共查询到18条相似文献,搜索用时 109 毫秒
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瞬变电压抑制器失效模式和失效机理研究 总被引:1,自引:0,他引:1
由于目前对TVS自身可靠性的研究较少,提出了对TVS产品的可靠性研究.这项研究得到国内TVS生产厂家的支持,对该厂6个型号TVS筛选进行了跟踪.根据筛选失效数据,对温度循环、箝位冲击、高温反偏和功率老炼等TVS失效比例较大的筛选项目的失效品,经过电参数测试、解剖、显微观察,确定失效模式、分析失效机理.结果表明,TVS主要失效模式有短路、开路、反向漏电流大和异常击穿,且高击穿电压TVS更易发生失效. 相似文献
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瞬态电压抑制管(TVS)是电子线路设计中常用的静电放电(ESD)防护器件,其可靠性将直接影响整个电路的安全。选取常见的TVS器件PESD5V0U1BA进行研究,通过实验和仿真分析了TVS器件的短路失效机理及其影响。研究表明,当TVS器件注入高压时,器件存在缺陷的SiO2层会发生自愈性击穿。当器件的pn结发生击穿时,器件将失效。如果两个pn结都被击穿,器件的I-V曲线表现为电阻特性。当TVS器件出现损伤后,器件仍具有箝位作用,且其表现的箝位电压更低,但由于器件的漏电流发生较大的增长,将影响被保护电路的正常工作。 相似文献
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受限于电子设备的内部空间,电池保护电路中MOSFET器件通常采用晶圆级芯片规模封装(WLCSP)。由于WLCSP的特点,电池保护电路中的MOSFET器件在生产、使用中会出现各种类型的失效模式和失效机理。介绍了采用WLCSP技术封装的MOSFET器件常用的分析方法与设备,结合相关的失效案例,论述了芯片开裂、芯片工艺缺陷、芯片腐蚀和过电应力这4种常见的失效机理,为MOSFET器件及其他电子元器件的失效分析和问题解决提供一定的参考。 相似文献
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对约50例微波器件失效分析结果进行了汇总和分析,阐述了微波器件在使用中失效的主要原因、分类及其分布。汇总情况表明,由于器件本身质量和可靠性导致的失效约占80%,其余20%是使用不当造成的。在器件本身的质量和可靠性问题方面,具体失效机理有引线键合不良、芯片缺陷(包括沾污、裂片、工艺结构缺陷等)、芯片粘结、管壳缺陷、胶使用不当等;在使用不当方面,主要是静电放电(ESD)损伤和过电损伤(EOS),EOS损伤中包括输出端失配、加电顺序等操作不当引入的过电应力等。 相似文献
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目的:研究阴道超声发现子宫内膜异常患者的宫腔镜诊治价值。方法:对827例经阴道超声检查发现子宫内膜异常的患者行官腔镜检查,并行诊断性刮宫或宫腔内病变电切,组织物送病检。结果:以病检结果为诊断标准,宫腔镜检查对子宫内膜息肉、子宫粘膜下肌瘤、正常子宫内膜、宫颈管息肉及子宫内膜癌的诊断符合率均明显高于阴道超声检查(P〈0.01);宫腔镜检查对子宫内膜病变诊断的敏感性和特异性分别是95.23%和86,82%,而阴道超声检查对子宫内膜病变诊断的敏感性和特异性分别是83.99%和41.23%。结论:对阴道超声检查发现子宫内膜异常的患者应常规行宫腔镜检查并取组织活检,才能提高诊断符合率,减少误诊和漏诊。 相似文献
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An ionic induced pMOSFET drift effect was investigated by deliberately enhancing the sodium concentration in interlevel dielectric layers.High frequency capacitance voltage and triangular voltage sweep (TVS) measurements as well as different bias temperature stress sequences were employed to show that the degradation is a two step process: sodium drift into active areas and charging of traps which were generated by sodium interactions with the semiconductor oxide interface.A special wafer level reliability method was developed which takes into consideration the two phase nature of the failure mechanism. 相似文献
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Sankaran V.A. Hudgins J.L. Rhodes C.A. Portnoy W.M. 《Power Electronics, IEEE Transactions on》1991,6(4):679-686
The spatio-temporal distribution of temperatures in high-power SCRs used for switching high di /dt current pulses were simulated using the finite element method (FEM). Two types of SCRs, with amplifying gate (unshorted device), and without amplifying gate (shorted device) structures, were analyzed. The details of the numerical simulation, such as the meshing strategy, the heat source model and the boundary conditions are discussed. Based on the analysis, the failure temperature of the unshorted device was computed to be 1100°C. The peak temperature in the shorted device was, however, found to be 335°C. The instantaneous cooling cycles of the devices and their cooling time constants, as obtained from the simulations, are presented. Based on these parameters, the safe operating frequencies of these devices were estimated 相似文献
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J. Urresti S. Hidalgo D. Flores J. Roig I. Corts J. Rebollo 《Microelectronics Reliability》2005,45(7-8):1181-1186
A novel lateral punch-through TVS (Transient Voltage Suppressor) structure addressed to on-chip protection in very low voltage applications is reported in this paper. Different lateral TVS structures have been studied in order to optimize the electrical performances related with the surge protection capability. Lateral TVS structures with a four-layer doping profile exhibit the best electrical performances, as in the case of vertical TVS devices. The dependence of the basic electrical characteristics on the technological and geometrical parameters is also analysed. Finally, the electrical performances of lateral TVS structures are compared with those of vertical punch-through TVS devices and conventional Zener diodes, being the leakage current level reduced two orders of magnitude in the case of the lateral architecture. Lateral TVS structures exhibits similar performance than vertical counterparts with the advantage of easiest on-chip integration. 相似文献
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Sujit Kumar Mitra 《Circuits, Systems, and Signal Processing》1990,9(2):197-212
A new class of shorted operators is considered. The shorted operator has an intimate relationship with electrical networks and has been extensively studied. In this work we consider the class of matrices with row and column spans in specified linear subspaces and dominated in a given partial order by a matrixA. If this class of matrices has an unique maximal element under the partial order, then this maximal element is called the shorted matrix ofA relative to the given linear subspaces and the relevant partial order. We study the shorted matrix under the star order of Drazin, the minus order, and also under partial orders induced by the minimum norm and least squares g-inverses. The parallel sum of matrices is intimately related to the shorted matrix and results are given for parallel addition. 相似文献
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Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system
Power bipolar devices with gold metallization experience high failure rates. The failures are characterized as shorts, detected during LSI testing at burn-in. Many of these shorted locations in the chip are the same for the failed devices. From a statistical analysis for wafer lots, it is found that the short failure rate is higher for the lots with thinner SiON interlayer dielectric films. Cracks are commonly observed in the SiON films at step edge portions of the device. The SiON film is locally turned to Au–Si eutectic at short positions by the reaction of Au with the SiON film and the reaction is only generated at specific step edge portions, i.e., at step edge on emitter electrodes in driver transistors and/or at cross-points of power lines. Based upon these results, a new electromigration and electrochemical reaction mixed failure mechanism is proposed for the failure. 相似文献
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Stacked shorted patch antenna 总被引:1,自引:0,他引:1
A novel stacked shorted patch antenna is proposed and investigated both theoretically and experimentally. The new antenna has significantly greater bandwidth than a conventional shorted patch and its behaviour is less susceptible to manufacturing errors. The stacked shorted patch is small in size and, thus, is suitable for mobile communication applications 相似文献