHz时,输入灵敏度达到-30 dBm.分频器工作在1.2 V电源电压下,消耗的电流大约为1.5 mA.给出了该设计的后仿真结果.     

A 90 nm CMOS 15/60 GHz frequency quadrupler

The design and characterisation of a 60?GHz frequency quadrupler implemented in a conventional 90?nm CMOS technology is presented. The proposed fully differential frequency quadrupler is formed by properly combining a 15?GHz to 30?GHz doubler, two 30?GHz amplifiers, a polyphase filter, a 30 to 60?GHz doubler and two 60?GHz amplifiers. The proposed design is based on a differential architecture and achieves enhanced characteristics in terms of harmonics rejection, bandwidth, power consumption and die area. Conversion loss of 9.3?dBm at 60?GHz with 1.1?dBm input power is achieved. The 3?dB bandwidth lies between 51.5?GHz and 61?GHz, while the total current consumption is 100?mA from a 1.2?V supply voltage for the fully balanced implementation.     

High-speed single-channel SAR ADC with a novel control logic in 65 nm CMOS

This paper presents an 8-bit 320 MS/s single-channel successive approximation register (SAR) analog-to-digital converter (ADC) with low power consumption. Through a procedure of splitting all the most significant bit (MSB) capacitors except the least significant bit (LSB) capacitor into two equal sub-capacitors and reusing the terminal capacitor, the average switching energy and total capacitance can be reduced by about 87 and 50% respectively compared to the conventional procedure. Meanwhile, high-speed operation can be achieved by using a novel SAR control logic featuring efficient hardware cost and small critical path delay. In addition, this paper analyzes how to obtain the value of the unit capacitance which exhibits trade-offs between conversion rate, power consumption and linearity performance. The SAR ADC is simulated in 65 nm CMOS technology. It can achieve 48.63 dB SNDR, 63.61 dB SFDR at a supply voltage of 1.2 V and sampling frequency of 320 MS/s for near-Nyquist input, consuming 2.59 mW of power and with a FoM of 37 fJ/conversion-step.     

A 0.1–4 GHz SDR receiver with reconfigurable 10–100 MHz signal bandwidth in 65 nm CMOS

A 0.1–4 GHz software-defined radio (SDR) receiver with reconfigurable 10–100 MHz signal bandwidth is presented. The complete system design methodology, taking blocker effects into account, is provided. Fully differential Op-Amp with Miller feedback and feed-forward compensations is proposed to support wideband analog circuits with low power consumption. The stability and isolation of inverter-based trans-conductance amplifier are analyzed in details. The design approach of high linearity Tow-Thomas trans-impedance amplifier is presented to reject out-of-band blockers. To compensate for PVT variations, IIP2, frequency tuning, DC offset and IQ calibration are also integrated on-chip. The SDR receiver has been implemented in 65 nm CMOS, with 1.2/2.5 V power supply and a core chip area of 2.4 mm². The receiver achieves S11 input matching below ?10 dB and a NF of 3–8 dB across the 0.1–4 GHz range, and a maximum gain of 82–92 dB with a 70 dB dynamic range. Dissipated power spans from 30 to 90 mW across this entire frequency range. For LTE application with 20 MHz signal bandwidth and a LO frequency of 2.3 GHz, the receiver consumes 21 mA current.     

A 11.2 mW 48–62 GHz Low Noise Amplifier in 65 nm CMOS Technology

In this paper, a wideband low noise amplifier (LNA) for 60 GHz wireless applications is presented. A single-ended two-stage cascade topology is utilized to realize an ultra-wideband and flat gain response. The first stage adopts a current-reused topology that performs the more than 10 GHz ultra-wideband input impedance matching. The second stage is a cascade common source amplifier that is used to enhance the overall gain and reverse isolation. By proper optimization of the current-reused topology and stagger turning technique, the two-stage cascade common source LNA provides low power consumption and gain flatness over an ultra-wide frequency band with relatively low noise. The LNA is fabricated in Global Foundries 65 nm RFCMOS technology. The measurement results show a maximum \(S_{21}\) gain of 11.4 dB gain with a \(-\)3 dB bandwidth from 48 to 62 GHz. Within this frequency range, the measured \(S_{11}\) and \(S_{12}\) are less than \(-\)10 dB and the measured DC power consumption is only 11.2 mW from a single 1.5 V supply.     

An all digital PLL with an active inductor DCO for LTE applications in 0.13 μm CMOS

In this paper, we propose a low-power all digital phase-locked loop with a wide input range, and a high resolution TDC that uses phase-interpolator and a time amplifier. The resolution of the proposed TDC is improved by using a phase-interpolator which divides the inverter delay time and the time amplifier which extends the time difference between the reference frequency and the DCO clock. The phase noise of the proposed ADPLL is improved by using a fine resolution DCO with an active inductor. In order to control the frequency of the DCO, the transconductance of the active inductor is tuned digitally. To cover the wide tuning range and to operate at a low-power, a three-step coarse tuning scheme is used. In addition, the DCO gain needs to be calibrated digitally in order to compensate for gain variations. The die area of the ADPLL is 0.8 mm² using 0.13 μm CMOS technology. The frequency resolution of the TDC is 1 ps. The DCO tuning range is 58% at 2.4 GHz and the effective DCO frequency resolution is 0.14 kHz. The phase noise of the ADPLL output at 2.4 GHz is −120.5 dBc/Hz with a 1 MHz offset. The total power consumption of the ADPLL is 12 mW from a 1.2 V supply voltage.     

5.18–7.42 GHz LC-VCO in subthreshold regime with low power low phase noise and immunity to PVT variations in 130 nm CMOS technology

In this paper, we propose an LC-VCO using automatic amplitude control and filtering technique to eliminate frequency noise around 2\(\omega _0\). The LC-VCO is designed with TSMC 130 nm CMOS RF technology, and biased in subthreshold regime in order to get more negative transconductance to overcome the losses in the LC-Tank and achieve less power consumption. The designed VCO operates at 5.17 GHz and can be tuned from 5.17 to 7.398 GHz, which is corresponding to 35.5% tuning range. The VCO consumes through it 495–440.5 \(\upmu\)W from 400 mV dc supply. This VCO achieves a phase noise of \(-\,122.3\) and \(-\,111.7\) dBc/Hz at 1 MHz offset from 5.17 and 7.39 GHz carrier, respectively. The calculated Figure-of-merits (FoM) at 1 MHz offset from 5.17 and 7.39 GHz is \(-\,199.7\) and \(-\,192.4\) dBc/Hz, respectively. And it is under \(-\,190.5\) dBc/Hz through all the tuning range. The FoM\(_T\) at 1 MHz offset from 5.17 GHz carrier is \(-\,210.6\) dBc/Hz. The proposed design was simulated for three different temperatures (\(-\,55\), 27, \(125\,^{\circ }\hbox {C}\)), and three supply voltages (0.45, 0.4, 0.35 V), it was concluded that the designed LC-VCO presents high immunity to PVT variations, and can be used for multi-standard wireless LAN communication protocols 802.11a/b/g.     

A noise-shaping SAR ADC for energy limited applications in 90 nm CMOS technology

In this paper, an ultra-low-power successive approximation register analog-to-digital converter (ADC) for energy limited applications is presented. The ADC resolution is enhanced by using a noise-shaping technique which does not need any integrator and only uses a finite impulse response (FIR) filter. To provide a first-order noise-shaping, the quantization error is firstly extracted by using the digital-to-analog converter (DAC) dummy capacitor and it is then employed in the error feedback scheme. The proposed structure employs a low-gain and low-swing operational transconductance amplifier (OTA) to realize the FIR filter which operates only at the sampling phase. To minimize the power consumption of the ADC analog part, the OTA is powered off during the conversion phase. The proposed ADC is designed and simulated in a 90 nm CMOS technology using Spectre with a 0.5 V single power supply. The simulated ADC uses a fully-differential 8-bit charge redistribution DAC with an oversampling ratio of 8 and achieves 10.7-bit accuracy. The simulated average power consumption is 4.53 μW and the achieved maximum SNDR and SFDR are 66.1 and 73.1 dB, respectively, resulting in a figure of merit of 27.6 fJ/conversion-step.     

A 5.7–6.0 GHz CMOS PLL with low phase noise and −68 dBc reference spur

This paper presents a 5.7–6.0 GHz Phase-Locked Loop (PLL) design using a 130 nm 2P6M CMOS process. We propose to suppress reference spur through reducing the current mismatch in charge pump (CP), controlling the delay time in phase frequency detector (PFD), and using a smaller VCO gain (KVCO). With a reference frequency of 32.768 MHz, chip measurement results show that the frequency tuning range is 5.7–6.0 GHz, the reference spur is −68 dBc, the phase noise levels are −109 dBc/Hz and −135 dBc/Hz at 1 MHz and 10 MHz offset respectively for 5.835 GHz. Compared with existing designs in the literature, this work’s reference spur is improved by at least 17% and its phase noise is the lowest. Under a 1.5 V supply voltage, the power dissipation with an output buffer of the PLL is 12 mW.     

90nm CMOS工艺低功耗20GHz比较器设计

A low power 20 GHz CMOS dynamic latched regeneration comparator for ultra-high-speed, low-power analog-to-digital converters （ADCs） is proposed. The time constant in both the tracking and regeneration phases of the latch are analyzed based on the small signal model. A dynamic source-common logic （SCL） topology is adopted in the master-slave latch to increase the tracking and regeneration speeds. Implemented in 90 nm CMOS technology, this comparator only occupies a die area of 65 × 150 μm^2 with a power dissipation of 14 mW from a 1.2 V power supply. The measurement results show that the comparator can work up to 20 GHz. Operating with an input frequency of 1 GHz, the circuit can oversample up to 20 Giga-sampling-per-second （GSps） with 5 bits resolution; while operating at Nyquist, the comparator can sample up to 20 GSps with 4 bits resolution. The comparator has been successfully used in a 20 GSps flash ADC and the circuit can be also used in other high speed applications.