共查询到20条相似文献,搜索用时 15 毫秒
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The current studies on pulsation phenomena in electrospray ionization, and pulsed electrospray ionization (ESI) under external electrical control are reviewed. A number of investigations have shown that two types of pulsation processes exist: low-frequency fluctuation and high-frequency droplet-formation. The low-frequency pulsation is induced by an imbalance between the flow rate of the input sample to the Taylor cone and the feed rate of the output solution to the liquid filament. The high-frequency pulsation mainly results from the initial droplet formation process, and is modulated by the low-frequency pulsation. The fundamental and experimental sections of these two pulsations are discussed. Experimental results also show that low and high pulsations can both be controlled electrically to create a pulsed ESI so that high sensitivity and an enhanced S/N ratio can be achieved. However, the co-ordination of the synchronization between a natural pulsation and a pulsed ESI, as well as its application to mass spectrometer (MS) analysis, demands further research. 相似文献
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A tutorial in small molecule identification via electrospray ionization‐mass spectrometry: The practical art of structural elucidation 下载免费PDF全文
Thomas De Vijlder Dirk Valkenborg Filip Lemière Edwin P. Romijn Kris Laukens Filip Cuyckens 《Mass spectrometry reviews》2018,37(5):607-629
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Hamann C Woltmann R Hong IP Hauptmann N Karan S Berndt R 《The Review of scientific instruments》2011,82(3):033903
An electrospray apparatus for deposition of organic molecules on surfaces in ultrahigh vacuum is presented. The kinetic energy at the impact and mass to charge ratio of deposited ions can be controlled by an electrostatic quadrupole deflector and an in-line quadrupole mass spectrometer. With an ion funnel in the first two vacuum stages a high ion transmission is achieved. Experiments on porphyrin cations and deoxyribonucleic acid deposited on a Au(111) surface demonstrate the capabilities of the instrument. 相似文献
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In order to improve such a widely used microtribological testing procedure as surface scratching by an AFM diamond tip, an experimental study has been carried out using single-crystalline silicon as the tested material. Wear of the AFM diamond tip under scratching was observed by a decrease in the scratch depth with increasing wear cycles and by the direct imaging of the diamond tip shape using a Si3N4 AFM tip. It was shown that the current widely used experimental method, which assumes the diamond tip to be non-wearable, introduces uncontrollable error into the obtained values for the tested material's wear rate. The harder the tested material, the larger may be the tip wear, and, therefore, the bigger may be its effect on the obtained wear rate values. The specific wear rates for the diamond tip and a silicon wafer were estimated to be 1.4 × 10-9 and 4.5 × 10-4 mm3/(N m), respectively. 相似文献
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STM和AFM的研制 总被引:1,自引:0,他引:1
叙述STM(扫描隧道显微镜)和AFM(原子力显微镜)的主要关键技术和研制情况。在研制的STM和AFM样机上,对12001/mm光栅进行测量,得出本样机的测量重复性可达10%以内。对研制的样机进行分析和对比后提出:STM和AFM,尤其是AFM,技术上已趋于成熟;使用上简单、方便,已达到实用化程度,可以作为高级表面粗糙度测量的常用计量仪器。 相似文献
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The surface morphology of grades 304L and 316LN stainless steels, after low-temperature bake-out process and vacuum annealing, has been studied by atomic force microscopy (AFM) and scanning tunnelling microscopy (STM). The local elemental composition on the surface before and after thermal treatment has been investigated by atom probe (AP) depth profiling measurements. After vacuum annealing, AFM and STM show significant changes in the surface structure and topology. Recrystallization and surface reconstruction is less pronounced on the 316LN stainless steel. AP depth profiling analyses result in noticeable nickel enrichment on the surface of grade 304L samples. Since hydrogen recombination is almost controlled by surface structure and composition, a strong influence on the outgassing behaviour by the particular surface microstructure can be deduced. 相似文献
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When the lateral displacement of an AFM tip due to friction is comparable to or larger than the scan size, for example during atomic-scale friction measurement, the interpretation of the friction image is different from the situation where the scan size is much larger than the lateral displacement of the tip and the image is a simple direct mapping of the friction value. This is because, due to the lateral displacement of the tip, the tip is not at the position where the scan indicates, as can be clearly observed by an in-situ TEM/AFM combined microscopy and atomic-scale friction analysis. This lateral displacement of the tip at the nanometer scale affects the shape of the force-distance curve. We discuss the effect of the tip lateral displacement in AFM data and its normal load dependence. 相似文献
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在现有理论的基础上,设计出一种新型的AFM工作台扫描控制电路。介绍了该电路的设计思想,与现有的AFM控制系统相比,X、Y方向的运动采用闭环控制,提高了控制精度。文中还介绍了一种简单实用的PI调节电路,该电路具有结构简单、成本低、功耗小和控制精度高等优点。 相似文献
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Michael Caleb Bagley Kenneth P. Garrard David C. Muddiman 《Mass spectrometry reviews》2023,42(1):35-66
In the past 15 years, ambient ionization techniques have witnessed a significant incursion into the field of mass spectrometry imaging, demonstrating their ability to provide complementary information to matrix-assisted laser desorption ionization. Matrix-assisted laser desorption electrospray ionization is one such technique that has evolved since its first demonstrations with ultraviolet lasers coupled to Fourier transform-ion cyclotron resonance mass spectrometers to extensive use with infrared lasers coupled to orbitrap-based mass spectrometers. Concurrently, there have been transformative developments of this imaging platform due to the high level of control the principal group has retained over the laser technology, data acquisition software (RastirX), instrument communication, and image processing software (MSiReader). This review will discuss the developments of MALDESI since its first laboratory demonstration in 2005 to the most recent advances in 2021. 相似文献
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AFM picking-up manipulation of the metaphase chromosome fragment by using the tweezers-type probe 总被引:1,自引:0,他引:1
Yamanaka K Saito M Shichiri M Sugiyama S Takamura Y Hashiguchi G Tamiya E 《Ultramicroscopy》2008,108(9):847-854
We have studied the development of a new procedure based on atomic force microscopy (AFM) for the analysis of metaphase chromosome. The aim of this study was to obtain detailed information about the specific locations of genes on the metaphase chromosome. In this research, we performed the manipulation of the metaphase chromosome by using novel AFM probes to obtain chromosome fragments of a smaller size than the ones obtained using the conventional methods, such as glass microneedles. We could pick up the fragment of the metaphase chromosome dissected by the knife-edged probe by using our tweezers-type probe. 相似文献
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