多孔硅表面氧化钒热敏电阻薄膜的阻温特性

用电化学腐蚀法制备了具有不同导热系数的多孔硅样品(孔隙率为80％±2、厚度为110μm时,导热系数可降低至0．20 W／m·K),并在其表面沉积了氧化钒热敏薄膜,研究了多孔硅样品的热绝缘性能对氧化钒热敏薄膜阻温特性的影响．结果表明:多孔硅良好的热绝缘性使在其表面制备的氧化钒热敏薄膜电阻的灵敏度远高于在硅基底上制备的热敏电阻的(多孔硅和硅片上的氧化钒薄膜电阻随功率变化斜率分别为120 kΩ／μW和2．1 kΩ／μW),且热敏电阻的灵敏度随着多孔硅孔隙率和厚度的增大而升高．     

红外微测辐射热计用纳米氧化钒薄膜的制备和性能研究

具有优异热敏性能的氧化钒薄膜材料是红外测辐射热计的首选热敏电阻材料，合适的薄膜电阻及高温度电阻系数的氧化钒薄膜的制备是实现高探测率红外测辐射热计的保证．利用新型对靶反应磁控溅射工艺制备了具有纳米颗粒的氧化钒薄膜材料，确定了最佳工艺参数．对其组成、结构和性能进行了分析，原子力显微镜AFM形貌分析表明薄膜具有均匀致密的表面，X射线光电子能谱分析XPS确定了其组成成分主要为V2O5,VO2和少量的V2O3.在常用作微测辐射热计结构层材料的氮化硅基底上，该薄膜材料在室温附近具有合适的薄膜电阻（大约为每方14kΩ）以及高的温度电阻系数（-3．17％／℃），有望适用于非致冷红外测辐射热计探测器．     

多种基底上溅射沉积ZnO薄膜的结构

在玻璃基底和四种硅基底上用反应式直流磁控溅射法制备了ＺｎＯ薄膜。用ＡＥＳ和ＸＲＤ对薄膜结构和组分进行测试,结果表明,五种基底上生长的ＺｎＯ薄膜在不同程度上都具有优良的纵均匀性、明显的ｃ轴择优取向和较高的结晶度,而硅基底上薄膜的结构普遍优于玻璃基底上沉积的薄膜。     

氧化法热处理温度对氧化钒薄膜热敏特性的影响

采用直流磁控溅射法制备氧化钒薄膜,并采用不同的温度对其进行氧化法热处理,通过XRD、SEM、四探针薄膜电阻测试,分析了不同热处理温度对氧化钒薄膜的晶相特性与热敏特性的影响。实验分析证明热处理温度升高后(400℃)得到的薄膜热敏特性良好,其室温电阻为160KΩ·cm,室温电阻温度变化系数为-2.4%/℃,变温过程中(20~98℃)其平均值约-1.98%/℃,表明温度升高有利于改善薄膜热敏特性,在非制冷红外探测器应用方面具有发展潜力。     

用于MEMS热敏传感器中绝热层的多孔硅性能研究

利用电化学方法制备了多孔硅,利用显微拉曼光谱法测量多孔硅样品的热导率和多孔硅中的残余应力,利用纳米压入测量仪测量多孔硅显微硬度与弹性模量.研究了多孔硅绝热性能和力学性能与微观结构的关系,认为通过控制制备条件可以得到绝热性能和力学性能满足MEMS热敏传感器结构性能要求的多孔硅.     

氧化钒薄膜热敏特性的研究

为研究氧化钒薄膜在非致冷红外微测辐射热计中的应用,综述了制备工艺等诸多因素对氧化钒热敏特性的影响,对其机理进行了探究,结果表明掺杂和新的制备工艺是调整氧化钒热敏特性较为有效的方法.     

晶粒尺寸对氧化钒薄膜电学与光学相变特性的影响

采用直流对靶磁控溅射方法制备氧化钒薄膜,通过改变热处理温度获得了具有不同晶粒尺寸的相变特性氧化钒薄膜,对氧化钒薄膜相变过程中电阻和红外光透射率随温度的突变性能进行研究.结果表明:经300℃和360℃热处理后,薄膜内二氧化钒原子分数达到40%,氧化钒薄膜具有绝缘体-金属相变特性,薄膜的晶粒尺寸分别为50nm和100nm;...     

微结构对太阳能选择性吸收薄膜性能的影响

介绍了制备光热太阳能选择性吸收薄膜的条件及薄膜的制备方法。采用二次阳极氧化方法在铝基底上制备了多孔微结构,再利用磁控溅射制备SS-AlN多层膜。用SEM、Optsol Absorber Control等测试手段表征了膜系的表面形貌、光谱吸收性能等,考察了微结构对太阳能选择性吸收薄膜性能的影响。结果表明基底表面微结构能有效提高其光谱吸收率。     

沉积在硅油表面上Au薄膜的电学性能及成膜机理

采用硅油作基底，沉积出具有网状特征结构的逾渗Au薄膜，用四引线方法原位测量Au薄膜的电学性能，测得其电阻随沉积时间以及凝聚时间的变化规律，较好地解释了此类薄膜的生长机制。对Au薄膜R-I特性的测量结果表明：生长在液体基底表面Au薄膜的局域隧道电流和跳跃电导效应比一般薄膜更为强烈，其功率谱指数w趋于零，该值远小于普通逾渗薄膜系统的相应值。     

电化学腐蚀多孔硅表面形貌的结构特性

多孔硅作为微电子机械系统中重要的热绝缘层和牺牲层材料，其表面形貌结构特性是影响多孔硅上薄膜器件性能的重要因素，为此，利用双槽电化学腐蚀方法制备了多孔硅薄膜，并通过原子力显微镜和场发射扫描电子显微镜对制备多孔硅的表面形貌和孔径大小分布进行了观察．结果发现：腐蚀初期，在硅表面会有大量的硅柱形成，硅柱的直径、高度、分布密度与电流密度成正比关系；硅柱在进一步腐蚀过程中会消失，多孔硅的表面粗糙度随着腐蚀的进行，先减小再增大，最后达到稳定值0．52nm；多孔硅孔径大小分布区间随腐蚀时间增加变窄．     

船舶围壁空气层对舱室热环境的影响

采用频域回归法（FDRM）计算4种船舶围壁的动态传热特性,并分析空气层对船舶围壁动态传热及舱室热环境的影响。计算结果表明：空气层对船舶围壁的传热有明显的阻隔作用,且空气层越厚阻隔作用越明显;船舶围壁空气层与保温层的排列次序对围壁传热有一定的影响,空气层在外、保温层在内的排列方式隔热效果更好,内壁温度波动小。     

SiO2层上沉积的纳米多晶硅薄膜及其特性

采用低压化学气相沉积(LPCVD)系统以高纯SiH4为气源,在p型10.16 cm<100>晶向单晶硅衬底SiO2层上制备纳米多晶硅薄膜,薄膜沉积温度为620℃,沉积薄膜厚度分别为30 nm、63 nm和98 nm.对不同薄膜厚度的纳米多晶硅薄膜分别在700℃、800℃和900℃下进行高温真空退火.通过X射线衍射(XRD)、Raman光谱、扫描电子显微镜(SEM)和原子力显微镜(AFM)对SiO2层上沉积的纳米多晶硅薄膜进行特性测试和表征,随着薄膜厚度的增加,沉积态薄膜结晶显著增强,择优取向为<111>晶向.通过HP4145B型半导体参数分析仪对沉积态掺硼纳米多晶硅薄膜电阻I-V特性测试发现,随着薄膜厚度的增加,薄膜电阻率减小,载流子迁移率增大.     

NH3 sensing characteristics of nano-WO3 thin films deposited on porous silicon

The NH3 sensing characteristics of nano-tungsten trioxide (WO3) thin films deposited on porous silicon (PS) were investigated in the present study. Porous silicon layer was first prepared by electrochemical etching in an HF-based solution on a p(+)-type silicon substrate. Then, WO3 nano-films were deposited on the porous silicon layer by DC magnetron sputtering. Pt electrodes were deposited on the top surface of the WO3 films to obtain the WO3/PS gas sensor. The WO3 films deposited on PS were characterized by SEM, XRD and XPS. The NH3 sensing characteristics for WO3/PS gas sensor were tested at room temperature and 50 degrees C. The results showed that the NH3 sensing characteristics of WO3/PS were superior to WO3/Al2O3 at room temperature. The sensing mechanism of the nano-WO3 thin films based on PS was also discussed.     

Improving the stability of amorphous silicon ultraviolet sensors

In this paper we present an improved structure of an amorphous silicon/amorphous silicon carbide ultraviolet sensor, previously presented in literature, whose overall performances have been enhanced by growing a very thin layer of chromium silicide film on the top of the sensor. The sensor is a n-type amorphous silicon/intrinsic amorphous silicon/p-type amorphous silicon carbide stacked structure deposited on a glass substrate. The substrate is covered with a chromium film that acts as back metal contact. The top metal contact is a grid shaped chromium/aluminum/chromium metal stack that allows the incident radiation to reach the active p-type layer.The responses of two sets of sensors fabricated with and without the alloy film under ultraviolet radiation have been studied. The role of the very thin chromium silicide layer is to increase the conductivity of the top surface without attenuating the UV radiation absorbed in the device active layer. The increased top-surface conductivity ensures a better collection of the photogenerated carriers and hides the resistivity variation of the underlying p-doped layer under ultraviolet light caused by dopant activation, leading to a stable and linear behavior. Comparing the photocurrent values obtained on sensors with different area and distance between the grid electrodes, we found that the presence of the chromium silicide film extends the charge collection length by a factor of 10, allowing a better device photoresponse.     

Pt／n—n＋-Si电极上化学沉积铁氰化镍薄膜及其应用

在表面外延生长9μm的n型层的磷重掺杂的硅基底n—n＋一Si）结构上沉积约40nm铂（Pt）,经氩气保护673K热处理30min作为半导体电极（Pt／n—n＋-Si）。将半导体电极和铁氰化钾、硫酸镍以及硝酸钠的溶液接触,沉积出稳定的铁氰化镍（NiHCF）薄膜。复合电极与Pt电极组成光电化学电池,在零偏电压条件下,通过测量该电池的光电流可检测过氧化氢。通过循环伏安和X-光电子能谱对NiHCF薄膜进行了分析与表征。     

Nano-polycrystalline vanadium oxide thin films prepared by pulsed laser deposition

Nano-polycrystalline vanadium oxide thin films have been successfully produced by pulsed laser deposition on Si(100) substrates using a pure vanadium target in an oxygen atmosphere. The vanadium oxide thin film is amorphous when deposited at relatively low substrate temperature (500 degrees C) and enhancing substrate temperature (600-800 degrees C) appears to be efficient in crystallizing VOx thin films. Nano-polycrystalline V3O7 thin film has been achieved when deposited at oxygen pressure of 8 Pa and substrate temperature of 600 degrees C. Nano-polycrystalline VO2 thin films with a preferred (011) orientation have been obtained when deposited at oxygen pressure of 0.8 Pa and substrate temperatures of 600-800 degrees C. The vanadium oxide thin films deposited at high oxygen pressure (8 Pa) reveal a mix-valence of V5+ and V4+, while the VOx thin films deposited at low oxygen pressure (0.8 Pa) display a valence of V4+. The nano-polycrystalline vanadium oxide thin films prepared by pulsed laser deposition have smooth surface with high qualities of mean crystallite size ranging from 30 to 230 nm and Ra ranging from 1.5 to 22.2 nm. Relative low substrate temperature and oxygen pressure are benifit to aquire nano-polycrystalline VOx thin films with small grain size and low surface roughness.     

Radiation-conduction heat transfer in fibrous heat-resistant insulation under thermal effect

The conjugate diffusion model of radiation transfer and the approximation of radiant thermal conductivity are used to investigate the radiation-conduction heat transfer in a flat layer of fibrous heat-resistant insulation under the effect of fire. The results of calculation of the characteristics of unsteady-state heat transfer and of the duration of heat resistance of the substrate demonstrate the accuracy of the approximation of radiant thermal conductivity which is good for practical applications. The fireproof efficiency of fibrous quartz heat insulation is investigated. The calculation results demonstrate that the application of this insulation provides for high limits of fire resistance of metal structures.     

Stability of high temperature chemical vapor deposited silicon based structures on metals for solar conversion

Highly crystallized silicon layers were grown on metal sheets at high temperature (950 degrees C) by thermal CVD from silane. An intermediate buffer layer was mandatory to prevent interdiffusion and silicide formation but also to compensate lattice parameters and thermal expansion coefficients mismatches between metal and silicon and ideally transfer some crystalline properties (grain size, texture) from the substrate to the silicon layer. After a thermodynamic study, aluminum nitride or titanium nitride diffusion barrier layers were selected and processed by CVD. The structure and the interfaces stabilities of these silicon/nitride/metal stacks were studied by field effect gun scanning and transmission electron microscopy, X-ray diffraction, Raman and energy dispersive X-ray spectroscopy. As a result, TiN deposited by CVD appears to be an efficient material as a buffer layer between steel and silicon.     

微波CVD金刚石热沉片的制备研究

采用化学气相沉积法（CVD）制备的金刚石薄膜具有接近于天然金刚石的导热性能,是目前最为理想的热沉材料。利用微波等离子体化学气相沉积法（MPCVD）制备了金刚石热沉片,并在此基础上研究了不同沉积工艺对金刚石热沉片散热性能的影响。采用扫描电子显微镜（SEM）和激光拉曼光谱（Raman）检测了薄膜的表面形貌及纯度,金刚石热沉片的导热性能则通过测量封装LED后薄膜的散热效果来进行表征。结果表明,在其他条件不变的情况下,提高生长过程中的微波输出功率、降低反应气压以及增加基片温度有利于制备出散热性能更佳的金刚石热沉片。     

Infrared and raman spectroscopic studies of optically transparent zirconia (ZrO2) films deposited by plasma-assisted reactive pulsed laser deposition

Plasma-assisted pulsed laser deposited zirconia (ZrO(2)) films were studied by Fourier transform infrared (FT-IR) and Raman spectroscopy for structural characterization and thermal stability in combination with optical characterization by spectroscopic ellipsometry and optical transmission measurements. Only the monoclinic ZrO(2) phase was positively identified from the infrared and Raman spectra of the as-deposited ZrO(2) films, which show excellent optical transparency from the ultraviolet to the near infrared as revealed by optical characterization. The as-deposited ZrO(2) films are free of any SiO(x) interfacial layer when deposited on silicon. The prepared ZrO(2) films exhibit good thermal stability in their structural, optical, and interfacial properties up to 900 °C. Upon annealing above 1100 °C, a silicon oxide interfacial layer forms due to the oxidation of the silicon substrate surface by the oxygen diffused from the oxide film to the silicon substrate at high temperatures.