基于VC的试题库管理系统设计

学校教务管理重要任务之一就是考试管理。考试管理不仅仅包括考试现场的管理,它同时还包括考卷及试题的管理。为了便于试题管理,现在设计一个试题库管理系统,并且要求系统可以自动生成试卷。文章主要从系统的结构、实现方法进行介绍,系统的开发环境采用的是VC++,数据库采用的是SQL server数据库。     

题库系统的研究和实现

介绍了一个用VisualFoxpro开发的计算机辅助教学中的试题库系统，本系统可以实现试题的统一管理、试卷的自动生成以及试题和试卷的简单测试和分析。从理论和具体实现两个方面对系统进行了分析和论述。     

通用试题库系统的设计

系统是开放的,用户可对试题库进行浏览、添加和删除操作,试题内容可以是Word软件可接受、识别的任何信息;可自动为多门课程创建试题库,并对试题库实施维护管理;自动保存历史试卷而逐渐形成试卷库,为直接抽取试卷（必要时可作修改）用于考试提供了可能;可以人工浏览抽题,也可以按给出的条件自动随机抽题,最后试卷生成于一个Word文档中;试题内容的输入借助Word软件的窗口实现。在Windows98平台上,以VisualBasic6．0为工具、利用OLE等技术设计实现了该试题库系统。该系统1．0版本已申请国家专利并获准,并在教学部门投入试用,取得了较好的效果。     

基于编辑环境的自动组卷试题库系统设计与开发

介绍了使用.NET和SQLServer 2000设计,开发试题库的方法和关键技术.试卷最终以WORD文档形式提供给出卷教师,便于试卷结构和格式的调整.该系统增强了试题库系统的实用性,注重试题质量,优化成卷算法,减少了同类型试题的重复性.     

改进随机函数局限性样本取数优化算法

为了解决各类考试系统中随机抽取试题时存在试题重复和试题命中率不均匀的现象,提出一种改进随机取数局限性的样本取数优化算法。通过引入样本概念,从试题库中采集题号产生题号样本,利用随机函数产生预选样本,由预选样本在题号样本中映射出所对应的题号,形成试卷草样,经过排序形成试卷正样,完成试卷生成工作。采用样本取数优化算法具有较好的区间收敛性,试题库中试题的命中率高,接近平均值。该算法应用于试题库抽取试题具有速度快、抽取时数据量轻,组卷速度快。     

Office考试阅卷管理系统的研究与实现

本文分析了Office应用考试流程和自动阅卷系统的需求,建立了Office应用考试的自动阅卷系统结构,对系统功能、试题库、试题管理、考卷管理及成绩统计等方面提出了设计方案,提供了系统实施过程中的关键技术,为教师教学搭建起自动阅卷的平台。     

框架化通用试题试卷设计系统开发

试题试卷设计是供教师作日常试题积累及试卷设计的辅助设计软件，针对目前通行的试题库题固定，应用不灵活等缺点，阐述具有框架化结构的试题，试卷设计系统的组成原理及其实现方法。     

数据库技术用于英语CAI考试

本文介绍在微机上实现英语 CAI 考试系统的功能、原理及操作方法。系统采用数据库技术,用 dBASEⅡ编制程序。由于采用模块化结构,修改容易,使用方便。同时,通过某些设计技巧,突破了 dBASE Ⅱ的一些限制,使试题的建库更加实用。本系统为推广英语 CAI 作出了尝试。一、英语 GAI 考试系统的功能本系统让用户进行英语考试的训练,也可供教师用计算机出考题,打印试卷。系统初步设立改错、选择、填空、阅读、回答问题等五个类型的试题。题目类型可随需要而增删。如果配上一套历年来的 EPT 试题库,计算机就可以对用户进行 EPT 的模拟考试。系统对历年来的题目按类型随机地重新组合编排,模拟一份试卷,让用户进行考试,然后批改评分。下机前,用户可以打印出一份成绩单、正确答案和自己答案的对照     

基于EXCEL和VBA的自动组卷系统设计与实现

论文主要介绍了一款基于EXCEL和VBA的自动组卷系统的设计思路和实现方法。相关内容既可作为EXCEL教学的高阶案例,也可直接用于学校教师或考试管理人员进行试题库管理和试卷拟制工作,以提高考试工作的质量和效率。     

“信号与系统”课程试题库的设计与实现

信号与系统课程是电子信息类专业的基础课,在整个培养计划体系中起着重要作用。随着教考分离的实施和教务部门对试卷重复率的要求,设计开发该课程的试题库十分必要。本文介绍了该课程试题库的设计与实现方法。目前,信号与系统试题库包括：目录管理、试题录入、试题查找、试题修改、自动组卷和手动组卷等主要功能模块,可以方便的录入试题,并进行组卷。截止目前为止,本试题库中已包括453道题目,涵盖了6大类型题型,可满足课程考核的基本需求。今后,还将继续增加试题库的试题数量和类型,对其功能进一步优化。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.