烧结温度对碳纳米管场发射性能的影响

采用丝 网印刷制备碳纳米管(CNT)阴极的过程中,烧结工艺不仅影响着CNT薄膜的稳定性,而且决定 最终阴 极的场发射性能,已经成为制约场发射电流提升的瓶颈。本文重点研究了烧结温度对CNT场 发射性能 的影响,通过测试不同烧结曲线所制备的阴极场发射性能,分析了烧结温度对阴极附着力、 散热性能的影 响机理,阐明了场发射性能产生差异的原因,最终通过最优烧结温度,制备出场发射电流密 度达到1A/cm²的CNT阴极。     

提高碳纳米管阴极膜场发射特性的研究

通过研究多步印刷制备的多层碳纳米管(CNTs)厚膜的场发射性能,发现开启电场随印刷次数增加而增加,二次印刷膜具有最好的场发射特性。微观特性研究表明,两步印刷制作的CNTs膜在热处理后界面间形成了良好的匹配结构,且底层膜与基底接触面积增加,从而增加了膜层导电性和形成欧姆接触的几率,并且提高了平均场增强因子。四种不同成分的CNTs膜一致显示两步印刷显著提高了CNTs阴极膜的场发射电流及发光均匀性。     

薄膜衬底电极CNT阴极制备及场发射性能研究

采用电泳沉积(EPD,electrophoretic deposition)法在不同薄膜衬底电极上制备碳纳米管(CNT,carbon nanotube)场发射阴极.采用场发射扫描电子显微镜(FESEM)对其进行表面形貌表征,结果表明,EPD可以制得CNT均匀分布的场发射阴极.场发射测试结果表明衬底电极对CNT阴极的场发...     

光纤支撑墙碳纳米管场发射显示器的研制

针对现有的碳纳米管场发射显示器(CNT-FED)制造技术中存在的工艺复杂、成本过高的问题,利用通信光纤,通过烧结炉热处理的方法制作出了一种直径为125 μm的石英玻璃光纤支撑墙,并将其切为30 mm、50 mm 2种长度.根据设计结果,用自制的简易支撑墙定位装置,按10 mm等间距交错位排列该支撑墙,并在同一线上相邻光纤间留8 mm间隙.结合阴、阳极丝网印刷工艺,设计制作了一种显示面积为118 mm×123 mm、像素点数为64×64和可矩阵寻址的二极结构纤维支撑墙CNT-FED,并实现了动态显示.     

大电流密度碳纳米管阴极的生长及场发射性能研究

研究了碳纳米管作为大电流密度场发射阴极的CVD生长情况与场发射性能。结果表明,通过CVD生长的碳纳米臂的直径与催化剂颗粒的直径相近,其生长方向是随机的。根据薄膜厚度与催化剂颗粒的关系,认为通过控制催化剂薄膜的厚度可能会达到调节碳纳米管直径的目的。在实验中获得的碳纳米管具备了良好的场发射性能,在直径为0．13mm的圆形面积上获得的碳纳米管场发射平均电流密度达到1．28A／cm^2。     

不同转移法对碳纳米管场发射特性的影响

通过印刷法、喷涂法和电泳沉积法转移经过处理的碳纳米管(CNT)原料到ITO电极上,高温烧结制备CNT阴极阵列,并对CNT的表面形貌和场发射性能进行测试分析。结果表明,不同转移方法对CNT阴极场发射性能的影响不同,印刷法、喷涂法及电泳沉积法3种方法制备CNT阴极场发射的开启电场分别为2.21、1.62和1.85 V/μm;当电场为2.3 V/μm时,喷涂法制备的CNT阴极场发射性能最佳,电泳沉积法制备CNT阴极次之,印刷法制备的CNT阴极最差,并根据金属半导体理论分析其原因。     

碳纳米管场发射阴极电泳法制备及场发射特性研究

采用电泳沉积法在玻璃基板上成功制备出碳纳米管场发射阴极,采用扫描电子显微镜观察薄膜表面形貌,并对制备的碳纳米管阴极进行场发射测试.实验结果表明电泳2 min沉积的碳纳米管薄膜均匀连续且具有较好的场发射特性,其开启电场为3.1 V/μm,当外加电场强度为11.5 V/μm时场发射电流密度达到11.33 mA/cm2,经过10 V/μm的电场激活处理后样品具有较好的场发射稳定性.     

碳纳米管场发射器件新型阴极的研究

碳纳米管场发射显示器件（CNT-FFDs）中阴极的制备和表面处理一直是其中的关键环节而备受关注,本文通过光刻技术、丝网印刷技术、表面超声等流程制作带有平整电阻层的发射阴极,并对该阴极进行场发射测试,并通过扫描电镜（SEM）照片分析阴极表面,发现开启电场、发射均匀性及电流稳定性比以前未加处理的阴极有很大程度上的改善。此法适合于大面积的碳纳米管场发射显示的阴极制作。     

涂敷法制备的碳纳米管阴极的场发射研究

研究了用涂敷法制备碳纳米管阴极的新工艺和改善其场发射特性的新方法,裂解法获得的碳纳米管与有机粘合剂等混合、研磨,直接涂敷在Si基底上,二极管结构测量的结果表明,碳纳米管阴极有较低的开启电场(1．25～1．5V／μm),场强为5V／μm时,电流密度达到了42μA／cm^2,F—N曲线也非常符合场发射规律。浆料中粘合剂的比例增大时,碳纳米管阴极的场发射性能会有所降低,施加外电场会改善其场发射特性。     

碳纳米管场发射阴极的厚膜工艺研究

研究了制备碳纳米管(CNT)场发射阴极的厚膜工艺,通过浆料配方和烧结工艺等方面的探索,在Si基底上制作了均匀、平整、场发射特性良好的CNT厚膜。CNT厚膜工艺研究表明,CNT浆料中银浆的最佳比例约为4.2％,最佳烧结温度为480℃(空气中),才能保证厚膜有较强的附着力,CNT又不至于全部氧化。银浆比例过大,则使高电压时场发射电流明显下降,通过对CNT厚膜的场发射特性测量得知,其开启电压为2．4V／μm,在5V／μm的电场下,场发射电流密度为27．8μA／cm^2,但发光显示情况不佳,通过使用含有机粘结剂的浆料,使显示发光情况得到了很大改善。     

场致发射显示器的现状与发展

通过对场致发射显示器（FED）发展现状及其应用前景进行系统的比较与分析，着重讨论了场致发射体与其阵列制备工艺以及各种关键技术的优缺点，并介绍国外著名公司的研究动态，展望FED的发展趋势。     

Chemical modification of carbon nanotube for improvement of field emission property

In the present work, chemical modification of carbon nanotube was proposed for improvement of field emission property. Multi-wall carbon nanotubes (MWCNTs) were grown vertically on silicon substrate using catalytic chemical vapor deposition. Tips of grown MWCNTs were chemically modified using oxygen plasma, nitric acid, and hydrofluoric acid. Surface state and morphology of the chemically modified CNTs were investigated. CNT tips were opened and defects working as trap sites were generated on the CNT surface by the chemical modification process leading to improvement of field emission property. We suggest that two main factors determining the field enhancement factor are geometric factor and surface state of the CNT tips.     

The fabrication and operation of fully printed Carbon nanotube field emission displays

Screen-printing is undoubtedly the most cost effective process for the fabrication of large-sized carbon nanotube field emission display (CNT-FED). A novel post-treatment method of mechnical crushing and blowing was presented to solve the problem of poor field emission properties of printed CNT films. The turn-on electric field of the treated film decreased and the emission current increased distinctly. Then a technique was developed to fabricate fully printed CNT-FED in which all the inner cells were fabricated by screen-printing process. Based on this technique, fully printed matrix-addressable diode CNT-FEDs, which can display moving image and be driven by the integrated drive circuits of commercial plasma display panel (PDP), were fabricated subsequently. A very high brightness of 1×10⁴ cd/m² can be achieved at 220 V.     

Mixed carbon nanotube bundles for interconnect applications

The increasing resistivity of copper with scaling and demands for higher current density are the driving forces behind the ongoing investigation for new wiring solutions for deep nanometer scale VLSI technologies. Metallic carbon nanotubes (CNTs) are promising candidates that can potentially address the challenges faced by copper, and thereby extend the lifetime of electrical interconnects. This article examines the state of the art in CNT applications with focus on CNT interconnect research. It is observed that individually, single-wall carbon nanotubes (SWCNTs) and multi-wall carbon nanotubes (MWCNTs) exhibit characteristics that can be better exploited when a combination of the two is used – in the form of a CNT bundle that plays a vital role in interconnect applications. The focus here is that the usage of a combination of SWCNT (at the centre area of the bundle) and MWCNT (on the outside) provides great performance boost with lower interaction and crosstalk between neighbouring CNT bundles. Simulation results show that the resistance, capacitance, and inductance of a CNT depend on the probability of metallic CNTs present in the bundle and the length of the nanotube. Because Cu is metallic, it indicates that using a higher number of metallic nanotubes in the bundle would aid the CNT bundle performance. In addition, using MWCNT on the outer periphery of the bundle and SWCNT in the centre of the bundle would be the ideal way to maximise the performance of the bundle. Based on the observations we provide an analysis of why a mixed CNT bundle would be highly suitable as interconnections.     

电镀镍及阴极腐蚀法提高CNTs阴极场发射性能

通过电镀镍及阴极腐蚀相结合的方法,对电泳沉积所制备的CNT薄膜进行处理。采用扫描电子显微镜对样品的表面形貌进行表征,并对样品的场发射性能进行测试。结果表明,处理后CNT阴极的场发射性能得到提高,如开启场强、阈值电场、发光均匀性和稳定性。当电流密度为1 mA/cm2时,开启场强由0.95 V/?m降低为0.45 V/?m;当电流密度为3 mA/cm2时,阈值电场由0.99 V/?m降低为0.46 V/?m。并且,电流密度在电场为0.48 V/?m时高达7 mA/cm2。在电流密度为0.75 mA/cm2时进行20h的场发射稳定性测试,结果表明,处理后CNT阴极的电流密度在0.70 mA/cm2左右波动。该场发射性能的提高归因于三个方面：（a）更多CNT尖端直立于表面（b）CNT之间的间隙变宽（c）镍颗粒渗入降低CNT与基底的势垒。     

Field emission of vertically-aligned carbon nanotube arrays grown on porous silicon substrate

Vertically aligned arrays of multi-walled carbon nanotubes were grown by pyrolysis of acetylene on iron catalytic particles within a porous silicon template via chemical vapor deposition (CVD) at 700 °C. Using this method ordered nanotubes with diameters from 75 to 100 nm could be produced. The diode configuration field emission of the CNT arrays were performed and the onset electric field is 4 V/μm and the emission current can approach 1 mA/cm² at a electric field of 9.5 V/μm. The enhancement factor of the CNT arrays (4012) is derived from the F–N plot of the experiment data. To demonstrate the uniformity of the field emission, an ITO glass substrate with phosphor coated is used as anode in the field emission experiment. The average fluctuation of the emission current density was less than 5%. The result shows that the field emission of the CNT arrays on the silicon substrate is very uniform. These carbon nanotube arrays are useful for applications in field emission displays and sensors. The fabrication method shows the feasibility of integration between carbon nanotube arrays and silicon microelectronics.     

A model for carbon nanotube FETs in the ballistic limit

As we know, a ballistic MOS-Like carbon nanotube FET can be simulated by using a self-consistent procedure between the charge and the Poisson equations. Because of the integral form of the charge equation, this model cannot be implemented in the commercially available circuit simulators, such as SPICE. In this paper, we propose an analytical solution for estimating the charge equation, so that the above mentioned procedure could be used in the aforementioned circuit simulators. We investigated the accuracy of the proposed model for various values of the physical parameters and biasing condition. Further investigations were performed in order to evaluate the model accuracy in the sub-threshold region and in presence of the short channel effects. The results of these investigations were compared with those obtained by some other models developed earlier in the literatures. All of these demonstrate superior accuracy of the proposed model with comparison to the other models.